JPS6348838B2 - - Google Patents

Info

Publication number
JPS6348838B2
JPS6348838B2 JP54103873A JP10387379A JPS6348838B2 JP S6348838 B2 JPS6348838 B2 JP S6348838B2 JP 54103873 A JP54103873 A JP 54103873A JP 10387379 A JP10387379 A JP 10387379A JP S6348838 B2 JPS6348838 B2 JP S6348838B2
Authority
JP
Japan
Prior art keywords
tube
pipe
silicon wafer
reaction
cvd film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54103873A
Other languages
Japanese (ja)
Other versions
JPS5628636A (en
Inventor
Hiroshi Isaji
Seishi Izumi
Kazuo Kobayashi
Haruo Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Mitsubishi Electric Corp
Original Assignee
Tokyo Electron Ltd
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Mitsubishi Electric Corp filed Critical Tokyo Electron Ltd
Priority to JP10387379A priority Critical patent/JPS5628636A/en
Publication of JPS5628636A publication Critical patent/JPS5628636A/en
Publication of JPS6348838B2 publication Critical patent/JPS6348838B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】 この発明は、拡散炉型CVD装置を使用し、シ
リコンウエハにCVD膜を生成する方法に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of producing a CVD film on a silicon wafer using a diffusion furnace type CVD apparatus.

通称減圧CVD装置またはLPCVDと呼ばれてい
る装置の中で、拡散炉の排気側に真空ポンプを配
置したものが、この発明で使用される拡散炉型
CVD装置である。この拡散炉型減圧CVD装置を
使用して、二酸化シリコン膜、窒化膜、ポリシリ
コン膜などが生成されるが、特にこの装置は
SiH4とO2の組合わせにより二酸化シリコン膜を
生成するのに使用すると有効である。以下、
SiH4とO2による二酸化シリコン生成プロセスを
例にとつて説明する。
The diffusion furnace type used in this invention is a device commonly called a low pressure CVD device or LPCVD, in which a vacuum pump is placed on the exhaust side of the diffusion furnace.
It is a CVD device. Silicon dioxide films, nitride films, polysilicon films, etc. are produced using this diffusion furnace type low pressure CVD equipment, but this equipment in particular
The combination of SiH 4 and O 2 is effective when used to produce silicon dioxide films. below,
An example of a silicon dioxide production process using SiH 4 and O 2 will be explained.

従来この種のCVD膜の生成のために使用され
る装置としては第1図に示すものがあつた。図に
おいて、1は反応管、2はボート、3はシリコン
ウエハ、4はガス入口、5はガス出口、6はヒー
タ、7は入口側取付具、8は出口側取付具であ
る。次に、第1図に示した従来の装置を使用して
CVD膜の生成方法を説明する。まず、シリコン
ウエハ3をボート2上に載せて反応管1に挿入す
る。次いで、SiH4とO2の各々のガスが入口4か
ら同時に導入され、シリコンウエハ3と反応管1
内周面との間隙を通過して出口5から排気され
る。このとき、シリコンウエハ表面にCVD膜
(二酸化シリコン膜)が生成される。
The apparatus shown in FIG. 1 has conventionally been used to produce this type of CVD film. In the figure, 1 is a reaction tube, 2 is a boat, 3 is a silicon wafer, 4 is a gas inlet, 5 is a gas outlet, 6 is a heater, 7 is an inlet side fitting, and 8 is an outlet side fitting. Next, using the conventional equipment shown in Figure 1,
The method for producing CVD films will be explained. First, the silicon wafer 3 is placed on the boat 2 and inserted into the reaction tube 1. Next, SiH 4 and O 2 gases are simultaneously introduced from the inlet 4 to the silicon wafer 3 and the reaction tube 1.
It passes through the gap with the inner peripheral surface and is exhausted from the outlet 5. At this time, a CVD film (silicon dioxide film) is generated on the surface of the silicon wafer.

ここで、反応サイクルを繰返すことにより、二
酸化シリコンは反応管1の内壁および、ボート2
の上にも付着する。このようにして付着した二酸
化シリコンの粉末やゴミは反応管1内にシリコン
ウエハをボートに出し入れするときなどに巻き上
がり、その上に二酸化シリコンを生成する目的の
シリコンウエハ表面に付着し、異物発生の原因と
なる。このようなことにより、ウエハ表面に異物
が発生することを防ぐためには、反応サイクルを
ある回数繰返した後あるいは、生成膜厚の総計が
ある一定量に達した後には、反応管を取外し、洗
浄された反応管と交換する必要がある。
By repeating the reaction cycle, silicon dioxide is deposited on the inner wall of the reaction tube 1 and the boat 2.
It also adheres to the top. The silicon dioxide powder and dust that have adhered in this way are blown up into the reaction tube 1 when silicon wafers are put in and taken out of the boat, and then they adhere to the surface of the silicon wafer that is intended to produce silicon dioxide, generating foreign matter. It causes. In order to prevent foreign matter from forming on the wafer surface, the reaction tube should be removed and cleaned after the reaction cycle has been repeated a certain number of times or after the total thickness of the produced film reaches a certain amount. It is necessary to replace the reaction tube with a new one.

