JPS6322540B2 - - Google Patents
Info
- Publication number
- JPS6322540B2 JPS6322540B2 JP17455281A JP17455281A JPS6322540B2 JP S6322540 B2 JPS6322540 B2 JP S6322540B2 JP 17455281 A JP17455281 A JP 17455281A JP 17455281 A JP17455281 A JP 17455281A JP S6322540 B2 JPS6322540 B2 JP S6322540B2
- Authority
- JP
- Japan
- Prior art keywords
- shutter
- sample
- measuring device
- input
- feeder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 241000209094 Oryza Species 0.000 description 26
- 235000007164 Oryza sativa Nutrition 0.000 description 26
- 235000009566 rice Nutrition 0.000 description 26
- 235000013339 cereals Nutrition 0.000 description 16
- 238000001514 detection method Methods 0.000 description 12
- 239000003550 marker Substances 0.000 description 12
- 238000003801 milling Methods 0.000 description 11
- 238000005498 polishing Methods 0.000 description 9
- 238000000227 grinding Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【発明の詳細な説明】
この発明は、穀粒、主として米粒の精白度を測
定する装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for measuring the degree of polishing of grains, mainly rice grains.
一般に、米粒は精米機で搗精することにより、
除糠され、白くなるが、従来からその白さの度合
をもつて搗精率すなわち、精白度として表示して
いた。そして、従来の白度測定装置では、鏡体よ
りなる積分球下部に試料皿をおき、そこに測定す
る精米を載せ、積分球上部から精米に熱線吸収フ
イルター、単色光フイルターを透過し、集光レン
ズで集められた光を照射し、精米からの反射光を
積分球側部に設けた受光素子に集め、増幅器で増
幅して反射光を測定し、白度としていた。 Generally, rice grains are milled using a rice milling machine.
The whiteness is removed by removing the bran, and the degree of whiteness has traditionally been expressed as the milling efficiency, or polishing degree. In the conventional whiteness measuring device, a sample dish is placed at the bottom of an integrating sphere made of a mirror, the polished rice to be measured is placed there, and the polished rice is passed through a heat ray absorption filter and a monochromatic light filter from the top of the integrating sphere, and the light is focused. The light collected by the lens was irradiated, and the reflected light from the polished rice was collected on a light-receiving element installed on the side of the integrating sphere, amplified by an amplifier, and the reflected light was measured to determine whiteness.
ところで精米機には、研削式精米機と、摩擦式
精米機があり、肉眼で観察すると、研削式精米機
の搗精作用を増加させた精白米に比較して摩擦式
精米機の搗精作用を増加させた精白米の方が透明
感、つや感が優れている。すなわち、研削式精米
機では、研削ロールと米粒との摩擦により搗精を
行うため、搗精米は表面に研削ロールによる傷が
多くついて粗面となつているのにたいして、摩擦
式精米機では、米粒の相互摩擦作用により搗精を
行うため、搗精米の表面は、滑らかになつてい
る。 By the way, there are two types of rice milling machines: grinding rice milling machines and friction rice milling machines. When observed with the naked eye, the polishing action of the friction rice milling machine is increased compared to the polished rice that has an increased polishing action of the grinding rice milling machine. Polished rice has better transparency and shine. In other words, in a grinding rice mill, the rice grains are milled by friction between the grinding rolls and the rice grains, so the surface of milled rice has many scratches from the grinding rolls and has a rough surface. The surface of the milled rice is smooth because it is milled by mutual friction.
従来の白度計は、試料からの反射光を測定して
白度とするため、滑かな表面より、粗い表面の方
が光の乱反射が多く、白度は高い値を示す傾向に
あり、滑らかな表面の方は、反射する光に対して
透過する光の量が多いので、白度は低い値を示す
傾向にあつた。すなわち、反射光を白度とする測
定法では、表面が滑らかに搗精された精白米の場
合は、光の反射率に比して透過率が大となるた
め、正確な値を測定することはできなかつた。 Conventional whiteness meters measure the reflected light from the sample to determine whiteness, so rough surfaces tend to reflect more diffuse light and show higher whiteness values than smooth surfaces. The whiteness of the surface tended to be low because the amount of light that was transmitted was greater than the amount of light that was reflected. In other words, with the measurement method that uses reflected light as whiteness, in the case of polished rice with a smooth surface, the transmittance is greater than the reflectance of light, so it is difficult to accurately measure whiteness. I couldn't do it.
