JPS63222245A - Defect inspector for mouth of bottle - Google Patents

Defect inspector for mouth of bottle

Info

Publication number
JPS63222245A
JPS63222245A JP5407887A JP5407887A JPS63222245A JP S63222245 A JPS63222245 A JP S63222245A JP 5407887 A JP5407887 A JP 5407887A JP 5407887 A JP5407887 A JP 5407887A JP S63222245 A JPS63222245 A JP S63222245A
Authority
JP
Japan
Prior art keywords
bottle
circuit
memory
image
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5407887A
Other languages
Japanese (ja)
Inventor
Yasuo Hongo
本郷 保夫
Toshio Hara
利雄 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHOKUHIN SANGYO ONRAIN SENSOR GIJUTSU KENKYU KUMIAI
Original Assignee
SHOKUHIN SANGYO ONRAIN SENSOR GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHOKUHIN SANGYO ONRAIN SENSOR GIJUTSU KENKYU KUMIAI filed Critical SHOKUHIN SANGYO ONRAIN SENSOR GIJUTSU KENKYU KUMIAI
Priority to JP5407887A priority Critical patent/JPS63222245A/en
Publication of JPS63222245A publication Critical patent/JPS63222245A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enable fast and highly accurate inspection, by expanding an inspection area of one screen with the development of a cylinder area of the inner surface of the mouth of a bottle to reduce the frequency of inputting images per bottle. CONSTITUTION:A bottle 1 is lighted with a lighting device 2 through a diffusion plate 3 to take the mouth part thereof with an image sensor 5 and an image signal is stored into a memory 6B through an A/D converter 6A. A development address generation circuit 6E performs a fast reading out of a memory 6B and writes an inner surface image developed into a memory 6F. An computing circuit 6G differentiates a development image circumferentially while being averaged axially to be written into memories 6H and 6I. A peak value detection circuit 6J reads out a differentiated value from the memory 6H to measure a value of a defect. An axial density value from the memory 6I is processed with an addition circuit 6K to detect circumferential periodicity. A decision circuit 6M judges a possible defect from the value of a defect in terms of the circumferentially differentiated value and the periodicity of the screw part at the bottle mouth.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、ねじ部をもつびんのびん口部にある欠けや
ビリ(ひゾの一種)等の欠陥を自動的に検査する検査装
置に関する。
[Detailed Description of the Invention] [Industrial Application Field] This invention relates to an inspection device that automatically inspects defects such as chips and burrs (a type of crack) in the mouth of a bottle with a threaded portion. .

〔従来の技術〕[Conventional technology]

びん口部の自動検査について、ねじのないびんについて
は種々行なわれているが、ねじのあるものについては殆
んど行なわれておらず、専ら人手に委ねられているのが
現状である。
Various automatic inspections of bottle openings have been carried out for bottles without screws, but almost none have been carried out for bottles with screws, and at present the inspection is left entirely to manual inspection.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

このため、人手によるものに共通した難点があり、高速
かつ高精度の検査ができないと云う問題がある。
For this reason, there is a problem common to manual inspections, namely that high-speed and high-precision inspections cannot be performed.

したがって、この発明は特にねじ部をもつびん口の検査
を高速かつ高精度に行なうことが可能な検査装置を提供
することを目的とする。
Accordingly, an object of the present invention is to provide an inspection device that can inspect bottle openings having threaded portions at high speed and with high precision.

〔問題点を解決するための手段〕[Means for solving problems]

ねじ部をもつびん口部を背面から拡散照明しつ\びん口
部を含む平面に対して所定の角度をもつ方向から撮像し
びん口部の2値化画像を取り出す操作をびん口一周分に
ついて順次行ない各々の2値化画像を処理してその欠陥
を検査すべく、びん口部の円筒状部分を真直ぐに延ばす
操作を行なう画像展開手段と、この展開画像を周方向に
微分して軸方向に延びる欠陥を検出する第1の検出手段
と、ねじ部の周期性を利用して周方向に延びる欠陥を検
出する第2の検出手段とを設け、雨検出手段からの出力
を総合して欠陥を検出する。
The operation of diffusing and illuminating a bottle mouth with a threaded part from the back and taking an image from a direction at a predetermined angle to the plane containing the bottle mouth and extracting a binarized image of the bottle mouth is performed for one circumference of the bottle mouth. In order to sequentially process each binarized image and inspect it for defects, there is an image developing means for straightening the cylindrical portion of the bottle mouth, and an image developing means for straightening the cylindrical portion of the bottle mouth, and for differentiating this developed image in the circumferential direction and for inspecting the defective image in the axial direction. A first detection means for detecting a defect extending in the circumferential direction and a second detection means for detecting a defect extending in the circumferential direction by utilizing the periodicity of the threaded portion are provided, and the outputs from the rain detection means are integrated to detect the defect. Detect.

