JPS6328871A - Plasma cvd treating device - Google Patents

Plasma cvd treating device

Info

Publication number
JPS6328871A
JPS6328871A JP17082686A JP17082686A JPS6328871A JP S6328871 A JPS6328871 A JP S6328871A JP 17082686 A JP17082686 A JP 17082686A JP 17082686 A JP17082686 A JP 17082686A JP S6328871 A JPS6328871 A JP S6328871A
Authority
JP
Japan
Prior art keywords
heating means
plasma cvd
heater
processing apparatus
cathode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17082686A
Other languages
Japanese (ja)
Inventor
Takashi Fujita
隆 藤田
Yasuhisa Shiraishi
泰久 白石
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP17082686A priority Critical patent/JPS6328871A/en
Publication of JPS6328871A publication Critical patent/JPS6328871A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a uniform coated film by arranging plural sets of opposed cathode plate and anode plate at regular intervals in a vacuum vessel provided with a heating means to uniformize the temp. of a material to be worked and the flow of a gas. CONSTITUTION:A cathode body 2, an anode body 3, and a heater 4 to be heated by an electric power source 6 are provided in plural stages at regular intervals in the vacuum vessel 1 provided with a gas supply port 1b and an exhaust port 1a to form the plasma CVD treating device. The material 5 to be worked is placed on the cathode body 2, heated by the heater 4 to about 550 deg.C, and coated with TiN, etc. The temp. of the material 5 to be worked is kept constant by this mechanism, and a uniform coated film can be formed. Besides, when a heating means is provided at the uppermost stage and the lowermost stage of the vessel 1 and further a temp. controller is furnished to each heating means, the temp. of the whole device can be uniformized. Since the electrode bodies 2 and 3 serve as the heating means, the throughput can be increased.

Description

【発明の詳細な説明】 [発明の目的] 〈産業上の利用分野) 本発明は、プラズマCVD処理装置に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to a plasma CVD processing apparatus.

(従来の技術) 時計ケース、カフスボタン、ネクタイピンのような各種
の部材にはプラズマ表面処理法を適用して、これらの部
材の表面に耐食性、耐摩耗性、美感等を備えた機能被膜
を形成することが行われている。
(Conventional technology) Plasma surface treatment is applied to various parts such as watch cases, cufflinks, and tie clips to coat the surfaces of these parts with functional coatings that provide corrosion resistance, abrasion resistance, and aesthetic appeal. Formation is taking place.

この機能被膜形成方法としては被処理物をプラズマCV
D処理装置の中にセットし、装置内に所望する反応ガス
とキャリアガスを流入しつつ所定の圧力下でプラズマを
発生し、この被処理物の救能面に所望する機能被膜を形
成するものである。
As a method for forming this functional film, the object to be treated is subjected to plasma CVD.
It is set in the D processing equipment, generates plasma under a predetermined pressure while flowing the desired reaction gas and carrier gas into the equipment, and forms the desired functional film on the salvageable surface of the object to be processed. be.

従来、このようなプラズマCVD処理装置を示したもの
として特開昭58−164777 (特願昭57−45
710)号明細書に示されているような金属加工物被膜
の形成方法に用いられるプラズマCVD処理装置がおる
Conventionally, such a plasma CVD processing apparatus is disclosed in Japanese Patent Application Laid-Open No. 58-164777 (Japanese Patent Application No. 57-45).
There is a plasma CVD processing apparatus used in a method of forming a coating on a metal workpiece as shown in the specification of No. 710).

この装置は、ガス供給口、排気口並びに器壁に加熱手段
を備えた真空容器内に、陰極板と陽極板を間隔をおいて
複数個対向配置してなるものである。
This device consists of a plurality of cathode plates and anode plates arranged facing each other at intervals in a vacuum container equipped with a gas supply port, an exhaust port, and a heating means on the vessel wall.