これに対して、本発明者は、試料の反射光と透
過光とを測定することにより、正確な精白度を得
る穀粒精白度測定装置を提供した。 On the other hand, the present inventor provided a grain whiteness measurement device that obtains accurate whiteness by measuring reflected light and transmitted light of a sample.
しかし、この穀粒精白度測定装置は、静止状態
の穀粒に対してのみその精白度を測定するため、
連続して流動する穀粒の精白度を刻々と測定する
ことができない欠点があつた。 However, this grain milling degree measuring device only measures the milling degree of grains in a stationary state.
There was a drawback that it was not possible to measure the milling degree of continuously flowing grains moment by moment.
そこでこの発明は、上記欠点を解消し、精白度
を試料の反射光だけで測定するのではなく、透過
光も測定し、両者を合わせて精白度とすることに
より、より正確な精白度を得るとともに流動する
穀粒の精白度を刻々と連続して測定することがで
きる穀粒精白度測定装置を提供することを目的と
するものである。 Therefore, this invention solves the above-mentioned drawbacks and obtains a more accurate degree of whiteness by measuring not only the reflected light of the sample but also the transmitted light and combining both of them to determine the whiteness. It is an object of the present invention to provide a grain whiteness measurement device that can continuously measure the whiteness of grains that flow together.
以下、図面を参照して本発明の実施例を詳述す
る。 Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図の1は、内面を鏡とした積分球であり、
右側には検出部チヤンバー2が、その反対側に
は、集光レンズ3が設けられており、該集光レン
ズ3の左方には、光源ランプ4、熱線吸収フイル
ター5、単色光フイルター6が設けられ、光源ラ
ンプ4、熱線吸収フイルター5、単色光フイルタ
ー6及び集光レンズ3により光源装置が形成され
ている。7は入光シヤツターである。 1 in Figure 1 is an integrating sphere whose inner surface is a mirror,
A detection chamber 2 is provided on the right side, and a condensing lens 3 is provided on the opposite side, and a light source lamp 4, a heat ray absorption filter 5, and a monochromatic light filter 6 are provided on the left side of the condensing lens 3. A light source device is formed by a light source lamp 4, a heat ray absorption filter 5, a monochromatic light filter 6, and a condensing lens 3. 7 is a light incident shutter.
前記検出部チヤンバー2の光源装置の反対側に
は試料からの透過光を捕える透過光測定装置とな
る透過光受光素子8を設けて、該透過光受光素子
8を増幅器9に接続する。 A transmitted light receiving element 8 serving as a transmitted light measuring device for capturing transmitted light from a sample is provided on the opposite side of the detection chamber 2 from the light source device, and the transmitted light receiving element 8 is connected to an amplifier 9.
また、前記光源装置と透過光受光素子8とを結
ぶ線を横切る方向である積分球1の下部には、試
料からの反射光を捕える反射光測定装置となる反
射光受光素子8′を設け、該反射光受光素子8′を
増幅器9′に接続する。 Further, at the lower part of the integrating sphere 1 in the direction crossing the line connecting the light source device and the transmitted light receiving element 8, there is provided a reflected light receiving element 8', which serves as a reflected light measuring device that captures the reflected light from the sample. The reflected light receiving element 8' is connected to an amplifier 9'.
そして、前記両増幅器9,9′は各々アナログ
デジタル変換装置(以下A−D変換装置と略す。)
10,10′を介して演算装置11に接続し、さ
らに精白度デジタル表示計12に連結する。図
中、13は増幅器9′に接続された反射度デジタ
ル表示計、14は増幅器9に接続された透過度デ
ジタル表示計、15は定電圧装置である。 Both amplifiers 9 and 9' are analog-to-digital converters (hereinafter abbreviated as A-D converters).