〔作用〕[Effect]

びん口内面の円筒(楕円)領域を平面に展開して一画面
の検査領域を拡大すると−もに、1つのびんに対する画
像取り込み回数を減らすことにより、高速かつ高精度の
検査を可能にする。
By expanding the cylindrical (elliptical) area on the inner surface of the bottle mouth onto a plane to expand the inspection area on one screen, and reducing the number of times images are captured for one bottle, high-speed and highly accurate inspection is possible.

〔実施例〕〔Example〕

第1図はこの発明の実施例を示す構成図である。 FIG. 1 is a block diagram showing an embodiment of the present invention.

同図において、1はびん、2は照明器、3は拡散板、4
は回転機構、5はテレビカメラ等のイメージセンサ、6
は検査装置である。なお、検査装置6はアナログ/ディ
ジタル(A/D)変換器6A。
In the same figure, 1 is a bottle, 2 is an illuminator, 3 is a diffuser plate, and 4
is a rotation mechanism, 5 is an image sensor such as a television camera, 6 is
is an inspection device. Note that the inspection device 6 is an analog/digital (A/D) converter 6A.

イメージメモリ6B、位置検出回路6C1展開関数用プ
ロセツサ6D、展開アドレス発生回路6E、展開イメー
ジメモリ6F、演算回路6G、周方向微分値メモリ6H
1軸方向濃度値メモリ6■、ピーク値検出回路6J、周
方向加算回路6K、周期性検出回路6L、欠陥判定回路
6M、回転同期回路6Nおよび総合判定回路6P等より
構成される。
Image memory 6B, position detection circuit 6C1 expansion function processor 6D, expansion address generation circuit 6E, expansion image memory 6F, arithmetic circuit 6G, circumferential differential value memory 6H
It is composed of a uniaxial concentration value memory 6■, a peak value detection circuit 6J, a circumferential addition circuit 6K, a periodicity detection circuit 6L, a defect determination circuit 6M, a rotation synchronization circuit 6N, a comprehensive determination circuit 6P, and the like.

検査対象物となる透明または半透明のびん1を拡散板3
を通して照明器2で照明し、イメージセンサ5によりび
ん1の口部をI最像する。びん口部のビデオ画像はA/
D変換器6Aでディジタル画像に変換され、イメージメ
モリ6Bに格納される一方、びん口の画面上の位置が検
出回路6Cにて検出される。展開関数演算用プロセッサ
6Dは検査装置6を検査ラインにセツティングする際に
、びん口の内径DAとイメージセンサ5の俯角θ。
A transparent or translucent bottle 1 to be inspected is placed on a diffuser plate 3
The mouth of the bottle 1 is imaged by the image sensor 5. The video image of the bottle opening is A/
The image is converted into a digital image by the D converter 6A and stored in the image memory 6B, while the position of the bottle mouth on the screen is detected by the detection circuit 6C. When setting the inspection device 6 on the inspection line, the expansion function calculation processor 6D calculates the inner diameter DA of the bottle mouth and the depression angle θ of the image sensor 5.

より座標展開用変換テーブルを演算し、展開アドレス発
生回路6E内のメモリに格納しておく。展開アドレス発
生回路6Eはイメージメモリ6B内の内容を高速に読出
し、展開した内面画像を展開イメージメモリ6Fに書き
込む。演算回路6Gは展開画像を周方向に微分すると−
もに、軸方向に平均化する処理を行ない、周方向微分値
をメモリ6Hに、また軸方向局所平均濃度値をメモリ6
Iにそれぞれ書き込む。ピーク値検出回路6Jは周方向
微分値メモリ6Hから微分値を読み出し、欠陥量を計測
する。また、メモリ6■からの軸方向濃度値は加算回路
6Kにより周方向に加算され、検出回路6Lによって軸
方向の周期性が検出される。判定回路6Mは周方向微分
値による欠陥量と、びん口ねじ部の周期性を用いて欠陥
の有無を判定する。
A coordinate expansion conversion table is calculated and stored in the memory within the expansion address generation circuit 6E. The developed address generation circuit 6E reads the contents of the image memory 6B at high speed and writes the developed internal image into the developed image memory 6F. When the arithmetic circuit 6G differentiates the developed image in the circumferential direction, -
Also, the axial direction averaging process is performed, and the circumferential direction differential value is stored in the memory 6H, and the axial direction local average density value is stored in the memory 6H.
Write each in I. The peak value detection circuit 6J reads the differential value from the circumferential differential value memory 6H and measures the amount of defects. Further, the axial density values from the memory 6■ are added in the circumferential direction by an adding circuit 6K, and the periodicity in the axial direction is detected by a detection circuit 6L. The determination circuit 6M determines the presence or absence of a defect using the amount of defects based on the circumferential differential value and the periodicity of the bottle mouth thread.

