JPS63311832A - Loop test system for lan transmission line - Google Patents

Abstract

PURPOSE:To quicken the loop test by setting the high speed mode to the slave side in applying master-slave loopback test so as to provide a route applying direct loopback from a reception buffer to a transmission buffer thereby reducing the loopback processing time in the slave. CONSTITUTION:A tester 5 of a slave equipment is set in advance to the high speed mode and a high speed mode display flip-flop 14 is set. Then a loop test frame is used from the tester 4 at the master side to send the test use data. The loop test frame is received by the tester 5 of the slave side and stored in a reception buffer 8. That is, since a high speed mode display flip-flop 14 is set, a loopback path 16 is selected and the loop test frame of a reception buffer 8 is transferred immediately to the transmission buffer 9 and sent to a LAN transmission line 1. Thus, since the loopback is applied at high speed, the test time is reduced remarkably.

Description

[Detailed Description of the Invention] [Summary] When performing a master-slave loopback test of a LAN transmission line, a high-speed mode is set on the slave side.

Provide a direct loopback route from the reception buffer to the transmission buffer. This shortens the loop processing time within the slave and speeds up loop testing.

[Industrial application field]

The present invention relates to a loop test method between arbitrary two nodes on a LAN transmission path using a tester, and in particular, a loop test frame is transmitted from a test on the master side, looped back within the test on the slave side, and then sent to the test frame on the master side. This test relates to a method for testing a LAN transmission line by receiving a test.

[Conventional technology]

FIG. 3 shows the configuration of a conventional loop test method for LAN transmission lines.

In the figure, 1 is a LAN transmission line, 2 and 3 are transceivers, 4 is a tester on the master side, 5 is a tester on the slave side, and 6
is the LAN controller (represented by LANC), 7 is the LAN
Local memory for C (represented by LS), 8 is a reception buffer, 9 is a transmission buffer, 10 is a line control processor that controls the transmission and reception of frames (Table t in LCP), 11 is a main control that controls the entire tester A processor (represented by MCP), 12 a local memory (represented by LS) for LCP and MCP, and 13 a work area for frame processing.

Each tester 4, 5 on the master side and the slave side is connected to a LAN via a transceiver 2.3 at two different nodes.
The LAN transmission line is connected to the transmission line 1, and various tests are performed on the LAN transmission line.In the loop test, test data is sent from the tester 4 on the master side to the tester 5 on the slave side using a loop test frame, and the test data on the slave side is The signal is looped back within the tester 5 and received by the tester on the master side, thereby detecting the presence or absence of a fault in the LAN transmission line l.

In this case, in the tester 5 on the slave side, the LANC6
stores the received frame in the reception buffer 8 of the LS7 for LANC, but first moves it to the work area 13 of the LS12 according to an instruction from the LCPIO.

The data transferred to the work area 13 of LS12 is transferred to LCPIO
In response to a strong transmission request, the data is transferred to one transmission panofer 9 of the LS7. This transmission request is also issued to LANC6 at the same time, so that LANC6.

The data in the transmission buffer 9 is transmitted as a frame to the LAN transmission line 1 so that it is received by the tester 4 on the master side.

[Problem that the invention seeks to solve]

In the conventional LAN transmission line loop test method, the received data goes up to the final stage local memory LS12 in the tester on the slave side and then is sent back, so it takes two hours to check the complete route of data transfer. Even if it is meaningful in some cases, there is a problem in that it is not efficient for the purpose of checking only the LAN transmission line 1.

[Means for solving problems]

The present invention provides a high-speed operation mode in the slave-side tester, and in this high-speed mode, a high-speed loopback route is set within the tester to reduce the loopback processing time for received data.

FIG. 1 shows the basic configuration of the present invention.

In fig.

l is the LAN transmission line to be tested.

4 is a tester on the master side.

5 is a tester on the slave side.

8 is a receiving buffer.

9 is a transmission buffer.

