JPS63244828A - Sliding contact apparatus - Google Patents
Sliding contact apparatusInfo
- Publication number
- JPS63244828A JPS63244828A JP62079072A JP7907287A JPS63244828A JP S63244828 A JPS63244828 A JP S63244828A JP 62079072 A JP62079072 A JP 62079072A JP 7907287 A JP7907287 A JP 7907287A JP S63244828 A JPS63244828 A JP S63244828A
- Authority
- JP
- Japan
- Prior art keywords
- thick film
- sliding contact
- pattern
- contact
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims description 22
- 229920005989 resin Polymers 0.000 claims description 21
- 239000011347 resin Substances 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 11
- 229910000416 bismuth oxide Inorganic materials 0.000 claims description 6
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000001050 lubricating effect Effects 0.000 description 1
- 229910000480 nickel oxide Inorganic materials 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Details Of Resistors (AREA)
- Adjustable Resistors (AREA)
- Contacts (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、計測器、各種機械等で、検出用、制御用、設
定用、発振器用などに使用されているボリュームスイッ
チ、ポテンシオメータ、トリマー(可変抵抗器の一種)
等で用いられる摺動接点装置の改良に関する。Detailed Description of the Invention (Field of Industrial Application) The present invention applies to volume switches, potentiometers, and trimmers used for detection, control, setting, oscillators, etc. in measuring instruments, various machines, etc. (a type of variable resistor)
This paper relates to improvements to sliding contact devices used in, etc.
(従来の技術とその問題点)
従来より上記のボリュームスイッチ、ポテンシオメータ
、トリマー等で用いられる摺動接点装置は、樹脂基板上
にカーボン(C)などの抵抗ペーストにて厚膜抵抗パタ
ーンを形成して成る配線板と、この配線板の厚膜抵抗パ
ターンに対向して摺動し得るようになされたスプリング
端子材にAg接点材をかしめ或いは溶接して成るすり接
点とにより構成されているが、この摺動接点装置は、ノ
イズが発生し易(、又接触抵抗がやや高く且つ幾分ばら
つきがあって不安定であり接触信顛性にやや欠けるもの
であった。(Prior art and its problems) Sliding contact devices conventionally used in the above-mentioned volume switches, potentiometers, trimmers, etc., have a thick film resistance pattern formed on a resin substrate using a resistance paste such as carbon (C). It consists of a wiring board made of a wiring board, and a sliding contact made by caulking or welding an Ag contact material to a spring terminal material that can slide against the thick film resistance pattern of the wiring board. This sliding contact device was prone to noise generation (also, the contact resistance was somewhat high and varied, making it unstable and lacking in contact reliability).
この為、樹脂基板上のカーボンの厚膜抵抗パターンのす
り接点と摺動する部分を、Ag−樹脂系の導体ペースト
に置き換えて硬化するかあるいは厚膜抵抗パターンのす
り接点と摺動する部分にAg−樹脂系導体ペーストを重
ねて硬化することにより、接触信顧性を改善していた。For this reason, the parts of the carbon thick film resistor pattern on the resin substrate that slide against the sliding contacts should be replaced with Ag-resin-based conductive paste and cured, or the parts that slide with the sliding contacts of the thick film resistor pattern Contact reliability was improved by layering and curing Ag-resin conductor paste.
然し乍ら、厚膜導体パターンと接点材が同種の組合せの
為、容易に凝着、剥離が起こり、摩耗が促進され早期に
寿命となる問題点があった。However, since the thick film conductor pattern and the contact material are the same type of combination, there is a problem that adhesion and peeling easily occur, accelerating wear and shortening the service life.
(発明の目的)
本発明は、上記問題点を解決することのできる摺動接点
装置を提供することを目的とするものである。(Object of the Invention) An object of the present invention is to provide a sliding contact device that can solve the above problems.
(問題点を解決するための手段)
前記の問題点を解決するための本発明の摺動接点装置は
、樹脂基板上に、抵抗ペーストにて厚膜抵抗パターンを
形成し、この厚膜抵抗パターンに接続してCu−樹脂系
導体ペーストにて厚膜導体パターンを形成して成る配線
板と、この配線板の厚膜導体パターンに対向して摺動し
得るAg−酸化ビスマス3〜15wt%の接点材がスプ
リング端子材に取付けられて成るすり接点とにより構成
されていることを特徴とする。(Means for Solving the Problems) A sliding contact device of the present invention for solving the above-mentioned problems includes forming a thick film resistor pattern using a resistor paste on a resin substrate. A wiring board formed of a thick film conductor pattern formed with a Cu-resin conductor paste connected to It is characterized in that the contact material is constituted by a sliding contact which is attached to a spring terminal material.
