JPS63247232A - Transporting method for semiconductor wafer - Google Patents
Transporting method for semiconductor waferInfo
- Publication number
- JPS63247232A JPS63247232A JP1375888A JP1375888A JPS63247232A JP S63247232 A JPS63247232 A JP S63247232A JP 1375888 A JP1375888 A JP 1375888A JP 1375888 A JP1375888 A JP 1375888A JP S63247232 A JPS63247232 A JP S63247232A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- adsorbing
- suction
- pipe
- vacuum suction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 13
- 239000004065 semiconductor Substances 0.000 title claims description 9
- 235000012431 wafers Nutrition 0.000 claims description 59
- 210000000078 claw Anatomy 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 3
- 239000007779 soft material Substances 0.000 abstract 1
- 238000001179 sorption measurement Methods 0.000 abstract 1
- 230000036544 posture Effects 0.000 description 8
- 239000013078 crystal Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Feeding Of Articles By Means Other Than Belts Or Rollers (AREA)
- Sheets, Magazines, And Separation Thereof (AREA)
Abstract
Description
【発明の詳細な説明】 (a)発明の技術分野 本発明は半導体ウェハの転送方法に関する。[Detailed description of the invention] (a) Technical field of the invention The present invention relates to a method for transferring semiconductor wafers.
(b)技術の背景
半導体IC,LSIなどのデバイスはシリコン(Si)
。(b) Technical background Devices such as semiconductor ICs and LSIs are made of silicon (Si).
.
ガリウム砒素(GaAs)などの単体或いは化合物半導
体からなる単結晶基板を用いて形成されている。It is formed using a single crystal substrate made of a single or compound semiconductor such as gallium arsenide (GaAs).
この単結晶基板はウェハと呼称され、引上げ法などで育
成されたロンド状の単結晶から約500 μmの厚さに
スライスされ、表面研磨が施されたものからなっている
。This single-crystal substrate is called a wafer, and is made by slicing a rondo-shaped single crystal grown by a pulling method or the like into a thickness of about 500 μm, and polishing the surface.
こ・・で、ウェハの直径は半導体部品の量産化に比例し
て増大しており、例をSiにとれは、3インチ、4イン
チ、と進み5インチのものも作られている。The diameter of wafers has been increasing in proportion to the mass production of semiconductor parts. For example, in the case of Si, wafer diameters have progressed to 3 inches, 4 inches, and even 5 inches.
また、作業工程もその多くのものについて自動化が図ら
れている。Additionally, many of the work processes are being automated.
(C)従来技術と問題点1
半導体部品の形成には薄膜形成技術と写真蝕刻技術(ホ
トリソグラフィ)とが使用され、エピタキシャル成長、
導電層の形成、またレジスト塗布と選択エツチングなど
の工程はウェハ単位で行われ、最終段階でスクライブさ
れてチップが作られている。(C) Prior art and problem 1 Thin film formation technology and photolithography are used to form semiconductor components, and epitaxial growth,
Processes such as formation of the conductive layer, resist coating, and selective etching are performed on a wafer basis, and in the final stage, the wafer is scribed to form chips.
こ\で、各工程での処理は複数枚のウェハをウェハボル
ダ或いはカセットに装着し、この状態で行うことが多い
。Here, processing in each step is often carried out in this state with a plurality of wafers mounted on a wafer boulder or cassette.
例えば、化学気相成長(CV D)を行う場合などはウ
ェハホルダを使用し、一方スパックリングやエツチング
などの処理はカセットを処理装置に装着し、自動的に一
枚づつ引き出して処理し、処理後は別のカセットに収納
する操作を繰り返すことにより環境条件を変えずに量産
化することができる。For example, when performing chemical vapor deposition (CVD), a wafer holder is used, while for processes such as spackling and etching, a cassette is attached to the processing equipment, and the wafers are automatically pulled out one by one for processing. can be mass-produced without changing the environmental conditions by repeating the operation of storing it in another cassette.
こ\で、ウェハホルダに装着されて一括処理の終わった
ウェハは、順次一枚づつ取り出して別の処理工程に移す
ことが必要であるが、この方法として真空吸着治具、別
名真空ピンセットが使用されている。In this case, once the wafers have been loaded onto the wafer holder and have been processed in bulk, it is necessary to take them out one by one and transfer them to another processing step, but a vacuum suction jig, also known as vacuum tweezers, is used for this method. ing.
