JPS63263815A - Surface acoustic wave device - Google Patents

Surface acoustic wave device

Info

Publication number
JPS63263815A
JPS63263815A JP9886087A JP9886087A JPS63263815A JP S63263815 A JPS63263815 A JP S63263815A JP 9886087 A JP9886087 A JP 9886087A JP 9886087 A JP9886087 A JP 9886087A JP S63263815 A JPS63263815 A JP S63263815A
Authority
JP
Japan
Prior art keywords
type
surface acoustic
acoustic wave
film thickness
distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9886087A
Other languages
Japanese (ja)
Inventor
Takaya Watanabe
隆彌 渡邊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP9886087A priority Critical patent/JPS63263815A/en
Publication of JPS63263815A publication Critical patent/JPS63263815A/en
Pending legal-status Critical Current

Links

Landscapes

  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

PURPOSE:To improve a characteristic with comparatively simple constitution, by forming the aluminum film thickness of a reflection grid which constitutes a metallic RAC(reflective array compressor)type/distribution type delay line thicker as being separated from an input/output transducer. CONSTITUTION:The input/output transducers 11 and 13 are provided at the left side of a Bi12 GeO20 crystal 15, and the reflection grids 12 and 14 having film thickness inclined distribution 16 arranged with a prescribed interval are constituted, and form a metallic RAC type/SAW distribution type dalay line. By forming the reflection grid on such film thickness distribution, an in-band characteristic can be stabilized.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明dRAc (リフレクティフ”・アレイ・コンプ
レッサ)型弾性表面波(SAW)分散型遅延線の金属反
射格子の構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to the structure of a metal reflective grating of a dRAc (Reflective Array Compressor) type surface acoustic wave (SAW) distributed delay line.

〔従来の技術〕[Conventional technology]

従来%RAC型SAW分散型)V延線の反射格子の構造
は、基板上に一定な膜厚の金属膜を形成することによっ
て作られていた。
Conventionally, the structure of the reflection grating of the %RAC type SAW distributed type) V extended wire was made by forming a metal film of a constant thickness on a substrate.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述の従来の反射格子構造では、入出カドランスシェー
ブから遠く離れた反射格子で反射される弾性表面波は摂
動を受け、減衰の為に反射係数が落ち、帯域内特性に傾
斜を鳴していた。
In the conventional reflection grating structure described above, the surface acoustic waves reflected by the reflection grating far from the input and output quadrangle shavers are perturbed, the reflection coefficient drops due to attenuation, and the in-band characteristics become sloped. .

〔問題点を解決するための手段〕[Means for solving problems]

本発明の弾性表面波装置は、金属BAC型分数分散型遅
延線成す・る反射格子のアルミニウム膜厚奮入出カドラ
ンスジューサから離れるにしたがって厚くした構造を有
している。
The surface acoustic wave device of the present invention has a structure in which the aluminum film of the reflection grating, which is a metal BAC type fractional dispersion delay line, increases in thickness as it goes away from the output quadrature transducer.

〔実施例〕〔Example〕

次に本発明の実施例を図面を参照して説明する。 Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示し、(a)は平面図。FIG. 1 shows an embodiment of the present invention, and (a) is a plan view.

[blri断面図である。図において、基板であるBi
t鵞Gem、、結晶15の左側に人出カドランスシュー
ブ11.13が設けられ、膜ル傾斜分布16を有する所
定の間隔で配置された反射格子12.14が構成されて
金属RAC型SAW分散型遅延紛を成している。この遅
延線の特性が第2図に示すダウンチャーブ特性である。
[This is a cross-sectional view of blri. In the figure, the substrate Bi
A metal RAC type SAW is provided with a quadrangle shovel 11.13 on the left side of the crystal 15, and reflection gratings 12.14 arranged at predetermined intervals having a film gradient distribution 16. It constitutes a distributed delay conflict. The characteristic of this delay line is the downchirve characteristic shown in FIG.

従来の反射格子の膜厚が一定の場合ri第3図の様な傾
斜した帯域内特性となっていた。すなわち、高域の周仮
数は入出カドランスジ=−サ11,13に近い反射格子
で反射でれ、低域0114ri人出力ID′1゛(イン
タデジタル電極)から離れた反射格子で反射されていた
When the film thickness of a conventional reflection grating is constant, it has a sloped in-band characteristic as shown in FIG. That is, the high-frequency mantissa was reflected by a reflection grating close to the input/output quadrature switches 11 and 13, and was reflected by a reflection grating distant from the low-frequency output ID'1 (interdigital electrode).