以上により1画面についての欠陥判定が終了するので、
回転機構4と同期をとりつ一同期回路6Nで別位置の画
像を取り込んで上記と同様の処理を繰り返して全内周面
の欠陥検査を行ない、総合判定結果を判定回路6Pを介
して出力する。
With the above steps, defect determination for one screen is completed, so
While synchronizing with the rotating mechanism 4, a synchronization circuit 6N captures an image at a different position, repeating the same process as above to inspect the entire inner peripheral surface for defects, and outputting a comprehensive judgment result via the judgment circuit 6P. .

以下、第2図ないし第16図を参照して詳細に説明する
。なお、第2図はびん口部のディジタル画像例を示す説
明図、第3図はびん口位置検出回路の具体例を示すブロ
ック図、第4図はびん口位置検出原理を説明するための
原理図、第5図は展開アドレス発生回路の具体例を示す
ブロック図、第6図はびん口部の展開領域と展開用楕円
線群の関係を説明するための説明図、第7図はびん口部
の内面を展開した座標系を説明するための説明図、第8
図は展開関数メモリを示す概念図、第9図は展開イメー
ジメモリと展開イメージ微分回路の具体例を示すブロッ
ク図、第10図は3×3の大きさをもつ2次元局部メモ
リを説明するための説明図、第11図は微分演算子を示
す概念図、第12図は平均演算子を示す概念図、第13
図はピーク値検出回路の具体例を示すブロック図、第1
4図は微分値ヒストグラムと欠陥との関係を説明するた
めのグラフ、第15図は周方向加算回路の具体例を示す
ブロック図、第16図は濃度値の周方向加算結果を示す
ヒストグラムである。
A detailed explanation will be given below with reference to FIGS. 2 to 16. Furthermore, Fig. 2 is an explanatory diagram showing an example of a digital image of the bottle opening, Fig. 3 is a block diagram showing a specific example of a bottle opening position detection circuit, and Fig. 4 is a principle for explaining the principle of detecting the bottle opening position. Figure 5 is a block diagram showing a specific example of the expansion address generation circuit, Figure 6 is an explanatory diagram for explaining the relationship between the expansion area of the bottle opening and the group of elliptical lines for expansion, and Figure 7 is the bottle opening. Explanatory diagram for explaining the coordinate system developed for the inner surface of the part, No. 8
The figure is a conceptual diagram showing an expanded function memory, Figure 9 is a block diagram showing a specific example of an expanded image memory and an expanded image differential circuit, and Figure 10 is for explaining a two-dimensional local memory with a size of 3 x 3. , Figure 11 is a conceptual diagram showing the differential operator, Figure 12 is a conceptual diagram showing the average operator, and Figure 13 is a conceptual diagram showing the average operator.
The figure is a block diagram showing a specific example of a peak value detection circuit.
Fig. 4 is a graph for explaining the relationship between differential value histograms and defects, Fig. 15 is a block diagram showing a specific example of a circumferential addition circuit, and Fig. 16 is a histogram showing the result of circumferential addition of density values. .

イメージセンサ5を介して入力されるディジタル画像は
、第2図に符号11で示される如きびん口部の濃淡画像
であり、位置検出回路6Cはこのびん口内面の中心位置
を求める。位置検出回路6Cは、具体的には第3図の如
く2値化回路6C1゜X方向投影回路6C2,びん口中
心YA演算回路6C3,びん口側端検出回路6C4およ
び中心XA演算回路6C5等より構成される。こ\で、
いま2値化回路6C1にて2値化された画像が第4図に
符号13の如く示されるものとすると、まず投影回路6
C2で求めた投影長ヒストグラムからびんの先端近傍を
検出し、X方向投影長が例えばWA画素以上となるY座
標Y1から、EA画素およびE8画素だけ離れた位置に
それぞれ開始座標Y2と中心座標YAとを求める。次に
、びん口の検出位W、 ’y cでねじ口部の側端X、
とX2とを検出回路6C4により求め、その中心座標を
平均値((X++Xt)/2)として求めて中心位置1
4の座標(XA 、 YA )を決定する。
The digital image input via the image sensor 5 is a grayscale image of the bottle mouth as shown by reference numeral 11 in FIG. 2, and the position detection circuit 6C determines the center position of the inner surface of the bottle mouth. Specifically, the position detection circuit 6C includes a binarization circuit 6C1°X-direction projection circuit 6C2, a bottle mouth center YA calculation circuit 6C3, a bottle mouth side edge detection circuit 6C4, a center XA calculation circuit 6C5, etc. as shown in FIG. configured. Here,
Assuming that the image binarized by the binarization circuit 6C1 is shown as 13 in FIG.
The vicinity of the tip of the bottle is detected from the projected length histogram obtained in C2, and the starting coordinate Y2 and center coordinate YA are set at positions EA pixel and E8 pixel apart from the Y coordinate Y1 where the X direction projected length is, for example, WA pixel or more. and seek. Next, at the detection position W, 'y c of the bottle opening, the side edge X of the screw opening,
and X2 are determined by the detection circuit 6C4, and their center coordinates are determined as the average value ((X++Xt)/2) to determine the center position 1.
Determine the coordinates (XA, YA) of 4.

