JPS63190974U - - Google Patents
Info
- Publication number
- JPS63190974U JPS63190974U JP8259687U JP8259687U JPS63190974U JP S63190974 U JPS63190974 U JP S63190974U JP 8259687 U JP8259687 U JP 8259687U JP 8259687 U JP8259687 U JP 8259687U JP S63190974 U JPS63190974 U JP S63190974U
- Authority
- JP
- Japan
- Prior art keywords
- current detection
- detection resistor
- circuit
- subtraction circuit
- operational amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 239000000284 extract Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8259687U JPH0645909Y2 (ja) | 1987-05-29 | 1987-05-29 | Ｉｃ試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8259687U JPH0645909Y2 (ja) | 1987-05-29 | 1987-05-29 | Ｉｃ試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63190974U true JPS63190974U (US20100056889A1-20100304-C00004.png) | 1988-12-08 |
| JPH0645909Y2 JPH0645909Y2 (ja) | 1994-11-24 |
Family
ID=30935385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8259687U Expired - Lifetime JPH0645909Y2 (ja) | 1987-05-29 | 1987-05-29 | Ｉｃ試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0645909Y2 (US20100056889A1-20100304-C00004.png) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3426254B2 (ja) * | 1997-11-20 | 2003-07-14 | 株式会社アドバンテスト | Ｉｃ試験方法及びこの試験方法を用いたｉｃ試験装置 |
| JP2007003368A (ja) * | 2005-06-24 | 2007-01-11 | Yokogawa Electric Corp | 電圧印加装置 |
| JP2013104859A (ja) * | 2011-11-17 | 2013-05-30 | Hioki Ee Corp | 電圧出力装置および抵抗測定装置 |
| JP2014119379A (ja) * | 2012-12-18 | 2014-06-30 | Sharp Corp | 半導体トランジスタのテスト方法 |
| WO2021039753A1 (ja) * | 2019-08-28 | 2021-03-04 | パナソニックＩｐマネジメント株式会社 | 換気装置 |
-
1987
- 1987-05-29 JP JP8259687U patent/JPH0645909Y2/ja not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3426254B2 (ja) * | 1997-11-20 | 2003-07-14 | 株式会社アドバンテスト | Ｉｃ試験方法及びこの試験方法を用いたｉｃ試験装置 |
| JP2007003368A (ja) * | 2005-06-24 | 2007-01-11 | Yokogawa Electric Corp | 電圧印加装置 |
| JP4581865B2 (ja) * | 2005-06-24 | 2010-11-17 | 横河電機株式会社 | 電圧印加装置 |
| JP2013104859A (ja) * | 2011-11-17 | 2013-05-30 | Hioki Ee Corp | 電圧出力装置および抵抗測定装置 |
| JP2014119379A (ja) * | 2012-12-18 | 2014-06-30 | Sharp Corp | 半導体トランジスタのテスト方法 |
| WO2021039753A1 (ja) * | 2019-08-28 | 2021-03-04 | パナソニックＩｐマネジメント株式会社 | 換気装置 |
| JP6865361B1 (ja) * | 2019-08-28 | 2021-04-28 | パナソニックＩｐマネジメント株式会社 | 換気装置 |
| US11486903B2 (en) | 2019-08-28 | 2022-11-01 | Panasonic Intellectual Property Management Co., Ltd. | Ventilation device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0645909Y2 (ja) | 1994-11-24 |
