JPS63105341U - - Google Patents
Info
- Publication number
- JPS63105341U JPS63105341U JP20207686U JP20207686U JPS63105341U JP S63105341 U JPS63105341 U JP S63105341U JP 20207686 U JP20207686 U JP 20207686U JP 20207686 U JP20207686 U JP 20207686U JP S63105341 U JPS63105341 U JP S63105341U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- connection terminal
- external connection
- discrimination
- outputs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Lead Frames For Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986202076U JPH0534104Y2 (en:Method) | 1986-12-24 | 1986-12-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986202076U JPH0534104Y2 (en:Method) | 1986-12-24 | 1986-12-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63105341U true JPS63105341U (en:Method) | 1988-07-08 |
| JPH0534104Y2 JPH0534104Y2 (en:Method) | 1993-08-30 |
Family
ID=31166127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986202076U Expired - Lifetime JPH0534104Y2 (en:Method) | 1986-12-24 | 1986-12-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0534104Y2 (en:Method) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5810853A (ja) * | 1981-07-13 | 1983-01-21 | Nec Corp | 集積回路 |
| JPS58143545A (ja) * | 1982-02-19 | 1983-08-26 | Nec Corp | 試験回路を備えた集積回路 |
-
1986
- 1986-12-24 JP JP1986202076U patent/JPH0534104Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5810853A (ja) * | 1981-07-13 | 1983-01-21 | Nec Corp | 集積回路 |
| JPS58143545A (ja) * | 1982-02-19 | 1983-08-26 | Nec Corp | 試験回路を備えた集積回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0534104Y2 (en:Method) | 1993-08-30 |