びん口内面の円筒面を展開する回路の具体例を第5図に
示す。すなわち、展開関数用プロセッサ6Dは設定時に
おけるびんの内径DA (mm)とセンサ5の俯角θ。
A specific example of a circuit for developing the cylindrical surface of the inner surface of the bottle mouth is shown in FIG. That is, the expansion function processor 6D uses the inner diameter DA (mm) of the bottle and the depression angle θ of the sensor 5 at the time of setting.

から、内面の楕円領域の長径Wと短径Hを決定する。つ
まり、換算値k〔画素/ m m )から、 W= h DA 、  H=W  sin  θ。
From this, the major axis W and minor axis H of the inner elliptical area are determined. That is, from the converted value k [pixels/mm], W=h DA , H=W sin θ.

なる関係式によりWとHを得る。展開関数演算用プロセ
ッサ6Dは、次式より楕円線群を求める。
W and H are obtained from the following relational expression. The expansion function calculation processor 6D obtains an elliptic line group from the following equation.

(i=o、1,2.・・・・・・、N、)こ\で、PA
は楕円線群のピッチを示す。楕円線群16の例を第6図
に示す。同図では楕円線E116 (i=o、1.2.
・・・・・・、N、)がPA画素分のピッチをもって、
展開領域15内で定義されている。なお、楕円線の数N
、は次式で求められる。
(i=o, 1, 2..., N,) here, PA
indicates the pitch of the elliptic line group. An example of the elliptic line group 16 is shown in FIG. In the figure, ellipse line E116 (i=o, 1.2.
......, N,) has a pitch of PA pixels,
It is defined within the development area 15. In addition, the number of elliptical lines N
, is determined by the following formula.

NE = (2H/PA)(()ニガウス記号)第6図
の各楕円線Eiを展開すると、第7図に示す展開面18
上では直線Li 21となる。また、第6図に示す画像
領域17上の点Q (X、 Y)を展開すると、第7図
に示す直線り、21の点Q(T、Z)となり、同様に楕
円領域15を展開すると領域20となる。このように、
展開座標系19は、びん口の内周方向Tと軸方向Zとか
らなり、XI = −W cos (j−Pm )Y、
=i−Pa−H−sin  (j−P++)(j=0.
1.・・・・・・、NF) なる関係が成立する。たtl、、P6は周方向のピッチ
(r a d)である。また、 であり、展開座標(T、Z)との関係は次式のとおりで
ある。
NE = (2H/PA) ((Nigauss symbol)) When each ellipse line Ei in Fig. 6 is developed, the development surface 18 shown in Fig. 7 is obtained.
At the top, it becomes a straight line Li 21. Furthermore, when the point Q (X, Y) on the image area 17 shown in Fig. 6 is expanded, it becomes the straight line 21 point Q (T, Z) shown in Fig. 7, and when the elliptical area 15 is similarly expanded. This becomes area 20. in this way,
The developed coordinate system 19 consists of the inner circumferential direction T and the axial direction Z of the bottle mouth, and XI = -W cos (j-Pm)Y,
=i-Pa-H-sin (j-P++) (j=0.
1. ......, NF) The following relationship holds true. tl, , P6 is the pitch (r a d) in the circumferential direction. Also, the relationship with the developed coordinates (T, Z) is as follows.

T=j  (j=o、1,2.・・・・・・、NF)Z
=i  (i=o、1,2.・・・・・・、NE)こ\
に、Nr  ’ P−s =πである。また、こ\では
PA=1画素とし、楕円線群の間引きはしないものとす
る。
T=j (j=o, 1, 2..., NF)Z
=i (i=o, 1, 2..., NE) \
Then, Nr'P-s = π. Also, in this case, PA=1 pixel, and no thinning of the elliptic line group is performed.

