JPS63141370A - Manufacture of thyristor - Google Patents

Manufacture of thyristor

Info

Publication number
JPS63141370A
JPS63141370A JP28801286A JP28801286A JPS63141370A JP S63141370 A JPS63141370 A JP S63141370A JP 28801286 A JP28801286 A JP 28801286A JP 28801286 A JP28801286 A JP 28801286A JP S63141370 A JPS63141370 A JP S63141370A
Authority
JP
Japan
Prior art keywords
jcr
bevel
thyristor
substrate
applying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28801286A
Other languages
Japanese (ja)
Inventor
Kozo Tsukada
塚田 剛三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP28801286A priority Critical patent/JPS63141370A/en
Publication of JPS63141370A publication Critical patent/JPS63141370A/en
Pending legal-status Critical Current

Links

Landscapes

  • Thyristors (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To remove a thin section and the formation of air bubbles in the case of a JCR and thoroughly protect its surface by causing a thyristor element to rotate under a state in which its element is held almost in the vertical direction on the occasion of applying the JCR to a bevel part of the thyristor element having a SIGMA bevel. CONSTITUTION:A thyristor element 10 where a silicon substrate 1 is glued to its Mo support plate 2 is fit in a chuck jig 7 and a central axis 71 of its jig 7 is held by obtaining an inclination of 20 deg. to a level surface. Its rotation axis 71 of the chuck jig is connected to a motor 8 and its motor 8 is supported by a prop 82 that is vertically erected on a stand 81. The motor 8 rotates at a low speed in this state and allow a dispenser 9 to drip a JCR 5 to a bevel part of the substrate 1 so as to apply it. After applying it, a primary drying of the JCR 5 is performed while the element 10 rotates. In the case of applying it, as the rotation axis is so inclined to a horizontal plane that a lower part of JCR 5 becomes slightly thick. However, it is also true that since its element 10 is held almost vertically, no adhesion of JCR 5 to the sides of the Mo plate 2 and no development of thin parts of the JCR on an upper part of a SIGMA bevel or of the remainder of air bubbles in the JCR are caused when the JCR is applied.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、交互に異なる導電形の三つの層が基板面に平
行な接合を介して隣接しており、基板面に平行な基板横
断面の面積が板厚の中央部で最も小さくされたシグマ 
(Σ)ベベル構造を有するサイリスタの製造方法に関す
る。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is characterized in that three layers of alternately different conductivity types are adjacent to each other via bonds parallel to the substrate surface, and the cross-section of the substrate parallel to the substrate surface is sigma whose area is smallest at the center of the plate thickness
(Σ) A method of manufacturing a thyristor having a bevel structure.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

高耐圧サイリスタの高抵抗のベース層をはさむPN接合
に逆バイアスがかかったときの表面電界強度を低減させ
るために、両PN接合の基板側面への露出部をそれぞれ
正ベベルにするために、第2図に示すようにpNpN4
F!tを存するシリコン基板lの側面がV形の断面形伏
をもつように成形されるΣベベル構造が知られている。
In order to reduce the surface electric field strength when a reverse bias is applied to the PN junction sandwiching the high-resistance base layer of a high-voltage thyristor, the exposed portions of both PN junctions to the side surfaces of the substrate are made to have positive bevels. pNpN4 as shown in Figure 2
F! A Σ bevel structure is known in which the side surface of the silicon substrate l having the t is formed so as to have a V-shaped cross-sectional shape.

このようなサイリスタは、シリコン基板1と支持板とし
てのMo板2を合金接着し、ゲート電極3.カソード電
極4を被着したのち、基板1の側面を砂噴射法によりあ
るいはダイヤモンドカッタを用いてΣベベル加工し、ベ
ベル部をエツチングしたサイリスタエレメントlOを平
面上に置き、中心軸11を中心として回転させて接合被
覆樹脂(以下JCRと記す)5を塗布していた。しかし
、この方法では、図示のようにJCR5がMo板2の側
面に流れ出て、精度の高い組立の障害となるため、Mo
板2の側面のJCR5を完全に除去しなければならなか
った。
Such a thyristor consists of a silicon substrate 1 and a Mo plate 2 serving as a support plate bonded with an alloy, and a gate electrode 3. After the cathode electrode 4 has been deposited, the side surface of the substrate 1 is processed into a Σ bevel using a sand blasting method or a diamond cutter, and the thyristor element lO with the beveled part etched is placed on a flat surface and rotated about the central axis 11. Then, a bonding coating resin (hereinafter referred to as JCR) 5 was applied. However, with this method, JCR5 flows out to the side of the Mo plate 2 as shown in the figure, which obstructs highly accurate assembly.
JCR5 on the side of plate 2 had to be completely removed.