It is connected to an arithmetic unit 11 via terminals 10 and 10', and further connected to a precision digital display meter 12. In the figure, 13 is a reflectance digital indicator connected to the amplifier 9', 14 is a transmittance digital indicator connected to the amplifier 9, and 15 is a constant voltage device.
また、16は、反射光受光素子暗電流の測定値
を記憶する記憶回路、17は、標柱20に設けた
基準白板の白度が基準白度となるよう増幅器9′
の増幅率を変化させ一致させる比較回路である。
なお、暗電流を取り除く減算回路は前記演算装置
11に含まれる。 Further, 16 is a memory circuit for storing the measured value of the dark current of the reflected light receiving element, and 17 is an amplifier 9' so that the whiteness of the reference white board provided on the marker post 20 becomes the reference whiteness.
This is a comparator circuit that changes the amplification factor of the two to make them match.
Note that the arithmetic unit 11 includes a subtraction circuit that removes dark current.
第2図及び第3図に示すように、試料が流れる
前記検出部チヤンバー2の積分球1側の面及びそ
の反対面は石英ガラス18で構成され、検出部チ
ヤンバー2の他の一側面には開口部を設け、該開
口部から試料流路内に、先端にクリーナー19を
取りつけた標柱20を出入自在に挿入する。21
は、標柱20の出入を案内するガイドである。 As shown in FIGS. 2 and 3, the surface of the detection chamber 2 on the integrating sphere 1 side and the opposite surface thereof, through which the sample flows, are made of quartz glass 18, and the other side of the detection chamber 2 is made of quartz glass 18. An opening is provided, and a marker 20 with a cleaner 19 attached to its tip is inserted into and out of the sample flow path through the opening. 21
is a guide for guiding the entry and exit of the marker pole 20.
前記標柱20の一側面には、精白度を測定する
場合、基準となる白度を設定するための基準白板
22が取りつけてあり、該標柱20はクリーナー
駆動モータ23により、試料流路に対して直角方
向に出入する。24,25は、リミツトスイツチ
であり、標柱20はその側面に設けた基準白板2
2が透過光受光素子8の前面に達するまで挿入さ
れるとリミツトスイツチ24の接片に当たり、ク
リーナー駆動モータ23を停止させ、クリーナー
駆動モータ23を逆転させて標柱20を後退さ
せ、標柱先端が前記開口部まで後退すると、リミ
ツトスイツチ25の接片に当たつてモータ23の
作動が止まる。 A reference white plate 22 is attached to one side of the marker column 20 for setting a standard whiteness when measuring whiteness, and the marker column 20 is moved relative to the sample flow path by a cleaner drive motor 23. Enter and exit at right angles. 24 and 25 are limit switches, and the marker 20 has a reference white board 2 provided on its side.
2 is inserted until it reaches the front surface of the transmitted light receiving element 8, it hits the contact piece of the limit switch 24, and the cleaner drive motor 23 is stopped, the cleaner drive motor 23 is reversed, the marker column 20 is retreated, and the tip of the marker is inserted into the opening. When the motor 23 is moved back to the position shown in FIG.
前記検出部チヤンバー2の上下口には、投入シ
ヤツター26及び排出シヤツター27をシヤツタ
ー駆動モータ(図示せず)により、開閉自在に設
ける。 A loading shutter 26 and a discharge shutter 27 are provided at the upper and lower openings of the detection chamber 2 so as to be openable and closable by a shutter drive motor (not shown).
投入シヤツター26の上部には試料投入タンク
28から振動フイーダ29を流れて選別された整
粒を投入する試料落下口30を設ける。前記試料
投入タンク28には試料が測定必要量投入される
とそれを感知し、クリーナー駆動モータ23を作
動させるレベル計である静電容量近接スイツチ3
1を設ける。また、振動フイーダ29には該振動
フイーダ29を振動させるバイブレーター32が
接続されており、該バイブレーター32はシヤツ
ター駆動モータに連結し、投入シヤツター26が
開かれると同時に動作するように構成する。33
は、振動フイーダ29に設けられている選別金
網、34は、未熟米、割米等の不良試料落下口で
ある。排出シヤツター27の下部には測定が終了
した試料を排出する排出路35及び受箱36を設
ける。 A sample drop port 30 is provided at the upper part of the input shutter 26 to input the sorted grains that have flowed from the sample input tank 28 through the vibrating feeder 29 and been sorted. When a required amount of sample is added to the sample input tank 28, a capacitance proximity switch 3, which is a level meter, senses this and operates the cleaner drive motor 23.
