JPS63200951A - Duplex polishing method for sheet - Google Patents

Duplex polishing method for sheet

Info

Publication number
JPS63200951A
JPS63200951A JP3086287A JP3086287A JPS63200951A JP S63200951 A JPS63200951 A JP S63200951A JP 3086287 A JP3086287 A JP 3086287A JP 3086287 A JP3086287 A JP 3086287A JP S63200951 A JPS63200951 A JP S63200951A
Authority
JP
Japan
Prior art keywords
polishing
workpiece
thin plate
wax
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3086287A
Other languages
Japanese (ja)
Inventor
Mikio Yamashita
幹生 山下
Seiichi Hara
原 成一
Hiroyuki Matsunaga
博之 松永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3086287A priority Critical patent/JPS63200951A/en
Publication of JPS63200951A publication Critical patent/JPS63200951A/en
Pending legal-status Critical Current

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  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)

Abstract

PURPOSE:To aim at improvement in parallelism and flatness, by applying a first polishing to both sides side by side of the sheet stuck to a work holder via wax, correcting each surface roughness and, after stress release by means of heating and annealing, applying a second polishing likewise. CONSTITUTION:A workpiece 1 of a germanium sheet or the like is stuck to a work holder 2 via wax 3, while a first polishing by diamond abrasive grains is applied to a polishing surface A, and surface from and surface roughness are corrected. Next, the surface A is turned down, and surface form and surface roughness of a polishing surface B are corrected likewise. Afterward, it is heated up to a temperature, for example, of 60-80 deg.C where the wax 3 is melted, annealed, stress is released, and the workpiece 1 is clamped in a curved state by a polishing strain difference, applying a second polishing to the A surface as well, then it is turned down, thus this second polishing is applied to the B surface as well, and both surfaces A and B are formed into a polished surface being high in from accuracy. Thus, parallelism and flatness is both surfaces of the sheet are polishable so favorably and, what is more, such a surface that is high in form accuracy is securable.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は、研磨により形状仕上げ加工を行なう、薄板
の両面研磨方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a method for polishing both sides of a thin plate in which shape finishing is performed by polishing.

〔技術分野〕〔Technical field〕

従来法(特開昭61−33848号公報)を両面研磨方
法に応用した例を第2図(a)〜(1)の断面図に薄板
の形状変化を工稈順に示すつ 図において、(1)は被加工物の薄板、 +21Viワ
ークホルダ、(3)はワックスであり、(A)は被加工
物filの最初に研磨される一方の面(A)、 (Bi
はA面に続いて研磨される他方の面Bである。
An example of applying the conventional method (Japanese Unexamined Patent Publication No. 61-33848) to a double-sided polishing method is shown in cross-sectional views of FIGS. ) is a thin plate of the workpiece, +21Vi workholder, (3) is wax, (A) is one side of the workpiece fil to be polished first, (Bi
is the other surface B that is polished following surface A.

従来の研磨加工はB面をワックス(3)を介してホルダ
(2)に接着しておいて、まず被加工物filのA面を
研磨することにより、A面の表面形状及び表面粗度を修
正する、それを表わしたのが(8)であり。
In conventional polishing, the B side is bonded to the holder (2) via wax (3), and the A side of the workpiece fil is first polished to improve the surface shape and surface roughness of the A side. (8) expresses this.