また、第3図に示すようにMo仮2の周辺部に、J C
R流れ止め21を設けて、JCR5を塗布する方法もあ
るが、この方法も前記方法と同様、Σベベルの上部のJ
 CR5の厚みが薄くなる。そこでJCR5の厚みを充
分確保するために、第4図に示すように、Mo板2の径
と同一の内径をもつリング22をエレメント10周辺に
かぶせ、シリコン基板1の上面の周辺部にJCR流れ止
めを設けてリング22とサイリスタ基板1との間にJC
R5を充填する方法がある。
In addition, as shown in Fig. 3, J C
There is also a method of applying JCR5 by providing an R flow stopper 21, but this method is also similar to the method described above, since the JCR5 is applied at the top of the Σ bevel.
The thickness of CR5 becomes thinner. Therefore, in order to ensure a sufficient thickness of the JCR 5, a ring 22 having the same inner diameter as the diameter of the Mo plate 2 is placed around the element 10, as shown in FIG. A stop is provided to connect the JC between the ring 22 and the thyristor board 1.
There is a method of filling R5.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のように、Σベベル構造をもつサイリスタエレメン
トにJCRを塗布しようとする際、第2図、第3図に示
した方法ではJCR5の厚みの薄い部分が生じ、600
0 Vを越える高耐圧サイリスタでは、JCRの薄いと
ころで放電するという欠点がある。また第4図に示した
方法でも、ガスの脱出がベベルの突出部にさえぎられて
Σベベルの上部に気泡24ができやすく、気泡部で放電
するという欠点があった。
As mentioned above, when trying to apply JCR to a thyristor element with a Σ bevel structure, the method shown in FIGS. 2 and 3 produces a thin part of JCR5.
A high breakdown voltage thyristor exceeding 0 V has the disadvantage that discharge occurs at a thin JCR. Furthermore, the method shown in FIG. 4 also has the disadvantage that gas escape is obstructed by the protruding portion of the bevel and bubbles 24 are likely to form at the top of the Σ bevel, causing discharge at the bubble portion.

本発明の目的は、基板面に平行な基板横断面の面積が板
厚中央部において最小のΣベベル構造をもつサイリスタ
基板の側面にJCRを塗布する際に0、放電の原因とな
るJCRの厚さの薄い部分あるいは気泡の発生がなく、
表面保護が十分で信転性の高いサイリスタの製造方法を
提供することにある。
The object of the present invention is to reduce the thickness of JCR, which causes discharge, when applying JCR to the side surface of a thyristor substrate having a Σ bevel structure where the cross-sectional area of the substrate parallel to the substrate surface is the smallest at the center of the thickness. There are no thin areas or bubbles,
An object of the present invention is to provide a method for manufacturing a thyristor with sufficient surface protection and high reliability.

〔問題点を解決するための手段〕[Means for solving problems]

上記の目的を達成するために、本発明の方法は、サイリ
スタ基板面をほぼ鉛直面にして回転させながら、基板側
面上方よりJCRを落下させてJCRを塗布し、乾燥さ
せるものとする。
In order to achieve the above object, the method of the present invention is to apply JCR by dropping JCR from above the side surface of the thyristor substrate while rotating the thyristor substrate with the surface substantially vertical, and then drying the thyristor substrate.

〔作用〕[Effect]

はぼ鉛直な状態で回転する基板側面にJCRを塗布する
ことにより、重力によりJCRがΣベベル下部に偏って
付着したり、支持板側面まで流れ落ちることがなく、ま
たΣベベルの開口部が上方に向いているのでガスが脱出
しやすいため気泡が残ることもなく、はぼ均一な厚さを
有するJCRによってPN接合露出部を保護することが
できる。
By applying JCR to the side of the board that rotates in a vertical state, the JCR will not stick to the bottom of the Σ bevel due to gravity or run down to the side of the support plate, and the opening of the Σ bevel will be directed upward. The exposed portion of the PN junction can be protected by the JCR, which has a nearly uniform thickness, so that gas can easily escape, leaving no bubbles.

〔実施例〕〔Example〕

第1図は、本発明の一実施例のJCR塗布装置を示し、
第2〜第4図と共通の部分には同一の符号が付されてい
る0例えば直径82鶴のシリコン基板1を直径85龍の
10支持板2に接着したサイリスタエレメント10をチ
ャック治具7に嵌め、チャック治具7の中心軸71を水
平に対し20′″の角度に傾けて保持する。これにより
エレメント10は治具7から落ちることがない、チャッ
ク治具回転軸71はモータ8に接続されており、モータ
8は台81の上に立てられた支柱82によって支持され
ている。この状態でモータ8を低速で回転し、基板1の
ベベル部にディスペンサ9よりJCR5を滴下させて塗
布する。塗布後、エレメント10を回転させなからJC
Rの一次乾燥を施す、これにより第5図に示したように
JCR5によりΣベベル面を保護されたサイリスタエレ
メント10を得ることができる。
FIG. 1 shows a JCR coating device according to an embodiment of the present invention,
Parts common to those in FIGS. 2 to 4 are given the same reference numerals.0 For example, a thyristor element 10 in which a silicon substrate 1 with a diameter of 82 mm is bonded to a support plate 2 with a diameter of 85 mm is attached to a chuck jig 7. Fit and hold the central axis 71 of the chuck jig 7 at an angle of 20'' with respect to the horizontal. This prevents the element 10 from falling off the jig 7, and the chuck jig rotating shaft 71 is connected to the motor 8. The motor 8 is supported by a support 82 placed on a stand 81. In this state, the motor 8 is rotated at low speed, and JCR5 is applied by dropping it onto the bevel portion of the substrate 1 from the dispenser 9. .After coating, do not rotate the element 10.
By performing primary drying of R, it is possible to obtain a thyristor element 10 whose Σ bevel surface is protected by JCR5 as shown in FIG.

