JPS63167255A - 電子計数装置 - Google Patents

電子計数装置

Info

Publication number
JPS63167255A
JPS63167255A JP31123886A JP31123886A JPS63167255A JP S63167255 A JPS63167255 A JP S63167255A JP 31123886 A JP31123886 A JP 31123886A JP 31123886 A JP31123886 A JP 31123886A JP S63167255 A JPS63167255 A JP S63167255A
Authority
JP
Japan
Prior art keywords
voltage
anode
counting
anode voltage
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31123886A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0573190B2 (enrdf_load_stackoverflow
Inventor
Masayuki Uda
応之 宇田
Hiroshi Ishida
博志 石田
Atsushi Manmoto
敦 万本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hochiki Corp
RIKEN
Original Assignee
Hochiki Corp
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hochiki Corp, RIKEN filed Critical Hochiki Corp
Priority to JP31123886A priority Critical patent/JPS63167255A/ja
Publication of JPS63167255A publication Critical patent/JPS63167255A/ja
Publication of JPH0573190B2 publication Critical patent/JPH0573190B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Radiation (AREA)
JP31123886A 1986-12-27 1986-12-27 電子計数装置 Granted JPS63167255A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31123886A JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31123886A JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Publications (2)

Publication Number Publication Date
JPS63167255A true JPS63167255A (ja) 1988-07-11
JPH0573190B2 JPH0573190B2 (enrdf_load_stackoverflow) 1993-10-13

Family

ID=18014753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31123886A Granted JPS63167255A (ja) 1986-12-27 1986-12-27 電子計数装置

Country Status (1)

Country Link
JP (1) JPS63167255A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110672001A (zh) * 2019-10-24 2020-01-10 中航通飞华南飞机工业有限公司 一种铁磁性材料表面非铁磁材料厚度测量方法及装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110672001A (zh) * 2019-10-24 2020-01-10 中航通飞华南飞机工业有限公司 一种铁磁性材料表面非铁磁材料厚度测量方法及装置

Also Published As

Publication number Publication date
JPH0573190B2 (enrdf_load_stackoverflow) 1993-10-13

Similar Documents

Publication Publication Date Title
Coates The origins of afterpulses in photomultipliers
EP0309956A2 (en) Method of testing semiconductor elements and apparatus for testing the same
JPH01171225A (ja) プラズマ処理装置及び方法
US20100231194A1 (en) Method and device for monitoring plasma discharges
Anikin et al. Breakdown development at high overvoltage: electric field, electronic level excitation and electron density
US4721910A (en) High speed circuit measurements using photoemission sampling
CN106196159B (zh) 火焰检测系统
US4554455A (en) Potential analyzer
De Martini et al. Photomultiplier Gate for Stimulated‐Spontaneous Light Scattering Discrimination
JPS63167255A (ja) 電子計数装置
JP2723215B2 (ja) 動作中に集積回路の機能を監視する方法と装置
Chen et al. Excitation of the B Π g 3 states of N 2 by electron impact
JP3597054B2 (ja) 飛行時間型質量分析計
Golden et al. Role of resonances in the electron-impact excitation functions of the C Π u 3 and E Σ g+ 3 states of N 2
RU2737511C1 (ru) Способ контроля дефектности изоляции обмоточных проводов
JPH0789148B2 (ja) 電子計数装置
Ballantine Fluctuation noise due to collision ionization in electronic amplifier tubes
Haydon et al. Time-resolved studies of the electrical breakdown of a gas at radio frequencies
JPH02171644A (ja) 電子計数装置
JP3309491B2 (ja) 蛍光ランプの検査方法
JPH0376841B2 (enrdf_load_stackoverflow)
JPH0786347A (ja) 荷電粒子ビーム試験装置
JPH0547041B2 (enrdf_load_stackoverflow)
SU1274028A1 (ru) Устройство дл измерени потенциала поверхности в растровом электронном микроскопе
JPH0556459B2 (enrdf_load_stackoverflow)

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees