JPS63244807A - Sliding contact apparatus - Google Patents

Sliding contact apparatus

Info

Publication number
JPS63244807A
JPS63244807A JP62079050A JP7905087A JPS63244807A JP S63244807 A JPS63244807 A JP S63244807A JP 62079050 A JP62079050 A JP 62079050A JP 7905087 A JP7905087 A JP 7905087A JP S63244807 A JPS63244807 A JP S63244807A
Authority
JP
Japan
Prior art keywords
thick film
sliding contact
pattern
wiring board
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62079050A
Other languages
Japanese (ja)
Inventor
亮 上田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Original Assignee
Tanaka Kikinzoku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP62079050A priority Critical patent/JPS63244807A/en
Publication of JPS63244807A publication Critical patent/JPS63244807A/en
Pending legal-status Critical Current

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  • Details Of Resistors (AREA)
  • Adjustable Resistors (AREA)
  • Contacts (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、計測器、各種機械等で、検出用、制御用、設
定用、発振器用などに使用されているボリュームスイッ
チ、ポテンシオメータ、トリマー(可変抵抗器の一種)
等で用いられる摺動接点装置の改良に関する。
Detailed Description of the Invention (Field of Industrial Application) The present invention applies to volume switches, potentiometers, and trimmers used for detection, control, setting, oscillators, etc. in measuring instruments, various machines, etc. (a type of variable resistor)
This paper relates to improvements to sliding contact devices used in, etc.

(従来の技術とその問題点) 従来より上記のポリニームスイッチ、ポテンシオメータ
、トリマー等で用いられる摺動接点装置は、樹脂基板上
にカーボン(C)などの抵抗ペーストにて厚膜抵抗パタ
ーンを形成して成る配線板と、この配線板の厚膜抵抗パ
ターンに対向して摺動し得るようになされたスプリング
端子材にAg接点材をかしめ或いは溶接して成るすり接
点とにより構成されているが、この摺動接点装置は、ノ
イズが発生し易(、又接触抵抗がやや高く且つ幾分ばら
つきがあって不安定であり接触信頌性にやや欠けるもの
であった。
(Prior art and its problems) Sliding contact devices conventionally used in the above-mentioned polyneme switches, potentiometers, trimmers, etc. are made by forming a thick film resistor pattern on a resin substrate using a resistive paste such as carbon (C). It consists of a wiring board formed by forming a wiring board, and a sliding contact made by caulking or welding an Ag contact material to a spring terminal material that can slide against the thick film resistance pattern of the wiring board. However, this sliding contact device was prone to noise generation (also, the contact resistance was somewhat high and varied, making it unstable and lacking in contact reliability).

この為、樹脂基板上のカーボンの厚膜抵抗パターンのす
り接点と摺動する部分を、Ag−樹脂系の導体ペースト
に置き換えて硬化するかあるいは厚膜抵抗パターンのす
り接点と摺動する部分にAg−樹脂系導体ペーストを重
ねて硬化することにより、接触信頼性を改善していた。
For this reason, the parts of the carbon thick film resistor pattern on the resin substrate that slide against the sliding contacts should be replaced with Ag-resin-based conductive paste and cured, or the parts that slide with the sliding contacts of the thick film resistor pattern Contact reliability was improved by layering and curing Ag-resin conductor paste.

然し乍ら、厚膜導体バクーンと接点材が同種の組合せの
為、容易に凝着、剥離が起こり、摩耗が促進され早期に
寿命となる問題点があった。
However, since the thick film conductor bag and the contact material are the same type of combination, there is a problem that adhesion and peeling easily occur, accelerating wear and shortening the service life.

(発明の目的) 本発明は、上記問題点を解決することのできる摺動接点
装置を提供することを目的とするものである。
(Object of the Invention) An object of the present invention is to provide a sliding contact device that can solve the above problems.

