JPS63298644A - Normal action confirming method for circuit to be tested - Google Patents

Normal action confirming method for circuit to be tested

Info

Publication number
JPS63298644A
JPS63298644A JP13590387A JP13590387A JPS63298644A JP S63298644 A JPS63298644 A JP S63298644A JP 13590387 A JP13590387 A JP 13590387A JP 13590387 A JP13590387 A JP 13590387A JP S63298644 A JPS63298644 A JP S63298644A
Authority
JP
Japan
Prior art keywords
data
circuit
test
tested
expected value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13590387A
Other languages
Japanese (ja)
Inventor
Kazuhiro Hara
和裕 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP13590387A priority Critical patent/JPS63298644A/en
Publication of JPS63298644A publication Critical patent/JPS63298644A/en
Pending legal-status Critical Current

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  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To decrease a manday by sampling a test object part in output data obtained by giving input data for test to a circuit to be tested at a selector latch circuit with a prescribed timing and collating the data of the result with the corresponding expected value data. CONSTITUTION:At the time of the test, a test program, an expected value data, etc., are loaded to a main memory 2, input data for test having a prescribed pattern are given to a tested circuit 3 and the output data are supplied through an interface part 9 to a selector latch part 7. On the other hand, a microprocessor 4 gives instruction data and timing from a test program in the memory 2 to a signal selecting instructing circuit 6, the circuit 6 samples the instruction data to a latch part 7 with a prescribed timing, collates the data of the result with the expected value data and detects automatically the error.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は被試験回路の正常動作確認方法に関し、特にデ
ィジタル計算による回路シミュレーションにおける被試
験回路の正常動作確認方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for confirming the normal operation of a circuit under test, and particularly to a method for confirming the normal operation of a circuit under test in circuit simulation using digital calculation.

〔従来の技術〕[Conventional technology]

従来のこの種の被試験回路の正常動作確認方法では、試
験用入力データに応答して被試験回路が出力するデータ
をタイムチャート形式で出力した上で、試験者が期待出
力値のタイムチャートと照合して、その正常性を確認し
ている。
In the conventional method of confirming the normal operation of this type of circuit under test, the data output by the circuit under test in response to test input data is output in the form of a time chart, and then the tester creates a time chart of the expected output value. It is checked to confirm its normality.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の被試験回路の正常動作確認方法では、被
試験回路が大規模化し複雑化すると、試験用データのパ
ターンの種類が厖大になるので、人手によるタイムチャ
ート出力のチェックには多大の工数を費やさざるを得な
くなるという欠点がある。
In the conventional method for confirming the normal operation of the circuit under test described above, as the circuit under test becomes larger and more complex, the types of test data patterns become enormous, so manually checking the time chart output requires a large amount of man-hours. The disadvantage is that you will have to spend a lot of money.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の被試験回路の正常動作確認方法は、シミュレー
ション用モデルの被試験回路に予め設定したパターンを
もつ試験用入力データを与え、これに応答して出力され
るデータをセレクタ・ラッチ回路に送り、プロセッサの
制御に応答して前記出力データ中の試験対象の部分およ
びタイミングを信号選択指示回路から指示して前記セレ
クタ・ラッチ回路でサンプリングさせ、該サンプリング
の結果のデータとこれに対応する期待値データと 、を
前記プロセッサの制御により照合して自動的にエラー検
出する方法である。
The method of confirming the normal operation of a circuit under test according to the present invention is to apply test input data having a preset pattern to the circuit under test of a simulation model, and send the output data in response to the test input data to the selector/latch circuit. In response to the control of the processor, the signal selection instruction circuit instructs the portion and timing of the test target in the output data to be sampled by the selector/latch circuit, and the sampling result data and the corresponding expected value are This is a method for automatically detecting errors by collating data and under the control of the processor.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する9第1図
は本発明の一実施例を示すブロック図である。同図にお
いて、コントロール部1は、シミューレーション実行制
御用のテストプログラムやデータ確認用サブルーチンを
ロードするためのメインメモリ2、シミュレーションの
モデルである被試験回路3、およびマイクロプロセッサ
4に接続しである。マイクロプロセッサ4には、マイク
ロプログラムをロードしであるマイクロメモリ4が接続
しである。
Next, the present invention will be explained with reference to the drawings.9 FIG. 1 is a block diagram showing one embodiment of the present invention. In the figure, a control unit 1 is connected to a main memory 2 for loading test programs for controlling simulation execution and subroutines for data confirmation, a circuit under test 3 that is a simulation model, and a microprocessor 4. be. Connected to the microprocessor 4 is a micromemory 4 into which microprograms are loaded.

第2図は、本実施例中のコントロール部1の構成例を示
すブロック図である。マイクロプロセッサ4から到来す
る信号に応答してメインメモリ2上にセーブする信号を
指示する信号選択指定回路6と、被試験回路3の出力信
号を中継するインク。
FIG. 2 is a block diagram showing an example of the configuration of the control section 1 in this embodiment. A signal selection designation circuit 6 which instructs a signal to be saved in the main memory 2 in response to a signal arriving from the microprocessor 4, and an ink which relays the output signal of the circuit under test 3.