(発明が解決しようとする問題点) 上記従来の方法は、被加工材を、被加工材を載置してい
る極板の外側からモリブデンあるいはタングステンより
なるヒーターにより加熱している。しかし、この加熱方
法によると被加工材は不均一に加熱されており、加熱手
段から遠い位五にある被加工材の温度は近いものに比べ
低いものとなっていた。また、装置内には反応ガスやキ
ャリアガス等のガスを流入しているが、掻体が板状のた
めにガスの流れが不均一になり、被加工材へ均一に流れ
ないことがおった。これら、温度やガスの流れの不均一
性は装置が大きくなるほどその影響が大きくなっていた
。このように、従来のプラズマCVD処理装置は被加工
材への加熱温度または/およびガスの流れが不均一であ
り、そのため被膜形成の際の膜厚、膜質等の膜の不均一
性が発生した。
(Problems to be Solved by the Invention) In the above-mentioned conventional method, the workpiece is heated by a heater made of molybdenum or tungsten from the outside of the electrode plate on which the workpiece is placed. However, according to this heating method, the workpiece is heated non-uniformly, and the temperature of the workpiece farther from the heating means is lower than that of the workpiece closer to the heating means. In addition, gases such as reaction gas and carrier gas flow into the equipment, but because the scraping body is plate-shaped, the gas flow is uneven, and the gas does not flow uniformly to the workpiece. . The influence of these non-uniformities in temperature and gas flow increases as the device becomes larger. As described above, in conventional plasma CVD processing equipment, the heating temperature and/or gas flow to the workpiece are non-uniform, resulting in non-uniformity in film thickness, film quality, etc. during film formation. .

したがって、本発明は上記問題を解決し、均一な被膜成
形の可能なプラズマCVD処理装置を提供することを目
的とする。
Therefore, an object of the present invention is to solve the above-mentioned problems and provide a plasma CVD processing apparatus capable of forming a uniform film.

[発明の構成] (問題点を解決するための手段) 本発明者らは、上記目的を達成するために被加工材の温
度およびガスの流れを均一にすることに注目し以下の発
明を見い出した。
[Structure of the Invention] (Means for Solving the Problem) In order to achieve the above object, the present inventors focused on making the temperature of the workpiece and the flow of gas uniform, and discovered the following invention. Ta.

第1に本発明のプラズマCVD処理装置は、ガス供給口
と排気口を備えた真空容器に陰極体および/または陽極
体と加熱手段を間隔をおいて複数段配置したことを特徴
とするものである。
Firstly, the plasma CVD processing apparatus of the present invention is characterized in that a cathode body and/or anode body and a heating means are arranged in multiple stages at intervals in a vacuum container equipped with a gas supply port and an exhaust port. be.

上記発明において、加熱手段は掻体と平行に配置してい
るため、掻体に載置されている被加工材を均一に加熱す
ることができる。これにより被加工材の温度を一定にす
ることができる。
In the above invention, since the heating means is arranged parallel to the scraper, it is possible to uniformly heat the workpiece placed on the scraper. This allows the temperature of the workpiece to be kept constant.

ざらに、装置全体の温度の均一化を図るためには、容器
の最上段または/および最下段に加熱手段を設ける。こ
れにより、温度が不均一となりやすい最上段または/お
よび最下段の被加工材への加熱も可能となる。
Generally speaking, in order to make the temperature of the entire apparatus uniform, heating means are provided at the top and/or bottom of the container. This also makes it possible to heat the workpieces at the top and/or bottom where the temperature tends to be non-uniform.

ざらに装置全体の温度の均一化を図るためには、各加熱
手段に温度制御装置を設ける。
In order to roughly equalize the temperature of the entire device, each heating means is provided with a temperature control device.

これにより各加熱手段を任意に制御し、被加工材の加熱
温度をより精度よく制御できるとともに装置全体の温度
の均一化を図ることができる。
Thereby, each heating means can be arbitrarily controlled, and the heating temperature of the workpiece can be controlled more accurately, and the temperature of the entire apparatus can be made uniform.