本発明の摺動接点装置に於いて、すり接点の接点材をA
g−酸化ビスマス3〜15iuL%とした理由は、Ag
中の酸化ビスヤスが3wt%未満だと潤滑効果が薄(、
そのすり接点が樹脂基板上のCu−樹脂系の厚膜導体パ
ターンとの接触に於いて凝着、剥離が生じ、酸化ビスマ
スが151%を超えると、ノイズの発生原因となるから
である。In the sliding contact device of the present invention, the contact material of the sliding contact is A
The reason why g-bismuth oxide was set at 3 to 15 iuL% is that Ag
If the content of the oxidized steel inside is less than 3wt%, the lubricating effect will be weak (,
This is because adhesion and peeling occur when the sliding contacts come into contact with the Cu-resin thick film conductor pattern on the resin substrate, and if the bismuth oxide content exceeds 151%, it becomes a cause of noise generation.
(作用)
上記の如く構成された摺動接点装置は、すり接点と樹脂
基板上の厚膜導体パターンとの接触作用において、すり
接点のAg−酸化ビスラ13〜15wt%接点材が滑り
やすいので、Cu−樹脂系厚膜導体パターンと凝着する
ことが無(、そのパターンの剥離が殆んど無くなり、摩
耗が減少して良好な接触が得られる。(Function) In the sliding contact device configured as described above, the Ag-Visla 13 to 15 wt% contact material of the sliding contact easily slips during the contact action between the sliding contact and the thick film conductor pattern on the resin substrate. There is no adhesion to the Cu-resin thick film conductor pattern (there is almost no peeling of the pattern, wear is reduced, and good contact is obtained).
(実施例)
本発明の摺動接点装置の実施例を説明すると、図に示す
如き板厚0.61■、直径301mのエポキシ樹脂製基
板1上の外周に幅3鶴でカーボンの抵抗ペーストをスク
リーン印刷し、130℃で硬化して厚さ10μの厚膜抵
抗パターン2を形成し、この厚膜抵抗パターン2に接続
して、周方向に、Cu−樹脂導体ペーストをスクリーン
印刷し、130℃で硬化して、0.2龍間隔に幅0,2
mm、長さ7龍、厚さ10μの厚膜導体パターン(Cu
−樹脂26−1%)3を形成して配線板4とした。一方
、この配線板4の厚膜導体パターン3に対向して夫々摺
動するようになされた2種のすり接点5は、Ag酸化ビ
スマス31%とAg−酸化ビスマス6wt%−酸化ニッ
ケルO,ht%の2種の接点線材(直径1.51m)か
ら作製した頭部径3鶴、頭部厚さ0.6u、m部径1.
5龍、脚部長1.5mmの2種のリベット接点6を、夫
々幅4龍、厚さ0.15鶴のBe−Cuより成るスプリ
ング端子材7の接点取付穴に挿入しかしめて成るもので
ある。(Example) To explain an example of the sliding contact device of the present invention, carbon resistance paste is applied to the outer periphery of an epoxy resin substrate 1 having a thickness of 0.61 cm and a diameter of 301 m as shown in the figure. A thick film resistor pattern 2 with a thickness of 10 μm was formed by screen printing and curing at 130°C, and connected to this thick film resistor pattern 2, a Cu-resin conductor paste was screen printed in the circumferential direction and cured at 130°C. harden with 0.2 dragon spacing and width 0.2
Thick film conductor pattern (Cu
-Resin 26-1%) 3 was formed to form a wiring board 4. On the other hand, the two types of sliding contacts 5, which are slidably opposed to the thick film conductor pattern 3 of the wiring board 4, are composed of 31% Ag bismuth oxide and 6 wt% Ag-bismuth oxide-nickel oxide O,h. The head diameter is 3 cranes, the head thickness is 0.6 u, and the m part diameter is 1.
Two types of rivet contacts 6 each having a width of 4 mm and a leg length of 1.5 mm are inserted and secured into contact mounting holes of a spring terminal material 7 made of Be-Cu with a width of 4 mm and a thickness of 0.15 mm. be.
このように構成された実施例1.2の摺動接点装置と、
Ag接点材を有するすり接点を実施例と同じ配線板4の
Cu−樹脂261%の厚膜導体パターン3と対向させて
成る従来の摺動接点装置とを、下記の試験条件にて摺動
開閉試験を行った処、下記の表に示すような結果を得た
。The sliding contact device of Example 1.2 configured in this way,
A conventional sliding contact device consisting of a sliding contact having an Ag contact material facing a thick film conductor pattern 3 made of 261% Cu-resin on the same wiring board 4 as in the example was subjected to sliding opening and closing under the following test conditions. When the test was conducted, the results shown in the table below were obtained.
試験条件
接触カニ10g、動作二回転往復型(55度)、駆動:
60ストローク/ rm i n s通電: 12V、
100mA[
上記の表で明らかなように実施例1.2の摺動接点装置
は、従来例の摺動装置に比し、寿命が増していることが
判る。これはひとえにすり接点5のAg−酸化ビスラ1
3〜15wt%接点材が滑りやすい為、対向するCu−
樹脂系の厚膜導体パターン3と凝着することが無く、ま
たそのパターンが剥離することも無(、摩耗も減少する
からに他ならない。Test conditions Contact crab 10g, action 2 rotation reciprocating type (55 degrees), drive:
60 strokes/rm ins Current: 12V,
100mA [As is clear from the table above, the sliding contact device of Example 1.2 has a longer lifespan than the sliding contact device of the conventional example. This is simply the Ag-Visla oxide 1 of the sliding contact 5.
