JPS63170778U - - Google Patents

Info

Publication number
JPS63170778U
JPS63170778U JP6447087U JP6447087U JPS63170778U JP S63170778 U JPS63170778 U JP S63170778U JP 6447087 U JP6447087 U JP 6447087U JP 6447087 U JP6447087 U JP 6447087U JP S63170778 U JPS63170778 U JP S63170778U
Authority
JP
Japan
Prior art keywords
circuit
exclusive
input
under test
connect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6447087U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6447087U priority Critical patent/JPS63170778U/ja
Publication of JPS63170778U publication Critical patent/JPS63170778U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】
第１図は本考案に係る半導体素子の検査装置の
一実施例を示す回路構成ブロツク図である。第２
図は半導体素子の検査装置の従来例を示す回路構
成ブロツク図である。 １１…被試験素子、１２…標準素子、１４…論
理和回路、ｃ１，ｃ２…ｃｎ，ｄ１，ｄ２…ｄｎ
…入力端子、ｅ１，ｅ２…ｅｎ，ｆ１，ｆ２，…
ｆｎ…出力端子、Ｐ１，Ｐ２，…Ｐｎ…排他的論
理和回路。

Claims (1)

    【実用新案登録請求の範囲】
  1. 被試験素子の各入力端子に対応させて、被試験
    素子と同一で且つ良品判定された標準素子の各入
    力端子を接続し、上記両素子の夫々対応する各出
    力端子を排他的論理和回路に入力接続し、更に排
    他的論理和回路の出力を論理和回路に入力接続し
    たことを特徴とする半導体素子の検査装置。
JP6447087U 1987-04-28 1987-04-28 Pending JPS63170778U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6447087U JPS63170778U (ja) 1987-04-28 1987-04-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6447087U JPS63170778U (ja) 1987-04-28 1987-04-28

Publications (1)

Publication Number Publication Date
JPS63170778U true JPS63170778U (ja) 1988-11-07

Family

ID=30900659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6447087U Pending JPS63170778U (ja) 1987-04-28 1987-04-28

Country Status (1)

Country Link
JP (1) JPS63170778U (ja)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5637572A (en) * 1979-09-05 1981-04-11 Toshiba Corp Test unit for semiconductor circuit
JPS61105474A (ja) * 1984-10-29 1986-05-23 Toshiba Corp 半導体装置試験用ボ−ドの検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5637572A (en) * 1979-09-05 1981-04-11 Toshiba Corp Test unit for semiconductor circuit
JPS61105474A (ja) * 1984-10-29 1986-05-23 Toshiba Corp 半導体装置試験用ボ−ドの検査装置

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