JPS63198883A - System for testing logic circuit package - Google Patents

System for testing logic circuit package

Info

Publication number
JPS63198883A
JPS63198883A JP62127764A JP12776487A JPS63198883A JP S63198883 A JPS63198883 A JP S63198883A JP 62127764 A JP62127764 A JP 62127764A JP 12776487 A JP12776487 A JP 12776487A JP S63198883 A JPS63198883 A JP S63198883A
Authority
JP
Japan
Prior art keywords
signal
test
unstable
circuit
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62127764A
Other languages
Japanese (ja)
Other versions
JPH0350226B2 (en
Inventor
Hajime Tanaka
一 田中
Toshiro Kosaka
小坂 敏郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62127764A priority Critical patent/JPS63198883A/en
Publication of JPS63198883A publication Critical patent/JPS63198883A/en
Publication of JPH0350226B2 publication Critical patent/JPH0350226B2/ja
Granted legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To conduct an accurate logic test by interrupting testing operation with a wait signal while an output signal is unstable and conducting the test only in a stable period. CONSTITUTION:A circuit to be tested has integral elements R and C which make an output signal unstable to an input signal. A monostable multivibrator 7 provided in a tester outputs the wait signal when the output becomes unstable after the input is applied to the circuit to be tested, thereby interrupting the testing operation. When the output signal becomes unstable, the transmission of said wait signal is stopped. Consequently, the tester begins to operate to test the object circuit.

Description

【発明の詳細な説明】 本発明は、論理回路パッケージの試験方式に関し、更に
詳しくは積分回路のような不安定回路を内蔵した論理回
路パッケージの試験方式に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for testing a logic circuit package, and more particularly to a method for testing a logic circuit package containing an unstable circuit such as an integrating circuit.

論理回路の試験を行なう場合、テスター側から同期信号
を加え、ある入力の際における被試験パッケージからの
出力信号をテスターで判定することが行なわれている。
When testing a logic circuit, a synchronizing signal is applied from the tester side, and the tester determines the output signal from the package under test at a certain input.

一般に論理回路は、論理が定まる要素で構成されている
が、最近は例えば積分回路のように、出力に不安定状態
をもたらすものが混在するようになって来ている。この
種の回路においては、被試験パッケージの出力信号がテ
スターと同期しなくなるため、判定不可能になる。
Logic circuits are generally made up of elements that have a fixed logic, but recently they have come to include elements that cause an unstable output, such as integration circuits. In this type of circuit, the output signal of the package under test is no longer synchronized with the tester, making judgment impossible.

第1図は、積分回路を含んだパッケージの試験方式と各
部における波形を示す図である。(イ)に示す回路図に
おいて、抵抗RとコンデンサCで形成される積分回路に
、テスターから(ロ)図に示すような入力信号が加えら
れるとコンデンサCの両端すの波形は、(ロ)図の波形
すのように、充放電のくり返し波形となる。ところが、
抵抗Rの抵抗値やコンデンサCの容量が被試験パッケー
ジごとに一定しないので、それぞれの充放電時間が不均
一となり、コンパレート時における波形すも一定しなく
なる。そのため、後続のインバータ2がある値のスレッ
シュホールド電圧を持っていることもあって、出力信号
eは、(ワ)図の出力信号eの波形における斜線部Xの
ように、“0゛であるのか、°°l°”であるのか、被
試験パッケージによって異なる部分が発生し、判定不能
となる。
FIG. 1 is a diagram showing a test method for a package including an integrating circuit and waveforms at various parts. In the circuit diagram shown in (a), when an input signal as shown in (b) is applied from the tester to the integrating circuit formed by resistor R and capacitor C, the waveform at both ends of capacitor C will be (b). As shown in the waveform in the figure, the waveform is a repetitive charge/discharge waveform. However,
Since the resistance value of the resistor R and the capacitance of the capacitor C are not constant for each tested package, the respective charging and discharging times are not uniform, and the waveform at the time of comparison is also not constant. Therefore, partly because the subsequent inverter 2 has a threshold voltage of a certain value, the output signal e is "0", as shown by the shaded part X in the waveform of the output signal e in the figure (W). It is impossible to determine whether it is "°°l°" or "°°l°" as it differs depending on the package under test.

このように従来の試験方式では、被試験論理パッケージ
に不安定回路を有していて、その出力がテスターと非同
期で動作するものについては、論理判定が不可能なため
、本発明はこの問題を有効に解消するものである。
In this way, with conventional test methods, it is impossible to determine the logic of a logic package under test that has an unstable circuit whose output operates asynchronously with the tester.The present invention solves this problem. This is an effective solution.

この技術的課題を解決するために、本発明による技術的
手段は、入力信号に対して出力信号が不安定で、論理判
定が不可能になる回路を内蔵した論理回路パッケージを
試験する論理回路パッケージの試験方式において、前記
論理回路パッケージの入力信号の変化点で単安定マルチ
バイブレータをトリガして、テスターにウェイト信号を
出力し、論理判定不能な期間においては、テスト動作が
中止されるようにした構成を採っている。
In order to solve this technical problem, the technical means according to the present invention is a logic circuit package that tests a logic circuit package that includes a built-in circuit whose output signal is unstable with respect to an input signal, making logic judgment impossible. In the test method, a monostable multivibrator is triggered at a change point of the input signal of the logic circuit package, a wait signal is output to the tester, and the test operation is stopped during a period in which logic cannot be determined. The structure is adopted.

