JPS6324407Y2 - - Google Patents

Info

Publication number
JPS6324407Y2
JPS6324407Y2 JP433581U JP433581U JPS6324407Y2 JP S6324407 Y2 JPS6324407 Y2 JP S6324407Y2 JP 433581 U JP433581 U JP 433581U JP 433581 U JP433581 U JP 433581U JP S6324407 Y2 JPS6324407 Y2 JP S6324407Y2
Authority
JP
Japan
Prior art keywords
holding member
measured
main body
receiver
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP433581U
Other languages
Japanese (ja)
Other versions
JPS57118306U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP433581U priority Critical patent/JPS6324407Y2/ja
Publication of JPS57118306U publication Critical patent/JPS57118306U/ja
Application granted granted Critical
Publication of JPS6324407Y2 publication Critical patent/JPS6324407Y2/ja
Expired legal-status Critical Current

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  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【考案の詳細な説明】 本考案は、被測定体の表面の平坦度合(以下、
平面度と記す)を測定する光干渉縞測定装置に関
する。
[Detailed description of the invention] The present invention is designed to measure the flatness of the surface of the object to be measured (hereinafter referred to as
The present invention relates to an optical interference fringe measurement device that measures the flatness (referred to as flatness).

ウエハ固定装置に設けられたウエハ等の被測定
体の平面度を測定する光干渉縞測定装置には、測
定装置本体に設けられた基準鏡面体上に被測定体
を載置するものと、被測定体上に基準鏡面体を載
置するものとがある。また、基準鏡面体と被測定
体の接触は、各々の対向面を全面的に接触させる
ものと、両者間に突起体等を介在させて部分的に
接触させるものとがある。而して、被測定体上に
突起を介在させてその上に基準鏡面体を載置する
機構を採用した光干渉縞測定装置が最も多く使用
されているが、いずれの方式においても測定精度
を高めるために基準鏡面体の被測定体に対する接
触圧力をできるだけ小さくして被測定体の被測定
面の弾性歪の発生を阻止することが望ましい。
Optical interference fringe measurement devices that measure the flatness of objects to be measured, such as wafers, installed on a wafer fixing device include those in which the object to be measured is placed on a reference mirror surface provided in the main body of the measurement device, and those in which the object to be measured is placed on a reference mirror surface provided in the main body of the measurement device. There is one in which a reference mirror object is placed on the measurement object. Further, the reference mirror surface body and the object to be measured may be brought into contact by bringing their opposing surfaces into full contact with each other, or by interposing a protrusion or the like between the two to bring them into partial contact. Optical interference fringe measurement devices that employ a mechanism in which a reference mirror is placed on a protrusion on the object to be measured are most commonly used, but in either method, measurement accuracy is not guaranteed. In order to increase this, it is desirable to minimize the contact pressure of the reference specular body against the object to be measured to prevent occurrence of elastic strain on the surface to be measured of the object to be measured.

本考案は、かかる点に鑑みてなされたもので、
被測定体の被測定面の弾性歪の発生を阻止して測
定精度の向上を図つた光干渉縞測定装置を提供す
るものである。
This invention was made in view of these points,
An object of the present invention is to provide an optical interference fringe measuring device that improves measurement accuracy by preventing the occurrence of elastic strain on a surface to be measured of an object to be measured.

以下、本考案の実施例について図面を参照して
説明する。
Embodiments of the present invention will be described below with reference to the drawings.

