JPS6317252Y2 - - Google Patents

Description

[Detailed explanation of the invention] (1) Technical field of the invention This invention relates to an IC autohandler used for final IC testing.

(2) Technology background IC that accurately measures and classifies a large number of ICs in a short time
The popularity of autohandlers is increasing as ICs are used in large quantities these days. IC like this
Of course, in an autohandler,
In order to improve the performance and precision of ICs, it is necessary to improve their measurement and classification accuracy.

(3) Conventional technology and problems In conventional IC autohandlers, after measuring ICs with measurement contacts, the ICs are classified according to the measurement results and checked until they are automatically placed in a designated container. However, there were cases where misclassification occurred.

ICs are classified by measuring their electrical characteristics using measurement contacts, and in addition to classifying whether the IC is good or defective, for example, the measurement time among good ICs is also classified.

In other words, the types of containers are, for example, a defective product storage container, a good product IC storage container with a measurement time of 1 second,
Good IC storage containers with a measurement time of 2 seconds, etc.
Among good-quality ICs, those whose measurement time is shorter are used for higher-precision circuits.

(4) Purpose of the invention The purpose of the present invention is to provide an IC autohandler that solves the above-mentioned conventional drawbacks and correctly classifies ICs into predetermined containers according to measurement results.

(5) Structure of the invention In order to achieve the above-mentioned purpose, the present invention includes: an inclined track surface on which a semiconductor device (IC) is allowed to fall at an angle due to its own weight; A stopper for stopping the IC during measurement, two photo sensors arranged at a predetermined interval on the inclined track surface downstream of the stopper for detecting the IC passing through the inclined track surface, and a stopper for stopping the IC during measurement. a classification table for accommodating the IC and transporting the IC to a classification destination classified according to the measurement results; a photo sensor provided for each classification destination to detect the stop position of the classification table; A container that receives ICs from a classification table, a photo sensor installed at the insertion port of the container to detect the passage of ICs, and a measured IC that detects signals from the photo sensor and stopper in a predetermined order and time, and ,
An IC equipped with a detection circuit that detects whether or not it is placed in a predetermined classification container according to the measurement results.
It provides an autohandler.

(6) Example of the invention Figure 1 is a side view partially showing the schematic configuration of the IC autohandler according to the invention, Figure 2 is a circuit block diagram showing the IC measurement/classification system according to the invention, and Figure 3 The figure is a diagram showing the stored contents of the memory in FIG. 2.

In Fig. 1, 1 is the main body of the device, 2 is a measurement contact, 3 is a vertically movable stopper, 4, 5,
6 and 7 are photo sensors in which a light emitting element and a light receiving element are paired; 8 is a classification table; 9 is a container; 10
is an inclined surface.

The measurement contact 2 is formed of a comb-shaped contact as is well known, and is used to measure the electrical characteristics of an IC (not shown) sliding on the inclined surface 10 by gravity from the direction of the arrow a. In this measurement, the measurement contact 2 in the open state closes and contacts the terminal pin of the IC, and the measurement circuit performs the measurement according to a predetermined program, and the result is obtained. The stopper 3 is for stopping the IC during measurement, and is equipped with a sensor (not shown) that generates a detection signal A when the stopper falls and when it rises, respectively. Photo sensor 4 and 5
monitors the passage of the IC over the inclined surface 10, and generates detection signals B and C when the IC passes between the light emitting element and the light receiving element.

The photo sensors 6 detect the position of the classification table 8, and in the illustrated example, four photo sensors 6 are provided along the moving direction of the classification table 8. This photo sensor 6 is connected to one of the table 8.
A detection signal D is generated when the motor stops corresponding to the number of motors.

The photo sensor 7 has a light emitting element and a light receiving element arranged facing each other in the IC insertion slot 11 corresponding to each of the four containers 9, and the photo sensor 7 has a light emitting element and a light receiving element arranged facing each other in the IC insertion slot 11 corresponding to each of the four containers 9.
Detects the IC and generates a detection signal E.

Container 9 is ICs classified according to measurement results.
For example, the measurement time is 0.5
Good ICs of 0.5 to 1 second, 1 to 2 seconds, and 2 to 3 seconds are stored separately. At this time, as a result of measurement using measurement contact 2, it was determined that the product was defective.
The IC is removed at that point or when it slides on the inclined surface 10 between the photo sensors 4 and 5.

The classification table 8 is for loading the measured ICs supplied from the slope 10 and transporting them to the container 9 corresponding to the measurement result, and the container 9 side is equipped with a stopper (not shown) for stopping the loaded ICs. ing.

The IC flow of this IC autohandler is
The ICs that are continuously and intermittently supplied from the supply section over a certain period of time are measured by the measurement contacts, and then slide on the inclined surface 10 and are once supported on the classification table 8. After that, the classification table 8 moves and stops when it faces the container 9 selected according to the measurement result, and then the above-mentioned stopper of the classification table 8 is opened to insert the IC through the insertion port 11. and store it in the container 9.