展開関数メモリ6E2には例えば第8図の如く、(T、
  Z”)に対応する(Xm 、 Ys )座標が記憶
されている。つまり、0≦T:5Nr、O≦Z≦N9に
対し、 XB =−W−cos  (T−Pa )Y、−Z  
−pA −H−5in  (T −P+  )なる式か
ら(X、、’y、)が求められ、これがメモリ6E2に
記憶される。たりし、 ならば、(Xs 、 Ys )は強制的に(0,0)と
して記憶する。このようにして、プロセッサ6Dは展開
関数をメモリ6E2に書き込んでおき、欠陥検査時には
メモリ6E2から(T、Z)および(xs 、y、)を
読み出すと−もに、位置ずれ量(XA、yA)を演算回
路6E1で補正する。
For example, as shown in FIG. 8, the expansion function memory 6E2 stores (T,
The (Xm, Ys) coordinates corresponding to 0≦T:5Nr, O≦Z≦N9 are stored.
-pA -H-5in (T-P+) (X,,'y,) is obtained from the equation and stored in the memory 6E2. If, then (Xs, Ys) is forcibly stored as (0,0). In this way, the processor 6D writes the expansion function into the memory 6E2, and reads out (T, Z) and (xs, y,) from the memory 6E2 during defect inspection, and also calculates the amount of positional deviation (XA, yA). ) is corrected by the arithmetic circuit 6E1.

XmXl +XA Y=Y、+YA そして、イメージメモリ6Bの内容をアドレス(x、y
)で読み出し、(T、Z)のアドレスでメモリ6Fに濃
度値F (X、Y)を書き込む。
XmXl +XA Y=Y, +YA Then, the contents of the image memory 6B are transferred to the address (x, y
) and write the density value F (X, Y) to the memory 6F at the address (T, Z).

こうして展開される画像G (T、  Z)について、
周(T)方向微分G、および軸(Z)方向平均G2を算
出する回路を第9図に示す。すなわち、イメージメモリ
6Bの濃度値F (X、Y)をメモリ6Fに展開した濃
度値G (T、  Z’)として記憶し、2次元局部メ
モリ6F2により、第10図に示すような3×3の2次
元局部領域22を形成する。
Regarding the image G (T, Z) developed in this way,
FIG. 9 shows a circuit for calculating the circumferential (T) direction differential G and the axis (Z) direction average G2. That is, the density value F (X, Y) of the image memory 6B is stored as the expanded density value G (T, Z') in the memory 6F, and the two-dimensional local memory 6F2 stores it as a 3×3 density value as shown in FIG. A two-dimensional local region 22 is formed.

2次元局部メモリ6F2の出力は微分回路6G1におい
て、第11図に示す如き周(T)方向微分オペレータ2
3によって微分される一方、平均値回路6G2において
第12図に示す如き平均値オペレータ24によって平均
化され、各演算結果GrとG2がメモリ6Hと61にそ
れぞれ記憶される。
The output of the two-dimensional local memory 6F2 is processed by a circumferential (T) direction differential operator 2 in a differentiating circuit 6G1 as shown in FIG.
3, and averaged by an average value operator 24 as shown in FIG. 12 in an average value circuit 6G2, and the respective calculation results Gr and G2 are stored in memories 6H and 61, respectively.

第13図に示すピーク値検出回路6Jは、周方向微分値
メモリ6Hの内容から欠陥の面積値HTを演算する。す
なわち、周方向微分値GTの絶対値1Grl毎にその画
素数を加算回路6J1で加算し、第14図の如きヒスト
グラム25を演算器6J2によって求める。そして、微
分値IGtlがGTAより小さい範囲で、ピーク値Aア
26を検出する。プロセッサ6J3はこのピーク値At
と、A7/2に相当するヒストグラム25上の点を求め
、ピーク値と結んだ直線の1Gtl軸と交わる点の微分
値をGTllとし、GTAとGTHのいずれか大きい方
よりも大きな微分値をもつ画素の総和Htを欠陥画素数
として、判定回路6Mへ出力する。
The peak value detection circuit 6J shown in FIG. 13 calculates the area value HT of the defect from the contents of the circumferential differential value memory 6H. That is, for every absolute value 1Grl of the circumferential differential value GT, the number of pixels is added by an adder circuit 6J1, and a histogram 25 as shown in FIG. 14 is obtained by an arithmetic unit 6J2. Then, a peak value A26 is detected in a range where the differential value IGtl is smaller than GTA. The processor 6J3 uses this peak value At
Then, find the point on the histogram 25 corresponding to A7/2, and let the differential value of the point that intersects the 1Gtl axis of the straight line connected to the peak value be GTll, which has a differential value larger than the larger of GTA and GTH. The total sum Ht of pixels is output to the determination circuit 6M as the number of defective pixels.