(問題点を解決するための手段) 前記の問題点を解決するための本発明の摺動接点装置は
、樹脂基板上に、抵抗ペーストにて厚膜抵抗パターンを
形成し、この厚膜抵抗パターンに接続してAg−樹脂系
導体ペーストにて厚膜導体パターンを形成して成る配線
板と、この配線板の厚膜導体パターンに対向して摺動し
得るようになされAg−カドミウム0.5〜15wt%
の接点材がスプリング端子材に取付けられて成るすり接
点とにより構成されていることを特徴とする。
(Means for Solving the Problems) A sliding contact device of the present invention for solving the above-mentioned problems includes forming a thick film resistor pattern using a resistor paste on a resin substrate. A wiring board formed of a thick film conductor pattern formed of an Ag-resin conductor paste connected to the wiring board, and a wiring board made of Ag-cadmium 0.5 so that it can slide against the thick film conductor pattern of the wiring board. ~15wt%
The contact member is comprised of a sliding contact attached to a spring terminal member.

本発明の摺動接点装置に於いて、すり接点の接点材をA
g−カドミウム0.5〜15wt%とした理由は、Ag
中のカドミウムが0.5wt%未満だと潤滑効果が薄く
、そのすり接点が樹脂基板上のAg−樹脂系の厚膜導体
パターンとの接触に於いて凝着、剥離が生じ、カドミウ
ムが15wt%を超えると、ノイズの発生原因となるか
らである。
In the sliding contact device of the present invention, the contact material of the sliding contact is A
The reason for setting g-cadmium to 0.5 to 15 wt% is that Ag
If the cadmium content is less than 0.5 wt%, the lubricating effect will be weak, and adhesion and peeling will occur when the sliding contact contacts the Ag-resin thick film conductor pattern on the resin substrate. This is because if it exceeds this, it will cause noise generation.

(作用) 上記の如く構成された摺動接点装置は、すり接点と樹脂
基板上の厚膜導体パターンとの接触作用において、すり
接点のAg−カドミウム0.5〜15wt%接点材が滑
りやすいので、Ag−樹脂系厚膜導体パターンと凝着す
ることが無く、そのパターンの剥離が殆んど無くなり、
摩耗が減少して良好な接触が得られる。
(Function) In the sliding contact device configured as described above, the Ag-cadmium 0.5 to 15 wt% contact material of the sliding contact easily slips during the contact action between the sliding contact and the thick film conductor pattern on the resin substrate. , there is no adhesion to the Ag-resin thick film conductor pattern, and there is almost no peeling of the pattern.
Reduced wear and better contact.

(実施例) 本発明の摺動接点装置の実施例の説明すると、図に示す
如き板厚0 、6 am、直径30鰭のエポキシ樹脂製
基板1上の外周に幅3 mmでカーボンの抵抗ペースト
をスクリーン印刷し、130℃で硬化して厚さ10μの
厚膜抵抗パターン2を形成し、この厚膜抵抗パターン2
に接続して、周方向に、Ag−樹脂導体ペーストをスク
リーン印刷し、130℃で硬化して、0.2鰭間隔に幅
0.2mm、長さ71、厚さ10μの厚膜導体パターン
(Ag−樹Jliff26wt%)3を形成して配線板
4とした。一方、この配線板4の厚膜導体パターン3に
対向して夫々摺動するようになされた2種のすり接点5
は、Ag−カドミウムlht%とAg−カドミウム3w
t%−ニッケル0、1wt%の2種の接点線材(直径1
.5fl)から作製した頭部径31m、頭部厚さ0.6
fi、脚部径1.5龍、脚部長1.5tmの2種のリベ
ット接点6を、夫々幅4鶴、厚さ0.151mのBe−
Cuより成るスプリング端子材7の接点取付穴に挿入し
かしめて成るものである。
(Example) To explain an example of the sliding contact device of the present invention, a carbon resistance paste with a width of 3 mm is placed on the outer periphery of an epoxy resin substrate 1 having a thickness of 0.6 am and a diameter of 30 fins as shown in the figure. was screen printed and cured at 130°C to form a thick film resistor pattern 2 with a thickness of 10μ.
A thick film conductor pattern (width 0.2 mm, length 71 mm, thickness 10 μm) is formed at 0.2 fin intervals by screen printing Ag-resin conductor paste in the circumferential direction and hardening it at 130°C. A wiring board 4 was formed by forming an Ag-tree (Jliff 26 wt%) 3. On the other hand, two types of sliding contacts 5 are arranged to slide oppositely to the thick film conductor pattern 3 of the wiring board 4.
are Ag-cadmium lht% and Ag-cadmium 3w
t%-nickel 0 and 1 wt% contact wire (diameter 1
.. Head diameter 31 m, head thickness 0.6 made from 5fl)
fi, two types of rivet contacts 6 with a leg diameter of 1.5mm and a leg length of 1.5tm, each with a width of 4mm and a thickness of 0.151m.
It is inserted into a contact mounting hole of a spring terminal material 7 made of Cu and then tightened.