12 is a local memory (LS).

14 is a high speed mode display flip-flop. Displays normal (non-high speed) mode when off and high speed mode when on.

Reference numeral 15 indicates a loopback route in the 2 normal mode, and the received data is looped back via the local memory LSI2.

16 is a return route in the high speed mode. The received data is directly looped back from the reception buffer 8 to the transmission buffer 9.

[Effect]

In FIG. 1, when performing a loop test on the LAN transmission line 1, the slave-side tester 5 is set to high-speed mode in advance. That is, the high-speed mode display flip-flop 14 is set on.

Thereafter, test data is transmitted from the tester 4 on the master side using a loop test frame.

This loop test frame is received by the tester 5 on the slave side and stored in the reception buffer 8.

Here, since the high-speed mode display flip-flop 14 is on, the return path 16 is selected, and the loop test frame in the reception buffer 8 is immediately transferred to the transmission buffer 9 and transmitted to the LAN transmission line 1. .

On the other hand, when the slave side tester (5) is set to the normal mode, that is, the high-speed mode display flip-flop 14
If it is kept off, the return path 15 is selected as in the conventional method, and the loop test frame in the reception buffer 8 is.

The data is transmitted via the local memory LS12 and stored in the transmission buffer 9.

〔Example〕

FIG. 2 shows the configuration of one embodiment of the present invention. The illustrated configuration is an improvement over the conventional configuration described in FIG. 3, and the same reference numerals are used for common elements.

In the figure, 1 is a LAN transmission line, 2 and 3 are transceivers, 4 is a tester on the master side, 5 is a tester on the slave side, and 6
is a LAN controller (LANC), and 7 is a controller for LANC/L//-E (LS).

8 is a reception buffer, 9 is a transmission buffer, 10 is a line control processor (LCP), 11 is a main control processor (MCP), 12 is LCP and MC
Local memory (LS) for P, 13 is work area, 14
15 is a return route in the normal mode; and 16 is a return route in the high-speed mode.

The high-speed mode display flip-flop 14 transmits an appropriate control frame from the tester 4 on the master side, and sends this to the L
The high speed mode can be set by identifying it from the ANC6. It is also possible to enter a command in the slave-side tester 5 to set it to high-speed mode.

During operation, the LANC 6 refers to the high-speed mode display flip-flop 14, and when the high-speed mode is identified, selects the return route 16, stores the received data (loop test frame) in the reception buffer 8, and then transfers the received data (loop test frame) to the transmission buffer 9. Execute the MOVE process to move the LAN transmission line 1 to
Send to.

On the other hand, in 5 normal mode, return route 15 is selected,
The data stored in the reception buffer 8 by the LANC 6 is
It is moved to the work area 13 of the LSI 2 by CPlo and returned to the transmission buffer 9 from there. The LANC 6 then transmits the data in the transmission buffer 9 onto the LAN transmission path.

〔Effect of the invention〕

According to the present invention, when performing a loop test on a LAN transmission path, the tester on the slave side can be set to high-speed mode and looped back at high speed, so the test time can be significantly shortened compared to conventional methods. be able to.

[Brief explanation of drawings]

FIG. 1 is a diagram showing the basic configuration of the present invention, FIG. 2 is a diagram showing the configuration of one embodiment of the present invention, and FIG. 3 is a diagram showing the configuration of a conventional system. In Figure 1. 1: LAN transmission line 4: Master side tester 5 Nislep side tester 8: Reception buffer 9: Transmission buffer

Claims (1)

[Claims] A master tester (4) is connected to one of two nodes provided on the LAN transmission line (1), a slave tester (5) is connected to the other, and the slave side tester (5) on the master side, and the tester (4) on the master side
The tester (5) on the slave side is set to the above-mentioned high-speed mode.
This is a loop test method for a LAN transmission line, which is characterized in that received data is stored in a reception buffer (8), then directly transferred to a transmission buffer (9), and controlled to be sent back.