次に被加工物11)とワークホルダ(2)を固定した状
態で、ワックス(3)が溶融する温度までホットプレー
ト上で加熱し数分間放置した後、徐冷し再び被加工物(
1)とワークホルダ(2)をワックス(3)で接着固定
する。この時、トワイマン(Twyman)効果により
太き(湾曲し応力が解放されて固定される。その状態を
表わしたのが(b)である。次に再びA面を研磨するこ
とによりA面の形状を修正する。その状態を表わしたの
がfc)である。その後ワックス(3)を溶融除去し、
被加工物+11をワークホルダ(2)より分離する。す
でに−反応力を解放しているためA面に湾曲することな
(形状が精度よく保たれろうそれを表わしたのが(d)
であろう 越上のようにして片面を高精度に仕上げるの力;従来法
であり、この方法を被加工物の他方の面Bにも適用した
のが(e)〜(h)で、最終的に両面共研磨して被加工
物(])をワークホルダ(2)より分離したのが(1)
である。
Next, with the workpiece 11) and work holder (2) fixed, heat the wax (3) on a hot plate to a temperature that melts it, leave it for a few minutes, cool it slowly, and then fix the workpiece (2) again.
1) and work holder (2) are adhesively fixed with wax (3). At this time, due to the Twyman effect, it becomes thick (curved) and the stress is released and it is fixed. This state is shown in (b). Next, by polishing the A side again, the shape of the A side is fixed. The state is represented by fc). After that, wax (3) is melted and removed,
Separate the workpiece +11 from the work holder (2). Since the reaction force has already been released, it will not curve to the A side (the shape will be maintained with high accuracy, which is shown in (d)
The force of finishing one side with high precision in a manner similar to that of the previous method; (e) to (h) are the conventional method, and this method is also applied to the other side B of the workpiece, and the final (1) is obtained by polishing both sides and separating the workpiece (]) from the work holder (2).
It is.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、この方法によれば、かなり高精度に両面加工
はできるものの、(d)において高精度に仕上げられた
最初の研磨面Aまでも他方の研磨面Bを研磨する際、B
面における前加工による加工歪と仕上研磨による加工歪
との差ゆえに、(f)から(g)の工程でわずかに湾曲
してしまうという問題点があったつ この発明は9以上のような問題点を除去するためになさ
れたもので、被加工物の両面が共に湾曲せず、形状が高
精度に保たれる薄板の研磨方法を得ること全目的として
いる。
However, although this method allows both sides to be machined with fairly high precision, when polishing the other polished surface B, even the first polished surface A finished with high precision in (d)
There was a problem in that the surface was slightly curved in the steps (f) to (g) due to the difference between the processing distortion caused by pre-processing and the processing distortion caused by final polishing.However, this invention has the same problem as above 9. The overall purpose is to obtain a method of polishing a thin plate in which both sides of the workpiece are not curved and the shape is maintained with high precision.

〔問題点を解決するための手段〕[Means for solving problems]

この発明の薄板の両面研磨方法はワークホルダにワック
スを介して接着された薄板に片面ずつ両面にそれぞれ第
1研磨を施して表面粗度を修正した後、上記薄板を加熱
徐冷して応力を解放し、さらに第1研磨が施された薄板
の両面にそれぞれ第2研磨を施して表面形状を修正する
ようにしたものであろう 〔作用〕 この発明においては、薄板両面に第1研磨を施した後、
加熱徐冷して応力を解放すると前加工による加工歪と第
1研磨による加工歪との差により薄板は湾曲して固定さ
れる。
The method of polishing both sides of a thin plate according to the present invention is to perform first polishing on one side of a thin plate bonded to a work holder via wax to correct the surface roughness, and then heat and slowly cool the thin plate to relieve stress. [Operation] In this invention, the first polishing is applied to both surfaces of the thin plate, and the surface shape is corrected by applying second polishing to both sides of the thin plate that has been subjected to the first polishing. After that,
When the stress is released by heating and slow cooling, the thin plate is curved and fixed due to the difference between the processing strain caused by the pre-processing and the processing strain caused by the first polishing.

この応力解放された薄板に第2研磨を施して表面形状を
修正しているので、平行度、平面度とも良好に研磨でき
るう 〔実施例〕 第1図(8)〜(1)tfiこの発明の一実施例の薄板
の両面研磨方法を薄板の形状変化を示す断面図により工
程順に表わすものである5図において(1)は薄板の被
加工物で、この場合は前加工としてグリーンカーボラン
ダム(以下GCと略記する)14000砥粒で研磨を行
なったゲルマニウム、(2)はワークホルダ、 +31
1dワツクスで、この場合はエレクトロンワックス(商
品名二日本精工(株))である。
Since this stress-relieved thin plate is subjected to second polishing to modify the surface shape, it can be polished with good parallelism and flatness. [Example] Figure 1 (8) to (1) tfi In Figure 5, which shows the method for polishing both sides of a thin plate according to an embodiment in the order of steps using cross-sectional views showing changes in the shape of the thin plate, (1) is a thin plate workpiece, and in this case, green carbon carborundum ( (hereinafter abbreviated as GC) germanium polished with 14,000 abrasive grains, (2) is a work holder, +31
1d wax, in this case Electron wax (trade name Nippon Seiko Co., Ltd.).