第1図はウェハホルダ1に装着されているSiウェハ2
の状態を示すもので、同図(A)は正面図また(B)は
側面図である。Figure 1 shows a Si wafer 2 mounted on a wafer holder 1.
The figure (A) is a front view and (B) is a side view.
同図に示す実施例の場合、石英からなるウェハホルダ1
にはSiウェハを垂直方向に保持するために4組の爪3
が設けられており、前後よりSiウェハ2を保持してい
るが、前後の爪3の間隔は作業性を考慮してウェハの厚
さよりも充分に大きくとっであるため、第1図(B)で
示すようにSiウェハ2は厳密はウェハホルダ1の底面
に対し垂直ではなく、前後に幾分傾いた状態で余裕をも
って保持されている。In the case of the embodiment shown in the figure, a wafer holder 1 made of quartz
has four sets of claws 3 to hold the Si wafer vertically.
are provided to hold the Si wafer 2 from the front and back, but the spacing between the front and rear claws 3 is set to be sufficiently larger than the thickness of the wafer in consideration of workability. As shown in , the Si wafer 2 is not strictly perpendicular to the bottom surface of the wafer holder 1, but is held slightly tilted back and forth with a margin.
一方、Siウェハ2を運搬する真空吸着治具としては第
2図(A)に断面図を、また同図(B)に平面図を示す
偏平状のものがあり、これを手に持ち、Siウェハ2の
裏面に当て\真空吸着を行わせて所定の位置にまで転送
していた。On the other hand, as a vacuum suction jig for transporting the Si wafer 2, there is a flat one whose cross-sectional view is shown in FIG. 2 (A) and a plan view is shown in FIG. 2 (B). It was applied to the back side of the wafer 2 and transferred to a predetermined position by performing vacuum suction.
すなわち、真空吸1着治具4は下面中央に吸着孔5があ
り、真空ポンプに連結して、矢印6の方向に減圧吸引す
ることにより、Siウェハ2を吸着させ、所定の場所に
まで転送するものである。That is, the vacuum suction jig 4 has a suction hole 5 in the center of the lower surface, and is connected to a vacuum pump to suction the Si wafer 2 under reduced pressure in the direction of the arrow 6, thereby adsorbing the Si wafer 2 and transferring it to a predetermined location. It is something to do.
このように人手を使って転送する場合は対象物が如何な
る姿勢をとって保持されていてもそれに合わゼで行えば
よいが、ロボットを用いてウェハ2の転送を自動化しよ
うとすると、ウェハボルダ1に並べられているSiウェ
ハ2の姿勢が一定していないので、従来のような真空吸
着治具4では転送させることは困難である。When transferring the wafer 2 manually in this way, it can be done by adjusting the posture of the object no matter what posture it is held in. However, if you try to automate the transfer of the wafer 2 using a robot, the wafer boulder 1 Since the postures of the Si wafers 2 arranged side by side are not constant, it is difficult to transfer them using a conventional vacuum suction jig 4.
(d)発明の目的
本発明の目的はウェハの姿勢が一様でない場合でも確実
に吸引して転送を行うごとができるウェハ転送方法を提
供するにある。(d) Purpose of the Invention An object of the present invention is to provide a wafer transfer method that can reliably perform suction and transfer even when the wafer is not in a uniform posture.
(e)発明の構成
本発明の目的はウェハホルダに設けられている爪により
垂直方向に保持されている複数のウェハを水平方向から
順次に吸着し、所定位置に転送する装置が、吸着孔を中
心に備え、柔軟な材料からなる吸着部を先端にもつパイ
プがスプリングによりスリーブの中に収縮可能に形成さ
れている真空吸着治具を複数個備えて構成されており、
該装置が水平方向に移動し、何れかの真空吸着治具の吸
着部が前記ウェハに接して吸引し、該ウェハの姿勢を垂
直方向に正しながら収縮することにより、他の吸着部も
ウェハに触れて吸引し、輸送する半導体ウェハの転送方
法をとることにより実現することができる。(e) Structure of the Invention The object of the present invention is to provide a device that sequentially suctions a plurality of wafers held in a vertical direction by claws provided on a wafer holder from a horizontal direction and transfers them to a predetermined position. In preparation for this, the system is equipped with a plurality of vacuum suction jigs, each of which has a pipe made of a flexible material with a suction section at its tip that can be contracted into a sleeve by a spring.
