JPS63175423A - Electron beam exposure equipment - Google Patents

Electron beam exposure equipment

Info

Publication number
JPS63175423A
JPS63175423A JP613087A JP613087A JPS63175423A JP S63175423 A JPS63175423 A JP S63175423A JP 613087 A JP613087 A JP 613087A JP 613087 A JP613087 A JP 613087A JP S63175423 A JPS63175423 A JP S63175423A
Authority
JP
Japan
Prior art keywords
aperture
apertures
lithography
pattern
electron beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP613087A
Other languages
Japanese (ja)
Other versions
JP2588183B2 (en
Inventor
Kiyomi Koyama
清美 小山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62006130A priority Critical patent/JP2588183B2/en
Publication of JPS63175423A publication Critical patent/JPS63175423A/en
Application granted granted Critical
Publication of JP2588183B2 publication Critical patent/JP2588183B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Electron Beam Exposure (AREA)

Abstract

PURPOSE:To reduce the number of shots and to improve a lithography through put by forming a beam by using an aperture formed to match a figure repeated ly presented in a pattern to be of lithography. CONSTITUTION:Variable beams are formed by using 1 plurality of sets of apertures 5 placed on a rodlike supporting plate clamped with a click stop type screw. The plurality of apertures 5 placed on the plate are formed in optimal shapes for the patterns predicted in advance for a lithography. In order to replace all the click stop type apertures 5, an electro-optical barrel may be locally down in vacuum with air locking valves 3, 4, and the apertures of another machine sets can be set in a short time. Thus, the lithography can be formed in a short time by selecting the aperture formed in response to the type and the layer of the pattern to be of the lithography.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は電子ビームを使って、マスクやSi ウェーハ
にLSIパターンを形成する電子ビーム露光装置に係わ
り、特に高い描画スループットが得られるように改良を
図った可変成形ビーム方式゛電子ビーム露光装置に関す
る。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to an electron beam exposure apparatus that uses an electron beam to form an LSI pattern on a mask or a Si wafer. This invention relates to a variable shaped beam type electron beam exposure apparatus which has been improved to achieve the desired results.

(従来の技術) 電子ビーム露光装置は近年益々高速性と高精度が要求さ
れて来ており、このような要求に対応する方式として可
変成形ビーム方式の電子ビーム露光装置が登場して来た
(Prior Art) In recent years, electron beam exposure apparatuses have been increasingly required to be faster and more precise, and variable-shaped beam type electron beam exposure apparatuses have been introduced as a method to meet these demands.

第4図は本方式の標準的電子ビーム露光装置で採用され
ている描画方法を模式的に示した図である。電子銃10
1から放射した電子ビームは第1成形アパーチヤ102
で矩形状にカットした像が。
FIG. 4 is a diagram schematically showing the drawing method employed in the standard electron beam exposure apparatus of this system. electron gun 10
The electron beam emitted from the first shaping aperture 102
A statue cut into a rectangular shape.

成形偏向器103の偏向を受けた後第2成形アパーチヤ
104上に投影される。この投影像と第2成形アパーチ
ヤ104のAND像が更に副偏向器105と主偏向器1
06の偏向を受けた後、被露光試料107上に投影され
て所望の図形が描かれる。副偏向器105は比較的狭い
領域を高速で位置決めして5hotする時に使い、主偏
向器106は副偏向器105が偏向する領域を位置決め
するのlこ使う。図では成形偏向器103.主偏向器1
06゜副偏向器105とも静電108極偏向器が使われ
ているが、これ以外の場合(例えば静電4極偏向器など
)もある。
After being deflected by the shaping deflector 103, it is projected onto the second shaping aperture 104. The AND image of this projected image and the second shaping aperture 104 is further combined with the sub deflector 105 and the main deflector 1.
After receiving the deflection 06, it is projected onto the exposed sample 107 to draw a desired figure. The sub-deflector 105 is used to position a relatively narrow area at high speed and perform five hot shots, and the main deflector 106 is used to position the area to be deflected by the sub-deflector 105. In the figure, a shaping deflector 103. Main deflector 1
Although an electrostatic 108-pole deflector is used as the 06° sub-deflector 105, there are other cases (for example, an electrostatic 4-pole deflector).

(発明が解決しようとする問題点) 従来の可変成形ビーム方式電子ビーム露光装置では可変
サイズの矩形や3角形を5hotの基本単位としている
。これは任意の図形が矩形や3角形の単位に分割でき、
この単位で成形ビームが得られれば任意のパターンの描
画が可能゛となるからである。
(Problems to be Solved by the Invention) In the conventional variable shaped beam type electron beam exposure apparatus, a variable size rectangle or triangle is used as the basic unit of 5 hots. This allows any figure to be divided into rectangular or triangular units,
This is because if a shaped beam is obtained in this unit, it becomes possible to draw any pattern.

例えば第5図にはメモリパターンのプロット図を2種顕
示しであるが、これらのパターンも矩形や3角形の5h
otをつなぎ合わせて描画することが出来る。
For example, Figure 5 shows two types of memory pattern plots, and these patterns are also rectangular and triangular 5h.
You can connect and draw ot.

ところが近年のLSIの益々の高集積化に対応して1 
chipで描画すべき図形数は激増し、必然的に成形ビ
ームの5hotの数も比例して激増して来ている。この
ような事情から1 chipの描画に要する時間も飛躍
的に増え、スループットが著しく低下するという問題が
出て来ていた。例えば第5図(a)のメモリパターン2
01はfl!5図(b)および第6図に示すパターン群
202が繰返しの単位となって′いるが1合計69個の
矩形や3角形の5hotに分解して描画する必要があり
、スループット向上の障害となっていた。
However, in response to the increasing integration of LSI in recent years, 1
The number of figures to be drawn with a chip has increased dramatically, and the number of 5-hot shaping beams has also increased proportionally. Due to these circumstances, the time required to draw one chip increases dramatically, resulting in a problem that the throughput decreases significantly. For example, memory pattern 2 in FIG. 5(a)
01 is fl! Although the pattern group 202 shown in FIG. 5(b) and FIG. 6 is a repeating unit, it is necessary to decompose it into 5 hots of 69 rectangles and triangles and draw it, which becomes an obstacle to improving throughput. It had become.

本発明はこのような問題点に対処すべくなされたもので
ある。
The present invention has been made to address these problems.

〔発明の構成〕[Structure of the invention]

C問題点を解決するための手段および作用)上述の問題
を解決するために本発明ではクリックストップ式のネジ
に固定された棒状、の支持板に複数組載置したアパーチ
ャを可変ビーム成形に使う。このクリックストップ式の
ネジはクリックストップで棒状のアパーチャの位置を電
子光学鏡筒の真空を破らずに変えて、電子光学系の光軸
位置に所望の組のアパーチャを固定することができる。
Means and operation for solving problem C) In order to solve the above problems, the present invention uses a plurality of sets of apertures mounted on a rod-shaped support plate fixed to a click-stop type screw for variable beam shaping. . This click-stop type screw can change the position of the rod-shaped aperture without breaking the vacuum of the electron optical column, thereby fixing a desired set of apertures at the optical axis position of the electron optical system.

支持板上に載置した複数のアパーチャ上には予め描画が
予想されるそれぞれのパターンについて最適な形状に加
工がなされている。あるパターンについて最適な形状と
は、例えばそのパターンに繰返し現われる図形々状その
ものか、その図形々状を構成する基本図形の組み合わせ
である。またこれらは1組のアパーチャに複数個あって
も良い。
A plurality of apertures placed on a support plate are processed in advance into optimal shapes for each pattern expected to be drawn. The optimal shape for a certain pattern is, for example, the figure itself that repeatedly appears in the pattern, or a combination of basic figures that make up the figure. Further, a plurality of these may be provided in one set of apertures.