これは、従来が全ての加熱装置の温度制御を1体の温度
制御装置で行っていたために装置全体の温度を均一にす
ることが困難な場合があったためである。
This is because conventionally, the temperature of all the heating devices was controlled by one temperature control device, which sometimes made it difficult to make the temperature of the entire device uniform.

ざらに、被膜形成を均一に行うために、ガスの流れの均
一化を図る。まず陽極体、陰極体、加熱手段のいずれか
のガスの流れを阻害するものに対し、ガスの通る流通孔
を設Cブガスの通りを良好にすることが考えられる。こ
れは、加熱手段がモリブデン板、あるいはタングステン
板等を用いていたためであり、例えば下方からのガスの
流れが阻害され掻体上に載置されている被加工材へはガ
スが均一に流れなくなる場合があったためである。この
流通口は、被加工材が落下しない程度の開口であり形状
は問わない。
Generally speaking, in order to uniformly form a film, the flow of gas is made uniform. First, it is conceivable to provide a gas passage hole for any one of the anode body, cathode body, and heating means that obstructs the flow of gas to improve the flow of the gas. This is because the heating means used was a molybdenum plate or a tungsten plate, for example, which obstructed the flow of gas from below and prevented the gas from flowing uniformly to the workpiece placed on the scraper. This is because there was a case. This flow port is an opening that is large enough to prevent the workpiece from falling, and its shape does not matter.

例えば網目状のものでも可能でおる。For example, a mesh-like material is also possible.

さらに、加熱手段としてシースヒータを用いることによ
り、ガスの流れを妨げずに熱効率の良好なものが得られ
る。
Furthermore, by using a sheath heater as the heating means, good thermal efficiency can be obtained without interfering with the flow of gas.

ざらに、本発明者らは、陰極体、陽極体、加熱手段が各
々独立して設けられているための装置の大型化による内
部容積が限られた真空容器の処理容量の減少に対応する
ために、さらに研究を重ねた結果、加熱手段にシースヒ
ータを用いた場合、シースヒータの保護管が掻体をかね
ることができることを見い出した。
In general, the present inventors have developed a method to cope with the reduction in the processing capacity of a vacuum container with a limited internal volume due to an increase in the size of the device due to the fact that the cathode body, the anode body, and the heating means are each provided independently. As a result of further research, it was discovered that when a sheath heater is used as the heating means, the protective tube of the sheath heater can also serve as a scraper.

すなわち、ガス供給口と排気口とを備えた真空容器に、
陰極体と陽極体が間隔をおいて複数段配置しており、前
記陰極体および/または陽極体は加熱手段をかねている
ことを特徴とするものである。
That is, a vacuum container equipped with a gas supply port and an exhaust port,
The device is characterized in that a plurality of cathode bodies and anode bodies are arranged at intervals, and the cathode body and/or the anode body also serve as heating means.

この発明においては、シースヒータが好ましい。これは
、ステンレス等の保護管の中央部に発熱体を設け、マグ
ネシア、ジルコニア等の絶縁体を充填したものであり、
この保護管を掻体とするものである。
In this invention, a sheath heater is preferred. This is a protective tube made of stainless steel, etc., with a heating element installed in the center, and filled with an insulator such as magnesia or zirconia.
This protective tube is used as a scraping body.

この発明において加熱手段をかねていない慟体は、ガス
が均一に流れるように流通口を設けること、あるいは最
上段および/または最下段にざらにヒータを設け、おの
おの独立した温度制御手段を設けることによりガスおよ
び温度を均一にすることができる。
In the present invention, the cage that does not also serve as a heating means is provided with a communication port so that the gas flows uniformly, or heaters are provided roughly at the top and/or bottom step, and each is provided with an independent temperature control device. This allows the gas and temperature to be made uniform.

