JPH0277670U - - Google Patents
Info
- Publication number
- JPH0277670U JPH0277670U JP15611388U JP15611388U JPH0277670U JP H0277670 U JPH0277670 U JP H0277670U JP 15611388 U JP15611388 U JP 15611388U JP 15611388 U JP15611388 U JP 15611388U JP H0277670 U JPH0277670 U JP H0277670U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- wall
- protrusion
- proximal end
- sleeve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の一実施例の横断面図及び縦断
面図、第２図は本考案の他の実施例の横断面図及
び縦断面図である。
１０……スリーブ、１１……探針、１１ａ……
基端保持部、１１ｂ……先端測定部、１２……コ
イルスプリング、１３，２３……突起部、１４，
２４……斜溝。
FIG. 1 is a cross-sectional view and a vertical cross-sectional view of one embodiment of the present invention, and FIG. 2 is a cross-sectional view and a vertical cross-sectional view of another embodiment of the present invention. 10... Sleeve, 11... Probe, 11a...
Base end holding part, 11b...Tip measurement part, 12...Coil spring, 13, 23...Protrusion part, 14,
24...Diagonal groove.
Claims (1)
測定部からなる探針を、前記基端保持部を遊挿し
かつ弾性部材により前記先端測定部をスリーブ外
方に向けて突出付勢して設けてなる電気特性測定
用プローブにおいて、前記探針の基端保持部の外
壁及び前記スリーブの内壁の一方に突起部が形成
されると共に、前記探針の基端保持部の外壁及び
前記スリーブの内壁のうち前記突起部を形成しな
いものに前記突起部が収納案内され前記探針の突
出方向と所定角度をもたせた斜溝が形成されてい
ることを特徴とする電気特性測定用プローブ。 A probe consisting of a proximal end holding part and a distal measuring part is loosely inserted into a hollow part of a cylindrical sleeve, and the proximal end holding part is loosely inserted, and the distal measuring part is urged to protrude outward from the sleeve by an elastic member. In the probe for measuring electrical characteristics, a protrusion is formed on one of the outer wall of the proximal end holding portion of the probe and the inner wall of the sleeve, and the protrusion is formed on one of the outer wall of the proximal end holding portion of the probe and the inner wall of the sleeve. A probe for measuring electrical characteristics, characterized in that an oblique groove is formed in an inner wall where the protrusion is not formed, in which the protrusion is housed and guided and is at a predetermined angle with the protrusion direction of the probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15611388U JPH0277670U (en) | 1988-11-30 | 1988-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15611388U JPH0277670U (en) | 1988-11-30 | 1988-11-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0277670U true JPH0277670U (en) | 1990-06-14 |
Family
ID=31434352
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15611388U Pending JPH0277670U (en) | 1988-11-30 | 1988-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0277670U (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58219459A (en) * | 1982-06-16 | 1983-12-20 | Hitachi Ltd | Conductive probe |
| JPS6038663A (en) * | 1983-08-12 | 1985-02-28 | Hitachi Ltd | Contact pin for use in test |
| JPS6144572A (en) * | 1984-08-06 | 1986-03-04 | Tadaichi Suzuki | Metal mould lapping machine |
| JPS6398566A (en) * | 1986-10-15 | 1988-04-30 | Seiko Epson Corp | Contact probe |
-
1988
- 1988-11-30 JP JP15611388U patent/JPH0277670U/ja active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58219459A (en) * | 1982-06-16 | 1983-12-20 | Hitachi Ltd | Conductive probe |
| JPS6038663A (en) * | 1983-08-12 | 1985-02-28 | Hitachi Ltd | Contact pin for use in test |
| JPS6144572A (en) * | 1984-08-06 | 1986-03-04 | Tadaichi Suzuki | Metal mould lapping machine |
| JPS6398566A (en) * | 1986-10-15 | 1988-04-30 | Seiko Epson Corp | Contact probe |