図は、本考案の一実施例の断面図である。図中
1は、円筒状の装置本体である。装置本体1の開
口部1aの内周面には、係止部材2が突設されて
いる。係止部材2には、装置本体1の長手方向に
沿つてねじ孔4aが穿設されている。ねじ孔4a
には、調節ねじ4が嵌入されている。調節ねじ4
の途中には、ばね受け用のつば4bが設けられ、
その上にばね部材3が係合されている。調節ねじ
4の上端部は、装置本体1内に収納された略皿型
の保持部材5の縁部に穿設された穴5aに貫通さ
れている。保持部材5の中央部には装置本体1の
開口部1aに収納された被測定体6の上部が挿入
される窓5bが開口されている。保持部材5の皿
型の陥没部5cには基準鏡面体7が嵌合されてい
る。基準鏡面体7は、その下面7aに形成された
突起体7bを介して局部的に被測定体6の被測定
面6aに接触するようになつている。基準鏡面体
7は、保持部材5の上部に設けられた固定部材8
により固定されている。保持部材5の縁部の直下
には、先端部が保持部材5に近接するようにして
保持部材受体9が係止部材2に取付けられてい
る。
The figure is a sectional view of one embodiment of the present invention. 1 in the figure is a cylindrical device main body. A locking member 2 is provided protruding from the inner circumferential surface of the opening 1a of the device body 1. A screw hole 4 a is bored in the locking member 2 along the longitudinal direction of the device main body 1 . Screw hole 4a
An adjustment screw 4 is fitted into the. Adjustment screw 4
A collar 4b for a spring receiver is provided in the middle of the
A spring member 3 is engaged thereon. The upper end of the adjustment screw 4 is passed through a hole 5a bored in the edge of a substantially dish-shaped holding member 5 housed within the device main body 1. A window 5b is opened in the center of the holding member 5, into which the upper part of the object to be measured 6 housed in the opening 1a of the apparatus main body 1 is inserted. A reference mirror body 7 is fitted into the dish-shaped recessed portion 5c of the holding member 5. The reference mirror body 7 is adapted to locally contact the surface to be measured 6a of the object to be measured 6 via a protrusion 7b formed on its lower surface 7a. The reference mirror body 7 is attached to a fixing member 8 provided on the upper part of the holding member 5.
Fixed by A holding member receiver 9 is attached to the locking member 2 directly below the edge of the holding member 5 so that its tip is close to the holding member 5.

次いで本装置の作用について説明する。まず、
本装置は製作時または測定作業に先立つて調節ね
じ4によりばね部材3の下端の位置を調節し、図
示のように被測定体6が基準鏡面体7の下に置か
れていないとき、保持部材5と保持部材受体9の
間隔Sが零ないしわずかな値となるように定めて
おく。なお、この間隔Sが零のときにも、保持部
材受体9に作用する保持部材5の荷重をわずかに
押え、該荷重の大部分をばね部材3が受けるよう
に設定する。この設定は、ばね部材3のばね定数
を予じめ知ることができるので、前記間隔Sが存
在する状態から調節ねじ4を回して該間隔Sを次
第に小さくしていき、該間隔Sが零になつた状態
からさらに所定量調節ねじ4を回すことにより行
なわれ、前記間隔Sが零になつた状態からさらに
回すことによつて降下する調節ねじ4の降下量に
より保持部材受体9とばね部材3に作用する保持
部材5の荷重割合を適宜に定めることが可能であ
る。
Next, the operation of this device will be explained. first,
This device adjusts the position of the lower end of the spring member 3 using the adjustment screw 4 during manufacturing or prior to measurement work, and when the object to be measured 6 is not placed under the reference mirror surface 7 as shown in the figure, the holding member 5 and the holding member receiver 9 is determined to be zero or a small value. Note that even when this distance S is zero, the load of the holding member 5 acting on the holding member receiver 9 is slightly suppressed, and the setting is made such that the spring member 3 receives most of the load. In this setting, since the spring constant of the spring member 3 can be known in advance, the spacing S is gradually reduced by turning the adjusting screw 4 from the state where the spacing S exists, until the spacing S becomes zero. This is done by further turning the adjusting screw 4 by a predetermined amount from the relaxed state, and the holding member receiver 9 and the spring member are lowered by the lowering amount of the adjusting screw 4 which is lowered by further turning the distance S from the state where the distance S has become zero. It is possible to appropriately determine the load ratio of the holding member 5 that acts on the holding member 3.

