JPS6322252B2 - - Google Patents
Info
- Publication number
- JPS6322252B2 JPS6322252B2 JP56018543A JP1854381A JPS6322252B2 JP S6322252 B2 JPS6322252 B2 JP S6322252B2 JP 56018543 A JP56018543 A JP 56018543A JP 1854381 A JP1854381 A JP 1854381A JP S6322252 B2 JPS6322252 B2 JP S6322252B2
- Authority
- JP
- Japan
- Prior art keywords
- ion chamber
- casing
- external
- electrode
- sample gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 64
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims description 42
- 239000011734 sodium Substances 0.000 claims description 42
- 229910052708 sodium Inorganic materials 0.000 claims description 42
- 239000007789 gas Substances 0.000 claims description 36
- 230000005855 radiation Effects 0.000 claims description 16
- 239000012159 carrier gas Substances 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 7
- 230000001681 protective effect Effects 0.000 claims description 6
- 239000003822 epoxy resin Substances 0.000 claims description 2
- 229920000647 polyepoxide Polymers 0.000 claims description 2
- 229920002050 silicone resin Polymers 0.000 claims description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- 229910052786 argon Inorganic materials 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- 229910052695 Americium Inorganic materials 0.000 description 2
- 239000003570 air Substances 0.000 description 2
- LXQXZNRPTYVCNG-UHFFFAOYSA-N americium atom Chemical compound [Am] LXQXZNRPTYVCNG-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000000779 smoke Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Monitoring And Testing Of Nuclear Reactors (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Examining Or Testing Airtightness (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56018543A JPS57133331A (en) | 1981-02-10 | 1981-02-10 | Detector for sodium leak |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56018543A JPS57133331A (en) | 1981-02-10 | 1981-02-10 | Detector for sodium leak |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57133331A JPS57133331A (en) | 1982-08-18 |
| JPS6322252B2 true JPS6322252B2 (enrdf_load_stackoverflow) | 1988-05-11 |
Family
ID=11974543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56018543A Granted JPS57133331A (en) | 1981-02-10 | 1981-02-10 | Detector for sodium leak |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57133331A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010160062A (ja) * | 2009-01-08 | 2010-07-22 | Toshiba Corp | ナトリウム漏洩検出システム |
| JP2011203183A (ja) * | 2010-03-26 | 2011-10-13 | Toshiba Corp | ナトリウム漏えい検出装置及び検出方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5194737A (en) * | 1991-10-08 | 1993-03-16 | University Of California Patent, Trademark & Copyright Office | Single and double grid long-range alpha detectors |
-
1981
- 1981-02-10 JP JP56018543A patent/JPS57133331A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010160062A (ja) * | 2009-01-08 | 2010-07-22 | Toshiba Corp | ナトリウム漏洩検出システム |
| JP2011203183A (ja) * | 2010-03-26 | 2011-10-13 | Toshiba Corp | ナトリウム漏えい検出装置及び検出方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57133331A (en) | 1982-08-18 |
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