JPS63234123A - Optical temperature measuring instrument - Google Patents
Optical temperature measuring instrumentInfo
- Publication number
- JPS63234123A JPS63234123A JP62068493A JP6849387A JPS63234123A JP S63234123 A JPS63234123 A JP S63234123A JP 62068493 A JP62068493 A JP 62068493A JP 6849387 A JP6849387 A JP 6849387A JP S63234123 A JPS63234123 A JP S63234123A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- filter
- optical fiber
- light
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims description 15
- 239000013307 optical fiber Substances 0.000 claims abstract description 21
- 238000009529 body temperature measurement Methods 0.000 claims description 5
- 238000002834 transmittance Methods 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 230000035945 sensitivity Effects 0.000 abstract description 4
- 238000005259 measurement Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 2
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野]
この発明は、光ファイバを利用した光学式温度測定装置
に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an optical temperature measuring device using an optical fiber.
[従来の技術]
従来、温度により透過率もが変化する半導体等を感温部
とし、これに、光ファイバにより光を投光、受光し、検
出器の受光量の変化から温度を測定するものがある。[Conventional technology] Conventionally, a semiconductor or the like whose transmittance changes depending on temperature is used as a temperature sensing part, light is emitted and received by an optical fiber, and the temperature is measured from the change in the amount of light received by a detector. There is.
[この発明が解決しにうとする問題点]しかしながら、
感温部として半導体等を用いると、材料の性質から透過
率等の特性は決ってしまい、必要に応じた測温範囲、感
度を自由に選択しにくい等の問題点があった。[Problems that this invention attempts to solve] However,
When a semiconductor or the like is used as the temperature-sensing section, the characteristics such as transmittance are determined by the properties of the material, and there are problems such as difficulty in freely selecting the temperature measurement range and sensitivity as required.
この発明の目的は、以上の点に鑑み、感温部として干渉
膜フィルタを用い、高感度の温度測定を可能とした光学
式温度測定装置を提供することである。In view of the above points, an object of the present invention is to provide an optical temperature measuring device that uses an interference film filter as a temperature sensing section and enables highly sensitive temperature measurement.
[問題点を解決するための手段]
この発明は、温度により透過率または反り′1率が変化
づる感温部としての干渉膜フィルタに光ファイバを介し
て光を投受光し、光ファイバからの光を検出器で受光し
、測定手段で温度を測定するようにした光学式湿度測定
装置である。[Means for Solving the Problems] The present invention projects and receives light through an optical fiber to an interference film filter as a temperature sensing part whose transmittance or warp ratio changes depending on temperature, This is an optical humidity measuring device that receives light with a detector and measures temperature with a measuring means.
[実施例]
第1図は、この発明の一実施例を示す構成説明図である
。[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention.
図において、白熱電球、ハロゲンランプ、LED等の光
源1の光は、光ファイバ21を介して感温部としての多
層の干渉膜フィルタ3に投光される。このバンドパスフ
ィルタのような干渉膜フィルタ3を透過した光は、第2
図Aで示すような中心波長をもつバンドパスの透過光と
され再び光ファイバ22、フィルタ4を介し検出器5に
入射する。検出器5の出力は測定手段6で適当な演]E
L理がなされ温度が測定される。In the figure, light from a light source 1 such as an incandescent lamp, a halogen lamp, or an LED is projected through an optical fiber 21 to a multilayer interference film filter 3 serving as a temperature sensing section. The light transmitted through the interference film filter 3 such as this bandpass filter is
The light is converted into a band-pass transmitted light having a center wavelength as shown in FIG. The output of the detector 5 is suitably processed by the measuring means 6]E
The temperature is measured.
つまり、干渉膜フィルタ3は温度Tが上昇すると、第2
図へからA′へというように長波長側に透過波長特性が
シフトし、検出器5の前面のフィルタ4の波長特性は第
2図Bで示すようなロングパス(ローパス)特性で変ら
ないので、△または八−と8との垂なり具合が温度Tに
より変化し、検出器5に入射する放射エネルギーが変化
する。In other words, when the temperature T rises, the interference film filter 3
The transmission wavelength characteristic shifts to the longer wavelength side from Fig. 2 to A', and the wavelength characteristic of the filter 4 in front of the detector 5 remains unchanged as a long pass (low pass) characteristic as shown in Fig. 2B. The degree to which Δ or 8- and 8 hang changes depending on the temperature T, and the radiant energy incident on the detector 5 changes.
この検出器5の出力から、測定手段6により、あらかじ
め実験、計t1等で求めた演葬式、テーブル等から温度
Tを測定する。From the output of the detector 5, the temperature T is measured by the measuring means 6 from the performance surface, table, etc., which have been determined in advance through experiments, total time t1, etc.