軸(Z)方向濃度値Gz (T、Z)については、第1
5図に示す周方向加算回路6Kにより濃度ヒストグラム
を求める。すなわち、軸方向アドレス発生回路6に2に
より周方向ごとの濃度値を読み出し、これを加算回路6
に1にて加算し、その結果ΣG2をメモリ6に3に格納
する。メモリ6に3に記憶されたヒストグラムの例を第
16図に符号27にて示す。つまり、びん口ねじ部には
同図に示すような周期的な山があるので、同図に示すね
じ部の範囲28で各ピーク位置ZI、Zt、Z3・・・
・・・を求め、周期性検出回路6LによってピークZ+
 、Zt、Z3.・・・・・・のピッチを次式の如くチ
ェックし、P2のピッチに近ければ周期性は正しいもの
とし、そうでなければピッチが狂っているか、または欠
陥とする。
Regarding the axis (Z) direction concentration value Gz (T, Z), the first
A density histogram is obtained by a circumferential addition circuit 6K shown in FIG. That is, the density value for each circumferential direction is read out to the axial address generation circuit 6 by 2, and this is added to the addition circuit 6.
1 is added to , and the result ΣG2 is stored in the memory 6 at 3. An example of the histogram stored in memory 6 at 3 is shown at 27 in FIG. In other words, since the bottle opening thread has periodic peaks as shown in the same figure, each peak position ZI, Zt, Z3...
..., and the periodicity detection circuit 6L detects the peak Z+
, Zt, Z3. The pitch of .

lZz  Z+  Pzl<δ +23  Zt  Pzl<δ こ\に、δはピッチ偏差の上限値を示す。lZz Z+ Pzl<δ +23 Zt Pzl<δ Here, δ indicates the upper limit value of the pitch deviation.

以上のことから、周方向微分値メモリ6Hおよびピーク
値検出回路6J等により、主として軸方向に長さをもつ
欠陥が検出される一方、軸方向濃度値メモリ61.周方
向加算回路6におよび周期性検出回路6L等により、主
として周方向に長さをもつ欠陥の検出がなされることか
ら、たとえびん口部にねじがあるものについても欠陥を
検出することが可能になる。
From the above, while defects having lengths mainly in the axial direction are detected by the circumferential differential value memory 6H, the peak value detection circuit 6J, etc., the axial density value memory 61. Since defects having a length in the circumferential direction are mainly detected by the circumferential addition circuit 6 and the periodicity detection circuit 6L, it is possible to detect defects even in bottles with screws at the mouth. become.

なお、上記では主としてねじ部があるものについて説明
したが、この発明はねじ部を持たないものについても同
様に適用することができるのは勿論である。
In addition, although the above explanation has mainly been given to a device having a threaded portion, it goes without saying that the present invention can be similarly applied to a device that does not have a threaded portion.