このように構成された実施例1.2の摺動接点装置と、
Ag接点材を有するすり接点を実施例と同じ配線板4の
Ag−樹脂26wt%の厚膜導体パターン3と対向させ
て成る従来の摺動接点装置とを、下記の試験条件にて摺
動開閉試験を行った処、下記の表に示すような結果を得
た。
The sliding contact device of Example 1.2 configured in this way,
A conventional sliding contact device consisting of a sliding contact having an Ag contact material facing a thick film conductor pattern 3 made of 26 wt% Ag-resin on the same wiring board 4 as in the example was subjected to sliding opening and closing under the following test conditions. When the test was conducted, the results shown in the table below were obtained.

試験条件 接触カニ10g、動作:回転往復型(55度)、駆動=
60ストローク/min、通電:12■、100mA(
以下余白) 上記の表で明らかなように実施例1.2の摺動接点装置
は、従来例の摺動装置に比し、寿命が大概倍増している
ことが判る。これはひとえにすり接点5のAg−カドミ
ウム0.5〜15wt%接点材が滑りやすい為、対向す
るAg−樹脂系の厚膜導体パターン3と凝着することが
無(、またそのパターンが剥離することも無く、摩耗も
減少するからに他ならない。
Test conditions Contact crab 10g, operation: rotating reciprocating type (55 degrees), drive =
60 stroke/min, energization: 12■, 100mA (
As is clear from the above table, the life of the sliding contact device of Example 1.2 is almost twice as long as that of the conventional sliding device. This is because the Ag-cadmium 0.5 to 15 wt% contact material of the sliding contact 5 is slippery, so it does not adhere to the opposing Ag-resin thick film conductor pattern 3 (and the pattern may peel off). This is because there is no problem, and wear is also reduced.

尚、前記の寿命は、厚膜導体パターン3の摩耗により、
すり接点5が樹脂基板との接触となって、オーブン状態
(接触抵抗無限大)となった場合と、厚膜導体パターン
3間のスリット部の目詰まりによりショートした場合で
判定した。
Note that the above-mentioned lifespan is due to wear of the thick film conductor pattern 3.
The evaluation was made based on the case where the sliding contact 5 came into contact with the resin substrate, resulting in an oven state (infinite contact resistance), and the case where a short circuit occurred due to clogging of the slit between the thick film conductor patterns 3.