更に、他の一般的な図形(例えば矩形や3角形)を発生
させるための形状も各組に備えられている。
Additionally, each set includes shapes for generating other common figures (eg, rectangles and triangles).

このクリックストップ式のアパーチャ全部を交換するに
はエアロツクバルブとの併用により電子光学鏡筒を局所
的に真空ダウンさせるだけで済む。
To replace all the click-stop apertures, all you need to do is locally vacuum down the electron optical lens barrel by using an air valve.

従って別の幾組かのアパーチャが短時間でセットする事
が可能である。このため、描画すべきパターンの種類や
レイヤーに応じて作られたアパーチャを選択して、従来
よりはるかに短時間で描画ができる。
Therefore, several different sets of apertures can be set in a short time. Therefore, by selecting an aperture created according to the type and layer of the pattern to be drawn, drawing can be done in a much shorter time than before.

(実施例) 以下に本発明を実施例を用いて説明する。第1図は本発
明の実施例を模式的に示す図で、1は電子銃カソード、
2と7は真空ポンプ、3と4はエアロツクバルブ、5は
クリックストップ式のネジに取付けた第1成形アパーチ
ヤ6は第2成形アパーチヤである。簡単のための種々の
レンズ、偏向器などは本図から省略しである。
(Example) The present invention will be described below using examples. FIG. 1 is a diagram schematically showing an embodiment of the present invention, in which 1 is an electron gun cathode;
2 and 7 are vacuum pumps, 3 and 4 are air valves, 5 is a first forming aperture attached to a click-stop type screw, and 6 is a second forming aperture. Various lenses, deflectors, etc. are omitted from this figure for simplicity.

エアロツクバルブ3、同4はクリックストップ式第1成
形アパーチヤ5を丸ごと交換するときクローズするが通
常はオープンの状態で電子銃カソード1から放射した電
子ビームが第1成形アパーチヤ5で成形される。第1成
形アパーチヤは第2図(a)にその上面図を示すように
幾組かの違った図形状の開口部が作られている。描画す
るパターンの種類又はレイヤーlζよって、この中の1
組が光軸に来るよう5のクリックストップのネジを調節
する。ここでは第2図の上から2番目のアパーチャが光
軸位置に来るように調節する。固有に拡大図が示しであ
る。描画時は描画データに従って。
The airlock valves 3 and 4 are closed when the click-stop type first shaping aperture 5 is completely replaced, but are normally kept open so that the electron beam emitted from the electron gun cathode 1 is shaped by the first shaping aperture 5. The first molded aperture has several sets of openings with different shapes, as shown in the top view of FIG. 2(a). Depending on the type of pattern to be drawn or the layer lζ, one of these
Adjust the click stop screw 5 so that the set is on the optical axis. Here, adjustment is made so that the second aperture from the top in FIG. 2 is at the optical axis position. An enlarged view is shown. When drawing, follow the drawing data.

第1成形アパーチヤ5上にある偏向器(図示せず)で5
個ある図形状の開口部の何れか一つに位置決めする。位
置決めされたアパーチャの像が、第2成形アパーチヤに
投影される。萬2成形アパーチャは第2図(b)に上面
図を示すような形状をしている。第2図体)で中央の矩
形アパーチャが位置決めされるとその像は第2図(b)
に点線で示すような第2成形アパーチヤの種々の位置に
投影され、その位置関係で任意長の矩形や種々の向きを
持つ3角形のビームが成形される。第2図(b)で周辺
4図形のうち何れか1つが位置決めされた場合はその像
は第2図(b)のアパーチャの中央部に投影され、即ち
第2成形アパーチヤでビームをカットされることなく第
1アパーチヤ像の形状を保って試料面に到達する。
5 with a deflector (not shown) on the first forming aperture 5.
Position it in any one of the figure-shaped openings. An image of the positioned aperture is projected onto the second shaping aperture. The two-piece molded aperture has a shape as shown in a top view in FIG. 2(b). When the central rectangular aperture is positioned in Figure 2 (B), the image is as shown in Figure 2 (b).
The beams are projected onto various positions of the second shaping aperture as shown by dotted lines in the figure, and rectangular beams with arbitrary lengths or triangular beams with various orientations are formed depending on the positional relationships. When any one of the four peripheral figures is positioned in Figure 2(b), its image is projected onto the center of the aperture in Figure 2(b), that is, the beam is cut by the second shaping aperture. It reaches the sample surface while maintaining the shape of the first aperture image.