しかし、反応管をこのように頻繁に交換する
と、入口側取付具7、出口側取付具8を含めて反
応管1をも取外さなければならないので、多大の
時間と労力を必要とし、装置の稼動率が著しく低
下する。
However, if the reaction tube is replaced frequently, the reaction tube 1, including the inlet side fitting 7 and the outlet side fitting 8, must be removed, which requires a great deal of time and effort, and the equipment is damaged. The operating rate will drop significantly.

この発明は、上述の如き従来のものの欠点を除
去するためになされたもので、シリコンウエハの
反応管への出し入れ時に巻き上がるゴミ等がシリ
コンウエハに付着しないようにしたものであり、
また反応管の交換も簡単に行える方法を提供する
ことを目的としている。この発明に使用される装
置の構造を第2図に示す。第2図において、1は
外側反応管(以後外管と略称する)、2はボート、
3はシリコンウエハ、4はガス入口、5はガス出
口、6はヒータ、7は入口側取付具、8は出口側
取付具、9は内側反応管(以後内管と略称する)
である。次に、第2図に従つてこの発明の方法を
説明する。
This invention was made in order to eliminate the above-mentioned drawbacks of the conventional method, and is designed to prevent dust and the like that are stirred up when the silicon wafer is taken in and out of the reaction tube from adhering to the silicon wafer.
It is also an object of the present invention to provide a method for easily exchanging reaction tubes. The structure of the device used in this invention is shown in FIG. In Fig. 2, 1 is an outer reaction tube (hereinafter referred to as outer tube), 2 is a boat,
3 is a silicon wafer, 4 is a gas inlet, 5 is a gas outlet, 6 is a heater, 7 is an inlet side fitting, 8 is an outlet side fitting, 9 is an inner reaction tube (hereinafter abbreviated as the inner tube)
It is. Next, the method of the present invention will be explained with reference to FIG.

まず、シリコンウエハ3をボート2に載せて内
管9内に配置し、この状態で内管9を外管1内に
挿入する。次いで従来と同様にCVD膜を形成す
る。そしてシリコンウエハ3を内部に配置したま
まの内管9を、外管1から取り出し、ボート2を
内管9から引き出す。ここで、内管9は、外管1
の内部にあつて、外管の内面を可能な限り完全に
覆うように寸法を定めておく。勿論、内管につい
ては、取付治具等は一切必要とせず単に円筒状の
反応管を外管の内部に置いているだけである。
First, the silicon wafer 3 is placed on the boat 2 and placed inside the inner tube 9, and in this state, the inner tube 9 is inserted into the outer tube 1. Next, a CVD film is formed as in the conventional method. Then, the inner tube 9 with the silicon wafer 3 still placed therein is taken out from the outer tube 1, and the boat 2 is pulled out from the inner tube 9. Here, the inner tube 9 is the outer tube 1
The dimensions are determined so that the inner surface of the outer tube is covered as completely as possible. Of course, no mounting jig or the like is required for the inner tube, and the cylindrical reaction tube is simply placed inside the outer tube.

上記実施例では二酸化シリコン生成プロセスに
適用した場合について説明したが、他のポリシリ
コン、シリコン窒化膜等のプロセスについて採用
しても、この発明が有効であることは言うまでも
ない。
Although the above embodiments have been described with reference to the case where the present invention is applied to a silicon dioxide production process, it goes without saying that the present invention is also effective when applied to other processes such as polysilicon and silicon nitride films.

次に、第3図を参照してこの発明に使用するこ
とのできる他のCVD装置を説明する。この装置
では、内管9に凸部9aおよび一端に鍔9bを設
けている。このように、凸部9aを設けると、着
脱が容易になる。
Next, another CVD apparatus that can be used in the present invention will be explained with reference to FIG. In this device, the inner tube 9 is provided with a convex portion 9a and a collar 9b at one end. Providing the convex portion 9a in this manner facilitates attachment and detachment.