尚、上記実施例の摺動接点装置の配線板4は円形である
が、矩形でも良いものである。その場合、厚膜抵抗パタ
ーンは矩形の配線板の一側端に形成し、厚膜導体パター
ンは厚膜抵抗パターンに接続してその長手方向に一定間
隔に平行に形成すると良い。そしてすり接点は厚膜導体
パターンに対向して厚膜抵抗パターンの長手方向に摺動
し得るようにする。また樹脂基板上にベローズ形状に前
後に往復させた厚膜抵抗パターンを形成し、その上に厚
膜導体パターンを一定間隔に並べて形成した配線板と、
この配線板の厚膜導体パターンに対向して摺動するよう
にしたすり接点とより成る摺動接点装置としても良い。
Although the wiring board 4 of the sliding contact device in the above embodiment is circular, it may also be rectangular. In that case, the thick film resistor pattern is preferably formed at one end of the rectangular wiring board, and the thick film conductor patterns are preferably connected to the thick film resistor pattern and formed in parallel at regular intervals in the longitudinal direction thereof. The sliding contact is slidable in the longitudinal direction of the thick film resistor pattern, facing the thick film conductor pattern. Further, a wiring board in which a thick film resistor pattern reciprocated back and forth in a bellows shape is formed on a resin substrate, and thick film conductor patterns are formed on the resin substrate by arranging them at regular intervals;
A sliding contact device comprising a sliding contact slidably facing the thick film conductor pattern of the wiring board may also be used.

さらに実施例2のようにカドミウムの一部を0.01〜
1wt%の範囲で鉄族元素で置き換えてもよいものであ
る。
Furthermore, as in Example 2, a part of cadmium is added to 0.01~
It may be replaced with an iron group element within a range of 1 wt%.

(発明の効果) 以上の説明で判るように本発明の摺動接点装置は、すり
接点のAg−カドミウム0.5〜15wt%が滑りやす
いので、接触作用において樹脂基板上のAg−樹脂系導
体パターンと凝着することが無く、又そのパターンの剥
離も殆んど無くなり、摩耗も減少して良好な接触が得ら
れる。
(Effects of the Invention) As can be seen from the above explanation, in the sliding contact device of the present invention, since 0.5 to 15 wt% of Ag-cadmium in the sliding contact is slippery, the Ag-resin conductor on the resin substrate is used in the contact action. There is no adhesion to the pattern, there is almost no peeling of the pattern, and wear is reduced, resulting in good contact.

従って、接触偉績性が向上し、摺動接点装置の寿命が著
しく増長する。
Therefore, the contact efficiency is improved and the life of the sliding contact device is significantly extended.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の摺動接点装置の一実施例を示す概略図であ
る。
The figure is a schematic diagram showing an embodiment of the sliding contact device of the present invention.

Claims (1)

【特許請求の範囲】[Claims]  樹脂基板上に、抵抗ペーストにて厚膜抵抗パターンを
形成し、この厚膜抵抗パターンに接続してAg−樹脂系
導体ペーストにて厚膜導体パターンを形成して成る配線
板と、この配線板の厚膜導体パターンに対向して摺動し
得るようになされAg−カドミウム0.5〜15wt%
の接点材がスプリング端子材に取り付けられて成るすり
接点とにより構成されていることを特徴とする摺動接点
装置。
A wiring board in which a thick film resistor pattern is formed using a resistor paste on a resin substrate, and a thick film conductor pattern is connected to the thick film resistor pattern using an Ag-resin conductor paste, and this wiring board Ag-cadmium 0.5-15wt% so that it can slide against the thick film conductor pattern of
1. A sliding contact device comprising a sliding contact in which the contact member is attached to a spring terminal member.
JP62079050A 1987-03-31 1987-03-31 Sliding contact apparatus Pending JPS63244807A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62079050A JPS63244807A (en) 1987-03-31 1987-03-31 Sliding contact apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62079050A JPS63244807A (en) 1987-03-31 1987-03-31 Sliding contact apparatus

Publications (1)

Publication Number Publication Date
JPS63244807A true JPS63244807A (en) 1988-10-12

Family

ID=13679069

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62079050A Pending JPS63244807A (en) 1987-03-31 1987-03-31 Sliding contact apparatus

Country Status (1)

Country Link
JP (1) JPS63244807A (en)

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