JPS63211627A - Surface treatment lising chemical - Google Patents

Surface treatment lising chemical

Info

Publication number
JPS63211627A
JPS63211627A JP4500687A JP4500687A JPS63211627A JP S63211627 A JPS63211627 A JP S63211627A JP 4500687 A JP4500687 A JP 4500687A JP 4500687 A JP4500687 A JP 4500687A JP S63211627 A JPS63211627 A JP S63211627A
Authority
JP
Japan
Prior art keywords
substrate
treated
chemicals
chemical solution
processed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4500687A
Other languages
Japanese (ja)
Inventor
Shinya Kato
真也 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4500687A priority Critical patent/JPS63211627A/en
Publication of JPS63211627A publication Critical patent/JPS63211627A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make throughput speed uniform, and to improve the dimensional accuracy of film thickness, etc., formed onto a substrate to be treated by simultaneously supplying the whole surface of the substrate to be treated with chemicals by using a liquid supply nozzle to which a thin-film having a fine hole is shaped. CONSTITUTION:Chemicals 3 are held into a thin-film 2 having fine holes 2a in a chemical supply nozzle 1, the chemical supply nozzle 1 is brought near to a substrate to be treated 4 under the state in which chemicals 3 exude onto the surface by surface tension, chemicals 3 are brought into contact with the substrate to be treated 4, and the whole surface of the substrate to be treated 4 is supplied simultaneously with chemicals 3. The chemical supply nozzle 1 is pulled up by several mm and separated from the substrate to be treated 4 until chemicals 3 and the substrate to be treated 4 are not brought into contact from the state, the substrate 4 is developed, a spin chuck 5 is turned and used chemicals are flung away, and the substrate to be treated 4 is supplied with chemicals 3 as mentioned above. Accordingly, since the whole surface of the substrate to be treated 4 can be fed simultaneously with chemicals 3 by the fine holes 2a in the thin-film 2 shaped to the chemical supply nozzle 1, chemicals are distributed uniformly, thus improving the dimensional accuracy of film thickness formed to the substrate to be treated 4.

Description

【発明の詳細な説明】 〔概要〕 被処理基板より面積が大きな、薬液を透過させ得る微細
孔を備えた薄膜を透して、薬液を被処理基板の全面に同
時に供給して、この被処理基板の表面処理を行い、被処
理基板の表面の処理速度を均一にし、被処理基板に形成
する膜厚等の寸法精度を良好にする薬液による表面処理
方法。
[Detailed Description of the Invention] [Summary] A chemical solution is simultaneously supplied to the entire surface of a substrate to be processed through a thin film having a larger area than the substrate to be processed and having micropores through which the chemical solution can pass. A surface treatment method using a chemical solution that performs surface treatment on a substrate, uniformizes the processing speed on the surface of the substrate to be processed, and improves dimensional accuracy such as film thickness formed on the substrate to be processed.

〔産業上の利用分野〕[Industrial application field]

本発明は、半導体装置の製造方法に係り、特に薬液によ
る表面処理方法の改良に関するものである。
The present invention relates to a method for manufacturing a semiconductor device, and particularly to an improvement in a surface treatment method using a chemical solution.

半導体装置の製造工程において、被処理基板の表面を薬
液により処理することは一般によく行われているが、薬
液の供給方法によっては被処理基板の表面の処理速度が
不均一になり、被処理基板に形成する膜厚等の寸法精度
が悪くなることが屡々起こっている。
In the manufacturing process of semiconductor devices, it is common practice to treat the surface of the substrate to be processed with a chemical solution. It often happens that the dimensional accuracy of the film formed on the substrate becomes poor.

このような状況から処理速度を均一にし、被処理基板に
形成する膜厚等の寸法精度を良好にすることが可能な薬
液による表面処理方法が要望されている。
Under these circumstances, there is a need for a surface treatment method using a chemical solution that can uniformize the processing speed and improve the dimensional accuracy of the film formed on the substrate to be treated.