3~15wt% Because the contact material is slippery, the opposing Cu-
This is because there is no adhesion to the resin-based thick film conductor pattern 3, and no peeling of the pattern (and abrasion is also reduced).
尚、前記の寿命は、厚膜導体パターン3の摩耗により、
すり接点5が樹脂基板との接触となって、オーブン状B
(接触抵抗無限大)となった場合と、厚膜導体パターン
3間のスリット部の目詰まりによりショートした場合で
判定した。Note that the above-mentioned lifespan is due to wear of the thick film conductor pattern 3.
The sliding contact 5 comes into contact with the resin substrate, and an oven-like B is formed.
(contact resistance is infinite) and when a short circuit occurs due to clogging of the slit between the thick film conductor patterns 3.
尚、上記実施例の摺動接点装置の配線板4は円形である
が、矩形でも良いものである。その場合、厚膜抵抗パタ
ーンは矩形の配線板の一側端に形成し、厚膜導体パター
ンは厚膜抵抗パターンに接続してその長手方向に一定間
隔に平行に形成すると良い。そしてすり接点は厚膜導体
パターンに対向して厚膜抵抗パターンの長手方向に摺動
し得るようにする。また樹脂基板上にベローズ形状に前
後に往復させた厚膜抵抗パターンを形成し、その上に厚
膜導体パターンを一定間隔に並べて形成した配線板と、
この配線板の厚膜導体パターンに対向して摺動するよう
にしたすり接点とより成る摺動接点装置としても良い。Although the wiring board 4 of the sliding contact device in the above embodiment is circular, it may also be rectangular. In that case, the thick film resistor pattern is preferably formed on one side end of the rectangular wiring board, and the thick film conductor patterns are preferably connected to the thick film resistor pattern and formed in parallel at regular intervals in the longitudinal direction thereof. The sliding contact is slidable in the longitudinal direction of the thick film resistor pattern, facing the thick film conductor pattern. Further, a wiring board in which a thick film resistor pattern reciprocated back and forth in a bellows shape is formed on a resin substrate, and thick film conductor patterns are formed on the resin substrate by arranging them at regular intervals;
A sliding contact device comprising a sliding contact that slides opposite to the thick film conductor pattern of the wiring board may also be used.
さらに実施例2のように酸化ビスマスの一部を0.01
〜1wt%の範囲で鉄族元素の酸化物で置き換えてもよ
いものである。Furthermore, as in Example 2, a part of bismuth oxide was added to 0.01
It may be replaced with an oxide of an iron group element in a range of 1 wt%.
(発明の効果)
以上の説明で判るように本発明の摺動接点装置は、すり
接点のAg−酸化ビスマス3〜15wt%が滑りやすい
ので、接触作用において樹脂基板上のCu−樹脂系導体
パターンと凝着することが無く、又そのパターンの剥離
も殆んど無くなり、摩耗も減少して良好な接触が得られ
る。(Effects of the Invention) As can be seen from the above explanation, in the sliding contact device of the present invention, since 3 to 15 wt% of Ag-bismuth oxide in the sliding contact is slippery, the Cu-resin conductor pattern on the resin substrate is used for contact action. There is no adhesion, and there is almost no peeling of the pattern, and wear is reduced, resulting in good contact.
従って、接触信頼性が向上し、摺動接点装置の寿命が著
しく増長する。Therefore, the contact reliability is improved and the life of the sliding contact device is significantly extended.
図は本発明の摺動接点装置の一実施例を示す概略図であ
る。The figure is a schematic diagram showing an embodiment of the sliding contact device of the present invention.
Claims (1)
形成し、この厚膜抵抗パターンに接続してCu−樹脂系
導体ペーストにて厚膜導体パターンを形成して成る配線
板と、この配線板の厚膜導体パターンに対向して摺動し
得るAg酸化ビスマス3〜15wt%の接点材がスプリ
ング端子材に取り付けられて成るすり接点とにより構成
されていることを特徴とする摺動接点装置。A wiring board in which a thick film resistance pattern is formed using a resistance paste on a resin substrate, and a thick film conductor pattern is formed using a Cu-resin conductor paste connected to the thick film resistance pattern, and this wiring board. 1. A sliding contact device comprising a sliding contact formed by attaching a contact material of 3 to 15 wt % of Ag bismuth oxide to a spring terminal material and capable of sliding against a thick film conductor pattern.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62079072A JPS63244828A (en) | 1987-03-31 | 1987-03-31 | Sliding contact apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62079072A JPS63244828A (en) | 1987-03-31 | 1987-03-31 | Sliding contact apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63244828A true JPS63244828A (en) | 1988-10-12 |
Family
ID=13679683
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62079072A Pending JPS63244828A (en) | 1987-03-31 | 1987-03-31 | Sliding contact apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63244828A (en) |
-
1987
- 1987-03-31 JP JP62079072A patent/JPS63244828A/en active Pending
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