なお、干渉膜フィルタ3としては、高屈折率膜に81ま
たはGe、低屈折率膜にSiO等を用い、′iA着等に
より多層膜を形成し、測温範囲、感度に応じた所望の透
過波長特性をもつフィルタとする。For the interference film filter 3, use 81 or Ge for the high refractive index film, SiO, etc. for the low refractive index film, form a multilayer film by 'iA deposition, etc., and adjust the desired transmission according to the temperature measurement range and sensitivity. The filter has wavelength characteristics.
このように多層の干渉膜フィルタの層数、膜構成を変え
ることにより必要とするバンドパス特性をもつフィルタ
が(ワられ、また、3i、Qeの屈折率の温度係数は約
1.5X10−’ /′℃と十分大きく、感温部として
十分使用できる。In this way, by changing the number of layers and film configuration of a multilayer interference film filter, a filter with the required bandpass characteristics can be obtained (warped), and the temperature coefficient of the refractive index of 3i and Qe is approximately 1.5X10-'/'℃, which is sufficiently large that it can be used as a temperature sensing section.
第3図は、この発明の他の一実施例を示し、第1図と同
一符号は、同等の構成要素を示す。FIG. 3 shows another embodiment of the present invention, in which the same reference numerals as in FIG. 1 indicate equivalent components.
光源1からの光は、ハーフミラ−7を介し光)tlイバ
2により感温部としての干渉膜フィルタ3に投光され、
反射光は、再び光ファイバ2を介して取り出され、ハー
フミラ−7で反射してフィルタ4を透過して検出器5に
入射する。The light from the light source 1 passes through the half mirror 7 and is projected onto the interference film filter 3 as a temperature sensing section by the optical fiber 2.
The reflected light is again taken out via the optical fiber 2, reflected by the half mirror 7, transmitted through the filter 4, and incident on the detector 5.
この場合、干渉膜フィルタ3の反射光の波長特性は、第
4図へからA′というにうに温度Tにより変化するがフ
ィルタ4の波長特性は第4図Bのように変らないので、
AまたはA′とBとの重なり具合が温度Tにより変化し
、検出器5に入射する放射エネルギーが変化する。この
検出器5の出力から、測定手段6により、あらかじめ計
算等で求めた計算式、テーブル等から温度Tを測定する
。In this case, the wavelength characteristics of the reflected light from the interference film filter 3 change depending on the temperature T as shown in FIG. 4A', but the wavelength characteristics of the filter 4 do not change as shown in FIG. 4B.
The degree of overlap between A or A' and B changes depending on the temperature T, and the radiant energy incident on the detector 5 changes. From the output of the detector 5, the temperature T is measured by the measuring means 6 using a calculation formula, table, etc., calculated in advance.
なお、第5図で示すように、光ファイバ20の端面に干
渉膜フィルタ3を蒸着等で形成することにより(たとえ
ば多数の光ファイバの端面に同時に干渉膜フィルタを形
成することにより)、均一な感温部が、安価、人出に生
産でき、互換性も有し、また、光コネクタ20aにより
光ファイバ2に着脱可能とすることにより、取り扱い、
保守等が容易なものとなる。As shown in FIG. 5, by forming an interference film filter 3 on the end face of the optical fiber 20 by vapor deposition or the like (for example, by forming interference film filters on the end faces of a large number of optical fibers at the same time), a uniform The temperature sensing part can be produced inexpensively and quickly, has compatibility, and can be attached to and detached from the optical fiber 2 using the optical connector 20a, making it easy to handle,
Maintenance, etc. becomes easier.
[発明の効果]
以上述べたように、この発明は、感温部として干渉膜フ
ィルタを用いているので、光ファイバを利用して容易に
湿度を測定することが可能となり、また、干渉膜フィル
タは、膜構成等により透過波長特性等を自由に変えるこ
とができ、測温範囲、感度等に応じた各梯測温が容易に
可能となる。[Effects of the Invention] As described above, this invention uses an interference film filter as a temperature sensing section, so it becomes possible to easily measure humidity using an optical fiber. The transmission wavelength characteristics and the like can be freely changed by changing the film configuration, etc., and it is possible to easily measure the temperature at each level according to the temperature measurement range, sensitivity, etc.
