JPS63177767U - - Google Patents
Info
- Publication number
- JPS63177767U JPS63177767U JP6876187U JP6876187U JPS63177767U JP S63177767 U JPS63177767 U JP S63177767U JP 6876187 U JP6876187 U JP 6876187U JP 6876187 U JP6876187 U JP 6876187U JP S63177767 U JPS63177767 U JP S63177767U
- Authority
- JP
- Japan
- Prior art keywords
- drivers
- testing device
- calibration
- semiconductor testing
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987068761U JPH0743666Y2 (ja) | 1987-05-08 | 1987-05-08 | 半導体試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987068761U JPH0743666Y2 (ja) | 1987-05-08 | 1987-05-08 | 半導体試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63177767U true JPS63177767U (fr) | 1988-11-17 |
| JPH0743666Y2 JPH0743666Y2 (ja) | 1995-10-09 |
Family
ID=30908879
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987068761U Expired - Lifetime JPH0743666Y2 (ja) | 1987-05-08 | 1987-05-08 | 半導体試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0743666Y2 (fr) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832178A (ja) * | 1981-08-19 | 1983-02-25 | Advantest Corp | Ｉｃテスタ |
| JPS61209370A (ja) * | 1985-03-13 | 1986-09-17 | Hitachi Electronics Eng Co Ltd | スキユ−補正方式 |
-
1987
- 1987-05-08 JP JP1987068761U patent/JPH0743666Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832178A (ja) * | 1981-08-19 | 1983-02-25 | Advantest Corp | Ｉｃテスタ |
| JPS61209370A (ja) * | 1985-03-13 | 1986-09-17 | Hitachi Electronics Eng Co Ltd | スキユ−補正方式 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0743666Y2 (ja) | 1995-10-09 |