上記場合においては、シースヒータの保護管は全て陰極
体および/または陽極体としている。
In the above case, all of the protective tubes of the sheath heater are cathode bodies and/or anode bodies.

しかし、最上段および/または最下段のヒータも掻体と
しているためにヒータが汚れることがあった。そのため
最上段および/または最下段のヒーターを他の掻体をか
ねているビータとは独立させ、このヒータの保護管を掻
体とせずにアースにつなぐか、あるいは絶縁保持するこ
とによりシースヒータの汚れを大幅に減少することがで
きる。
However, since the top and/or bottom heaters are also used as scrapers, the heaters may become dirty. Therefore, by making the top and/or bottom heaters independent from the beaters that also serve as scrapers, and by connecting the heater's protective tube to the ground instead of using it as a scraper, or keeping it insulated, the sheathed heaters can be prevented from becoming dirty. can be significantly reduced.

上記発明においては掻体の電源には直流を用い掻体を陰
極または陽極として、掻体に載置した被加工材もまた載
置した掻体と同様に陰極または陽極として被膜形成を行
っている。掻体の電源に直流を用いるには直流回路が必
要であるため電源が大型化し、価格的にも高価になる。
In the above invention, a direct current is used as the power source for the scraping body, and the scraping body is used as a cathode or an anode, and the workpiece placed on the scraping body is also used as a cathode or an anode to form a film. . Using direct current as the power source for the scraper requires a direct current circuit, which makes the power source larger and more expensive.

被膜形成は交流による放電においても可能でおるため掻
体の電源に交流電源を用い電源の小型、軽量化および価
格の低減を図ることができる。
Since film formation is also possible with alternating current discharge, an alternating current power source can be used as the power source for the scraper, making it possible to reduce the size, weight, and cost of the power source.

被膜形成は補体上に被加工材を載置した状態で行っても
よいが、また、被加工材を掻体より吊下して行っても同
様の効果が得られる。
The coating may be formed with the workpiece placed on the complement, but the same effect can also be obtained by suspending the workpiece from the scraper.

(作 用) 本発明においては、加熱手段を掻体と平行に配置してい
るため掻体の面全体を均一に加熱ができる。したがって
、その補体上に載置されている被加工材の温度は均一に
なる。また、装置の最上段および/または最下段に加熱
手段を配置すること、および各加熱手段に温度制御装置
を備えることにより、装コ全体の温度、すなわち被加工
材の温度を均一にすることができる。
(Function) In the present invention, since the heating means is arranged parallel to the scraper, the entire surface of the scraper can be heated uniformly. Therefore, the temperature of the workpiece placed on the complement becomes uniform. In addition, by arranging the heating means at the top and/or bottom stage of the equipment and by providing each heating means with a temperature control device, the temperature of the entire equipment, that is, the temperature of the workpiece, can be made uniform. can.

さらに、陰極体および/または陽極体をかねることによ
り、限られた内部容積の真空容器においては、処理@量
を大きくすることができる。
Furthermore, by serving as a cathode body and/or an anode body, the processing capacity can be increased in a vacuum vessel with a limited internal volume.

(実施例) 以下、本発明の実施例を図面を用いて説明する。(Example) Embodiments of the present invention will be described below with reference to the drawings.

実施例1 第1図で示すように、ガス供給口1bと排気口1aを備
えた真空容器1に陰極体2−陽極体3−電源6により加
熱されるモリブデン板よりなるヒータ4を3段有するプ
ラズマCVDff1理装置の陰穫体上に被加工材5をt
直後、ヒータにより約550℃に加熱しTiNの被覆を
行った。
Embodiment 1 As shown in FIG. 1, a vacuum container 1 equipped with a gas supply port 1b and an exhaust port 1a has three stages of a cathode body 2, an anode body 3, and a heater 4 made of a molybdenum plate heated by a power source 6. Place the workpiece 5 on the victim body of the plasma CVDff1 processing device.
Immediately thereafter, the film was heated to about 550° C. using a heater and coated with TiN.