第1図、第3図、第5図は、この発明の一実施例を示す
構成説明口、第2図、第4図は、波長特性説明図である
。
1・・・光源、2.20.21.22・・・光ファイバ
、3・・・干渉膜フィルタ(感温部)、4・・・フィル
タ、5・・・検出器、6・・・測定手段、7・・・ハー
フミラ−120a・・・光コネクタ
昭和 年 月 日
1,1件の表示
昭和62年 特許願 第68−493@2、発明の名称
光学式温度測定装置
3、補正をする者
事件との関係 特許出願人
住 所 東京都新宿区西斬宿゛1丁目26番2号3
とフィルタ4とを交換して用いるようにしてもよい。」
を挿入する。FIGS. 1, 3, and 5 are diagrams for explaining the configuration of an embodiment of the present invention, and FIGS. 2 and 4 are diagrams for explaining wavelength characteristics. 1... Light source, 2.20.21.22... Optical fiber, 3... Interference film filter (temperature sensitive part), 4... Filter, 5... Detector, 6... Measurement Means, 7... Half mirror 120a... Optical connector Showa Year Month Date 1, 1 display 1988 Patent application No. 68-493 @ 2 Name of the invention Optical temperature measuring device 3 Person making the correction Relationship to the incident Patent applicant address 1-26-2-3 Nishikiranjuku, Shinjuku-ku, Tokyo
and filter 4 may be used interchangeably. ”
Insert.
Claims (1)
しての干渉膜フィルタと、この干渉膜フィルタに光源か
らの光を投光し干渉膜フィルタを透過または反射した光
を取り出す光ファイバと、この光ファイバからの光を受
光する検出器と、この検出器の出力から温度を測定する
測定手段とを備えたことを特徴とする光学式測定装置。 2、前記検出器は、フィルタを介して光ファイバからの
光を受光することを特徴とする特許請求の範囲第1項記
載の光学式温度測定装置。 3、光ファイバの端面に干渉膜フィルタを形成したこと
を特徴とする特許請求の範囲第1項または第2項記載の
光学式温度測定装置。 4、干渉膜フィルタが端面に形成された光ファイバを含
む感温部を光コネクタにより光ファイバに着脱可能とし
たことを特徴とする特許請求の範囲第1項から第3項記
載の光学式温度測定装置。 5、干渉膜フィルタの高屈折率膜としてSiまたはGe
を用いたことを特徴とする特許請求の範囲第1項から第
4項記載の光学式温度測定装置。 6、測温範囲に応じ干渉膜フィルタの膜構成または層数
を変化させたことを特徴とする特許請求の範囲第1項か
ら第5項記載の光学式温度測定装置。[Claims] 1. An interference film filter as a temperature-sensitive part whose transmittance or reflectance changes depending on temperature, and light from a light source projected onto this interference film filter and transmitted or reflected by the interference film filter. What is claimed is: 1. An optical measuring device comprising: an optical fiber for extracting light; a detector for receiving light from the optical fiber; and a measuring means for measuring temperature from the output of the detector. 2. The optical temperature measuring device according to claim 1, wherein the detector receives light from an optical fiber through a filter. 3. The optical temperature measuring device according to claim 1 or 2, characterized in that an interference film filter is formed on the end face of the optical fiber. 4. The optical temperature sensor according to claims 1 to 3, characterized in that the temperature sensing section including an optical fiber having an interference film filter formed on the end surface is detachable from the optical fiber using an optical connector. measuring device. 5. Si or Ge as a high refractive index film of the interference film filter
An optical temperature measuring device according to any one of claims 1 to 4, characterized in that the optical temperature measuring device uses: 6. The optical temperature measuring device according to claims 1 to 5, characterized in that the film configuration or the number of layers of the interference film filter is changed depending on the temperature measurement range.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62068493A JPS63234123A (en) | 1987-03-23 | 1987-03-23 | Optical temperature measuring instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62068493A JPS63234123A (en) | 1987-03-23 | 1987-03-23 | Optical temperature measuring instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63234123A true JPS63234123A (en) | 1988-09-29 |
Family
ID=13375272
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62068493A Pending JPS63234123A (en) | 1987-03-23 | 1987-03-23 | Optical temperature measuring instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63234123A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109632127A (en) * | 2018-11-30 | 2019-04-16 | 西安航空学院 | A kind of photoinduction temperature control system and its operating method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54158954A (en) * | 1978-06-02 | 1979-12-15 | Asea Ab | Device for measuring fiber optical |
JPS5641223B2 (en) * | 1973-01-13 | 1981-09-26 | ||
JPS58189530A (en) * | 1982-04-28 | 1983-11-05 | Omron Tateisi Electronics Co | Apparatus for temperature measurment |
-
1987
- 1987-03-23 JP JP62068493A patent/JPS63234123A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5641223B2 (en) * | 1973-01-13 | 1981-09-26 | ||
JPS54158954A (en) * | 1978-06-02 | 1979-12-15 | Asea Ab | Device for measuring fiber optical |
JPS58189530A (en) * | 1982-04-28 | 1983-11-05 | Omron Tateisi Electronics Co | Apparatus for temperature measurment |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109632127A (en) * | 2018-11-30 | 2019-04-16 | 西安航空学院 | A kind of photoinduction temperature control system and its operating method |
CN109632127B (en) * | 2018-11-30 | 2020-11-03 | 西安航空学院 | Photoinduction temperature measurement and control system and operation method thereof |
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