第3図はこのような構成の電子ビーム露光装置でM6図
のパターンを描画する場合の5hot配色を示している
。第3図で1.2,4,6,7,10..11゜14.
17の番号を付された図形は第2図(a)の第1成形ア
パーチヤの中央の矩形に位置決めが行われて、その像を
第2図(b)の4の位置に投影して得た成形ビームを5
hot シて描画する。
FIG. 3 shows a 5-hot color scheme when drawing an M6 pattern using an electron beam exposure apparatus having such a configuration. 1.2, 4, 6, 7, 10 in Figure 3. .. 11°14.
The figure numbered 17 was obtained by positioning the figure in the central rectangle of the first forming aperture in Fig. 2(a) and projecting its image onto position 4 in Fig. 2(b). 5 shaped beams
Draw hot.

第3図3,13の番号の図形は第2図(a)で左上の図
形に位置決めして、その像を第2成形アパーチヤを素通
りさせて得た成形ビームを5hot l、て描画する。
Figures numbered 3 and 13 in Figure 3 are positioned at the top left figure in Figure 2(a), and their images are drawn by 5 hot l with a shaped beam obtained by passing through the second shaping aperture.

同様に第3図5,13の番号の図形は第2図(a)で右
上の図形に、第3図12.16の番号の図形は第2図(
a)で左下の図形に、また第3図9゜15の番号の図形
は第2図(a)で右下の図形に位置決めして、それぞれ
の像を第2成形アパーチヤを素通りさせて得た成形ビー
ムを5hot シて描画する。
Similarly, the figures numbered 5 and 13 in Figure 3 are the upper right figures in Figure 2 (a), and the figures numbered 12 and 16 in Figure 3 are the figures in Figure 2 (a).
The figure numbered 9゜15 in Figure 3 was positioned at the lower left figure in Figure a), and the figure numbered 9゜15 in Figure 2 was positioned at the lower right figure in Figure 2 (a), and the respective images were obtained by passing through the second forming aperture. Draw with a 5-hot shaped beam.

このようにして、第6図の従来例では595hotかか
ったものが、僅か17シヨツトで描画できることが確認
できた。
In this way, it was confirmed that the conventional example shown in FIG. 6 required 595 shots to be drawn, but could be drawn in only 17 shots.

(発明の効果) 以上実施例で説明したように、本発明によれば描画すべ
きパターンに繰り返し現われる図形に合わせて作られた
アパーチャを使ってビーム形成が行えるので、同一のパ
ターンを描画するのに従来法と比較して5hot数が飛
躍的に減少し描画スループットの大幅な向上が得られる
。また従来と較べ斜矩形を3角形などで近似して描画す
る必要性が少なくなるので、データ処理時間も低減でき
る。
(Effects of the Invention) As explained above in the embodiments, according to the present invention, beam formation can be performed using an aperture made in accordance with a figure that appears repeatedly in a pattern to be drawn, so that it is possible to form a beam using Compared to the conventional method, the number of 5-hots is dramatically reduced, and the drawing throughput is significantly improved. Furthermore, compared to the conventional method, there is less need to approximate and draw a diagonal rectangle using a triangle or the like, so data processing time can also be reduced.