次に本発明による論理回路パッケージの試験方式が実際
上どのように具体化されるかを実施例で説明する。第1
図は積分回路を含むパッケージの試験回路と各部におけ
る波形を示す図である。この場合、(ロ)図のインバー
タ出力波形eにおける斜線部x−x’部のように、立ち
上がり、立ち下がりタイミングが一定しない期間T−T
″の間は、テスターの動作を停止させる。すなわちテス
ター内に単安定マルチバイブレーク7を設けて、(ハ)
図における入力波形が切り換わるタイミングT1で、テ
スター側から入カバターンの切り換え信号を印加して単
安定マルチバイブレーク7をトリガーし、その出力信号
をウェイト信号とする。
Next, how the logic circuit package testing method according to the present invention is actually implemented will be explained using an example. 1st
The figure shows a test circuit for a package including an integrating circuit and waveforms at various parts. In this case, as shown in the shaded area x-x' in the inverter output waveform e in Figure (b), a period T-T in which the rising and falling timings are not constant.
'', the operation of the tester is stopped.In other words, a monostable multi-vibration break 7 is provided in the tester, and (c)
At timing T1 when the input waveform switches in the figure, an input pattern switching signal is applied from the tester side to trigger the monostable multi-bi break 7, and its output signal is used as a wait signal.

単安定マルチバイブレーク7には、出力信号eの不安定
期間Tを経過した後、ウェイト信号が解除されるように
、試験中止時間を設定しておく。そして、ウェイト解除
後最初のストローブ!により、試験判定を行なう。同様
にして、入力信号が“0パから“1′”に切り換わるタ
イミングT1°においても、該入力信号の立ち上がり時
点で単安定マルチバイブレータ7をトリガーし、不安定
期間T′を含む間だけ、テスターにウェイト信号を出力
して、論理試験を中止する。従って、被試験パッケージ
の出力が安定している期間だけテスターが動作し、試験
が行なわれるので、正確な試験が可能となる。
A test stop time is set in the monostable multi-by-break 7 so that the wait signal is canceled after the unstable period T of the output signal e has elapsed. And the first strobe after lifting weights! The test judgment is made according to the following. Similarly, at timing T1° when the input signal switches from "0" to "1'", the monostable multivibrator 7 is triggered at the rising edge of the input signal, and only during the unstable period T'. A wait signal is output to the tester to stop the logic test.Therefore, the tester operates and tests are performed only while the output of the package under test is stable, making accurate testing possible.

以上のように本発明によれば、被試験論理パッケージが
、積分回路のように、人力信号に対して出力信号に不安
定状態が現れるような不安定要素を内蔵していても、出
力の不安定期間はウェイト信号でテスト動作を中止し、
安定状態においてのみ試験を行なうので、正確な論理試
験が可能となる。しかもウェイト開始、ウェイト解除は
自動的に繰り返し行なわれるので、見かけ上は常に試験
が行なわれている恰好になる。
As described above, according to the present invention, even if the logic package under test includes an unstable element such as an integrating circuit that causes an unstable state to appear in the output signal in response to a human input signal, the output may be unstable. During the stabilization period, the test operation is stopped with a wait signal, and
Since the test is performed only in a stable state, accurate logic testing is possible. Moreover, since the start and release of weights are automatically repeated, it appears as if a test is always being performed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は積分回路を含んだ論理パッケージの試験回路と
その各部波形の実施例を示す図である。 図において、2はインバータ、7は単安定マルチバイブ
レーク、Xは判定不能期間である。 特許出願人     富士通株式会社 復代理人 弁理士  福 島 康 文 第1図
FIG. 1 is a diagram showing an example of a logic package test circuit including an integrating circuit and waveforms of each part thereof. In the figure, 2 is an inverter, 7 is a monostable multi-by-break, and X is an undeterminable period. Patent Applicant: Fujitsu Limited Sub-Agent Patent Attorney: Yasushi Fukushima Figure 1

Claims (1)

【特許請求の範囲】 入力信号に対して出力信号が不安定で、論理判定が不可
能になる回路を内蔵した論理回路パッケージを試験する
論理回路パッケージの試験方式において、 前記論理回路パッケージの入力信号の変化点で単安定マ
ルチバイブレータをトリガして、テスターにウェイト信
号を出力し、論理判定不能な期間においては、テスト動
作が中止されるように構成したことを特徴とする論理回
路パッケージ試験方式。
[Scope of Claim] In a logic circuit package testing method for testing a logic circuit package including a circuit in which an output signal is unstable with respect to an input signal and logic judgment is impossible, the input signal of the logic circuit package is A logic circuit package testing method characterized in that a monostable multivibrator is triggered at a change point of , a wait signal is output to a tester, and test operation is stopped during a period in which logic cannot be determined.
JP62127764A 1987-05-25 1987-05-25 System for testing logic circuit package Granted JPS63198883A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62127764A JPS63198883A (en) 1987-05-25 1987-05-25 System for testing logic circuit package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62127764A JPS63198883A (en) 1987-05-25 1987-05-25 System for testing logic circuit package

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP6664879A Division JPS55164948A (en) 1979-05-29 1979-05-29 Test system for logic circuit package

Publications (2)

Publication Number Publication Date
JPS63198883A true JPS63198883A (en) 1988-08-17
JPH0350226B2 JPH0350226B2 (en) 1991-08-01

Family

ID=14968116

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62127764A Granted JPS63198883A (en) 1987-05-25 1987-05-25 System for testing logic circuit package

Country Status (1)

Country Link
JP (1) JPS63198883A (en)

Also Published As

Publication number Publication date
JPH0350226B2 (en) 1991-08-01

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