前記のように本装置を設定した状態で測定を行
なうものであるが、測定に際しては被測定体6の
被測定面6aを基台11の上面から所定高さの範
囲内に位置させ、図示のように、被測定体6の上
部が保持部材5の窓5b内に入るようにして装置
本体1を基台11上に置いたとき、被測定面6a
が基準鏡面体7の突起体7bに当接してこれを持
ち上げ、前述した間隔Sが前記の初期状態よりわ
ずかに増加するようにしておく。
Measurements are carried out with this device set up as described above. During measurement, the surface to be measured 6a of the object to be measured 6 is positioned within a predetermined height range from the top surface of the base 11, and the When the apparatus body 1 is placed on the base 11 so that the upper part of the object to be measured 6 enters the window 5b of the holding member 5, the surface to be measured 6a
comes into contact with the protrusion 7b of the reference mirror body 7 and lifts it so that the above-mentioned interval S is slightly increased from the above-mentioned initial state.

しかして、前記のように被測定体6の上に基準
鏡面体7を位置させて装置本体1を基台11上に
置いて測定を行えば、被測定面6aと突起体7b
は、被測定体6が基準鏡面体7を持ち上げること
によつて確実に接触し、その接触圧は基準鏡面体
7が持ち上げられることによる間隔Sの増加すな
わちばね部材3の伸びに伴なう該ばね部材3の受
ける荷重の減少分だけとなる。このばね部材3の
伸びに伴なう該荷重の減少分は、ばね部材3のば
ね定数と前記伸びの量によつて定まり、ばね定数
を比較的小さくし、伸び量を例えば0.5〜1mmな
どの比較的挟い範囲内に納まるようにすれば、前
記接触圧を十分小さな値に定めることができる。
なお、初期状態において、保持部材5が保持部材
受体9に接触しており、この保持部材受体9が保
持部材5の荷重の一部を受けている場合は、前記
ばね部材3の伸びに伴なう荷重のほか、保持部材
受体9が受けていた分の荷重も被測定面6aと突
起体7bとの間に作用する。そこで、調節ねじ4
の調節により前述したようにして保持部材受体9
が受ける保持部材5の荷重を適宜に定めておけ
ば、前記接触圧を測定に最も適した所定の値に容
易に近付けることが可能である。
Therefore, if measurement is performed by positioning the reference mirror surface 7 on the object to be measured 6 and placing the main body 1 on the base 11 as described above, the surface to be measured 6a and the protrusion 7b
The object to be measured 6 is brought into contact with the reference specular body 7 reliably by lifting it, and the contact pressure increases as the distance S increases due to the lifting of the reference specular body 7, that is, the spring member 3 stretches. This is only the reduction in the load that the spring member 3 receives. The amount by which the load decreases due to the elongation of the spring member 3 is determined by the spring constant of the spring member 3 and the amount of elongation. By keeping the contact pressure within a relatively narrow range, the contact pressure can be set to a sufficiently small value.
In addition, in the initial state, when the holding member 5 is in contact with the holding member receiver 9 and this holding member receiver 9 receives part of the load of the holding member 5, the expansion of the spring member 3 In addition to the accompanying load, the load received by the holding member receiver 9 also acts between the surface to be measured 6a and the protrusion 7b. Therefore, adjusting screw 4
By adjusting the holding member receiver 9 as described above,
By appropriately determining the load that the holding member 5 receives, it is possible to easily bring the contact pressure close to a predetermined value most suitable for measurement.

このため被測定面6aにほとんど歪を発生させ
ず、かつ突起体7bと被測定面6aを確実に接触
させて測定することができ、平面度を極めて高い
精度で測定することができる。
Therefore, the measurement can be performed with almost no distortion occurring on the surface to be measured 6a, and the protrusions 7b and the surface to be measured 6a are brought into reliable contact with each other, and the flatness can be measured with extremely high accuracy.