The apparatus moves in the horizontal direction, and the suction part of one of the vacuum suction jigs contacts and suctions the wafer, and contracts while correcting the posture of the wafer in the vertical direction, so that the other suction parts also absorb the wafer. This can be achieved by using a method of transferring semiconductor wafers that involves touching, suctioning, and transporting semiconductor wafers.
(f)発明の実施例
第3図は本発明に係るウェハ転送装置の斜視図また第4
図は真空吸着機構の断面図である。(f) Embodiment of the invention FIG. 3 is a perspective view of a wafer transfer apparatus according to the present invention, and FIG.
The figure is a sectional view of the vacuum suction mechanism.
本発明に係るウェハ転送装置は2個以上(第3図の実施
例では3個)の真空吸着治具を備え、この先端の吸着部
7はテフロンあるいはゴムのように柔軟な材料で構成さ
れていて、中央に吸着孔5を備え、また吸着部7をもつ
パイプ部8は収縮可能に形成されている。The wafer transfer apparatus according to the present invention is equipped with two or more (three in the embodiment shown in FIG. 3) vacuum suction jigs, and the suction part 7 at the tip thereof is made of a flexible material such as Teflon or rubber. A pipe portion 8 having a suction hole 5 in the center and a suction portion 7 is formed to be contractible.
すなわち、パイプ部8ば合成樹脂製或いは合成樹脂を被
覆した金属製のパイプからなり、先端には柔軟な吸着部
7が第4図に示すように嵌着される構造になっている。That is, the pipe portion 8 is made of synthetic resin or a metal pipe coated with synthetic resin, and has a structure in which a flexible suction portion 7 is fitted at the tip as shown in FIG. 4.
また、反対側にはスプリング9か設けられていて、これ
によりパイプ8が伸縮できる構造となっている。Further, a spring 9 is provided on the opposite side, which allows the pipe 8 to expand and contract.
また、パイプ8のスリーブ10に接する端面部11はス
リーブ部の内径と近似させることにより気密が保たれる
構成となっている。Further, the end face 11 of the pipe 8 that is in contact with the sleeve 10 is configured to be airtight by making it approximate the inner diameter of the sleeve part.
このような構造をとるウェハ転送機構は自動機に設置さ
れると共に、排気系により真空ポンプと連結されている
。A wafer transfer mechanism having such a structure is installed in an automatic machine and is connected to a vacuum pump by an exhaust system.
かへる装置の動作を説明すると、第3図で示す転送装置
が矢印12の方向に移動して複数個ある吸着部7の何れ
かがうエバ2に接すると、吸着部7は柔軟な材料で形成
されているため、ウェハ2の姿勢に順応して変形して真
空吸着する。To explain the operation of the transfer device, when the transfer device shown in FIG. Since it is formed of wafer 2, it deforms to adapt to the posture of the wafer 2 and vacuum-chucks it.
すると、パイプ部8の内部が減圧され、スプリング9の
弾力と釣り合った位置までウェハ2を吸着した状態で姿
勢を垂直に復しながら縮むが、その過程で他の真空吸着
治具の吸着部7にも接触し、その結果、複数個の吸着部
7で吸着固定されることになり、そのま\所定の位置に
まで転送されることになる。Then, the pressure inside the pipe section 8 is reduced, and the pipe section 8 contracts while returning to its vertical position while holding the wafer 2 to a position balanced with the elasticity of the spring 9, but in the process, the suction section 7 of the other vacuum suction jig is As a result, it is suctioned and fixed by a plurality of suction parts 7, and is transferred as it is to a predetermined position.
以上のように、本発明に係る転送装置はウェハ2の姿勢
が一定しない場合であっても吸着でき、また複数の吸着
部7て吸引固定するため、確実な自動転送が可能になる
。As described above, the transfer device according to the present invention can pick up the wafer 2 even when the posture of the wafer 2 is not constant, and since the wafer 2 is fixed by suction using the plurality of suction sections 7, reliable automatic transfer is possible.