また比較として第8図で示すような陰極体2の外側から
のヒータ4の加熱を行った。
For comparison, the cathode body 2 was heated from the outside with a heater 4 as shown in FIG.

この結果、本発明のプラズマCVD処理装置は最下段の
陰極体上の被加工材において温度の差は約100℃以内
でおった。また、比較として示した装置は約150 ’
C温度差がおり、ヒータによる温度の均一化が行われて
いる。
As a result, in the plasma CVD processing apparatus of the present invention, the temperature difference between the workpieces on the lowermost cathode body was within about 100°C. Also, the device shown for comparison is approximately 150'
There is a temperature difference, and the temperature is made uniform by the heater.

また、第2図に示すように陽極体3を陰極体2の外側に
配置した場合においても同様の被覆を行ったが、上記と
同様の温度の均一化が行なわれた。
Further, when the anode body 3 was placed outside the cathode body 2 as shown in FIG. 2, the same coating was applied, and the temperature was made uniform in the same way as above.

第1図、第2図で示したようなプラズマCVD処理装置
は、陽、陽画掻体は、真空容器と絶縁されているため、
真空容器には電気は流れない。したがって感電の恐れが
少なく容器、内壁の汚れも少ないものとなった。
In the plasma CVD processing apparatus as shown in FIGS. 1 and 2, the positive and negative film bodies are insulated from the vacuum vessel, so
No electricity flows in a vacuum container. Therefore, there is less risk of electric shock and less staining of the container and inner walls.

実施例2 実施例1と同様のプラズマCVD処理装買の陰極体、陽
極体、モリブデン板よりなるヒータに被加工材の載置が
可能な範囲で流通口を設は被加工材にTiNの被覆を行
った。
Example 2 A flow port was provided in a heater made of a cathode body, an anode body, and a molybdenum plate in the same plasma CVD processing equipment as in Example 1, and the workpiece was coated with TiN. I did it.

その結果、本発明の装置は、従来の板状のものに比へガ
スが陰、陽画極板おるいはヒータに阻害されることなく
通り扱けが可能でめるので、極板上の被加工材にガスは
均一に流れ、TiNの膜質、膜厚も均一になった。また
、梯体の中央部に載置されている被加工材へも均一にガ
スが流れるようになり装置の大型化が可能となつた。
As a result, compared to conventional plate-shaped devices, the device of the present invention allows gas to be handled without being hindered by negative or positive electrode plates or heaters. The gas flowed uniformly through the material, and the quality and thickness of the TiN film became uniform. Additionally, gas can now flow uniformly to the workpiece placed in the center of the ladder, making it possible to increase the size of the device.

実施例3 実施例1と同様のプラズマCVD処理装置において陰、
陽画掻体には実施例2と同様に開口部を設け、ヒータに
シースヒータを用いた。その結果実施例2のようなモリ
ブデン板よりなるヒータに開口部を設けたものに比べ、
ざらにガスの流れが良くなり、膜質、膜厚とも均一なも
のが得られた。
Example 3 In a plasma CVD processing apparatus similar to Example 1, negative,
An opening was provided in the positive print body as in Example 2, and a sheath heater was used as the heater. As a result, compared to the heater made of a molybdenum plate with openings as in Example 2,
The gas flow improved considerably, and a film with uniform quality and thickness was obtained.

実施例4 第3図に示すように、実施例1(図1)と同様のプラズ
マCVD処理装置においてヒータ4の電源6を各ヒータ
に設けた。この電源6により各ヒータの温度をおのおの
制御し、被加工材の温度が一定になるようにした。
Example 4 As shown in FIG. 3, in the same plasma CVD processing apparatus as in Example 1 (FIG. 1), a power source 6 for the heater 4 was provided for each heater. The temperature of each heater was controlled by this power source 6, so that the temperature of the workpiece was kept constant.