〔従来の技術〕[Conventional technology]

従来の薬液による表面処理方法の一つはスプレ一方式で
、第2図(a)に示すように被処理基板4をスピンチャ
ック5に載置し、薬液スプレーノズル11から処理に使
用する薬液を噴出させて霧状にして被処理基板4の表面
に付着させて処理を行い、処理後にスピンチャック5を
回転しながら、リンス液スプレーノズル6よりリンス液
を噴出させて被処理基板4の表面を洗浄するものである
One of the conventional surface treatment methods using a chemical liquid is a spray method, in which a substrate 4 to be processed is placed on a spin chuck 5, and a chemical liquid used for processing is applied from a chemical liquid spray nozzle 11, as shown in FIG. 2(a). Processing is performed by spouting the spray into a mist and adhering it to the surface of the substrate 4 to be processed, and after the processing, while rotating the spin chuck 5, the rinsing liquid is sprayed from the rinsing liquid spray nozzle 6 to cover the surface of the substrate 4 to be processed. It is something to be cleaned.

又、他の一つはノズル滴下方式で、第2図(b)に示す
ように薬液滴下ノズル21から薬液を滴下噴出させて被
処理基板4の表面に付着させて処理を行い、処理後にス
ピンチャック5を回転しながら、リンス液スプレーノズ
ル6よりリンス液を噴出させて被処理基板4の表面を洗
浄するものである。
The other method is a nozzle dripping method, in which the chemical solution is sprayed dropwise from the chemical solution dripping nozzle 21 and applied to the surface of the substrate 4 to be processed, as shown in FIG. 2(b). While rotating the chuck 5, a rinsing liquid is sprayed from a rinsing liquid spray nozzle 6 to clean the surface of the substrate 4 to be processed.

〔発明が解決しようとする問題点3 以上説明の従来の薬液による表面処理方法で問題となる
のは、薬液の使用量が非常に多くなることと、スプレ一
方式では周辺部の方が処理液の置換が速く、中心部では
処理に使用した後の処理液の排出が周辺部の処理液に妨
げられて悪くなり、逆に、ノズル滴下方式では中心部に
常に新しい液が供給され、周辺部には使用後の液が供給
されるため、被処理基板に供給される薬液の分布にバラ
ツキが生じて処理速度が不均一になり、被処理基板に形
成する膜厚等の寸法精度が悪くなることである。
[Problem to be Solved by the Invention 3] Problems with the conventional surface treatment method using a chemical as described above are that the amount of the chemical used is extremely large, and in the spray method, the treatment liquid is concentrated in the peripheral area. Replacement of liquid is fast, and in the center, the discharge of the processing liquid after being used for processing is blocked by the processing liquid in the periphery, making it difficult to discharge.On the other hand, with the nozzle dripping method, new liquid is always supplied to the center, and the discharge of the processing liquid after being used for processing is impaired. Since used liquid is supplied to the substrate, variations occur in the distribution of the chemical solution supplied to the substrate to be processed, resulting in uneven processing speed and poor dimensional accuracy such as the thickness of the film formed on the substrate to be processed. That's true.

本発明は以上のような状況から簡単且つ安価に実施可能
な薬液による表面処理方法の提供を目的としたものであ
る。
In view of the above-mentioned circumstances, the present invention aims to provide a surface treatment method using a chemical solution that can be carried out simply and at low cost.

〔問題点を解決するための手段〕[Means for solving problems]

上記問題点は、被処理基板より面積が大きい、薬液を透
過させ得る微細孔を備えた薄膜を透して、。
The above-mentioned problem is that the chemical solution passes through a thin film that has a larger area than the substrate to be processed and has micropores that allow the chemical solution to pass through.

薬液を被処理基板の全面に同時に供給して、この被処理
基板の表面処理を行う本発明の薬液による表面処理方法
によって解決される。
This problem is solved by the surface treatment method using a chemical solution of the present invention, in which a chemical solution is simultaneously supplied to the entire surface of the substrate to be processed, and the surface of the substrate to be processed is treated.

