JPS63204713A - Substrate holder for molecular beam crystal growth - Google Patents

Substrate holder for molecular beam crystal growth

Info

Publication number
JPS63204713A
JPS63204713A JP3851187A JP3851187A JPS63204713A JP S63204713 A JPS63204713 A JP S63204713A JP 3851187 A JP3851187 A JP 3851187A JP 3851187 A JP3851187 A JP 3851187A JP S63204713 A JPS63204713 A JP S63204713A
Authority
JP
Japan
Prior art keywords
substrate
holder
substrate holder
infrared rays
molecular beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3851187A
Other languages
Japanese (ja)
Inventor
Takeshi Igarashi
武司 五十嵐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3851187A priority Critical patent/JPS63204713A/en
Publication of JPS63204713A publication Critical patent/JPS63204713A/en
Pending legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To prevent the local temperature rise on the part of a substrate in contact with a substrate holder and to make it possible to obtain uniform temperature on the whole surface of the substrate by a method wherein the substrate is provided by inserting it into the recessed part provided on the tabular member which transmits infrared rays. CONSTITUTION:A recessed part 23, into which a substrate 22 will be inserted, is provided on the tabular member 21 which is a substrate holder and transmits infrared rays. As the substrate holder is made of the material which transmits infrared rays, the substrate is directly heated up by the infrared rays emitted from a heater. On the other hand, as the holder itself does not absorb the infrared rays, it is not heated up, heat is not transmitted to the substrate from the holder, and the circumferential part of the substrate is prevented from heating up to the temperature higher than that of the center part of the substrate. As a result, the temperature distribution on the surface of the substrate becomes uniform, and the molecular beam epitaxial crystal having uniform thickness and composition can be obtained.

Description

【発明の詳細な説明】 〔概要〕 分子線結晶成長装置の基板ホルダであって、赤外線を透
過する板状部材に凹部を設け、該凹部に基板を嵌挿して
設置することで、基板ホルダが赤外線を吸収しないこと
で、基板ホルダに接触している基板の箇所の局部的温度
上昇を防ぎ、基板ホルダに設置されている基板の温度が
、基板全面にわたって均一な温度となるようにした分子
線結晶成長用基板ホルダ。
[Detailed Description of the Invention] [Summary] A substrate holder for a molecular beam crystal growth apparatus, in which a recess is provided in a plate-like member that transmits infrared rays, and a substrate is inserted and installed in the recess. Molecular beams that do not absorb infrared rays prevent local temperature increases at the parts of the substrate that are in contact with the substrate holder, and ensure that the temperature of the substrate installed in the substrate holder is uniform over the entire surface of the substrate. Substrate holder for crystal growth.

〔産業上の利用分野〕[Industrial application field]

本発明は分子線エピタキシャル成長装置に係り、特にこ
の成長装置の基板ホルダに関する。
The present invention relates to a molecular beam epitaxial growth apparatus, and particularly to a substrate holder for this growth apparatus.

近年、分子線エピタキシャル成長方法は、その特徴であ
るすぐれた膜厚制御性を用いて、例えばガリウム砒素(
GaAs) G板のような化合物半導体基板上にアルミ
ニウム・ガリウム・砒素<AIIGaAs)のへテロ構
造の結晶を超格子構造に形成する方法や、選択ドープ構
造等を用いて新デバイスを実現させる成長方法として脚
光を浴びている。
In recent years, the molecular beam epitaxial growth method has been developed using its characteristic excellent film thickness controllability, for example, gallium arsenide (
A method of forming a heterostructure crystal of aluminum, gallium, arsenic (AIIGaAs) into a superlattice structure on a compound semiconductor substrate such as a G plate, and a growth method of realizing new devices using a selective doping structure, etc. has been in the spotlight as a

特にこの方法を用いて開発された高電子移動度トランジ
スタ(HEMT)等のデバイスは実用化段階に入ってい
る。
In particular, devices such as high electron mobility transistors (HEMT) developed using this method have entered the stage of practical use.