(発明の効果〕 この発明によれば、びん口部を斜め方向から撮像するこ
とにより、ねじ部等を画像として簡単に捉えることがで
き、かつびん口内部を展開゛関数テーブルで展開するこ
とにより、変換画像を水平な縞模様にすることができ、
比較的簡単な画像処理により欠陥が検出可能となるだけ
でなく、検査領域が広くとれることから少ない邊像回数
で全内周を検査することができる。また、周方向の微分
を行ない、微分ヒストグラムから決まる濃度値以上の画
素数をもって欠陥を検出するようにしたので検出精度が
向上すると\もに、軸方向の縞模様の周期性をチェック
することにより、ねじ部がある場合でも欠陥を検出する
ことが可能になる。
(Effects of the Invention) According to the present invention, by taking an image of the bottle opening from an oblique direction, it is possible to easily capture the threaded portion, etc. as an image, and by developing the inside of the bottle opening using an expansion function table. , the transformed image can be made into horizontal stripes,
Not only can defects be detected through relatively simple image processing, but since the inspection area can be widened, the entire inner periphery can be inspected with fewer side images. In addition, by performing differentiation in the circumferential direction and detecting defects when the number of pixels is greater than the density value determined from the differential histogram, detection accuracy is improved. , it becomes possible to detect defects even if there is a threaded part.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の実施例を示す構成図、第2図はびん
口部のディジタル画像例を示す説明図、第3図はびん口
位置検出回路の具体例を示すブロック図、第4図はびん
口位置検出原理を説明するための原理図、第5図は展開
アドレス発生回路の具体例を示すブロック図、第6図は
びん口部の展開領域と展開用楕円線群の関係を説明する
ための説明図、第7図はびん口部の内面を展開した座標
系を説明するための説明図、第8図は展開関数メモリを
示す概念図、第9図は展開イメージメモリと展開イメー
ジ微分回路の具体例を示すブロック図、第10図は3×
3の大きさをもつ2次元局部メモリを説明するための説
明図、第11図は微分演算子を示す概念図、第12図は
平均演算子を示す概念図、第13図はピーク値検出回路
の具体例を示すブロック図、第14図は微分値ヒストグ
ラムと欠陥との関係を説明するためのグラフ、第15図
は周方向加算回路の具体例を示すブロック図、第16図
は濃度値の周方向加算結果を示すヒストグラムである。 符号説明 ■・・・びん、2・・・照明器、3・・・拡散板、4・
・・回転機構、5・・・イメージセンサ、6・・・検査
装置、6A・・・A/D変換器、6B、6E2.6F、
6F1゜6F2,6H,61,6に3・・・メモリ、6
C・・・位置検出回路、6C1・・・2値化回路、6C
2・・・X方向投影回路、6C3・・・YA演算回路、
6C4・・・側端検出回路、6C5・・・島演算回路、
6D−・・・展開関数用プロセッサ、6E・・・展開ア
ドレス発生回路、6E1・・・位置ずれ補正演算回路、
6G・・・演算回路、6G1・・・微分回路、6G2・
・・平均値回路、6J1・・・周方向微分値加算回路、
6J2・・・ヒストグラム演算器、6J3・・・ピーク
値画素数演算プロセッサ、6K・・・周方向加算回路、
6に1・・・加算回路、6に2・・・軸方向アドレス発
生回路、6L・・・周期性検出回路、6M・・・欠陥判
定回路、6N・・・回転同期回路、6P・・・総合判定
回路、11・・・びん口部、12・・・撮像画面、13
・・・びん口部2値化パターン、14・・・びん口中心
位置、15・・・楕円展開領域、16・・・展開用楕円
線群、17・・・画像領域、18・・・展開面、19・
・・展開鹿標系、20・・・展開領域、21・・・展開
線群、22・・・2次元局部メモリ領域、23・・・微
分演算子、24・・・平均演算子、25・・・微分値ヒ
ストグラム、26・・・ピーク値、27・・・濃度値ヒ
ストグラム、28・・・周期的領域。 代理人 弁理士 並 木 昭 夫 代理人 弁理士 松 崎   清 Y 第3図 C 第4図 第5図 6、E 第6図 第7図 7114図
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is an explanatory diagram showing an example of a digital image of a bottle opening, FIG. 3 is a block diagram showing a specific example of a bottle opening position detection circuit, and FIG. 4 5 is a block diagram showing a specific example of an expansion address generation circuit. FIG. 6 is a diagram explaining the relationship between the expansion area of the bottle opening and the group of elliptical lines for expansion. Figure 7 is an explanatory diagram to explain the coordinate system of the inner surface of the bottle opening, Figure 8 is a conceptual diagram showing the expansion function memory, and Figure 9 is the expansion image memory and expansion image. A block diagram showing a specific example of a differential circuit, Figure 10 is 3×
11 is a conceptual diagram showing a differential operator, Figure 12 is a conceptual diagram showing an average operator, and Figure 13 is a peak value detection circuit. 14 is a graph for explaining the relationship between the differential value histogram and defects, FIG. 15 is a block diagram showing a specific example of the circumferential addition circuit, and FIG. 16 is a graph for explaining the relationship between the differential value histogram and defects. It is a histogram showing the circumferential direction addition result. Code explanation ■... Bottle, 2... Illuminator, 3... Diffusion plate, 4...
...Rotation mechanism, 5... Image sensor, 6... Inspection device, 6A... A/D converter, 6B, 6E2.6F,
6F1゜6F2, 6H, 61, 6 to 3...Memory, 6
C...Position detection circuit, 6C1...Binarization circuit, 6C
2...X direction projection circuit, 6C3...YA calculation circuit,
6C4...Side edge detection circuit, 6C5...Island calculation circuit,
6D-... Processor for expansion function, 6E... Expansion address generation circuit, 6E1... Position shift correction calculation circuit,
6G... Arithmetic circuit, 6G1... Differential circuit, 6G2...
...Average value circuit, 6J1...Circumferential differential value addition circuit,
6J2... Histogram calculator, 6J3... Peak value pixel number calculation processor, 6K... Circumferential addition circuit,
6 to 1... Addition circuit, 6 to 2... Axial address generation circuit, 6L... Periodicity detection circuit, 6M... Defect determination circuit, 6N... Rotation synchronization circuit, 6P... Comprehensive judgment circuit, 11... Bottle opening, 12... Imaging screen, 13
... Bottle mouth binarization pattern, 14... Bottle mouth center position, 15... Ellipse development area, 16... Ellipse line group for development, 17... Image area, 18... Development Face, 19・
... Expanded marker system, 20... Expanded area, 21... Expanded line group, 22... Two-dimensional local memory area, 23... Differential operator, 24... Average operator, 25... ... Differential value histogram, 26 ... Peak value, 27 ... Density value histogram, 28 ... Periodic region. Agent Patent Attorney Akio Namiki Agent Patent Attorney Kiyoshi Matsuzaki Figure 3 C Figure 4 Figure 5 6, E Figure 6 Figure 7 7114