(g)発明の効果
今まで、ウェハホルダに置かれているウェハの姿勢が一
定でなく、またウェハの寸法が大形化しているために転
送の自動化は困難であったが、複数位置で吸着固定する
本発明の実施により、転送の自動化が可能となる。(g) Effects of the invention Until now, the posture of the wafer placed in the wafer holder was not constant, and the size of the wafer was increasing, making it difficult to automate the transfer, but it was fixed by suction at multiple positions. By implementing the present invention, automation of the transfer becomes possible.
第1図はウェハホルダの構成図で同図(A)は正面図、
同図(B)は側面図、
第2図は真空吸着治具の構成図で、同図(A)は断面図
、同図(B)は平面図、
第3図は本発明に係るウェハ転送方法の説明図、また第
4図は真空吸着機構の断面図、
である。
図において、
1はウェハホルダ、 2はシリコンウェハ、3ば
爪、 4は真空吸着治具、5は吸着孔、
7は吸着部、8ばパイプ部、
9はスプリング、である。Figure 1 is a configuration diagram of the wafer holder, and (A) is a front view.
Figure 2 (B) is a side view, Figure 2 is a configuration diagram of the vacuum suction jig, Figure (A) is a sectional view, Figure (B) is a plan view, and Figure 3 is a wafer transfer according to the present invention. An explanatory diagram of the method, and FIG. 4 is a sectional view of the vacuum suction mechanism. In the figure, 1 is a wafer holder, 2 is a silicon wafer, 3 is a claw, 4 is a vacuum suction jig, 5 is a suction hole,
7 is the suction part, 8 is the pipe part,
9 is a spring.
Claims (1)
直方向に保持されている複数のウエハ(2)を水平方向
から順次に吸着し、所定位置に転送する装置が、吸着孔
(5)を中心に備え、柔軟な材料からなる吸着部(7)
を先端にもつパイプ(8)がスプリング(9)によりス
リーブ(10)の中に収縮可能に形成されている真空吸
着治具を複数個備えて構成されており、該装置が水平方
向に移動し、何れかの真空吸着治具の吸着部(7)が前
記ウエハ(2)に接して吸引し、該ウエハ(2)の姿勢
を垂直方向に正しながら収縮することにより、他の吸着
部(7)もウエハ(2)に触れて吸引し、輸送すること
を特徴とする半導体ウエハの転送方法。A device that sequentially suctions a plurality of wafers (2) vertically held by claws (3) provided on a wafer holder (1) from a horizontal direction and transfers them to a predetermined position opens a suction hole (5). At the center is a suction part (7) made of flexible material.
A pipe (8) having a pipe (8) at the tip thereof is provided with a plurality of vacuum suction jigs that are formed so as to be contractible inside a sleeve (10) by a spring (9), and the device moves horizontally. , the suction part (7) of one of the vacuum suction jigs contacts and suctions the wafer (2), and contracts while correcting the posture of the wafer (2) in the vertical direction. 7) is also a semiconductor wafer transfer method characterized by touching the wafer (2), suctioning it, and transporting it.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1375888A JPS63247232A (en) | 1988-01-22 | 1988-01-22 | Transporting method for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1375888A JPS63247232A (en) | 1988-01-22 | 1988-01-22 | Transporting method for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63247232A true JPS63247232A (en) | 1988-10-13 |
Family
ID=11842150
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1375888A Pending JPS63247232A (en) | 1988-01-22 | 1988-01-22 | Transporting method for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63247232A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008043195A1 (en) * | 2008-10-27 | 2010-05-12 | Beil-Registersysteme Gmbh | Printing plates processing method for use in printing machine, involves detecting chamfered plate by robot at outlet of work station, and transporting chamfered plate to intermediate magazine, and storing plate in magazine |
-
1988
- 1988-01-22 JP JP1375888A patent/JPS63247232A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008043195A1 (en) * | 2008-10-27 | 2010-05-12 | Beil-Registersysteme Gmbh | Printing plates processing method for use in printing machine, involves detecting chamfered plate by robot at outlet of work station, and transporting chamfered plate to intermediate magazine, and storing plate in magazine |
DE102008043195B4 (en) * | 2008-10-27 | 2013-04-11 | Beil-Registersysteme Gmbh | Apparatus for processing printing plates |
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