FIG. 2 shows a measurement classification system for preventing IC misclassification according to the present invention, and A to E indicate the above-mentioned detection signals. This includes an IC flow detection circuit 12, an IC accommodation state detection circuit 13, a memory 14, a stopper drive circuit 15, a classification table drive circuit 16, and an alarm circuit 17, which are controlled and executed by a controller 18. The structure is structured so that

The IC flow detection circuit 12 includes a counter 19, an IC detection circuit 20, a detection time detection circuit 21, and comparators 22 and 23. And counter 19
The IC flow order is determined by sequentially counting signals A, B, and C, and control is performed so that the comparator 22 sequentially compares the detected contents of the IC detection circuit 20 and the stored contents in the memory 1 corresponding to the counter value. be done.
In the memory 1, the detected or non-detected states of the photo sensors 4 and 5 are stored in advance in accordance with the flow order of the ICs as shown in FIG. The IC flow order "0" is a state in which the IC is being measured by the measurement contact 2, and the signals B and C at this time are detected by the IC detection circuit 20, and the detected state is the content of the order "0" in the memory 1. compared to The order "1" is when the stopper drive circuit 15 is driven by the controller 18 and the stopper 3 is raised;
At the time when the IC's photo sensor 4 is passing, the order "3" is
When the IC is located between photo sensors 4 and 5,
The order "4" is when the IC is passing through the photo sensor 5,
The order "5" is the passing time of the photo sensor 5 of the IC, and these are compared with the contents of the memory 1 in the same way as in the case of the order "0" described above.

If the detection circuit 12 and the memory 1 do not match, the comparator 22 outputs the abnormal state to the controller 18.
activates the alarm circuit 17 to notify of an abnormality.

Note that the installation distance of photo sensors 4 and 5 is
As is clear from the memory contents, the distance is set to be slightly longer than the dimensions of one IC.

Further, the detection circuit 21 detects the time between when the photo sensor 4 detects the IC and when the photo sensor 5 next detects the IC, that is, the time between the order "2" and "4", and the detection circuit 21 detects the time between the order "2" and "4", and The comparator 23 compares the detection time with the standard detection time stored in the memory, and if they do not match, an abnormality is notified via the controller 18 and alarm circuit 17.

In this way, in the IC flow detection circuit 22, the comparator 2
By the outputs of 2 and 23, it can be determined whether the ICs are flowing according to a fixed order and time, e.g., two ICs are moving without a gap (two together). It can be treated as an abnormality even if

The IC accommodation state detection circuit 13 is a means for detecting whether or not the IC is correctly accommodated in a predetermined container according to the measurement result, and is configured so that the signal D and the contents of the memory 3 are compared by a comparator 24. There is.

That is, the measurement circuit 25 measures the IC via the measurement contact 2, and determines to which category it belongs based on the measurement results. This determination result is temporarily stored in the memory 3, and when the controller 18 detects that the IC has been installed in the classification table 8 (the table 8 is provided with an installation completion switch (not shown)), the controller 18 transfers the classification table from the memory 3. The classification data on table 8 is read and the classification table driving circuit 16 is driven accordingly to move table 8 to arrow b or b' (see FIG. 1).
At this time, the data in the memory 3 is compared with the D signal read out when the table 8 is stopped by the comparator 24, and a check is made to see if the classification destination is correct.If they do not match, the comparator 24 A signal to that effect is output to the controller 18, and the alarm circuit 17 is driven. If they match, a signal to that effect is also output to the controller 18,
The controller 18 drives the stopper drive circuit 15 to operate the stopper of the table 8 mentioned above.
Drop the IC into insertion slot 7.

Finally, the photo sensor 7 actually performs the
Confirmation that the IC has entered the container 9 is given to the controller 18 by signal E, and -cycle IC measurement and classification confirmation is performed.

(7) Effects of the invention According to the invention described above, it is possible to continuously trace the IC flow after measurement, and it is possible to strictly check the IC flow and prevent misclassification. The practical effects are significant.

[Brief explanation of the drawing]

Figure 1 is a side view partially showing the schematic configuration of the IC autohandler according to the present invention, Figure 2 is a circuit block diagram showing the IC measurement/classification system according to the present invention, and Figure 3 is the memory in Figure 2. FIG. Explanation of symbols, 2 is measurement contact, 4, 5,
6 and 7 are photo sensors, 8 is a classification table, 9 is a container, 12 is an IC flow detection circuit, 13 is an IC accommodation state detection circuit, 14 is a memory, and 18 is a controller.

Claims (1)

[Scope of Claim for Utility Model Registration] An inclined raceway surface on which a semiconductor device (IC) is inclined to fall under its own weight, a measurement contact provided on the upper part of the raceway surface for measuring the electrical characteristics of the IC, and a measurement contact for measuring the electrical characteristics of the IC. a first stopper for stopping the IC; a determination circuit for determining the classification destination according to the measurement result of the IC; a memory circuit for storing the determination result; first and second photo sensors that are arranged at predetermined intervals and detect ICs passing through the inclined track surface; a classification table that accommodates and transports the ICs and has a second stopper; and classification destination data of the storage circuit. a classification table driving circuit that moves the classification table according to the classification table; a third photo sensor that is provided for each classification destination and detects the stop position of the classification table; and an output of the third photo sensor and a classification table of the storage circuit. a comparison circuit that compares the data with the previous data; a stopper drive circuit that releases the second stopper of the classification table and causes the data to pass through the IC when the results of the comparison circuit match; A container that receives ICs from a table, and a fourth photo sensor that is installed at an insertion port for the container and detects passage of ICs;
An IC autohandler characterized by detecting whether or not the IC is stored in a container of a predetermined classification destination according to measurement results.