Claims (1)

【特許請求の範囲】 ねじ部をもつびんの口部を背面から拡散照明しつゝびん
口部を含む平面に対して所定の角度をもつ方向から撮像
し少なくともびん口部の2値化画像を取り出す操作をび
ん口一周分について順次行ない各々の2値化画像を処理
してその欠陥を検査する検査装置であって、 前記びん口部の円筒状部分を真直ぐに延ばす操作を行な
う画像展開手段と、 該展開画像を周方向に微分して軸方向に延びる欠陥を検
出する第1の検出手段と、 前記ねじ部の周期性を利用して周方向に延びる欠陥を検
出する第2の検出手段と、 を備え、該第1、第2検出手段からの出力を総合して欠
陥を検出することを特徴とするびん口部の欠陥検査装置
[Scope of Claims] The mouth of a bottle having a threaded portion is diffusely illuminated from the back, and an image is taken from a direction at a predetermined angle with respect to a plane containing the bottle mouth, and at least a binarized image of the bottle mouth is obtained. An inspection device that sequentially performs a take-out operation around one circumference of a bottle mouth, processes each binarized image, and inspects the image for defects; , a first detection means for detecting a defect extending in the axial direction by differentiating the developed image in the circumferential direction; and a second detection means for detecting a defect extending in the circumferential direction by utilizing the periodicity of the threaded portion. , A defect inspection device for a bottle opening is characterized in that it detects a defect by integrating the outputs from the first and second detection means.
JP5407887A 1987-03-11 1987-03-11 Defect inspector for mouth of bottle Pending JPS63222245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5407887A JPS63222245A (en) 1987-03-11 1987-03-11 Defect inspector for mouth of bottle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5407887A JPS63222245A (en) 1987-03-11 1987-03-11 Defect inspector for mouth of bottle

Publications (1)

Publication Number Publication Date
JPS63222245A true JPS63222245A (en) 1988-09-16

Family

ID=12960575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5407887A Pending JPS63222245A (en) 1987-03-11 1987-03-11 Defect inspector for mouth of bottle

Country Status (1)

Country Link
JP (1) JPS63222245A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03500092A (en) * 1988-09-16 1991-01-10 オーエンス‐イリノイ・グラス・コンテナー・インコーポレーテツド Inspection of container mouth
JPH04231854A (en) * 1990-05-14 1992-08-20 Owens Brockway Glass Container Inc Inspection for crack in container
JP2008107347A (en) * 2006-10-23 2008-05-08 Emhart Glass Sa Device for inspecting glass container
JP2008275618A (en) * 2007-05-02 2008-11-13 Emhart Glass Sa Instrument for inspecting glass containers
US7495326B2 (en) 2002-10-22 2009-02-24 Unitive International Limited Stacked electronic structures including offset substrates
JP2011252746A (en) * 2010-06-01 2011-12-15 Nippon Telegr & Teleph Corp <Ntt> Device, method and program for detecting cable position
US8674494B2 (en) 2011-08-31 2014-03-18 Samsung Electronics Co., Ltd. Semiconductor package having supporting plate and method of forming the same
JP2015036648A (en) * 2013-08-13 2015-02-23 東洋ガラス株式会社 Apparatus and method for measuring boundary step difference
JP2016223883A (en) * 2015-05-29 2016-12-28 日本電気硝子株式会社 Inspection method of glass tube

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03500092A (en) * 1988-09-16 1991-01-10 オーエンス‐イリノイ・グラス・コンテナー・インコーポレーテツド Inspection of container mouth
JPH04231854A (en) * 1990-05-14 1992-08-20 Owens Brockway Glass Container Inc Inspection for crack in container
US7495326B2 (en) 2002-10-22 2009-02-24 Unitive International Limited Stacked electronic structures including offset substrates
JP2008107347A (en) * 2006-10-23 2008-05-08 Emhart Glass Sa Device for inspecting glass container
JP2008275618A (en) * 2007-05-02 2008-11-13 Emhart Glass Sa Instrument for inspecting glass containers
JP2011252746A (en) * 2010-06-01 2011-12-15 Nippon Telegr & Teleph Corp <Ntt> Device, method and program for detecting cable position
US8674494B2 (en) 2011-08-31 2014-03-18 Samsung Electronics Co., Ltd. Semiconductor package having supporting plate and method of forming the same
US9412720B2 (en) 2011-08-31 2016-08-09 Samsung Electronics Co., Ltd. Semiconductor package having supporting plate and method of forming the same
JP2015036648A (en) * 2013-08-13 2015-02-23 東洋ガラス株式会社 Apparatus and method for measuring boundary step difference
JP2016223883A (en) * 2015-05-29 2016-12-28 日本電気硝子株式会社 Inspection method of glass tube

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