なお、(A)は被加工物(1)の最初に研磨される一方
の面(A)、 (B)は他方の面Bを表わす。
Note that (A) represents one surface (A) of the workpiece (1) to be polished first, and (B) represents the other surface B.

まず被加工物(1)の研磨面Aをダイヤモンド砥粒で研
磨し第1研磨を施すことにより、A面の表面形状及び表
面粗度を修正する。それを表わしたのが(a)であり9
次に被加工物(1)をワークホルダ(2)から分離した
のが(b)であり、トワイマン(Twyman)効果に
より太きき湾曲する。次に被加工物fil f:裏返し
てワークホルダ(2)にワックス(3)で接着したのが
(C)であり、B面をダイヤモンド砥粒で第1研磨を施
した状態が(d)である。このときB面には前加工のG
C#4000砥粒による加工歪とは大きさの異る加工歪
が残るため2次にワックス(3)が溶融する温度、この
場合は60〜80℃までワークホルダ(2)を加熱し数
分間放置した後徐冷した時に、その加工歪の差によって
被加工物+lli湾曲して固定される。この状態を示し
たのが(e)である。
First, the polished surface A of the workpiece (1) is polished with diamond abrasive grains to perform first polishing, thereby modifying the surface shape and surface roughness of the surface A. This is expressed in (a), which is 9
Next, the workpiece (1) is separated from the work holder (2), as shown in (b), and is greatly curved due to the Twyman effect. Next, the workpiece fil f: (C) is the workpiece turned over and bonded to the work holder (2) with wax (3), and (d) is the state where the B side has been first polished with diamond abrasive grains. be. At this time, the B side has G of the pre-processing.
Since machining distortion that is different in size from the machining distortion caused by C#4000 abrasive grains remains, the work holder (2) is heated to the temperature at which the wax (3) melts, in this case 60 to 80°C, for several minutes. When the workpiece is allowed to stand and then slowly cooled, the workpiece is curved and fixed due to the difference in processing strain. (e) shows this state.

次に、B面を再度研磨、第2研磨を施してB面の形状を
修正する。この状態を表わしたのがff)である。最後
に被加工物(1)を裏返してワークホルダ(2)にワッ
クス(3)で接着したのが(g)であり、再度A面の研
磨、第2研磨を行ないA面の形状を修正したのが(h)
である。その後、被加工物(1)をワークホルダ(2)
から分離したのが(1)である。
Next, the B side is polished again and second polishing is performed to correct the shape of the B side. This state is expressed by ff). Finally, the workpiece (1) was turned over and bonded to the work holder (2) with wax (3), as shown in (g), and the A side was polished again and the shape of the A side was corrected. Noga(h)
It is. Then, place the workpiece (1) on the work holder (2).
(1) is separated from

以上の研磨工程をとることにより2両面共形状精度の高
い加工面が得られることになる。
By performing the above polishing process, a machined surface with high shape accuracy on both surfaces can be obtained.

なお、上記実施例では、被加工物fl)をGOシランン
クを行なったゲルマニウムとしたが、拐質としてはゲル
マニウムだけでな(、加工歪によって湾曲する薄板であ
れば何でも同様の効果を期待でき、前加工の状態もラン
ピングだけではな(、その他の研磨、切削、研削等が施
されたものでも同様の効果を期待できる。
In the above example, the workpiece fl) was made of germanium subjected to GO silanking, but germanium is not the only material to be used (the same effect can be expected with any thin plate that bends due to processing strain). The same effect can be expected even if the pre-processing condition is not only ramping (but also other polishing, cutting, grinding, etc.).

また、上記説明では片面全1回ずつ研醋して両面共同−
研磨を行なった後、応力解放を行なって。
In addition, in the above explanation, one side is studied once, and both sides are combined.
After polishing, perform stress relief.

更に片面ずつ研磨して両面研磨を行なう方法を示したが
、各研磨工程で応力解放を行なって、2回以上の研磨を
行う場合も同様の効果を期待できる。
Furthermore, although a method of polishing both sides by polishing one side at a time has been shown, the same effect can be expected if stress is released in each polishing step and polishing is performed two or more times.

