JPS63231695A - Test control system for automatic transactor - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Detailed Description of the Invention] [Summary] The present invention provides an automatic transaction device that uses an IC card as a transaction card, which loads a test means (test program) from the IC card and stores the internal memory provided for transaction operations. In addition to storing it in the work area and operating it,
To provide a test control method for an automatic transaction device that reads test results and recorded maintenance data to an IC card based on instructions from a test program.

[Industrial application field]

The present invention relates to a test control method for an automatic transaction device using an IC card.

In recent years, as the business handled by automated transaction devices has increased,
Business programs occupy more memory,
Test program [Test, maintenance data recording output, etc., collectively referred to as RA S (Reliability, Av
ailability, and 5serviceabi
It is becoming difficult to secure a place to implement the program.

Therefore, there is a need for a test control method for automatic transaction machines that solves the above problems.

[Conventional technology]

The conventional RAS section storage method explanatory diagram (part 1) shown in FIG. In the conventional RAS section storage method explanatory diagram (part 2) shown in Fig. 1, the program is stored in an external memory such as a floppy disk 17 along with auxiliary data necessary for a business program (hereinafter referred to as a business program) 16, and is read into the internal memory 6 for testing when used. This shows the method.

In this way, it is stored in the internal memory 6 or external memory of the RASAlB12 dynamic transaction device, and is activated when necessary to perform tests such as reading/writing the I10 section 13.

In addition, in the figure, a work area 7 provided in the internal memory 6
is a work area used by the business department 16 for transaction processing when the transaction card 19 is inserted.

[Problem that the invention seeks to solve]

In recent years, as the business of automatic transaction devices has expanded, it has become difficult to secure a place to implement RAS programs that are not directly related to business.

For this reason, there is a problem in that providing an external file device for the RAS programmer, such as a floppy device, increases costs.

An object of the present invention is to provide a test control method for an automatic transaction device that solves the above-mentioned problems.

Means for Solving Problem C] For the above purpose, the test control method in the automatic transaction device of the present invention, as shown in FIG. In addition to testing each part of the automatic transaction device, maintenance data (52) is transferred to the IC card (
1); a sending means (23) for storing the testing means (50) and sending the testing means (50) to the inserted automatic transaction device; an IC card (1) equipped with a recording means (24) for recording said maintenance data (52); and said test means (1) received from said IC card (1).
50) in a work area (7) provided in an internal memory (6) provided for transaction operations, and a control unit (4) for activating the data.

[Effect]

The processor built into the IC card generates test means (test program, hereinafter referred to as R) stored in data space.
AS program) 50 is transferred to the inserted automatic transaction device, together with, for example, an identification code (ID).

The automatic transaction device identifies the RAS program 50 using this identification code ID and transfers it to the work area 7 of the internal memory 6 provided for business use.

After the reading of the IC card 1 is completed, the RAS program 50 is activated by the control unit 4 and a test is executed. Write.

Note that in order to record the maintenance data 52, the memory of the IC card 1 includes an electrically erasable programmable memory EEP.
ROM is used.

As described above, by storing the test program 50 in the IC card I and inputting it into the automatic transaction device, various RAS programs 50 can be executed. No memory limitations.

[Example] An example of the present invention will be described with reference to FIGS. 1 and 2.

Figure 2 (al is a block diagram of the automatic transaction device of the embodiment,
Figure (b) is an operation flowchart.

In FIG. 2(a), ■ is a C card, which is an IC card for transactions (not shown), which is composed of an electrically erasable memory EEPROMI 2 and a processor 11 (corresponding to the sending means 23 and recording means 24). I4 is an automatic transaction device, and 2 is a read/write unit 2 which is equipped with an IC card 1, a mechanism for inserting the transaction IC card, and an interface means. 8 is a processor 8 (corresponding to the control unit 4) that performs read/write control of the IC card 1, transfer and startup control of the test program 50, and operates based on the test program 50; A work area provided in the memory 6 used by the business program; 15 is an input section 2 for inputting a password; and the same reference numerals represent the same objects throughout the figures.

In the above configuration, the EEPROMI 2 of the IC card 1 is provided with a RAS program area 20 for storing the RAS program 50 and a recording area 21 for storing the maintenance data 52. stored in a database.

By inserting this IC card 1 into the automatic transaction device 14, the RAS program 50 is read and a test control operation is started.

The operation will be explained below with reference to FIG.

(1) Insert the IC card l and enter the maintenance personnel's PIN number. (Fig. 2 (b) A, B) (2) After reading and verifying the PIN number from the IC card 1, the automatic transaction device 14 issues an ID number reading command to the IC card 1.
Send to C card 1.

It recognizes that the transferred data is the RAS program 50 based on the ID number, and then stores the read RAS program 50 in the internal memory 60 work area 7. (C-E
) (3) When the reading is completed, the processor 8 moves to the work area 7.
The RAS program 50 stored at a predetermined address is activated and executed. CF) (4) When the RAS program 50 instructs to record the maintenance data 52 (mechanism, etc.), the mechanism area 9 (maintenance data 52) is read and transferred to the IC card 1.

IC card 1 stores this as recording area 2 of EBFROMI 2.
1 and record it. CG'') As described above, the RAS program 50 is stored in the IC card 1, and the automatic transaction device 14 reads and executes it, and also stores the mechanism maintenance data 52 in the IC card 1.
can be recorded.

Note that if the RAS program 50 is configured for unit testing, even if the I10 section to be tested is added, it can be easily handled by adding the IC card 1.

〔Effect of the invention〕

Since the present invention stores a RAS program in an IC card, reads it, transfers it to a working area of a memory provided for transaction operations, and controls its execution, it is not necessary to provide an external file device for the RAS program. This has a great effect in that the RAS program can be easily adapted to changes in equipment.

[Brief explanation of drawings]

Fig. 1 is a diagram explaining the principle of the present invention, Fig. 2 (al is a block diagram of an automatic transaction device of an embodiment,
Figure 3(b) is an operation flowchart, Figure 3(a) is an explanatory diagram of the conventional RAS unit storage method (Part 1), and Figure 3(b) is an explanatory diagram of the conventional RAS unit storage method (Part 2).
), is. In the figure, 1 is an IC card, 2 is a read/write unit, 4 is a control unit, 6 is an internal memory, 7 is a work area, 8 is a processor, 9 is a mechanical area, 11 is a processor in the IC card, 12 is an electrical unit erasable memory EEPROM, 13 is 7
10 parts, 14 is an automatic transaction device, 15 is an input part, 20 is a RAS program area, 21 is a recording area, 23 is a sending means, 24 is a recording means, 50 is a test means (test program, RAS program), 52 is a maintenance (mechanism) data. Fig. 1 Block diagram of automatic transaction device according to the embodiment 2nd copy a) Operation flowchart Fig. 2 p)

Claims (1)

[Claims] A read/write unit (
2), a test means (50) that is activated within the automatic transaction device to test each part of the automatic transaction device and instructs to transfer maintenance data (52) to the IC card (1). ), a sending means (23) for storing the test means (50) and sending the test means (50) to the inserted automatic transaction device, and a record for recording the transferred maintenance data (52). an IC card (1) comprising means (24); and a test means (5) received from said IC card (1).
0) in a work area (7) of an internal memory (6) provided for transaction operations, and a control unit (4) that stores and activates the test unit (50) from the IC card (1). A test control method for an automatic transaction device, characterized in that the maintenance data (52) is read out to the IC card (1) at the same time as a reading test is performed.