JPS63128783A - Semidonductor laser device - Google Patents
Semidonductor laser deviceInfo
- Publication number
- JPS63128783A JPS63128783A JP27583386A JP27583386A JPS63128783A JP S63128783 A JPS63128783 A JP S63128783A JP 27583386 A JP27583386 A JP 27583386A JP 27583386 A JP27583386 A JP 27583386A JP S63128783 A JPS63128783 A JP S63128783A
- Authority
- JP
- Japan
- Prior art keywords
- output
- light
- laser beam
- semiconductor laser
- resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 27
- 230000000694 effects Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 238000005253 cladding Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は半導体レーザ装置に関する。[Detailed description of the invention] (b) Industrial application field The present invention relates to a semiconductor laser device.
(ロ)従来の技術
現在、半導体レーザチップから出力されるレーザ光のモ
ニタ方法としては特公昭5B−46879号公報に開示
されているように半導体レーザチップの1対の共振器端
面の両方からレーザ光を出力せしめ、その一方から出力
されるレーザ光を受光素子で検出することにより行なっ
ていた。(b) Prior Art Currently, as a method for monitoring laser light output from a semiconductor laser chip, as disclosed in Japanese Patent Publication No. 5B-46879, laser light is emitted from both of a pair of resonator end faces of a semiconductor laser chip. This was done by outputting light and detecting the laser beam output from one side with a light receiving element.
Vl 発明が解決しようとする問題轟然るに、斯る方
法では常に雨具振器端面よりレーザ光を出力せねばなら
ず、一方の共振器端面の反射率を略100%として、他
方の共振器端面のみからレーザ光を出力させることによ
り、高出力のレーザ光を取出す構成とはできない。Vl Problems to be Solved by the Invention Unsurprisingly, in this method, laser light must always be output from the end face of the rain gear resonator, and the reflectance of one resonator end face is set to approximately 100%, while the reflectance of the other resonator end face is set to approximately 100%. By outputting laser light from only one source, it is not possible to create a configuration in which high-output laser light can be extracted.
に)問題点を解決するための手段
本発明は斯る点に鑑みてなされたもので、その構成的特
徴#′i1対の共振器端面を有する半導体レーザチップ
、該チップの上記共振器端面とtヱする側面に積層され
た受光素子からなることにある。B) Means for Solving the Problems The present invention has been made in view of the above points, and its structural feature #'i is a semiconductor laser chip having one pair of resonator end faces, and the above-mentioned resonator end faces of the chip. It consists of a light-receiving element laminated on the side surface.
(ホ)作 用
半導体レーザチップの共振器端面からはレーザ光が出力
されるが、その他の面からも、上記レーザ発振にほぼ比
例して自然光が放出されている。(e) Operation Laser light is output from the resonator end face of the semiconductor laser chip, but natural light is also emitted from other faces in approximately proportion to the laser oscillation.
従って、上記受光素子は上記自然光を受光する。Therefore, the light receiving element receives the natural light.
(ハ)実施例
第1図は本発明の第1の実施例を示し、Slからなるヒ
ートシンク(1)上には第1〜第3の半導体レーザチッ
プ(21〜(4)が固着されている。斯るチ・lプ(2
)〜(4)は共に一生面の略中央に紙面垂直方向に延在
する溝が形成されたP型()aAs基板(5)上にP型
Gao、ss AlO,45Asからなる第1クラッド
層(6)、ノンドープGa(1,,5Aj?o、ts
Asからなる活性層(7)、n型Gao、s6 kl
O,45Asからなる第2クラッド層(8)及びn型G
a As からなるキャップ層(9)を順次積層して
なる屈折率導波型の半導体レーザチップである。斯る各
チップ(2)〜(4)において基板(5)の他主面及び
キャップ層(9)の表面に夫々形成された第1、第2電
極10αυ間に順方向バイアスを印加すると夫々紙面に
平行となる1対の共振器端面より紙面垂直方向にレーザ
光が出射される。また、上記各チップ(2)〜(4)の
共振器端面と直交する右側面には第1〜第3の受光素子
02〜[141が8を層されている。上記各受光素子(
2)〜αIは夫々、各チップ(2)〜(4)の右側面及
び第2電極011表面の一部に積層された5i02、S
iN、ANz 05等からなる1000人厚の透明絶縁
膜−上に工TO%5n02 等からなる2000人厚
の透明電極α臥アモルファス半導体材料からなる受光層
αり及び2000人厚の透明電極α咎を順次積層してな
る。尚、上記受光層C171とししたものを用いる。ま
た、上記All電極裏表面は受光層αηへの外来光の入
射を防止するためのんぽからなる光学バリアα9が積層
されている。(C) Embodiment FIG. 1 shows a first embodiment of the present invention, in which first to third semiconductor laser chips (21 to (4)) are fixed on a heat sink (1) made of Sl. .Such a chip (2
) to (4) are a first cladding layer made of P-type GaO, ss AlO, and 45As on a P-type ()aAs substrate (5) in which a groove extending perpendicular to the plane of the paper is formed approximately at the center of the surface. (6), non-doped Ga (1,,5Aj?o,ts
Active layer (7) made of As, n-type Gao, s6 kl
Second cladding layer (8) made of O,45As and n-type G
This is a refractive index waveguide type semiconductor laser chip in which cap layers (9) made of aAs are sequentially laminated. In each of the chips (2) to (4), when a forward bias is applied between the first and second electrodes 10αυ formed on the other main surface of the substrate (5) and the surface of the cap layer (9), Laser light is emitted from a pair of resonator end faces parallel to the plane in a direction perpendicular to the plane of the paper. Further, first to third light receiving elements 02 to 141 are layered on the right side surface of each of the chips (2) to (4) perpendicular to the resonator end face. Each of the above light receiving elements (
2) ~ αI are 5i02 and S laminated on the right side surface of each chip (2) ~ (4) and a part of the surface of the second electrode 011, respectively.