ところで、上記説明では、この発明を両面の平面、非球
面の曲面形状の修正にも利用できる。
By the way, in the above description, the present invention can also be used to correct the curved shape of both planes and aspherical surfaces.

〔発明の効果〕〔Effect of the invention〕

この発明は2以上説明したとおシ、ワークホルダにワッ
クスを介して接着された薄板に片面ずつ両面にそれぞれ
第1研M?施して表面粗度を修正した後、上記薄板を加
熱徐冷して応力を解放し。
This invention has been explained above two times, and the first grinding M? After the surface roughness has been corrected, the thin plate is heated and slowly cooled to release stress.

さらに第1研磨が施された薄板の両面にそれぞれ第2研
磨を施して表面形状を修正することにより。
Furthermore, by applying a second polishing to both surfaces of the thin plate that has been subjected to the first polishing, the surface shape is modified.

薄板の両面を平行度、平面度とも良好に研磨でき。Both sides of thin plates can be polished to good parallelism and flatness.

形状精度の高い面が得られるという効果がある。This has the effect that a surface with high shape accuracy can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)〜(1)はこの発明の一実施例の薄板の両
面研磨方法における薄板の形状開化を示す断面図により
工程順に表わすもので、第2図体)〜(1)は従来法を
薄板の形状変化を示す断面図により工程順に表わすもの
である。 図において、 fllは薄板、(2)はワークホルダ、
(3)はワックス、(A)は一方の面、IBm他方の面
である。 なお1図中、同一符号は同−又は相当部分を示す。
Figures 1 (a) to (1) are cross-sectional views showing the opening of the shape of a thin plate in the double-sided polishing method for a thin plate according to an embodiment of the present invention, and Figures 2) to (1) are sectional views showing the conventional method. The steps are shown in the order of steps using cross-sectional views showing changes in the shape of the thin plate. In the figure, flll is a thin plate, (2) is a work holder,
(3) is wax, (A) is one side, IBm is the other side. In addition, in FIG. 1, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] ワークホルダにワックスを介して接着された薄板に片面
ずつ両面にそれぞれ第1研磨を施して表面粗度を修正し
た後、上記薄板を加熱徐冷して応力を解放し、さらに第
1研磨が施された薄板の両面にそれぞれ第2研磨を施し
て表面形状を修正するようにした薄板の両面研磨方法。
A thin plate bonded to a work holder via wax is subjected to first polishing on one side and both sides to correct the surface roughness, and then the thin plate is heated and slowly cooled to release stress, and then first polishing is applied. A method for polishing both sides of a thin plate, in which second polishing is applied to both sides of the thin plate to modify the surface shape.
JP3086287A 1987-02-13 1987-02-13 Duplex polishing method for sheet Pending JPS63200951A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3086287A JPS63200951A (en) 1987-02-13 1987-02-13 Duplex polishing method for sheet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3086287A JPS63200951A (en) 1987-02-13 1987-02-13 Duplex polishing method for sheet

Publications (1)

Publication Number Publication Date
JPS63200951A true JPS63200951A (en) 1988-08-19

Family

ID=12315535

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3086287A Pending JPS63200951A (en) 1987-02-13 1987-02-13 Duplex polishing method for sheet

Country Status (1)

Country Link
JP (1) JPS63200951A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001060567A1 (en) * 2000-02-16 2001-08-23 Memc Electronic Materials, Inc. Process for reducing surface variations for polished wafer
CN105415027A (en) * 2015-12-07 2016-03-23 上海现代先进超精密制造中心有限公司 Method for conducting dewaxing without deformation through heat gun

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001060567A1 (en) * 2000-02-16 2001-08-23 Memc Electronic Materials, Inc. Process for reducing surface variations for polished wafer
US6479386B1 (en) 2000-02-16 2002-11-12 Memc Electronic Materials, Inc. Process for reducing surface variations for polished wafer
CN105415027A (en) * 2015-12-07 2016-03-23 上海现代先进超精密制造中心有限公司 Method for conducting dewaxing without deformation through heat gun

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