JPS63132362U

JPS63132362U -

Info

Publication number: JPS63132362U
Application number: JP2472287U
Authority: JP
Priority date: 1987-02-21
Filing date: 1987-02-21
Publication date: 1988-08-30

Description

[Brief explanation of the drawing]

第１図ないし第３図はこの考案の１実施例を示
し、第１図はピンプローブを一部断面で表わした
図、第２図は第１図の―′拡大断面図、第３
図は測定ピンを切断してその一部を示した部分拡
大斜視図であり、第４図及び第５図は、それぞれ
この考案の別の実施例を示すピンプローブの、そ
の軸方向に対し直角な方向の縦断面図である。ま
た第６図及び第７図は、それぞれ従来のピンプロ
ーブの拡大縦断面図及び測定ピンを切断した状態
の部分拡大斜視図である。１……測定ピン、２……固定用スリーブ、３，
１３，２３，３３……基体、４，１４，２４，３
４……金属薄膜、６……コイルスプリング、７…
…取付基板、１５，１５′，２５，２５′，３５
……切欠き部。 Figures 1 to 3 show one embodiment of this invention, with Figure 1 being a partially sectional view of the pin probe, Figure 2 being an enlarged sectional view of Figure 1, and Figure 3 being an enlarged sectional view of Figure 1.
The figure is a partially enlarged perspective view showing a part of the measuring pin cut away, and FIGS. 4 and 5 respectively show another embodiment of the pin probe at right angles to the axial direction of the pin probe. FIG. 6 and 7 are an enlarged vertical sectional view of a conventional pin probe and a partially enlarged perspective view of the measuring pin cut away, respectively. 1...Measuring pin, 2...Fixing sleeve, 3,
13, 23, 33...Base, 4, 14, 24, 3
4...Metal thin film, 6...Coil spring, 7...
...Mounting board, 15, 15', 25, 25', 35
...notch part.

Claims

[Claims for Utility Model Registration] 1. A measuring pin whose tip is in contact with a point to be measured is slidably inserted into a fixing sleeve, and a coil spring is wound around the measuring pin to fix the measuring pin as described above. In the pin probe which is resiliently supported in the axial direction with respect to the fixing sleeve, the measuring pin is provided with a groove-like or chamfer-like groove along the axial direction at least in a portion corresponding to the sliding surface with the fixing sleeve. A pin probe characterized in that it is constructed by coating a thin metal film on the surface of a base in which a notch is formed. 2. The pin probe according to claim 1, in which the notch portion is formed over the entire length of the base body. 3. The pin probe according to claim 1 or 2, wherein the base body is molded from a hard conductive resin material. 4. The pin probe according to claim 1 or 2, wherein the base body is molded from conductive ceramics. 5. The pin probe according to claim 1 or 2, wherein the base body is molded mainly from carbon fiber.