JPS63250U - - Google Patents
Info
- Publication number
- JPS63250U JPS63250U JP9403886U JP9403886U JPS63250U JP S63250 U JPS63250 U JP S63250U JP 9403886 U JP9403886 U JP 9403886U JP 9403886 U JP9403886 U JP 9403886U JP S63250 U JPS63250 U JP S63250U
- Authority
- JP
- Japan
- Prior art keywords
- optical fiber
- light
- annular
- annular surfaces
- receiving optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013307 optical fiber Substances 0.000 claims description 14
- 238000007689 inspection Methods 0.000 claims description 5
- 230000005856 abnormality Effects 0.000 claims 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図は、本考案による環状表面検査装置の一
実施例の使用状態を示す一部破断全体側面図、第
２図は、環状表面検査装置の拡大平面図、第３図
は、第１図の要部の拡大図、第４図は、ワークの
一例としてのシリンダヘツドの一部切欠側面図、
第５図は、検査原理の説明図である。
９…支持部材、１１…回転ホルダ、１２…光フ
アイバー保持部材、１８…回転駆動装置（ラツク
用シリンダ装置）、Ｂ…Ｏリング挿入部（環状表
面）、Ｃ…銅パツキン載置部（環状表面）、Ｆ…
光フアイバー、Ｆ１…投光用光フアイバー、Ｆ２
…受光用光フアイバー、Ｌ…光源、Ｓ…光検出器
。
FIG. 1 is a partially cutaway overall side view showing the state of use of an embodiment of the annular surface inspection device according to the present invention, FIG. 2 is an enlarged plan view of the annular surface inspection device, and FIG. 3 is the same as that shown in FIG. 1. Fig. 4 is a partially cutaway side view of a cylinder head as an example of a workpiece;
FIG. 5 is an explanatory diagram of the inspection principle. 9...Support member, 11...Rotary holder, 12...Optical fiber holding member, 18...Rotary drive device (cylinder device for rack), B...O-ring insertion part (annular surface), C...Copper packing mounting part (annular surface) ), F...
Optical fiber, F 1 ... Optical fiber for light projection, F 2
...Optical fiber for light reception, L...Light source, S...Photodetector.
Claims (1)
バーＦ２の先端面を環状表面Ｂ，Ｃに対向させて
配置し、前記投光用光フアイバーＦ１の基端面を
光源Ｌに接続するとともに、前記受光用光フアイ
バーＦ２の基端面を光検出器Ｓに接続し、前記環
状表面Ｂ，Ｃからの反射光により環状表面Ｂ，Ｃ
の異常を検出する環状表面検査装置において、位
置調節される支持部材９によつて前記投光用光フ
アイバーＦ１および受光用光フアイバーＦ２が内
部に挿通された円筒状の複数の回転ホルダ１１を
回転可能に支持し、前記各回転ホルダ１１基端部
に前記光源Ｌおよび光検出器Ｓを設けるとともに
回転ホルダ１１先端部に前記受光用光フアイバー
Ｆ２および投光用光フアイバーＦ１の先端部を所
定位置に保持する光フアイバー保持部材１２を設
け、前記支持部材９上に前記複数の回転ホルダ１
１を同時に回転させる回転駆動装置１８を配設し
たことを特徴とする環状表面検査装置。 The distal end surfaces of the light emitting optical fiber F1 and the light receiving optical fiber F2 are arranged to face the annular surfaces B and C, and the proximal end surface of the light emitting optical fiber F1 is connected to the light source L. The proximal end surface of the light-receiving optical fiber F2 is connected to a photodetector S, and the annular surfaces B and C are detected by the reflected light from the annular surfaces B and C.
An annular surface inspection device for detecting abnormalities in a plurality of cylindrical rotating holders 11 into which the light-emitting optical fiber F1 and the light-receiving optical fiber F2 are inserted through a support member 9 whose position is adjusted. The light source L and the photodetector S are provided at the base end of each rotary holder 11, and the tips of the light-receiving optical fiber F2 and the light-emitting optical fiber F1 are provided at the distal end of the rotary holder 11. An optical fiber holding member 12 is provided to hold the optical fiber in a predetermined position, and the plurality of rotary holders 1 are mounted on the support member 9.
1. An annular surface inspection device characterized in that a rotation drive device 18 for simultaneously rotating the annular surfaces 1 and 1 is provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9403886U JPS63250U (en) | 1986-06-20 | 1986-06-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9403886U JPS63250U (en) | 1986-06-20 | 1986-06-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63250U true JPS63250U (en) | 1988-01-05 |
Family
ID=30957120
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9403886U Pending JPS63250U (en) | 1986-06-20 | 1986-06-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63250U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50104985A (en) * | 1974-01-22 | 1975-08-19 | ||
| JPS58102138A (en) * | 1981-12-14 | 1983-06-17 | Toshiba Corp | Detector for invasion of foreign matter |
-
1986
- 1986-06-20 JP JP9403886U patent/JPS63250U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50104985A (en) * | 1974-01-22 | 1975-08-19 | ||
| JPS58102138A (en) * | 1981-12-14 | 1983-06-17 | Toshiba Corp | Detector for invasion of foreign matter |
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