JPS63187079U - - Google Patents
Info
- Publication number
- JPS63187079U JPS63187079U JP7905987U JP7905987U JPS63187079U JP S63187079 U JPS63187079 U JP S63187079U JP 7905987 U JP7905987 U JP 7905987U JP 7905987 U JP7905987 U JP 7905987U JP S63187079 U JPS63187079 U JP S63187079U
- Authority
- JP
- Japan
- Prior art keywords
- under test
- magazine
- transport
- transport mechanism
- predetermined position
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007246 mechanism Effects 0.000 claims description 8
- 230000007723 transport mechanism Effects 0.000 claims description 6
- 210000000078 claw Anatomy 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7905987U JPS63187079U (cg-RX-API-DMAC7.html) | 1987-05-26 | 1987-05-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7905987U JPS63187079U (cg-RX-API-DMAC7.html) | 1987-05-26 | 1987-05-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63187079U true JPS63187079U (cg-RX-API-DMAC7.html) | 1988-11-30 |
Family
ID=30928572
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7905987U Pending JPS63187079U (cg-RX-API-DMAC7.html) | 1987-05-26 | 1987-05-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63187079U (cg-RX-API-DMAC7.html) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5487190A (en) * | 1977-12-23 | 1979-07-11 | Toshiba Corp | High temperature test equipment for electronic parts |
-
1987
- 1987-05-26 JP JP7905987U patent/JPS63187079U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5487190A (en) * | 1977-12-23 | 1979-07-11 | Toshiba Corp | High temperature test equipment for electronic parts |
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