その結果、ヒータにより約550’Cで加熱した場合極
体上の被加工材の温度差は約70℃以内であった。また
、複数のヒータに対し制御手段が1つでおる実施例1は
約100℃でおったのと比較して、各ヒーター毎の制御
装置の温度の均一化への効果は大である。
As a result, when heated at about 550'C with a heater, the temperature difference between the workpiece on the pole body was within about 70°C. Further, compared to the first embodiment in which one control means is used for a plurality of heaters, the temperature was about 100° C., the effect of the control device for each heater on making the temperature uniform is large.

実施例5 第4図に示すように、実施例4と同様のプラズマCVD
処理装置の最下段にヒータ4を設けた。この際もヒータ
4はあのおの温度の制御手段6を有している。ヒータに
より約550℃の温度に加熱して被覆を行った場合、本
発明の装置の温度差は約60℃であった。最下段にヒー
タを設置プていない実施例4は約70°Cであり、最下
段のヒーターの効果は大である。
Example 5 As shown in FIG. 4, plasma CVD similar to Example 4 was carried out.
A heater 4 was provided at the bottom of the processing device. At this time as well, the heater 4 has its own temperature control means 6. When coating was carried out by heating to a temperature of about 550°C with a heater, the temperature difference in the apparatus of the present invention was about 60°C. In Example 4, in which no heater was installed at the bottom stage, the temperature was about 70°C, and the effect of the heater at the bottom stage was great.

本実施例において、実施例2,3と同様に陰、陽画掻体
およびビータに開口部を設けたり、あるいはヒータにシ
ースヒータを用いることによりざらに被覆の均一化の効
果は向上する。
In this embodiment, as in Examples 2 and 3, the effect of making the coating more uniform can be improved by providing openings in the negative, positive and beater bodies, or by using a sheath heater as the heater.

実施例6 第5図に示すようにガス供給口]bおよび排出口1aを
備える真空容器1に陽極体3−保護管を陰極体2とする
シースヒータ4を3段有するプラズマCVD処理装置の
陰極体上に被加工材5を載置しTiNの被覆を行った。
Example 6 As shown in FIG. 5, a cathode body of a plasma CVD processing apparatus having three stages of a sheath heater 4 having an anode body 3 and a protection tube as a cathode body 2 in a vacuum vessel 1 having a gas supply port b and a discharge port 1a. A workpiece 5 was placed on top and covered with TiN.

この結果、従来の陰極体−陽極体−ヒータを各々独立し
て有するものに対し、処理容量が約1.5〜2倍と向上
した。また、被加工材とヒータは接触しているので熱伝
導が良く加熱が行いやすいため熱効率は約5〜10%向
上した。
As a result, the processing capacity was improved to about 1.5 to 2 times that of the conventional structure having a cathode body, an anode body, and a heater independently. Furthermore, since the workpiece and the heater are in contact with each other, heat conduction is good and heating is easy to perform, so the thermal efficiency was improved by about 5 to 10%.

この場合もヒータは、おのおの電源6により独立した温
度の制御手段を設けている。
In this case as well, each heater is provided with independent temperature control means using the power source 6.

また、第6図に示すように、シースじ一夕4の保護管を
陽極体3とすることによっても処理容量の向上を図るこ
とができる。この場合、上記第5図に示したようなシー
スヒータの保護管を陰極にしたものに対しヒータの汚れ
が少ないものとなった。
Further, as shown in FIG. 6, the processing capacity can also be improved by using the protective tube of the sheath 4 as the anode body 3. In this case, the heater was less contaminated than the one shown in FIG. 5, in which the protective tube of the sheath heater was used as a cathode.

上記第5図、第6図の装置においても実施例4で示した
ように、最下段にヒータを設けることにより、より温度
の均一化を図ることができる。
In the apparatuses shown in FIGS. 5 and 6, as shown in Example 4, by providing a heater at the lowest stage, the temperature can be made more uniform.