このような分子線結晶装置に於いては、基板上に形成さ
れるエピタキシャル結晶の組成や厚さを均一に保つため
に、基板を均一な温度で加熱できるような基板ホルダが
要望されている。
In such a molecular beam crystallization device, there is a need for a substrate holder that can heat the substrate at a uniform temperature in order to maintain a uniform composition and thickness of the epitaxial crystal formed on the substrate.

〔従来の技術〕[Conventional technology]

このような分子線結晶成長装置の要部を第3図に示す。 FIG. 3 shows the main parts of such a molecular beam crystal growth apparatus.

図示するように10” ” torrの真空度に排気さ
れた結晶成長室1には、基板ホルダ2を先端部に備え、
基板ホルダ2を加熱するタンタル(Ta)より成るヒ」
夕を内臓し、回転駆動する基板マニピュレータ3が設け
られ、その基板ホルダ2と対向する位置には、基板上に
形成すべきエピタキシャル結晶のソースとなるAlの分
子線源セル4や、Gaの分子線源セル5が設置されてい
る。
As shown in the figure, a crystal growth chamber 1 evacuated to a vacuum level of 10'' torr is equipped with a substrate holder 2 at its tip.
A metal plate made of tantalum (Ta) that heats the substrate holder 2.
A substrate manipulator 3 that has a built-in holder and is rotatably driven is provided, and at a position facing the substrate holder 2 there is an Al molecular beam source cell 4 that serves as a source for epitaxial crystals to be formed on the substrate, and a Ga molecule source cell 4. A radiation source cell 5 is installed.

従来の基板ホルダの構造は第4図に示すように、円筒状
のモリブデン(MO)等の金属材料を用いて形成され、
その中央部には上下に突出部11が形成された貫通孔1
2が設けられ、この貫通孔12の内壁13に均熱板14
が設置され、その上にはタンタル(Ta)のようなスペ
ーサ15を介してエピタキシャル成長用のGaAs等の
基板16が設置されている。
As shown in FIG. 4, the structure of a conventional substrate holder is formed using a cylindrical metal material such as molybdenum (MO).
A through hole 1 in which a protrusion 11 is formed at the top and bottom in the center.
2 is provided, and a heat equalizing plate 14 is provided on the inner wall 13 of this through hole 12.
A substrate 16 made of GaAs or the like for epitaxial growth is placed thereon with a spacer 15 made of tantalum (Ta) interposed therebetween.

そして基板ホルダ17は前記した基板マニピュレータ3
にMo製の基板ホルダ17の設置治具(図示せず)を用
いて取りつけられており、この基板マニピュレータ3内
には基板を650℃程度の温度に加熱するためのTaよ
り成るヒータ18が内臓され、このヒータ18の加熱に
よって基板16は、均熱板14側から基板ホルダ17と
共に加熱されるように成っている。
The substrate holder 17 is connected to the substrate manipulator 3 described above.
A substrate holder 17 made of Mo is attached to the substrate using an installation jig (not shown), and a heater 18 made of Ta is built into the substrate manipulator 3 to heat the substrate to a temperature of about 650°C. By heating the heater 18, the substrate 16 is heated together with the substrate holder 17 from the heat equalizing plate 14 side.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

然し、このような従来の構造の基板ホルダ17に於いて
は、この基板ホルダ17に設置された基板16の温度は
、基板ホルダ17から基板16に対して熱の伝達がある
ために、基板上6の温度は、基板ホルダ17と接触して
いる基板16の周辺部になる程裔(なり、基板16の中
央部は低くなり、基板16の温度が全面にわたって均一
でない欠点が生じる。
However, in the substrate holder 17 having such a conventional structure, the temperature of the substrate 16 installed in the substrate holder 17 is low due to the transfer of heat from the substrate holder 17 to the substrate 16. The temperature of the substrate 16 becomes lower at the periphery of the substrate 16 that is in contact with the substrate holder 17, and becomes lower at the center of the substrate 16, resulting in the disadvantage that the temperature of the substrate 16 is not uniform over the entire surface.