A 1,000-layer thick transparent insulating film made of iN, ANz 05, etc.; a 2,000-layer-thick transparent electrode made of TO%5n02, etc.; a light-receiving layer made of an amorphous semiconductor material; and a 2,000-layer-thick transparent electrode. are layered one after another. Note that the light receiving layer C171 described above is used. Further, on the back surface of the All electrode, an optical barrier α9 made of a transparent material is laminated to prevent external light from entering the light-receiving layer αη.
第2図に例えば第1の半導体レーザ光出力(2)の第1
、第2電極00α1)間に順方向バイアスを印加した際
の、レーザの駆動電流と第1の半導体レーザチップ(2
)のレーザ光出力との関係及びこのレーザ光出力と第1
の受光素子(1zの出力との関係を夫々実線及び一点鎖
線で示す。尚、図中A%B点は夫々半導体レーザチップ
にしきい値電流が印加された時点を示す。尚、上記チッ
プ(2)の水平方向の幅は約100μmである。FIG. 2 shows, for example, the first semiconductor laser light output (2).
, the laser drive current and the first semiconductor laser chip (2
) and the relationship between this laser light output and the first
The relationship between the output of the light receiving element (1z) and the output of the photodetector (1z) is shown by a solid line and a dashed-dotted line, respectively. In the figure, points A%B indicate the time point when a threshold current is applied to the semiconductor laser chip, respectively. ) has a horizontal width of approximately 100 μm.
第2図より明らかな如く、第1の半導体レーザチップ(
2)にしきい値以上の電流が印加されレーザ光が出力さ
れた後は、レーザ光出力と受光素子出力とは比例関係と
なる。ゆえに、受光素子の出力に基づいてレーザ光の出
力を制御することができる。As is clear from FIG. 2, the first semiconductor laser chip (
After a current equal to or higher than the threshold value is applied to 2) and the laser light is output, the laser light output and the light receiving element output have a proportional relationship. Therefore, the output of the laser beam can be controlled based on the output of the light receiving element.
従って、本実施例装置では、共振器端面より出力される
レーザ光をモニタ光として使用しなくて面
も良いので、1対の共振器シ一方を高反射率として、他
方の共振器端面のみからレーザ光を出力させることによ
り、高出力のレーザ光を取出すことができる。Therefore, in this example device, since the laser beam output from the resonator end face is not used as a monitor light and the surface is good, one of the pair of resonators is set to have a high reflectance, and only the other resonator end face is used. By outputting laser light, high-power laser light can be extracted.
また、第1〜第3の半導体レーザチップ(2)〜(4)
を第1図に示す如く、近接配置した際でも例えば第2の
半導体レーザチップ(3)の左側面から放出される自然
光は第1の受光素子α2及び光学バリアOjの存在によ
り、第1の半導体レーザチップ(2)内に入射すること
を防止できる。従って、第1の半導体レーザチップ(2
)において、第2の半導体レーザチップ(3)の側面か
ら放出される自然光の影響による出力変動、SN比の低
下等を防止できる。Moreover, the first to third semiconductor laser chips (2) to (4)
As shown in FIG. 1, even when the chips are placed close to each other, for example, natural light emitted from the left side of the second semiconductor laser chip (3) is not absorbed by the first semiconductor laser chip (3) due to the presence of the first light-receiving element α2 and the optical barrier Oj. It is possible to prevent the laser beam from entering the laser chip (2). Therefore, the first semiconductor laser chip (2
), it is possible to prevent output fluctuations, decreases in S/N ratio, etc. due to the influence of natural light emitted from the side surface of the second semiconductor laser chip (3).
