JPS63122265U - - Google Patents
Info
- Publication number
- JPS63122265U JPS63122265U JP1452687U JP1452687U JPS63122265U JP S63122265 U JPS63122265 U JP S63122265U JP 1452687 U JP1452687 U JP 1452687U JP 1452687 U JP1452687 U JP 1452687U JP S63122265 U JPS63122265 U JP S63122265U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- measuring
- measuring pin
- probe
- conductive ceramics
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 3
- 239000010409 thin film Substances 0.000 claims description 2
- 239000000919 ceramic Substances 0.000 claims 3
- 238000000151 deposition Methods 0.000 claims 1
- 238000010304 firing Methods 0.000 claims 1
- 238000000465 moulding Methods 0.000 claims 1
- 238000007747 plating Methods 0.000 claims 1
- 239000000843 powder Substances 0.000 claims 1
- 239000002994 raw material Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
図はこの考案の１実施例を示すものであつて、
第１図はピンプローブを一部縦断面で表わした図
、第２図は第１図の―′横断面図、第３図は
測定ピンを切断してその一部を示した拡大斜視図
である。
１……測定ピン、２……固定用スリーブ、３…
…コイルスプリング、４……取付基板、１４……
基体、１６……金属薄膜。
The figure shows one embodiment of this invention,
Figure 1 is a partial longitudinal section of the pin probe, Figure 2 is a cross-sectional view of Figure 1, and Figure 3 is an enlarged perspective view of a portion of the measuring pin. be. 1... Measuring pin, 2... Fixing sleeve, 3...
...Coil spring, 4...Mounting board, 14...
Substrate, 16...metal thin film.
Claims (1)
用スリーブに摺動自在に挿通させるとともに、前
記測定ピンにコイルスプリングを巻装して測定ピ
ンを前記固定用スリーブに対し軸方向に弾発的に
支持してなるピンプローブにおいて、前記測定ピ
ンを、導電性セラミツクスからなる基体の表面に
メツキにより金属薄膜を被着して構成したことを
特徴とするピンプローブ。 ２ 導電性セラミツクスからなる基体はセラミツ
クス原料に金属粉を混入して成形し焼成したもの
である実用新案登録請求の範囲第１項記載のピン
プローブ。[Claims for Utility Model Registration] 1. A measuring pin whose tip is in contact with a point to be measured is slidably inserted into a fixing sleeve, and a coil spring is wound around the measuring pin to fix the measuring pin as described above. A pin probe elastically supported in the axial direction with respect to a measuring sleeve, characterized in that the measuring pin is constructed by depositing a metal thin film on the surface of a base made of conductive ceramics by plating. probe. 2. The pin probe according to claim 1, wherein the base body made of conductive ceramics is obtained by mixing metal powder into a ceramic raw material, molding it, and firing it.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1452687U JPH058525Y2 (en) | 1987-02-03 | 1987-02-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1452687U JPH058525Y2 (en) | 1987-02-03 | 1987-02-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63122265U true JPS63122265U (en) | 1988-08-09 |
| JPH058525Y2 JPH058525Y2 (en) | 1993-03-03 |
Family
ID=30804595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1452687U Expired - Lifetime JPH058525Y2 (en) | 1987-02-03 | 1987-02-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH058525Y2 (en) |
-
1987
- 1987-02-03 JP JP1452687U patent/JPH058525Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH058525Y2 (en) | 1993-03-03 |
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