本発明によれば予め描画すべきパターンIこ合わせた専
用のアパーチャを用意しておき、それを交換しながら、
高スループツトで描画することが可能になる。
According to the present invention, a dedicated aperture for the pattern I to be drawn is prepared in advance, and while being replaced,
It becomes possible to draw with high throughput.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示す平面図、第2図はアパー
チャ形状の例を示す平面図、第3図は本発明のメモリパ
ターンを示す図、第4図は可変成形ビーム方式電子ビー
ム露光装置の従来例を示す図、第5図は従来方式でメモ
リパターンを描画する時のsho を分割を示す図、第
6図はメモリパターンを示す図である。 1・・・電子銃カソード、2・・・真空ポンプ、3・・
・エアーロックバルブ% 5・・・クリックストップア
パーチャ(第1成形アパーチヤ)%6・・・第2成形ア
パーチヤ。 代理人 弁理士 則 近 憲 佑 同    竹 花 喜久勇 第  3 図 第  4 図
FIG. 1 is a plan view showing an embodiment of the present invention, FIG. 2 is a plan view showing an example of an aperture shape, FIG. 3 is a view showing a memory pattern of the present invention, and FIG. 4 is a variable shaped beam type electron beam. A diagram showing a conventional example of an exposure apparatus, FIG. 5 is a diagram showing division of sho when drawing a memory pattern in the conventional method, and FIG. 6 is a diagram showing a memory pattern. 1... Electron gun cathode, 2... Vacuum pump, 3...
-Air lock valve% 5...Click stop aperture (first molded aperture)%6...Second molded aperture. Agent Patent Attorney Noriyuki Chika Yudo Takehana Kikuyu Figure 3 Figure 4

Claims (1)

【特許請求の範囲】[Claims] 棒状の薄い板等に複数組みのアパーチャを載置させ、ク
リックストップ式のネジにこのアパーチャを載置した板
を固定して電子光学系の鏡筒に取付け、描画するチップ
の種類又はレイヤー毎に、前記クリックストップ式のネ
ジを回転させて所望のアパーチャを選択して、このアパ
ーチャを使って成形させた種々の形状の成形ビームを用
いて描画することを特徴とする可変成形ビーム方式の電
子ビーム露光装置。
Multiple sets of apertures are placed on a rod-shaped thin plate, etc., and the plate with the apertures placed on it is fixed to a click-stop type screw and attached to the lens barrel of the electron optical system. , a variable shaped beam type electron beam characterized in that a desired aperture is selected by rotating the click stop screw, and writing is performed using shaped beams of various shapes formed using this aperture. Exposure equipment.
JP62006130A 1987-01-16 1987-01-16 Electronic beam exposure system Expired - Fee Related JP2588183B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62006130A JP2588183B2 (en) 1987-01-16 1987-01-16 Electronic beam exposure system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62006130A JP2588183B2 (en) 1987-01-16 1987-01-16 Electronic beam exposure system

Publications (2)

Publication Number Publication Date
JPS63175423A true JPS63175423A (en) 1988-07-19
JP2588183B2 JP2588183B2 (en) 1997-03-05

Family

ID=11629915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62006130A Expired - Fee Related JP2588183B2 (en) 1987-01-16 1987-01-16 Electronic beam exposure system

Country Status (1)

Country Link
JP (1) JP2588183B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5731591A (en) * 1996-01-19 1998-03-24 Nec Corporation Beam exposure system having improved mask unit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53143175A (en) * 1977-05-20 1978-12-13 Hitachi Ltd Electron beam drawing apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53143175A (en) * 1977-05-20 1978-12-13 Hitachi Ltd Electron beam drawing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5731591A (en) * 1996-01-19 1998-03-24 Nec Corporation Beam exposure system having improved mask unit

Also Published As

Publication number Publication date
JP2588183B2 (en) 1997-03-05

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