〔作用〕[Effect]

即ち本発明においては、微細孔を備えた被処理基板より
も大きな薄膜内に薬液を表面張力によって保持し、薬液
が微細孔より滲み出している状態の薄膜を被処理基板に
近接して薬液を被処理基板に接触することにより、薬液
を被処理基板の表面の全面に同時に供給することができ
るので、被処理基板の全面への薬液の同時供給が可能と
なり、処理速度が均一になり、被処理基板に形成する膜
厚等の寸法精度を良好にすることが可能となる。
That is, in the present invention, a chemical solution is held in a thin film having micropores that is larger than the substrate to be processed by surface tension, and the thin film with the chemical solution seeping out from the micropores is placed close to the substrate to be processed. By contacting the substrate to be processed, the chemical solution can be simultaneously supplied to the entire surface of the substrate to be processed. This makes it possible to simultaneously supply the chemical solution to the entire surface of the substrate to be processed, making the processing speed uniform and reducing the It becomes possible to improve the dimensional accuracy of the film thickness and the like formed on the processing substrate.

〔実施例〕〔Example〕

以下第1図について本発明の一実施例を現像の場合につ
いて説明する。
An embodiment of the present invention will be described below with reference to FIG. 1 in the case of development.

第1図(a)に示すように薬液供給ノズル1の微細孔2
aを備えた薄膜2内に薬液3を保持し、薬液3が表面張
力によって表面に滲み出した状態で薬液供給ノズル1を
被処理基板4に近接させ、薬液3を被処理基板4に接触
させて、薬液3を被処理基板4の全面に同時に供給して
いる。
As shown in FIG. 1(a), the fine holes 2 of the chemical liquid supply nozzle 1
A chemical solution 3 is held in the thin film 2 having a surface tension, and the chemical solution supply nozzle 1 is brought close to the substrate to be processed 4 with the chemical solution 3 oozing out to the surface due to surface tension, and the chemical solution 3 is brought into contact with the substrate to be processed 4. The chemical solution 3 is simultaneously supplied to the entire surface of the substrate 4 to be processed.

この状態から薬液3と被処理基板4が接触しなくなるま
で、薬液供給ノズルlを数龍引き上げて被処理基板4か
ら離し、現像が行われるのを待って後、スピンチャック
5を回転して使用した薬液を振り飛ばし、再び上記のよ
うに薬液3を被処理基板4に供給する。
From this state, until the chemical solution 3 and the substrate to be processed 4 are no longer in contact with each other, lift the chemical solution supply nozzle l until it is separated from the substrate to be processed 4, wait for development to occur, and then rotate the spin chuck 5 to use it. The chemical solution 3 is shaken off, and the chemical solution 3 is again supplied to the substrate 4 to be processed as described above.

このような動作を所要の回数行った後、薬液供給ノズル
1を高く引き上げて、スピンチャック5を回転しながら
リンス液スプレーノズル6からリンス液を噴出し、被処
理基板4の表面を洗浄して処理を終了する。
After performing this operation a required number of times, the chemical supply nozzle 1 is pulled up high, and while the spin chuck 5 is rotated, the rinsing liquid is spouted from the rinsing liquid spray nozzle 6 to clean the surface of the substrate 4 to be processed. Finish the process.

又、使用済の薬液3の除去及び新たな薬液3の供給方法
として、上記の被処理基板4表面の全面への薬液3の供
給状態に薬液供給ノズル1を保持し、薬液3の除去及び
供給を薬液供給ノズル1内への加圧による微細孔2aか
らの薬液3の噴出により行うことも可能である。
In addition, as a method for removing the used chemical solution 3 and supplying a new chemical solution 3, the chemical solution supply nozzle 1 is held in a state where the chemical solution 3 is supplied to the entire surface of the substrate 4 to be processed, and the chemical solution 3 is removed and supplied. It is also possible to perform this by ejecting the chemical solution 3 from the micropores 2a by pressurizing the inside of the chemical solution supply nozzle 1.