実施例7 第7図に示すように実施例6の第5図で示したような保
護管を陰極体2としたシースヒータ4上に被加工材5を
載置し、被膜形成を行う場合において最下段のヒータの
保護管を陰極電源に接続せず、他の電極と独立させてア
ース7に接続した。このプラズマCVDff1理装置に
より被膜形成を行ったところ、第5図で示したプラズマ
CVD処理装置の最下段のヒータに比べ、本発明の装置
の最下段のヒータの汚れは極めて少ないものとなり、従
来に比べ汚れを除去するための処理の回数が減少した。
Embodiment 7 As shown in FIG. 7, when forming a film by placing a workpiece 5 on a sheath heater 4 whose cathode body 2 is a protective tube as shown in FIG. The protective tube of the lower heater was not connected to the cathode power supply, but was connected to the ground 7 independently from other electrodes. When a film was formed using this plasma CVD processing apparatus, the bottom heater of the apparatus of the present invention was much less contaminated than the bottom heater of the plasma CVD processing apparatus shown in FIG. The number of treatments required to remove dirt has been reduced.

また、第7図で示したプラズマCVD理装置の最下段の
ヒータをアースに接続せず他の電極と独立させたのみの
場合においても同様の効果が得られた。
Further, the same effect was obtained even when the heater at the lowest stage of the plasma CVD processing apparatus shown in FIG. 7 was not connected to the ground and was made independent from other electrodes.

[発明の効果] 本発明のプラズマCVD処理装置により、被加工材の加
熱温度およびガスの流れが均一であるため均一な被膜を
形成することができる。また、掻体は加熱手段をかねる
ため処理容量が大きくなる。
[Effects of the Invention] With the plasma CVD processing apparatus of the present invention, a uniform coating can be formed because the heating temperature of the workpiece and the gas flow are uniform. Furthermore, since the scraping body also serves as a heating means, the processing capacity becomes large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第7図は、本発明のプラズマCVD処理装置
の実施例を示す概要図である。第8図は従来のプラズマ
CVD処理装置を示す概要図でおる。 1・・−・・・真空容器   1a・・・ガス排気口1
b・・・ガス供給口   2・・・・・・陰 極 体3
・・・・・・陽極体 4・・・・・・ヒータ5・・・・
・・被加工材  6・・・・・・電  源7・・・・・
・ア − ス
1 to 7 are schematic diagrams showing embodiments of the plasma CVD processing apparatus of the present invention. FIG. 8 is a schematic diagram showing a conventional plasma CVD processing apparatus. 1...--Vacuum container 1a...Gas exhaust port 1
b...Gas supply port 2...Cathode body 3
... Anode body 4 ... Heater 5 ...
...Workpiece material 6...Power supply 7...
・Earth

Claims (10)

