JPS6315815Y2 - - Google Patents
Info
- Publication number
- JPS6315815Y2 JPS6315815Y2 JP16669282U JP16669282U JPS6315815Y2 JP S6315815 Y2 JPS6315815 Y2 JP S6315815Y2 JP 16669282 U JP16669282 U JP 16669282U JP 16669282 U JP16669282 U JP 16669282U JP S6315815 Y2 JPS6315815 Y2 JP S6315815Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- laser beam
- axis
- reflecting mirror
- plane reflecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Mechanical Optical Scanning Systems (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16669282U JPS5971157U (ja) | 1982-11-02 | 1982-11-02 | 分光分析装置におけるスキヤニング装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16669282U JPS5971157U (ja) | 1982-11-02 | 1982-11-02 | 分光分析装置におけるスキヤニング装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5971157U JPS5971157U (ja) | 1984-05-15 |
JPS6315815Y2 true JPS6315815Y2 (enrdf_load_stackoverflow) | 1988-05-06 |
Family
ID=30364874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16669282U Granted JPS5971157U (ja) | 1982-11-02 | 1982-11-02 | 分光分析装置におけるスキヤニング装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5971157U (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100396954B1 (ko) * | 2001-03-27 | 2003-09-03 | 임채헌 | 광원의 파장 분석용 필터박스 및 필터박스를 이용한 세포분석 장치 |
JP2011013167A (ja) * | 2009-07-06 | 2011-01-20 | Hitachi High-Technologies Corp | 分光蛍光光度計及び試料セル |
-
1982
- 1982-11-02 JP JP16669282U patent/JPS5971157U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5971157U (ja) | 1984-05-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11169366B2 (en) | Compact microscope | |
US4917462A (en) | Near field scanning optical microscopy | |
US5825020A (en) | Atomic force microscope for generating a small incident beam spot | |
US6144455A (en) | Fluorometer | |
CN104502315A (zh) | 一种微区荧光扫描测量系统 | |
US5473157A (en) | Variable temperature near-field optical microscope | |
US6495812B1 (en) | Apparatus and method for analyzing an object of interest having a pivotably movable source and detector | |
CN120352445A (zh) | 集成测量系统 | |
JPH0797078B2 (ja) | 赤外線顕微分光測定装置 | |
JPH11132728A (ja) | 光学的サンプルの厚み測定方法および装置 | |
CN106198407B (zh) | 一种样品空间扫描及定位装置 | |
US4922104A (en) | Infrared microspectrometer | |
JPS6315815Y2 (enrdf_load_stackoverflow) | ||
KR101493838B1 (ko) | 광발광 측정 및 이미징 장치 | |
US7177019B2 (en) | Apparatus for imaging metrology | |
JPS62133339A (ja) | ルミネツセンス測定装置 | |
JPH0786460B2 (ja) | 光ルミネセンスによる半導体試料の特性表示デバイス | |
JP2009123477A (ja) | 紫外・可視・近赤外吸収スペクトル測定用試料ホルダー | |
CN117491327B (zh) | 一种显微共聚焦荧光光谱仪 | |
US5229611A (en) | Infrared microscopic spectrometer using the attenuated total reflection method | |
Visser et al. | Construction of a liquid He cryostat insert for high spatial resolution photoluminescence experiments on GaAs | |
RU2112209C1 (ru) | Устройство для определения толщины покрытий рентгенофлуоресцентным методом | |
US7042580B1 (en) | Apparatus for imaging metrology | |
Marquardt et al. | A surface science compatible epifluorescence microscope for inspection of samples under ultra high vacuum and cryogenic conditions | |
US20230273134A1 (en) | Transmission x-ray diffraction apparatus and related method |