塗布時の回転軸が水平に対して傾いているので、JCR
5は下方がやや厚くなっているが、エレメント10を鉛
直に近い状態で保持しているため、JCR5はMo板2
の側面への付着ならびにΣベベル上部のJCR5の薄い
部分あるいはJCR内の気泡残りの発生がなくなる。
Since the rotation axis during application is tilted with respect to the horizontal, JCR
5 is slightly thicker at the bottom, but because the element 10 is held in a nearly vertical state, JCR5 is similar to Mo board 2.
This eliminates adhesion to the sides of the Σ bevel, as well as the formation of air bubbles in the thin part of JCR5 on the top of the Σ bevel or in the JCR.

この実施例では、すでにΣベベル部のエツチングを施し
たエレメントlOをチャック治具7に取付けたが、この
塗布装置を用いてエツチングからJCR塗布までの工程
を実施することもできる。
In this embodiment, the element IO whose Σ bevel portion has been etched is attached to the chuck jig 7, but this coating device can also be used to perform the steps from etching to JCR coating.

(発明の効果〕 本発明によれば、Σベベルを有するサイリスタエレメン
ト耗のベベル部にJCRを塗布する際、サイリスタエレ
メントをほぼ鉛直方向に保持した状態で回転させるため
、JCRがベベル面にとどまって不必要な箇所まで流出
することなく、ベベル上部のJCRの薄い個所も生じな
い。また塗布時にΣベベルが上方に向いて開いているた
め、JCRからのガスの脱出が容易で、JCRを厚くし
ても気泡ができにくくなる。この結果、サイリスタの安
定した耐圧が保持され、サイリスタ製造歩留りが向上す
る。
(Effects of the Invention) According to the present invention, when applying JCR to the worn bevel portion of a thyristor element having a Σ bevel, the thyristor element is rotated while being held in an almost vertical direction, so that the JCR remains on the bevel surface. It does not leak to unnecessary areas, and there is no thin part of the JCR at the top of the bevel.Also, since the Σ bevel opens upwards during application, it is easy for gas to escape from the JCR, making the JCR thicker. As a result, stable pressure resistance of the thyristor is maintained and the thyristor manufacturing yield is improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例におけるJCR塗布装匝の断
面図、第2図、第3図、第4図は従来のJcR塗布時の
サイリスタエレメントの断面図、第5図は第1図の装置
によって製造されたサイリスタエレメントの断面図であ
る。 1:シリコン基板、10:サイリスタエレメント、5:
JCR,’I:チャック治具、8:モータ、9:第1図
FIG. 1 is a cross-sectional view of a JCR coating casserole according to an embodiment of the present invention, FIGS. 2, 3, and 4 are cross-sectional views of a thyristor element during conventional JcR coating, and FIG. FIG. 3 is a cross-sectional view of a thyristor element manufactured by the apparatus of FIG. 1: Silicon substrate, 10: Thyristor element, 5:
JCR,'I: Chuck jig, 8: Motor, 9: Fig. 1

Claims (1)

【特許請求の範囲】[Claims] 1)基板面に平行な基板横断面の面積が板厚中央部で最
小のシグマベベル構造をもつサイリスタ基板の側面に接
合被覆樹脂を塗布する際に、サイリスタ基板面をほぼ鉛
直面にして回転させながら、基板側面に上方より前記樹
脂を落下させて樹脂を塗布し、乾燥させることを特徴と
するサイリスタ製造方法。
1) When applying bonding coating resin to the side surface of a thyristor substrate with a sigma bevel structure where the cross-sectional area of the substrate parallel to the substrate surface is the smallest at the center of the board thickness, while rotating the thyristor substrate with the surface almost vertical, . A method for manufacturing a thyristor, characterized in that the resin is applied by dropping the resin from above onto a side surface of a substrate, and then dried.
JP28801286A 1986-12-03 1986-12-03 Manufacture of thyristor Pending JPS63141370A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28801286A JPS63141370A (en) 1986-12-03 1986-12-03 Manufacture of thyristor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28801286A JPS63141370A (en) 1986-12-03 1986-12-03 Manufacture of thyristor

Publications (1)

Publication Number Publication Date
JPS63141370A true JPS63141370A (en) 1988-06-13

Family

ID=17724664

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28801286A Pending JPS63141370A (en) 1986-12-03 1986-12-03 Manufacture of thyristor

Country Status (1)

Country Link
JP (1) JPS63141370A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0448639A (en) * 1990-06-14 1992-02-18 Toshiba Corp Apparatus and method for manufacturing semiconductor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0448639A (en) * 1990-06-14 1992-02-18 Toshiba Corp Apparatus and method for manufacturing semiconductor

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