【特許請求の範囲】[Claims] (1)ガス供給口と排気口を備えた真空容器に陰極体お
よび/または陽極体と加熱手段を間隔をおいて複数段配
置したことを特徴とするプラズマCVD処理装置。
(1) A plasma CVD processing apparatus characterized in that a cathode body and/or anode body and a heating means are arranged in plural stages at intervals in a vacuum container equipped with a gas supply port and an exhaust port.
(2)陽極体と陰極体と加熱手段のいづれか一段以上は
ガスの通る流通口を設けていることを特徴とする特許請
求の範囲第1項に記載のプラズマCVD処理装置。
(2) The plasma CVD processing apparatus according to claim 1, wherein at least one stage of the anode body, the cathode body, and the heating means is provided with a gas communication port.
(3)最上段および/または最下段に加熱手段を設けた
ことを特徴とする特許請求の範囲第1項に記載のプラズ
マCVD処理装置。
(3) The plasma CVD processing apparatus according to claim 1, characterized in that a heating means is provided at the uppermost stage and/or the lowermost stage.
(4)加熱手段はモリブデンあるいはタングステンのい
ずれかである特許請求の範囲第1項に記載のプラズマC
VD処理装置。
(4) The plasma C according to claim 1, wherein the heating means is either molybdenum or tungsten.
VD processing equipment.
(5)加熱手段はシースヒータである特許請求の範囲第
1項に記載のプラズマCVD処理装置。
(5) The plasma CVD processing apparatus according to claim 1, wherein the heating means is a sheath heater.
(6)各加熱手段には加熱温度を制御する温度制御装置
を備えている特許請求の範囲第1項に記載のプラズマC
VD処理装置。
(6) The plasma C according to claim 1, wherein each heating means is equipped with a temperature control device for controlling the heating temperature.
VD processing equipment.
(7)ガス供給口と排気口とを備えた真空容器に陰極体
と陽極体が間隔をおいて複数段配置しており、前記陰極
体および/または陽極体は加熱手段をかねていることを
特徴とするプラズマCVD処理装置。
(7) A vacuum container equipped with a gas supply port and an exhaust port has a plurality of cathode bodies and anode bodies disposed at intervals, and the cathode body and/or the anode body also serves as heating means. Plasma CVD processing equipment.
(8)加熱手段はシースヒーターである特許請求の範囲
第7項に記載のプラズマCVD処理装置。
(8) The plasma CVD processing apparatus according to claim 7, wherein the heating means is a sheath heater.
(9)陽極体と陰極体のいずれかはガスの通る流通口を
設けていることを特徴とする特許請求の範囲第7項に記
載のプラズマCVD処理装置。
(9) The plasma CVD processing apparatus according to claim 7, wherein either the anode body or the cathode body is provided with a communication port through which gas passes.
(10)各加熱手段は加熱温度を制御する温度制御装置
を備えている特許請求の範囲第7項に記載のプラズマC
VD処理装置。
(10) The plasma C according to claim 7, wherein each heating means is equipped with a temperature control device for controlling the heating temperature.
VD processing equipment.
JP17082686A 1986-07-22 1986-07-22 Plasma cvd treating device Pending JPS6328871A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17082686A JPS6328871A (en) 1986-07-22 1986-07-22 Plasma cvd treating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17082686A JPS6328871A (en) 1986-07-22 1986-07-22 Plasma cvd treating device

Publications (1)

Publication Number Publication Date
JPS6328871A true JPS6328871A (en) 1988-02-06

Family

ID=15912046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17082686A Pending JPS6328871A (en) 1986-07-22 1986-07-22 Plasma cvd treating device

Country Status (1)

Country Link
JP (1) JPS6328871A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5326404A (en) * 1991-12-19 1994-07-05 Sony Corporation Plasma processing apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54155137A (en) * 1978-05-29 1979-12-06 Kanematsu Semikondakutaa Kk Processing machine for etching and deposition using plasma
JPS5778941A (en) * 1980-11-04 1982-05-17 Matsushita Electric Ind Co Ltd Method and apparatus for plasma deposition
JPS58164777A (en) * 1982-03-24 1983-09-29 Toshiba Corp Formation of metallic compound film
JPS5935674A (en) * 1982-08-24 1984-02-27 Sumitomo Electric Ind Ltd Vapor deposition device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54155137A (en) * 1978-05-29 1979-12-06 Kanematsu Semikondakutaa Kk Processing machine for etching and deposition using plasma
JPS5778941A (en) * 1980-11-04 1982-05-17 Matsushita Electric Ind Co Ltd Method and apparatus for plasma deposition
JPS58164777A (en) * 1982-03-24 1983-09-29 Toshiba Corp Formation of metallic compound film
JPS5935674A (en) * 1982-08-24 1984-02-27 Sumitomo Electric Ind Ltd Vapor deposition device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5326404A (en) * 1991-12-19 1994-07-05 Sony Corporation Plasma processing apparatus

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