フェース部9との、再出力信号をセレクタ・ラッチ部7
へ入力し、セレクタ・ラッチ部7の送出データは、メモ
リ書込制御部8を介してメインメモリ2にセーブされる
The re-output signal with the face section 9 is sent to the selector/latch section 7.
The output data of the selector/latch section 7 is saved in the main memory 2 via the memory write control section 8.

試験時にはまず、メインメモリ2にテストプログラムお
よび期待値データ、データ確認用サブルーチンをロード
して、試験開始する。マイクロプロセッサ4は、メイン
メモリ2にロードされたテストプログラムを、マイクロ
メモリ5のマイクロプログラムを参照することによって
実行していく。
At the time of testing, the test program, expected value data, and data confirmation subroutine are first loaded into the main memory 2, and the test is started. The microprocessor 4 executes the test program loaded into the main memory 2 by referring to the microprogram in the micromemory 5.

テストプログラムでチェックすべき信号およびそのタイ
ミングが指示されると、これに応じてマイクロプロセッ
サ4が信号選択指示回路6に指示データを与え、セレク
タ・ラッチ部7でチェック対象のデータをサンプリング
させる。サンプリングしたチェック対象のデータは、メ
モリ書込制御部8の制御により、メインメモリ2上のプ
ログラムによって指定された番地にセーブされる。この
あと、データ確認用サブルーチンを起動して、セーブし
たデータを期待値データと比較照合し、エラーならばそ
の情報をメインメモリ2の所定のエリアに書込んでいく
When the test program specifies the signal to be checked and its timing, the microprocessor 4 provides instruction data to the signal selection instruction circuit 6 in response to the instruction, and the selector/latch section 7 samples the data to be checked. The sampled data to be checked is saved at an address specified by the program on the main memory 2 under the control of the memory write control unit 8. Thereafter, a data confirmation subroutine is started, the saved data is compared with the expected value data, and if an error is found, the information is written to a predetermined area of the main memory 2.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明の被試験回路の正常動作確認
方法によれば、被試験回路の出力タイムチャーI・を指
定したタイミングでサンプリングし期待値データを照合
してエラーを自動的に検出するので、人手による厖大な
チェックを省くことができる効果がある。
As explained above, according to the method for confirming normal operation of a circuit under test of the present invention, the output time chart I of the circuit under test is sampled at a specified timing, and errors are automatically detected by comparing expected value data. Therefore, there is an effect that a huge amount of manual checking can be omitted.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本発明の実施例を示すブロック図
である。 1・・・コントロール部、2・・・メインメモリ、3・
・・被試験回路、4・・・マイクロプロセッサ、5・・
マイクロメモリ、6・・・信号選択指示回路、7・・・
セレクタ・ラッチ部、8・・・メモリ書込制御部、9・
・・インタフェース部。
1 and 2 are block diagrams showing embodiments of the present invention. 1...Control section, 2...Main memory, 3.
...Circuit under test, 4...Microprocessor, 5...
Micromemory, 6... Signal selection instruction circuit, 7...
Selector latch section, 8...Memory write control section, 9.
...Interface section.

Claims (1)

【特許請求の範囲】[Claims] シミュレーション用モデルの被試験回路に予め設定した
パターンをもつ試験用入力データを与え、これに応答し
て出力されるデータをセレクタ・ラッチ回路に送り、プ
ロセッサの制御に応答して前記出力データ中の試験対象
の部分およびタイミングを信号選択指示回路から指示し
て前記セレクタ・ラッチ回路でサンプリングさせ、該サ
ンプリングの結果のデータとこれに対応する期待値デー
タとを前記プロセッサの制御により照合して自動的にエ
ラー検出することを特徴とする被試験回路の正常動作確
認方法。
Test input data with a preset pattern is given to the circuit under test of the simulation model, the output data in response is sent to the selector/latch circuit, and in response to the control of the processor, the data in the output data is The part and timing to be tested is instructed from the signal selection instruction circuit, the selector/latch circuit samples it, and the sampling result data and the corresponding expected value data are collated under the control of the processor and automatically performed. A method for confirming normal operation of a circuit under test, characterized by detecting errors.
JP13590387A 1987-05-29 1987-05-29 Normal action confirming method for circuit to be tested Pending JPS63298644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13590387A JPS63298644A (en) 1987-05-29 1987-05-29 Normal action confirming method for circuit to be tested

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13590387A JPS63298644A (en) 1987-05-29 1987-05-29 Normal action confirming method for circuit to be tested

Publications (1)

Publication Number Publication Date
JPS63298644A true JPS63298644A (en) 1988-12-06

Family

ID=15162518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13590387A Pending JPS63298644A (en) 1987-05-29 1987-05-29 Normal action confirming method for circuit to be tested

Country Status (1)

Country Link
JP (1) JPS63298644A (en)

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