しかし、本発明の様な膜厚分布に反射格子を形成するこ
とにより、第2図に示すように帯域内特性が安定化した
。本発明の実施例の素子の製造方法としては、第4図の
様に真空ペルジャー内で電子ビーム42でルツボ43か
らアルミを蒸発(矢印44ri蒸発したアルばを示す)
させる。HGO基板41を蒸着源から第4図のように蒸
発したアルミが多い位置aから少ない位fbO間におく
ことにより、第1図の構造の金Fj!RAc型分散型遅
延線が得られる。
However, by forming a reflection grating in the film thickness distribution as in the present invention, the in-band characteristics were stabilized as shown in FIG. As shown in FIG. 4, aluminum is evaporated from a crucible 43 using an electron beam 42 in a vacuum Pelger (arrow 44ri indicates the evaporated aluminum).
let By placing the HGO substrate 41 from the evaporation source as shown in FIG. 4 between a position a where there is a large amount of evaporated aluminum and a position where there is a small amount of evaporated aluminum fbO, gold Fj of the structure shown in FIG. A RAc type distributed delay line is obtained.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に本発明の弾性表面波装置では比較的簡
単な構成で金酋RAC型分散型遅廷線の特性改善ができ
る。
As explained above, the surface acoustic wave device of the present invention can improve the characteristics of the RAC-type distributed delay line with a relatively simple configuration.

【図面の簡単な説明】[Brief explanation of drawings]

第1図fat 、 fblf1本発明の実施例を示し、
fa)i平面図−(t))d(alのA−A断面図、第
2図ri第1図の素子の揚幅竹性を示す線図、第3図r
t従来のKAC型5Avv分散型遅延紳の振幅特性を示
す線図、第4図は本発明の素子の製造方法を説明するた
めの図である。
FIG. 1 shows an embodiment of the present invention,
fa) i Plan view - (t)) d (A-A sectional view of al, Fig. 2 ri Diagram showing the lift width of the element in Fig. 1, Fig. 3 r
FIG. 4 is a diagram showing the amplitude characteristics of a conventional KAC type 5Avv distributed delay circuit.

Claims (1)

【特許請求の範囲】[Claims] 金属リフレクティブ、アレイ、コンプレッサ(RAC)
型弾性表面波分散型遅延線を構成する反射格子が基板上
に形成された弾性表面波装置において、前記反射格子の
膜厚分布が、入出力交差状電極から離れるにしたがって
、直線的に厚くなる様にしたことを特徴とする弾性表面
波装置。
Metal Reflective, Array, Compressor (RAC)
In a surface acoustic wave device in which a reflection grating constituting a surface acoustic wave dispersion type delay line is formed on a substrate, the film thickness distribution of the reflection grating increases linearly as it moves away from the input/output intersecting electrodes. A surface acoustic wave device characterized by:
JP9886087A 1987-04-21 1987-04-21 Surface acoustic wave device Pending JPS63263815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9886087A JPS63263815A (en) 1987-04-21 1987-04-21 Surface acoustic wave device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9886087A JPS63263815A (en) 1987-04-21 1987-04-21 Surface acoustic wave device

Publications (1)

Publication Number Publication Date
JPS63263815A true JPS63263815A (en) 1988-10-31

Family

ID=14230976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9886087A Pending JPS63263815A (en) 1987-04-21 1987-04-21 Surface acoustic wave device

Country Status (1)

Country Link
JP (1) JPS63263815A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02186708A (en) * 1989-01-13 1990-07-23 Nec Corp Surface acoustic wave device
WO1999005788A1 (en) * 1997-07-28 1999-02-04 Kabushiki Kaisha Toshiba Surface acoustic wave device and method of producing the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02186708A (en) * 1989-01-13 1990-07-23 Nec Corp Surface acoustic wave device
WO1999005788A1 (en) * 1997-07-28 1999-02-04 Kabushiki Kaisha Toshiba Surface acoustic wave device and method of producing the same
US6377138B1 (en) 1997-07-28 2002-04-23 Kabushiki Kaisha Toshiba Surface acoustic wave device with a layered conductive film and method of producing the same

Similar Documents

Publication Publication Date Title
US4144507A (en) Surface acoustic wave resonator incorporating coupling transducer into reflecting arrays
CA1113554A (en) Surface wave device having enhanced reflectivity gratings
US3970970A (en) Multiple acoustically coupled surface acoustic wave resonators
EP0226372B1 (en) Saw resonator or resonator filter
US3663899A (en) Surface-wave electro-acoustic filter
JPS5831767B2 (en) Hiyomenhayoudenki - Kikaihenkansouchi
US4143340A (en) Acoustic surface wave device with improved transducer
US4336514A (en) Acoustic wave devices
JPS63263815A (en) Surface acoustic wave device
US4599532A (en) Surface acoustic wave device with anti-reflection electrode structure
JPH0482315A (en) Surface acoustic wave device
JPH0410764B2 (en)
US3611203A (en) Integrated digital transducer for variable microwave delay line
US4151492A (en) Surface acoustic wave grating
JP2615020B2 (en) Ultrasonic transducer and surface wave device
JPH02250413A (en) Surface acoustic wave device
JPS61199314A (en) Surface acoustic wave resonator
JPH02260908A (en) Surface acoustic wave device
US4017813A (en) Surface acoustic wave notch filter
JPS61281612A (en) Surface acoustic wave resonator
JPS6172408A (en) Surface acoustic wave element
JPH0334245B2 (en)
JPH07162054A (en) Method of forming piezoelectric thin film
JPH0221793Y2 (en)
JPS5840650Y2 (en) Surface wave thin film interdigital transducer