このように薬液供給ノズル1に設けた薄膜2の微細孔2
aにより被処理基板4の全面に同時に薬液3の供給が可
能となるので、薬液の分布が均一になり、被処理基Fi
4の全面を同じ条件で現像することができるので、被処
理基板4に形成する膜厚の寸法精度を良好にすることが
可能となる。
The fine holes 2 of the thin film 2 provided in the chemical solution supply nozzle 1 in this way
Since the chemical solution 3 can be simultaneously supplied to the entire surface of the substrate 4 to be processed, the distribution of the chemical solution becomes uniform, and the substrate to be processed Fi
Since the entire surface of the substrate 4 can be developed under the same conditions, it is possible to improve the dimensional accuracy of the film thickness formed on the substrate 4 to be processed.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、極めて簡車な構造
の微細孔を備えた薄膜を設けた液体供給ノズルを用いて
薬液を被処理基板の全面に同時に供給することにより、
処理速度が均一になり、被処理基板に形成する膜厚等の
寸法精度を良好にすることが可能となる利点があり、著
しい品質向上の効果が期待でき工業的には極めて有用な
ものである。
As explained above, according to the present invention, by simultaneously supplying a chemical solution to the entire surface of a substrate to be processed using a liquid supply nozzle provided with a thin film with micropores having an extremely simple structure,
It has the advantage of making the processing speed uniform and making it possible to improve the dimensional accuracy of the film formed on the substrate to be processed, such as the thickness of the film, so it is expected to have a significant quality improvement effect and is extremely useful industrially. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による一実施例を示す側断面図、第2図
は従来の薬液による表面処理方法を示す側断面図、  
  である。 図において、 1は薬液供給ノズル、  2は薄膜、 2aは微細孔、     3は薬液、 4は被処理基板、    5はスピンチャック、6はリ
ンス液スプレーノズル、 薬液の供給 +8+ リンス液による洗浄 (bl 本発明による一実施例を示す側面図 第1図
FIG. 1 is a side sectional view showing an embodiment of the present invention, FIG. 2 is a side sectional view showing a conventional surface treatment method using a chemical solution,
It is. In the figure, 1 is a chemical liquid supply nozzle, 2 is a thin film, 2a is a fine hole, 3 is a chemical liquid, 4 is a substrate to be processed, 5 is a spin chuck, 6 is a rinse liquid spray nozzle, chemical liquid supply +8+ cleaning with rinse liquid (bl FIG. 1 is a side view showing one embodiment of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 被処理基板(4)より大なる面積を有し、薬液を透過さ
せ得る微細孔(2a)を備えた薄膜(2)を透して、薬
液(3)を前記被処理基板(4)の全面に同時に供給し
て、前記被処理基板(4)の表面処理を行うことを特徴
とする薬液による表面処理方法。
The chemical solution (3) is applied to the entire surface of the substrate to be processed (4) through a thin film (2) having a larger area than the substrate to be processed (4) and having micropores (2a) through which the chemical solution can pass. A surface treatment method using a chemical solution, characterized in that the surface treatment of the substrate (4) to be treated is performed by simultaneously supplying a chemical solution to the substrate (4).
JP4500687A 1987-02-26 1987-02-26 Surface treatment lising chemical Pending JPS63211627A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4500687A JPS63211627A (en) 1987-02-26 1987-02-26 Surface treatment lising chemical

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4500687A JPS63211627A (en) 1987-02-26 1987-02-26 Surface treatment lising chemical

Publications (1)

Publication Number Publication Date
JPS63211627A true JPS63211627A (en) 1988-09-02

Family

ID=12707292

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4500687A Pending JPS63211627A (en) 1987-02-26 1987-02-26 Surface treatment lising chemical

Country Status (1)

Country Link
JP (1) JPS63211627A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011066301A (en) * 2009-09-18 2011-03-31 Dainippon Screen Mfg Co Ltd Device and method for cleaning substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011066301A (en) * 2009-09-18 2011-03-31 Dainippon Screen Mfg Co Ltd Device and method for cleaning substrate

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