したがつて、この発明の方法によれば第1の管
(外管)と、この第1の管の外側に設けられたヒ
ータと、上記第1の管に挿入可能に設けられた第
2の管(内管)とを用い、被処理物が第2の管内
に配置された状態で第2の管と被処理物とを第1
の管に挿入し、被処理物が管内に配置された第2
の管を第1の管に挿入した状態で被処理物に
CVD膜を生成させ、そしてCVD膜生成後の被処
理物が第2の管内に配置された状態で第2の管と
被処理物とを第1の管から取出すようにするもの
であるから、ウエハの出入れ時の対流によるゴミ
の巻き込みが第2の管により防止でき、またウエ
ハの出入れ時ウエハは第2の管内に設けた状態と
されているので、ゴミが発生しても直接ウエハに
付着することがないようにできる。
Therefore, according to the method of the present invention, a first tube (outer tube), a heater provided outside the first tube, and a second heater provided insertably into the first tube are provided. tube (inner tube), and with the object to be treated placed in the second tube, the second tube and the object to be treated are connected to the first tube.
The second tube is inserted into the second tube, and the object to be treated is placed inside the tube.
The tube inserted into the first tube is inserted into the object to be treated.
A CVD film is generated, and the second tube and the object to be treated are taken out from the first tube while the object to be processed after the CVD film is formed is placed in the second tube. The second tube prevents dust from being drawn in by convection when wafers are taken in and out, and since the wafers are placed inside the second tube when wafers are taken in and out, even if dust is generated, it can be directly removed from the wafers. It can be prevented from adhering to the surface.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の方法で使用されるCVD装置を
示す断面図、第2図と第3図はこの発明の方法で
使用される装置の断面図である。 1…反応管(第1の管)、2…ボート、3…シ
リコンウエハ、4…ガス入口、5…ガス出口、6
…ヒーター、7…入口側取付具、8…出口側取付
具、9…内側反応管(第2の管)。なお、図中同
一符号は同一または相当部分を示す。
FIG. 1 is a cross-sectional view showing a CVD apparatus used in the conventional method, and FIGS. 2 and 3 are cross-sectional views of the apparatus used in the method of the present invention. 1... Reaction tube (first tube), 2... Boat, 3... Silicon wafer, 4... Gas inlet, 5... Gas outlet, 6
...Heater, 7...Inlet side fitting, 8...Outlet side fitting, 9...Inner reaction tube (second tube). Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 1 第1の管と、この第1の管の外側に設けられ
たヒータと、上記第1の管に挿入可能に設けられ
た第2の管とを用い、上記第2の管の内部で被処
理物にCVD膜を生成するものにおいて、被処理
物が第2の管内に配置された状態で第2の管と被
処理物とを第1の管に挿入する工程と、被処理物
が管内に配置された第2の管を第1の管に挿入し
た状態で被処理物にCVD膜を生成する工程と、
CVD膜生成後の被処理物が第2の管内に配置さ
れた状態で第2の管と被処理物とを第1の管から
取出す工程とを有するCVD膜生成方法。
1 Using a first pipe, a heater provided outside the first pipe, and a second pipe insertably provided into the first pipe, the heater is heated inside the second pipe. In a device that generates a CVD film on a processed material, there is a step of inserting the second tube and the processed material into the first pipe while the processed material is placed in the second pipe, and a step in which the processed material is placed in the pipe. a step of generating a CVD film on the object to be treated while inserting a second tube located in the first tube into the first tube;
A method for producing a CVD film, comprising the steps of taking out the second tube and the object to be processed from the first tube while the object to be processed after CVD film generation is placed in the second tube.
JP10387379A 1979-08-15 1979-08-15 Cvd film forming apparatus Granted JPS5628636A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10387379A JPS5628636A (en) 1979-08-15 1979-08-15 Cvd film forming apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10387379A JPS5628636A (en) 1979-08-15 1979-08-15 Cvd film forming apparatus

Publications (2)

Publication Number Publication Date
JPS5628636A JPS5628636A (en) 1981-03-20
JPS6348838B2 true JPS6348838B2 (en) 1988-09-30

Family

ID=14365546

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10387379A Granted JPS5628636A (en) 1979-08-15 1979-08-15 Cvd film forming apparatus

Country Status (1)

Country Link
JP (1) JPS5628636A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61111992A (en) * 1984-11-05 1986-05-30 Rohm Co Ltd Vacuum gaseous-phase growth device
CN111433390B (en) * 2017-12-22 2022-09-27 株式会社村田制作所 Film forming apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5355978A (en) * 1976-10-29 1978-05-20 Nec Corp Vaccuum type vapor growth device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5355978A (en) * 1976-10-29 1978-05-20 Nec Corp Vaccuum type vapor growth device

Also Published As

Publication number Publication date
JPS5628636A (en) 1981-03-20

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