このように基板の温度が全ての領域に於いて、均一でな
いと、その上に形成されるエピタキシャル層の厚さや、
組成も均一とならない欠点を生じる。
If the temperature of the substrate is not uniform in all regions, the thickness of the epitaxial layer formed on it,
The composition also has the disadvantage of not being uniform.

本発明は上記した問題点を解決し、基板の表面温度が均
一となるようにした基板ホルダの提供を目的とする。
The present invention aims to solve the above-mentioned problems and provide a substrate holder in which the surface temperature of the substrate is made uniform.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の分子線結晶装置用基板ホルダは、第1図の原理
図に示すように、赤外線を透過する板状部材21に基板
22を嵌挿する凹部23を設ける。
As shown in the principle diagram of FIG. 1, the substrate holder for a molecular beam crystallization apparatus of the present invention is provided with a recess 23 into which a substrate 22 is inserted in a plate member 21 that transmits infrared rays.

〔作用〕[Effect]

本発明の分子線結晶成長用基板ホルダは、基板ホルダが
赤外線を透過する材料で形成されているため、ヒータか
らの赤外線で基板が直接加熱される一方、ホルダ自体は
赤外線を吸収しないために加熱されなく、従来のホルダ
のように、ホルダからから基板への熱が伝達しなく、基
板周辺部が基板中央部より高温に成るのが防止できる。
In the substrate holder for molecular beam crystal growth of the present invention, since the substrate holder is made of a material that transmits infrared rays, the substrate is directly heated by the infrared rays from the heater, while the holder itself is heated because it does not absorb infrared rays. Unlike conventional holders, heat is not transferred from the holder to the substrate, and it is possible to prevent the periphery of the substrate from becoming hotter than the center of the substrate.

〔実施例〕〔Example〕

以下、図面を用いながら本発明の一実施例につき詳細に
説明する。
Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

第2図は本発明の分子線結晶成長装置用基板ホルダの断
面図で、図示するように、本発明の分子線結晶成長用基
板ホルダ31は、サファイアのような赤外線を透過する
2枚の円板状部材32.33で構成されている。この各
々の円板状部材32.33には基板34を嵌挿するため
の凹部35と、基板34の基板ホルダ31への接触を低
減するための凹部36が設けられ、これらの円板状部材
32.33は基板マニピュレータ37に取りつけられ、
ネジ溝38を有し、Moで形成された後部取りつけ治具
39と、このネジ溝38に嵌合するネジを有する前部取
りつけ治具40によって前記した基板マニピュレータ3
7に固定されている。
FIG. 2 is a cross-sectional view of a substrate holder for a molecular beam crystal growth apparatus according to the present invention. As shown in the figure, the substrate holder 31 for molecular beam crystal growth according to the present invention is made of two circular sheets such as sapphire that transmit infrared rays. It is composed of plate-like members 32 and 33. Each of these disc-shaped members 32 and 33 is provided with a recess 35 for inserting the board 34 and a recess 36 for reducing the contact of the board 34 with the board holder 31. 32 and 33 are attached to the substrate manipulator 37,
The substrate manipulator 3 described above is equipped with a rear mounting jig 39 having a thread groove 38 and made of Mo, and a front mounting jig 40 having a screw that fits into the thread groove 38.
It is fixed at 7.

そして基板マニピュレータ37にはTaよりなるヒータ
41が埋設されている。
A heater 41 made of Ta is embedded in the substrate manipulator 37.

このような本発明の基板ホルダ31にGaAs等の化合
物半導体基板34を設置し、基板マニピュレータ37に
埋設されているヒータ41で基板の温度が650℃程度
の温度になるように加熱し、基板の前面側より矢印A方
向に示すようにA I 5Gax As等の分子線源セ
ルより分子線を基板34に照射して基板上に/l It
 GaAsの結晶を形成する。
A compound semiconductor substrate 34 such as GaAs is placed on the substrate holder 31 of the present invention, and the substrate is heated to a temperature of about 650° C. with the heater 41 embedded in the substrate manipulator 37. As shown in the direction of arrow A from the front side, molecular beams are irradiated onto the substrate 34 from a molecular beam source cell such as AI 5Gax As, and /l It is applied onto the substrate.
Form a GaAs crystal.