1 will be provided. Further, a vibrator 32 for vibrating the vibration feeder 29 is connected to the vibration feeder 29, and the vibrator 32 is connected to a shutter drive motor and is configured to operate at the same time as the input shutter 26 is opened. 33
is a sorting wire mesh provided on the vibrating feeder 29, and 34 is an opening for dropping defective samples such as immature rice and split rice. A discharge path 35 and a receiving box 36 are provided at the bottom of the discharge shutter 27 for discharging the sample after measurement.
次に本発明の作用に就いて説明する。 Next, the operation of the present invention will be explained.
投入タンク28に試料をいれて、測定必要量に
達すると、静電容量近接スイツチ31よりなるレ
ベル計が感知し、クリーナー駆動モータ23が動
作し、検出部チヤンバー2方向にクリーナー19
を押し込む。これにより、検出部チヤンバー2の
石英ガラス18面はクリーナー19で磨かれ付着
物が落される。標柱20が検出部チヤンバー2へ
挿入され、標柱20の側面に設けた基準白板22
が透過光受光素子8の前面に達するとリミツトス
イツチ24によりクリーナー駆動モータ23が停
止する。 When a sample is put into the input tank 28 and the amount required for measurement is reached, the level meter consisting of the capacitance proximity switch 31 senses it, and the cleaner drive motor 23 operates, causing the cleaner 19 to move in the direction of the detection chamber 2.
Push in. As a result, the surface of the quartz glass 18 of the detection chamber 2 is polished by the cleaner 19 to remove deposits. The marker post 20 is inserted into the detection chamber 2, and the reference white plate 22 provided on the side of the marker post 20
When the light reaches the front surface of the transmitted light receiving element 8, the limit switch 24 stops the cleaner drive motor 23.
数秒後、光をいれない状態で反射光受光素子暗
電流を測定する。暗電流値は記憶回路16に記憶
される。次にシヤツタ駆動モータを動作し、入光
シヤツタ7を開き光を標柱20の基準白板22へ
入射させる。比較回路17にて基準白板22の白
さの度合が基準白度として設定されるように増幅
器の増幅率をサーボ機構により、変化させ一致さ
せる。次に暗電流値を演算装置11の減算回路に
て取り除き、基準白度を調整する。 After a few seconds, the dark current of the reflected light receiving element is measured without light. The dark current value is stored in the storage circuit 16. Next, the shutter drive motor is operated to open the light entrance shutter 7 and allow the light to enter the reference white plate 22 of the marker post 20. The amplification factor of the amplifier is changed by a servo mechanism so that the degree of whiteness of the reference white board 22 is set as the reference whiteness in the comparison circuit 17 to match it. Next, the dark current value is removed by the subtraction circuit of the arithmetic unit 11, and the reference whiteness is adjusted.
このように、基準白度を設定したうえで次に試
料の精白度を計測する。 After setting the reference whiteness in this way, the whiteness of the sample is then measured.