以上説明した如く、本考案に係る光干渉縞測定
装置10によれば、保持部材と保持部材受体間に
設けたばね部材を調節ねじにて予め調節しておく
ことにより、被測定体に対する基準鏡面体の接触
力をより小さな値にして確実に接触させることが
でき、このため被測定面の弾性歪の発生を阻止し
て極めて高い精度で平面度を測定でるものであ
る。
As explained above, according to the optical interference fringe measuring device 10 according to the present invention, by adjusting the spring member provided between the holding member and the holding member receiver in advance with the adjustment screw, the reference mirror surface relative to the object to be measured can be adjusted. It is possible to ensure contact by reducing the contact force of the body to a smaller value, thereby preventing the generation of elastic strain on the surface to be measured, and making it possible to measure flatness with extremely high accuracy.

【図面の簡単な説明】[Brief explanation of the drawing]

図は、本考案の一実施例の断面図である。 1……装置本体、2……係止部材、3……ばね
部材、4……調節ねじ、5……保持部材、5a…
…穴、6……被測定体、7……基準鏡面体、7a
……下面、7b……突起体、8……固定部材、9
……保持部材受体、10……光干渉縞測定装置、
11……基台、12……単色光。
The figure is a sectional view of one embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Device main body, 2... Locking member, 3... Spring member, 4... Adjustment screw, 5... Holding member, 5a...
...hole, 6... object to be measured, 7... reference specular object, 7a
...Lower surface, 7b...Protrusion, 8...Fixing member, 9
... Holding member receiver, 10 ... Optical interference fringe measuring device,
11... Base, 12... Monochromatic light.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 干渉光が透過する基準鏡面体と、該基準鏡面体
を保持する保持部材と、該保持部材及び前記基準
鏡面体を収納し、かつ、前記基準鏡面体を被測定
体に直接または突起部材を介して接触対向させる
ための開口部を有する装置本体と、前記被測定体
と前記基準鏡面体が対向する方向に沿つて前記保
持部材と零ないしわずかな間隔を有して前記保持
部材を支持するように前記装置本体に形成された
保持部材受体と、該保持部材受体と前記保持部材
間に介在されたばね部材と、該ばね部材の一端側
を移動可能に受けて前記保持部材と前記保持部材
受体間の前記間隔およびばね部材に作用する力を
調節する調節ねじとを具備することを特徴とする
光干渉縞測定装置。
A reference specular body through which interference light passes, a holding member that holds the reference specular body, the holding member and the reference specular body are housed, and the reference specular body is attached to the object to be measured directly or through a protruding member. an apparatus main body having an opening for contacting and opposing each other; and a device body configured to support the holding member with zero to a small distance from the holding member along the direction in which the object to be measured and the reference mirror surface face each other. a holding member receiver formed on the apparatus main body; a spring member interposed between the holding member receiver and the holding member; An optical interference fringe measuring device characterized by comprising an adjustment screw for adjusting the distance between the receivers and the force acting on the spring member.
JP433581U 1981-01-16 1981-01-16 Expired JPS6324407Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP433581U JPS6324407Y2 (en) 1981-01-16 1981-01-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP433581U JPS6324407Y2 (en) 1981-01-16 1981-01-16

Publications (2)

Publication Number Publication Date
JPS57118306U JPS57118306U (en) 1982-07-22
JPS6324407Y2 true JPS6324407Y2 (en) 1988-07-05

Family

ID=29802765

Family Applications (1)

Application Number Title Priority Date Filing Date
JP433581U Expired JPS6324407Y2 (en) 1981-01-16 1981-01-16

Country Status (1)

Country Link
JP (1) JPS6324407Y2 (en)

Also Published As

Publication number Publication date
JPS57118306U (en) 1982-07-22

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