すると基板ホルダ31は赤外線を透過するサファイアで
形成されているため、この基板ホルダ自体は加熱されず
、ヒータ41からの熱のみによって基板が加熱されるた
め、基板34が全面にわたって均一に加熱されるため、
その上に組成、および厚さが均一なエピタキシャル層が
形成される。
Then, since the substrate holder 31 is made of sapphire that transmits infrared rays, the substrate holder itself is not heated, and the substrate is heated only by the heat from the heater 41, so that the substrate 34 is heated uniformly over the entire surface. For,
An epitaxial layer having a uniform composition and thickness is formed thereon.

尚、本実施例では基板ホルダ31の形成材料としてサフ
ァイアを用いたが、その他、赤外線を透過するPBN 
(パイロリティック窒化硼素)を用いても良い。
In this embodiment, sapphire was used as the material for forming the substrate holder 31, but PBN, which transmits infrared rays, may also be used.
(pyrolytic boron nitride) may also be used.

(発明の効果〕 以上述べたように、本発明の基板ホルダによれば、基板
の表面の温度分布が均一な値となるため、その上に形成
される分子線エピタキシャル結晶の厚さ、並びに組成も
均一な厚さのエピタキシャル結晶が得られる効果がある
(Effects of the Invention) As described above, according to the substrate holder of the present invention, the temperature distribution on the surface of the substrate becomes uniform, so that the thickness and composition of the molecular beam epitaxial crystal formed thereon are reduced. Also has the effect of obtaining epitaxial crystals with uniform thickness.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の基板ホルダの原理図、第2図は本発明
の基板ホルダの一実施例を示す断面図、 第3図は分子線結晶成長装置の要部の説明図、第4図は
従来の基板ホルダの断面図である。 図に於いて、 21は板状部材、22.34は基板、23.35.36
は凹部、31は基板ホルダ、32.33は円板状部材、
37は基板マニピュレータ、38はネジ、39は後部取
りつけ治第2図 吟力線φσ品吹表衷111帥n寂明m 第3図 従来/IM乙14り4 @rk rXJ第4図
Fig. 1 is a principle diagram of the substrate holder of the present invention, Fig. 2 is a sectional view showing an embodiment of the substrate holder of the present invention, Fig. 3 is an explanatory diagram of the main parts of the molecular beam crystal growth apparatus, and Fig. 4 is a sectional view of a conventional substrate holder. In the figure, 21 is a plate member, 22.34 is a substrate, 23.35.36
31 is a substrate holder, 32.33 is a disc-shaped member,
37 is the board manipulator, 38 is the screw, and 39 is the rear mounting jig.

Claims (1)

【特許請求の範囲】[Claims]  赤外線を透過する板状部材(21)に凹部(23)を
設け、該凹部(23)に基板(22)の周辺部を嵌挿さ
せて固定したことを特徴とする分子線結晶成長用基板ホ
ルダ。
A substrate holder for molecular beam crystal growth, characterized in that a plate-like member (21) that transmits infrared rays is provided with a recess (23), and a peripheral part of a substrate (22) is fitted and fixed into the recess (23). .
JP3851187A 1987-02-20 1987-02-20 Substrate holder for molecular beam crystal growth Pending JPS63204713A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3851187A JPS63204713A (en) 1987-02-20 1987-02-20 Substrate holder for molecular beam crystal growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3851187A JPS63204713A (en) 1987-02-20 1987-02-20 Substrate holder for molecular beam crystal growth

Publications (1)

Publication Number Publication Date
JPS63204713A true JPS63204713A (en) 1988-08-24

Family

ID=12527293

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3851187A Pending JPS63204713A (en) 1987-02-20 1987-02-20 Substrate holder for molecular beam crystal growth

Country Status (1)

Country Link
JP (1) JPS63204713A (en)

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