まず、クリーナー駆動モータ23を逆転させ、
クリーナー19をチヤンバー2から引抜いてリミ
ツトスイツチ25により、前記クリーナー駆動モ
ータ23を停止させる。シヤツター駆動モータ
(図示せず)により投入シヤツタ26が開かれる
と同時にバイブレータ32が動作し、投入タンク
28から投下された試料が振動フイーダ29を流
れ始める。このとき、試料は、選別金網33上を
通過するため、未熟米や割米等の不良試料は金網
33よりこぼれ落ち、整粒だけが試料落下口30
に運び込まれる。整粒は、検出部チヤンバー2へ
高密度で蓄積し、やがて検出部チヤンバー2から
オーバーフローすると、投入シヤツター26が閉
じられ同時にバイブレータ32が停止する。 First, the cleaner drive motor 23 is reversed,
The cleaner 19 is pulled out from the chamber 2 and the limit switch 25 is used to stop the cleaner drive motor 23. At the same time as the input shutter 26 is opened by a shutter drive motor (not shown), the vibrator 32 is operated, and the sample dropped from the input tank 28 begins to flow through the vibrating feeder 29. At this time, since the sample passes over the sorting wire mesh 33, defective samples such as immature rice and split rice fall out of the wire mesh 33, and only the sorted grains are passed through the sample drop port 33.
carried to. The sorted particles accumulate in the detection chamber 2 at a high density, and when they eventually overflow from the detection chamber 2, the charging shutter 26 is closed and the vibrator 32 is stopped at the same time.
バイブレータが停止してから数秒後、反射光受
光素子8′と透過光受光素子8によつて精米の反
射率、透過率が測定され、演算装置11にて計算
され、精白度デジタル表示計12で精白度が表示
される。精白度は、次の式により表される。 A few seconds after the vibrator stops, the reflectance and transmittance of the milled rice are measured by the reflected light receiving element 8' and the transmitted light receiving element 8, calculated by the arithmetic unit 11, and calculated by the polishing degree digital indicator 12. The fineness level is displayed. The polishing degree is expressed by the following formula.
精白度=反射量+K・透過量、なお、Kは透過
度を白度の単位に換算するための係数(実験的に
求めた数値を用いる)である。 Brightness=reflection amount+K・transmission amount, where K is a coefficient (an experimentally determined value is used) for converting the transmittance into a unit of whiteness.
試料の精白度の測定が終了すると、シヤツター
駆動モータにより、排出シヤツター27が開き、
検出部チヤンバー2の中の試料は排出される。次
いで排出シヤツター27と入光シヤツター7が閉
じ、シヤツター駆動モータが停止し、1サイクル
の動作が終了する。 When the measurement of the purity of the sample is completed, the discharge shutter 27 is opened by the shutter drive motor.
The sample in the detection chamber 2 is discharged. Next, the discharge shutter 27 and the light input shutter 7 are closed, the shutter drive motor is stopped, and one cycle of operation is completed.
このとき、試料投入タンク28内の試料が必要
レベルに達しているとレベル計の静電容量近接ス
イツチ31が感知し、ふたたび上記サイクルが繰
り返される。 At this time, the capacitance proximity switch 31 of the level meter senses that the sample in the sample input tank 28 has reached the required level, and the above cycle is repeated again.
排出された試料は、器内に設けられた受箱36
に入る。また、投入タンク28及び振動フイーダ
29に残つた試料は排出用スイツチ(図示せず)
を押し下げることにより、排出される。 The discharged sample is placed in a receiving box 36 provided inside the vessel.
to go into. In addition, the sample remaining in the input tank 28 and the vibration feeder 29 is removed by a discharge switch (not shown).
It is ejected by pressing down.
以上に述べたように、本発明によると精白度が
光の反射度と透過度の和として表されるから、表
面が滑らかに搗精された精白米の場合もその精白
度をより正確に測定することができ、しかも、流
動する穀粒の精白度を刻々と測定することができ
る。 As described above, according to the present invention, since the degree of polishing is expressed as the sum of the reflectance and transmittance of light, the degree of polishing can be measured more accurately even in the case of polished rice with a smooth surface. Furthermore, the degree of polishing of flowing grains can be measured moment by moment.
また、投入タンクにレベル計を設け、このレベ
ル計とフイーダ、投入シヤツター及び排出シヤツ
ターを関連させたため、精米機等から投入タンク
へ排出される穀類の排出を特に制御しなくても、
連続して自動的にその穀類の精白度を測定するこ
とができる。 In addition, since a level meter is installed in the input tank and this level meter is connected to the feeder, input shutter, and discharge shutter, the discharge of grain from the rice mill etc. to the input tank is not particularly controlled.
The milling degree of the grain can be continuously and automatically measured.