更に、上記各受光素子02〜αりは各チップ(2)〜(
4)の右側面に対してパッジベージ賞ン膜として働くの
で、半導体レーザチップの長寿命化が計れる。Furthermore, each of the light receiving elements 02 to α is connected to each chip (2) to (
4) Since it acts as a padding film on the right side, the life of the semiconductor laser chip can be extended.
尚、本実施例では右側面のみに受光素子を積層したが、
左側面にも受光素子を積層することにより更にパッシベ
ーション効果を上げることができる。In addition, in this example, the light receiving element was laminated only on the right side, but
The passivation effect can be further improved by stacking a light receiving element on the left side as well.
第3図は本発明の第2の実施例を示し、第1の実施例と
の相違は、第1の実施例ではヒートシンク(1)上にハ
イブリッドに載置した第1〜第3の半導体レーザチップ
(2)〜(4)の各々に第1〜第3の受光素子■〜α滲
を形成したのに対して、第2の実施例では1つの基板(
5)上に第1〜第3の半導体レーザチップ(2)〜(4
)ヲモノリシックに形成してなる装置の各々のチップに
第1〜第3の受光素子0z〜0滲を形成したものである
。尚、第3図中、第1図と同一箇所には同一符号を付し
説明を省略する。FIG. 3 shows a second embodiment of the present invention, and the difference from the first embodiment is that in the first embodiment, the first to third semiconductor lasers are mounted in a hybrid manner on the heat sink (1). While the first to third light receiving elements (1) to (α) were formed on each of the chips (2) to (4), in the second embodiment, one substrate (
5) First to third semiconductor laser chips (2) to (4) on top.
) The first to third light receiving elements 0z to 0 are formed on each chip of the device formed monolithically. In FIG. 3, the same parts as in FIG. 1 are designated by the same reference numerals, and their explanation will be omitted.
このような第2の実施例の構成でも第1の実施例と同様
な効果が得られる。Even with this configuration of the second embodiment, similar effects to those of the first embodiment can be obtained.
(ト) 発明の効果
本発明によれば、半導体レーザチップの側面から放出さ
れる自然光をモニタ光として用いることができるので、
共振器端面の一方から高出力のレーザ光を出力可能であ
る。(G) Effects of the Invention According to the present invention, natural light emitted from the side surface of a semiconductor laser chip can be used as monitor light.
High-power laser light can be output from one of the cavity end faces.
第1図及び第3図は夫々本発明の第1、第2の実施例を
示す断面図、第2図はレーザ光出力と駆動電流及び受光
素子出力との関係を示す特性図である。
(2)〜(4)・・・第1〜第3半導体レーザチップ、
02〜αト・・第1〜第3受光素子。1 and 3 are cross-sectional views showing the first and second embodiments of the present invention, respectively, and FIG. 2 is a characteristic diagram showing the relationship between laser light output, drive current, and light-receiving element output. (2) to (4)...first to third semiconductor laser chips,
02~αt...first~third light receiving elements.
Claims (1)
該チップの上記共振器端面と交叉する側面に積層された
受光素子からなることを特徴とする半導体レーザ装置。(1) A semiconductor laser chip having a pair of cavity end faces;
A semiconductor laser device comprising a light receiving element laminated on a side surface of the chip that intersects with the resonator end surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27583386A JPH071815B2 (en) | 1986-11-19 | 1986-11-19 | Semiconductor laser device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27583386A JPH071815B2 (en) | 1986-11-19 | 1986-11-19 | Semiconductor laser device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63128783A true JPS63128783A (en) | 1988-06-01 |
JPH071815B2 JPH071815B2 (en) | 1995-01-11 |
Family
ID=17561062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP27583386A Expired - Fee Related JPH071815B2 (en) | 1986-11-19 | 1986-11-19 | Semiconductor laser device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH071815B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009021432A (en) * | 2007-07-12 | 2009-01-29 | Nichia Corp | Semiconductor laser apparatus |
JP2009117522A (en) * | 2007-11-05 | 2009-05-28 | Fujifilm Corp | Laser module |
-
1986
- 1986-11-19 JP JP27583386A patent/JPH071815B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009021432A (en) * | 2007-07-12 | 2009-01-29 | Nichia Corp | Semiconductor laser apparatus |
JP2009117522A (en) * | 2007-11-05 | 2009-05-28 | Fujifilm Corp | Laser module |
Also Published As
Publication number | Publication date |
---|---|
JPH071815B2 (en) | 1995-01-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |