JPS63110636A - Chemical treating system - Google Patents
Chemical treating systemInfo
- Publication number
- JPS63110636A JPS63110636A JP25650986A JP25650986A JPS63110636A JP S63110636 A JPS63110636 A JP S63110636A JP 25650986 A JP25650986 A JP 25650986A JP 25650986 A JP25650986 A JP 25650986A JP S63110636 A JPS63110636 A JP S63110636A
- Authority
- JP
- Japan
- Prior art keywords
- filter
- pump
- chemical
- buffer tank
- air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000126 substance Substances 0.000 title claims abstract description 29
- 239000007788 liquid Substances 0.000 claims description 30
- 238000012993 chemical processing Methods 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 5
- 230000006641 stabilisation Effects 0.000 abstract 1
- 238000011105 stabilization Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 239000007789 gas Substances 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000010129 solution processing Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は半導体製造工程、特にフォトリソグラフィー工
程における半導体ウェハーへのフォトレジスト塗布処理
、現@処理を行う半導体ウェハーの薬液処理装置に関す
るものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a semiconductor wafer chemical processing apparatus that performs photoresist coating processing and current treatment on semiconductor wafers in semiconductor manufacturing processes, particularly photolithography processes. .
[従来の技術]
従来、この種の薬液処理装置は第3図に示すように加圧
容器式バッファタンク1にエアー央きボート2aを備え
たフィルター2を接続し、該フィルター2にエアーオペ
レートバルブ3を介して複数本のノズルを並列に接続し
たものであり、バッフ1タンク1内に加圧窒素を送り込
みその気体圧により薬液を圧送してフィルター2に通し
、分枝配管された各ノズルに送液している。また、フィ
ルター2のバルブ9を開閉操作してエアー1友きボー1
〜2aからエアー1友ぎを行っている。[Prior Art] Conventionally, this type of chemical processing apparatus has a pressurized buffer tank 1 connected to a filter 2 equipped with an air center boat 2a, as shown in FIG. 3, a plurality of nozzles are connected in parallel through 3, and pressurized nitrogen is sent into the buff 1 tank 1, and the gas pressure is used to forcefully send the chemical solution through the filter 2. Liquid is being sent. Also, open and close valve 9 of filter 2 to air 1
I've been doing Air 1 Friendship since ~2a.
[発明が解決しようとする問題点コ
上述した従来の薬液処理装置の送液系は、薬液容器を窒
素等で加圧して送液しフィルターで濾過した後、ノズル
から半導体ウェハーに直接薬液を滴下する方式となって
いるため、下記の様な欠点を生じる。すなわち、
第1に、薬液を加圧して送液するために薬液に加圧した
ガスがかなり溶は込んでいる。このため、配管中におい
て薬液中に気泡か生じやすく、この気泡はフィルターを
通過しないため、フィルターの一次側に次々に気泡かた
まっていくことになり、この結果流量が不安定になって
しまう。フォトリソグラフィープロセスにおいては半導
体ウェハーに直接薬液を滴下するため、流量を一定に制
御することが重要であり、この流量が安定しないことは
大きな問題となる。[Problems to be Solved by the Invention] The liquid feeding system of the conventional chemical processing apparatus described above pressurizes a chemical liquid container with nitrogen, etc., feeds the liquid, filters it with a filter, and then drops the chemical liquid directly onto the semiconductor wafer from a nozzle. This method has the following disadvantages. That is, firstly, in order to pressurize the medicinal solution and send it, a considerable amount of pressurized gas is dissolved in the medicinal solution. For this reason, bubbles are likely to form in the chemical solution in the piping, and since these bubbles do not pass through the filter, they accumulate one after another on the primary side of the filter, resulting in an unstable flow rate. In the photolithography process, a chemical solution is dropped directly onto a semiconductor wafer, so it is important to control the flow rate to a constant level, and unstable flow rates pose a major problem.
第2に圧縮性であるガスにより加圧しているため、送液
開始時と定常送液時で送液圧力に差を生じ、送液流量が
送液開始時から定常送液状態となるまで経時的に低下す
る。Second, since the pressure is applied using compressible gas, there is a difference in the liquid feeding pressure between the start of liquid feeding and the steady liquid feeding, and it takes time for the liquid feeding flow rate to reach the steady liquid feeding state from the start of liquid feeding. decreases.
本発明の目的は安定した流量の送液を行う薬液処理装置
を提供することにある。An object of the present invention is to provide a chemical liquid processing apparatus that delivers liquid at a stable flow rate.
[発明の従来技術に対する相違点]
上述した従来の薬液処理装置に対し、本発明は薬液の送
液をポンプにより行い、フィルターの一次側に設けたエ
アー1友ぎの配管系に流量調整用のニードルバルブと流
量の確認用の流量計を備え、これをバッファタンクに接
続することによりポンプ動作中は常にある一定量の薬液
をフィルターのエアー後きより戻すという動作が行われ
、これによりフィルターにエアーが溜まっていくという
現巣を防ぎ安定した流量の送液を行うことができるとい
う独Ω]的内容を有する。[Differences between the invention and the prior art] In contrast to the conventional chemical processing apparatus described above, the present invention uses a pump to feed the chemical liquid, and a needle for adjusting the flow rate is provided in the piping system connecting the air 1 provided on the primary side of the filter. It is equipped with a valve and a flow meter for checking the flow rate, and by connecting this to a buffer tank, a certain amount of chemical solution is always returned after the air in the filter while the pump is operating, and this causes air to flow into the filter. It has the unique content of being able to prevent the current problem of liquid buildup and to deliver a stable flow rate of liquid.
[問題点を解決するための手段]
本発明はバッファタンク内の薬液をフィルターに通して
処理部に給送する薬液処理装置において、薬液給送用ポ
ンプをバッファタンクに接続し、該ポンプの送液配管系
にエアー1友ぎポートを備えたフィルターを設け、フィ
ルターのエアー後きポートとバッファタンクとの間に戻
り配管系を形成し、該戻り配管系にニードルバルブと流
量計とを設けたことを特徴とする薬液処理装置である。[Means for Solving the Problems] The present invention provides a chemical solution processing device for supplying a chemical solution in a buffer tank to a processing section through a filter, in which a chemical solution supply pump is connected to the buffer tank, and the pump is connected to the buffer tank. A filter with an air port is provided in the liquid piping system, a return piping system is formed between the air rear port of the filter and the buffer tank, and a needle valve and a flow meter are provided in the return piping system. This is a chemical processing device characterized by the following.
[実施例] 以下、本発明の実施例を図により説明する。[Example] Embodiments of the present invention will be described below with reference to the drawings.
(実施例1) 第1図は本発明の実施例1を示す構成図である。(Example 1) FIG. 1 is a configuration diagram showing a first embodiment of the present invention.
第1図において、薬液を収納するバッファタンク1にポ
ンプ4を接続し、ポンプ4の出力側にエアー後きポート
2aを備えたフィルター2を接続し、フィルター2には
エアーオペレートバルブ3を介してノズルを接続する。In FIG. 1, a pump 4 is connected to a buffer tank 1 that stores a chemical solution, a filter 2 equipped with an air rear port 2a is connected to the output side of the pump 4, and an air operated valve 3 is connected to the filter 2. Connect the nozzle.
さらに、フィルター2のエアー後きポート2aとバッフ
ァタンク1とを戻り配管10で接続し、戻り配管10の
途中にニードルバルブ5と流量計6とを設置する。Further, the air rear port 2a of the filter 2 and the buffer tank 1 are connected by a return pipe 10, and a needle valve 5 and a flow meter 6 are installed in the middle of the return pipe 10.
バッファタンク1に諮められた薬液はポンプ4によりく
み上げられ、フィルター2により濾過されノズルに送ら
れる。同時に薬液はフィルター2のエアー後きポート2
aよりニードルバルブ5、ざらに流量計6を通り戻り配
管10でバッファタンク1に返送される。The chemical solution introduced into the buffer tank 1 is pumped up by a pump 4, filtered by a filter 2, and sent to a nozzle. At the same time, the chemical solution is transferred to port 2 after the air of filter 2.
From a, it passes through a needle valve 5, a flow meter 6, and is returned to the buffer tank 1 via a return pipe 10.
ノズルからの薬液滴下時には、フィルター2において一
部の薬液はノズルに流れずにフィルター2の一次側から
バッファタンク1に戻ることになる。このことにより途
中の配管中やポンプ4内において発生した気泡はフィル
ター2内に溜まることなくエアー後きポート2aより排
出されていくことになる。ざらにポンプ4の吐出圧は圧
送式よりも数段安定性が高いということによりノズルか
らの安定した流星の送液を行うことができる。When the chemical liquid is dripped from the nozzle, a part of the chemical liquid in the filter 2 returns to the buffer tank 1 from the primary side of the filter 2 without flowing to the nozzle. As a result, air bubbles generated in the intermediate piping or in the pump 4 are discharged from the air rear port 2a without being accumulated in the filter 2. Roughly speaking, the discharge pressure of the pump 4 is several orders of magnitude more stable than that of the pressure-feeding type, so it is possible to stably feed the meteor from the nozzle.
(実施例2)
第2図は本発明の実施例2の構成図である。この実施例
は半導体製造工程であるフォトリソグラフィープロセス
において使用されるポジ現像装置の現像液配管系統を示
すものである。第1図の配管系との違いはバッファタン
ク1とポンプ4との聞に現像液の濡調槽8が設けられて
おり、これにより現像液温度を一定にコントロールして
いる。(Embodiment 2) FIG. 2 is a configuration diagram of Embodiment 2 of the present invention. This embodiment shows a developer piping system for a positive developing device used in a photolithography process, which is a semiconductor manufacturing process. The difference from the piping system shown in FIG. 1 is that a developer wetting tank 8 is provided between the buffer tank 1 and the pump 4, thereby controlling the developer temperature at a constant level.
またノズルの数に応じてそれぞれ独立にポンプ系を設け
ている。7はニードルバルブを備えた流量計である。し
たがって複数のノズルに独立のポンプ系を使って現像液
を供給するので各ノズルに定量の現像液を供給すること
ができ、安定した薬液の滴下を行うことができるという
利点がある。In addition, pump systems are provided independently depending on the number of nozzles. 7 is a flow meter equipped with a needle valve. Therefore, since the developer is supplied to a plurality of nozzles using an independent pump system, a fixed amount of developer can be supplied to each nozzle, and there is an advantage that the chemical solution can be dropped stably.
[発明の効果]
以上説明したように本発明は薬液の送液をポンプにより
行い、ポンプ動作中は常におる一定0の薬液をフィルタ
ーのエアー後きよりタンクに返送するにうにしたので、
フィルターにエアーが)?11留Uず、流はを安定化さ
Uることができ、しかもポンプにより送液を行うので、
送液開始時と定常送液時とで不同を生じることがなく、
薬液処理装置において高精度な薬液滴下値の制御を行う
ことができる効果が必る。[Effects of the Invention] As explained above, in the present invention, the chemical liquid is fed by a pump, and the chemical liquid at a constant level of 0 is returned to the tank after the filter air while the pump is in operation.
Is there air in the filter? 11 The flow can be stabilized, and the liquid is delivered by a pump, so
There is no discrepancy between the start of liquid feeding and the steady liquid feeding.
It is necessary to have the effect of being able to control the droplet value of a chemical liquid with high precision in a chemical liquid processing apparatus.
第1図は本発明の実施例1を示す構成図、第2図は本発
明の実施例2を示す構成図、第3図は従来の薬液処理装
置を示す構成図である。
1・・・バッファタンク、2・・・フィルター、2a・
・・エアー1友きポート、3・・・エアーオペレートバ
ルブ、4・・・ポンプ、5・・・ニードルバルブ、6・
・・流量計、7・・・ニードルバルブ付流量計、8・・
・温調槽、10・・・戻り配管FIG. 1 is a block diagram showing a first embodiment of the present invention, FIG. 2 is a block diagram showing a second embodiment of the present invention, and FIG. 3 is a block diagram showing a conventional chemical processing apparatus. 1... Buffer tank, 2... Filter, 2a.
...Air 1 friendly port, 3...Air operated valve, 4...Pump, 5...Needle valve, 6...
...Flowmeter, 7...Flowmeter with needle valve, 8...
・Temperature control tank, 10...Return piping
Claims (1)
理部に給送する薬液処理装置において、薬液給送用ポン
プをバッファタンクに接続し、該ポンプの送液配管系に
エアー抜きポートを備えたフィルターを設け、フィルタ
ーのエアー抜きポートとバッファタンクとの間に戻り配
管系を形成し、該戻り配管系にニードルバルブと流量計
とを設けたことを特徴とする薬液処理装置。(1) In a chemical processing device that supplies chemical liquid in a buffer tank to a processing section through a filter, a chemical liquid feeding pump is connected to the buffer tank, and an air vent port is provided in the liquid feeding piping system of the pump. 1. A chemical liquid processing device comprising: a filter; a return piping system formed between an air vent port of the filter and a buffer tank; and a needle valve and a flow meter provided on the return piping system.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25650986A JPH061756B2 (en) | 1986-10-28 | 1986-10-28 | Chemical processing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25650986A JPH061756B2 (en) | 1986-10-28 | 1986-10-28 | Chemical processing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63110636A true JPS63110636A (en) | 1988-05-16 |
JPH061756B2 JPH061756B2 (en) | 1994-01-05 |
Family
ID=17293614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25650986A Expired - Lifetime JPH061756B2 (en) | 1986-10-28 | 1986-10-28 | Chemical processing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH061756B2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003059486A1 (en) * | 2001-12-27 | 2003-07-24 | Koganei Corporation | Liquid medicine supplying device and method for venting air from liquid medicine supplying device |
US7708880B2 (en) | 2001-12-28 | 2010-05-04 | Koganel Corporation | Chemical liquid supply apparatus and a chemical liquid supply method |
JP2013077640A (en) * | 2011-09-29 | 2013-04-25 | Sokudo Co Ltd | Process liquid supply apparatus, substrate processing apparatus, removal method of bubbles, and substrate processing method |
JP2013146650A (en) * | 2012-01-17 | 2013-08-01 | Kobelco Eco-Maintenance Co Ltd | Device for supplying liquid chemical |
JP2014078562A (en) * | 2012-10-09 | 2014-05-01 | Tokyo Electron Ltd | Processing liquid supply method, processing liquid supply device and storage medium |
JP2015144318A (en) * | 2015-04-21 | 2015-08-06 | 東京エレクトロン株式会社 | Filter wetting method, filter wetting device, and storage medium |
-
1986
- 1986-10-28 JP JP25650986A patent/JPH061756B2/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003059486A1 (en) * | 2001-12-27 | 2003-07-24 | Koganei Corporation | Liquid medicine supplying device and method for venting air from liquid medicine supplying device |
KR100874564B1 (en) | 2001-12-27 | 2008-12-16 | 코가네이 코포레이션 | Degassing method of chemical liquid supply device and chemical liquid supply device |
US7708880B2 (en) | 2001-12-28 | 2010-05-04 | Koganel Corporation | Chemical liquid supply apparatus and a chemical liquid supply method |
JP2013077640A (en) * | 2011-09-29 | 2013-04-25 | Sokudo Co Ltd | Process liquid supply apparatus, substrate processing apparatus, removal method of bubbles, and substrate processing method |
JP2013146650A (en) * | 2012-01-17 | 2013-08-01 | Kobelco Eco-Maintenance Co Ltd | Device for supplying liquid chemical |
JP2014078562A (en) * | 2012-10-09 | 2014-05-01 | Tokyo Electron Ltd | Processing liquid supply method, processing liquid supply device and storage medium |
JP2015144318A (en) * | 2015-04-21 | 2015-08-06 | 東京エレクトロン株式会社 | Filter wetting method, filter wetting device, and storage medium |
Also Published As
Publication number | Publication date |
---|---|
JPH061756B2 (en) | 1994-01-05 |
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