第1図及び第2図は、本発明の実施例を示す説
明図、第3図は第2図の要部断面図である。
1……積分球、2……試料流路(検出部チヤン
バー)、20……標柱、26……投入シヤツター、
27……排出シヤツター、28……投入タンク、
29……振動フイーダ、30……試料落下口、3
1……静電容量近接スイツチ、32……バイブレ
ータ、35……試料排出路、36……受箱。
1 and 2 are explanatory diagrams showing an embodiment of the present invention, and FIG. 3 is a sectional view of a main part of FIG. 2. 1... Integrating sphere, 2... Sample flow path (detection section chamber), 20... Marker, 26... Injection shutter,
27... Discharge shutter, 28... Input tank,
29... Vibration feeder, 30... Sample drop port, 3
1... Capacitance proximity switch, 32... Vibrator, 35... Sample discharge path, 36... Receiving box.
Claims (1)
を介して透過光測定装置を設けると共に該積分球
の他部に反射光測定装置を設け、前記透過光測定
装置で測定した透過量に係数を掛けたものと前記
反射光測定装置で測定した反射量との和を計算す
る演算装置に前記透過光測定装置及び反射光測定
装置とそれぞれ連絡し、該試料流路の上方には、
投入シヤツターを介してフイーダの試料落下口を
臨ませると共に、更にそのフイーダの上方にはレ
ベル計を設けた投入タンクを位置させ、前記試料
流路の下方には、排出シヤツターを設け、投入タ
ンクのレベル計が試料の存在を感知すると前記投
入シヤツターが開かれフイーダが作動し、前記投
入シヤツターが閉じられるとフイーダが非作動と
なり、その後、前記排出シヤツターが開き、次い
で前記排出シヤツターが閉じるように、前記レベ
ル計、フイーダ、投入シヤツター及び排出シヤツ
ターを関連させたことを特徴とする連続式穀粒精
白度測定装置。1. A transmitted light measuring device is provided on the opposite side of the light source device across the integrating sphere via a sample flow path, and a reflected light measuring device is provided in the other part of the integrating sphere, and the amount of transmitted light measured by the transmitted light measuring device is The transmitted light measuring device and the reflected light measuring device are each connected to an arithmetic device that calculates the sum of the multiplied coefficient and the amount of reflection measured by the reflected light measuring device, and above the sample flow path,
The sample drop port of the feeder is faced through the input shutter, and an input tank equipped with a level gauge is located above the feeder.A discharge shutter is installed below the sample flow path, and the input tank is equipped with a level gauge. When the level meter senses the presence of a sample, the input shutter is opened and the feeder is activated; when the input shutter is closed, the feeder is deactivated; thereafter, the output shutter is opened, and then the output shutter is closed; A continuous grain whiteness measuring device characterized in that the level meter, feeder, input shutter, and discharge shutter are associated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17455281A JPS5877637A (en) | 1981-11-02 | 1981-11-02 | Continuous measuring apparatus of polishing degree of grain |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17455281A JPS5877637A (en) | 1981-11-02 | 1981-11-02 | Continuous measuring apparatus of polishing degree of grain |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5877637A JPS5877637A (en) | 1983-05-11 |
JPS6322540B2 true JPS6322540B2 (en) | 1988-05-12 |
Family
ID=15980546
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17455281A Granted JPS5877637A (en) | 1981-11-02 | 1981-11-02 | Continuous measuring apparatus of polishing degree of grain |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5877637A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01142441A (en) * | 1987-11-28 | 1989-06-05 | Satake Eng Co Ltd | Apparatus for measuring polishing degree of grain of rice |
US5256886A (en) * | 1991-04-30 | 1993-10-26 | E. I. Du Pont De Nemours And Company | Apparatus for optically detecting contamination in particles of low optical-loss material |
JP3379340B2 (en) * | 1996-07-01 | 2003-02-24 | 株式会社サタケ | Sample filling device in spectrometer |
-
1981
- 1981-11-02 JP JP17455281A patent/JPS5877637A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5877637A (en) | 1983-05-11 |
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