JPS63103978A - Source voltage drop detecting circuit - Google Patents

Source voltage drop detecting circuit

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Publication number
JPS63103978A
JPS63103978A JP24905186A JP24905186A JPS63103978A JP S63103978 A JPS63103978 A JP S63103978A JP 24905186 A JP24905186 A JP 24905186A JP 24905186 A JP24905186 A JP 24905186A JP S63103978 A JPS63103978 A JP S63103978A
Authority
JP
Japan
Prior art keywords
resistance
power supply
voltage drop
voltage
supply voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24905186A
Other languages
Japanese (ja)
Inventor
Kanji Aoki
貫司 青木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP24905186A priority Critical patent/JPS63103978A/en
Publication of JPS63103978A publication Critical patent/JPS63103978A/en
Pending legal-status Critical Current

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  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To obtain extremely small temperature characteristics by using a high resistance polysilicone for the resistance of a source voltage drop detecting circuit. CONSTITUTION:The high-resistance polysilicone is used for the resistance 4 of the source voltage drop detecting circuit. The high-resistance polysilicone has minus temperature characteristics and varies in temperature characteristics based upon sheet resistance, so the resistance is so settable that the temperature characteristic of the threshold voltage of an MOS transistor 3 which is the major part of the temperature characteristic is canceled. Thus, nearly flat temperature characteristics are obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は電源電圧低下回路の回路塁子に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a circuit guard for a power supply voltage reduction circuit.

〔従来の技術〕[Conventional technology]

従来の電源電圧低下回路を第2図に示す。0は電源電圧
のマイナス電位、1は電源電圧のプラス電位、2は電源
電圧低下検出出力、3は検出電圧を設定する為にチャン
ネルドープされた1)チャンネルトランジスタ、7はP
チャ/ネルトランジスタlの0N1OFFを次段インパ
ークへ伝達する為のP−抵抗、5.6は前段の伏態を増
幅ず為のインバータである。
A conventional power supply voltage reduction circuit is shown in FIG. 0 is the negative potential of the power supply voltage, 1 is the positive potential of the power supply voltage, 2 is the power supply voltage drop detection output, 3 is the channel transistor doped to set the detection voltage, 7 is the P
A P-resistance 5.6 is used to transmit the 0N1OFF state of the channel transistor 1 to the next stage impark, and 5.6 is an inverter used to amplify the state of the previous stage.

電源電圧が低下し、Pチャンネルトランジスタ3のスレ
ッシュホールド電圧以下になるとオフレドレイン電位は
マイナス電位となり出力2がプラス電位となり電源電圧
の低下を検出する。
When the power supply voltage decreases to below the threshold voltage of the P-channel transistor 3, the off-red drain potential becomes a negative potential, and the output 2 becomes a positive potential, thereby detecting a decrease in the power supply voltage.

検出電圧は次のようになる。尚、記号は以下のとおりと
する。
The detection voltage is as follows. The symbols are as follows.

vit L I+ :電源電圧低下検出電圧Vtnn:
MO3)ランジスク″n”のスレッシュ;1.−ルド電
圧 βn:MO8)ランジスタ″n”の電b)ε増幅率R:
P−抵抗7の抵抗値 vl:インバータのゲート電位 V、、:電源電圧 電圧低下検出電圧のときはインパークのゲート電位がイ
ンバータの人力ロジックレベル(V、。
vit L I+: Power supply voltage drop detection voltage Vtnn:
MO3) Thresh of Ranjisk "n"; 1. − field voltage βn: MO8) voltage of transistor “n” b) ε amplification factor R:
Resistance value vl of P-resistance 7: Gate potential of the inverter V, .: When the voltage drop detection voltage of the power supply voltage is reached, the gate potential of impark is at the manual logic level of the inverter (V,).

L)となった時であるからトランジスタ3は飽和領域で
はたらく。電圧低下検出電圧VQL’Dは次のとおりに
なる。
Since this is the case when the voltage becomes L), the transistor 3 works in the saturation region. The voltage drop detection voltage VQL'D is as follows.

■ ■より VFllJl= (VTl13+C) +((Vtos
+C)”−2C(VTMS −4屓VruJ  Vtn
5”)番−■””(AR(1+〃qK)−1−■ 例えば、VT u j=3VNβ5=15μA/V’ 
、VT II & =Vf II @ 、β、=β@、
R=IMΩとすると Vo L o ’ =3. 48V 他の従来例の構成図を第3図に示す。基準電圧回路8と
電源電圧検出回路9の出力を比較器10で比較し、電源
電圧が低下したのを検出するという構成である。第4図
は、前記構成の電池電圧低下検出回路の一例である。ト
ランジスタ12.17.19はNチャンネルのデプレシ
g7−)ランジスクであり電流源として用いられている
。トランジスタ11.12は基準電圧回路を形成してお
り、両方のトランジスタの閾値電圧の差をプラス電源基
準で出力する。トランジスタ13〜19は比較器を形成
している。抵抗20.21電源電圧を抵抗分割し、電源
電圧低下を検出する電圧時に、分割電位が基準電圧と等
しくなるように形成されている。前記基準電圧と、電源
電圧分割電位とが比較器の入力となり、電源電圧分割電
位が基準電圧より小さくなったときに出力2が反転し、
電源電圧の低下を検出する。
■ From ■, VFllJl= (VTl13+C) +((Vtos
+C)”-2C(VTMS -4屓VruJ Vtn
5") number -■""(AR(1+〃qK)-1-■ For example, VT u j = 3VNβ5 = 15μA/V'
, VT II & =Vf II @ , β, = β @,
If R=IMΩ, then Vo Lo' = 3. 48V A configuration diagram of another conventional example is shown in FIG. The configuration is such that a comparator 10 compares the outputs of a reference voltage circuit 8 and a power supply voltage detection circuit 9 to detect a drop in the power supply voltage. FIG. 4 is an example of the battery voltage drop detection circuit having the above configuration. Transistors 12, 17, and 19 are N-channel depressor transistors and are used as current sources. Transistors 11 and 12 form a reference voltage circuit and output the difference between the threshold voltages of both transistors with reference to the plus power supply. Transistors 13-19 form a comparator. Resistors 20 and 21 are formed so that the power supply voltage is divided into resistors, and the divided potential becomes equal to the reference voltage when the power supply voltage drop is detected. The reference voltage and the power supply voltage division potential are input to a comparator, and when the power supply voltage division potential becomes smaller than the reference voltage, the output 2 is inverted,
Detects a drop in power supply voltage.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、従来技術の第2図においては温度特性が悪い。 However, in the prior art shown in FIG. 2, the temperature characteristics are poor.

以下に第2図の温度特性について述べる。The temperature characteristics shown in FIG. 2 will be described below.

前記検出電圧においてvTII s ” VTMS @
 、βi=β、とすると、 VIILJ= (VTM!+C) + (C”+2Vt
osC)士C=(2AR)−’ ’h”= ’??”+ N++ (2CVT、ls +
 C”)(X (2Vms%+2C’2−+2C!1 
−■靜=−(213sR) −” x (2R掠+2A
静)−■ここで、閾値7丁、の温度特性は一2mV/”
C1βの温度特性は一3000ppm/’ C11)−
抵抗の温度特性は+3000ppm/@C1βs’ =
 1511 A / V ’ 、R= I M Q I
−L 、以上の温度特性を■、■に代入する。
At the detection voltage, vTII s ” VTMS @
, βi=β, VIILJ= (VTM!+C) + (C”+2Vt
osC) Officer C=(2AR)-''h'='??'+ N++ (2CVT, ls +
C”)(X (2Vms%+2C'2-+2C!1
- ■ Silence = - (213sR) -” x (2R 掠 + 2A
static) - ■Here, the temperature characteristic of the threshold value 7 is -2 mV/"
The temperature characteristic of C1β is -3000ppm/'C11)-
The temperature characteristic of the resistance is +3000ppm/@C1βs' =
1511 A/V', R= I M Q I
-L, Substitute the above temperature characteristics into ■ and ■.

蒼=C(−(AR)−’X(2R鋒+2A静))=0 ”Xf = ’2f’+ (2CVTR1+ C”)−
’ X C%”9−= −2mv/”C,Vt)ls=
3v、  とすると豐= −2,15mv/”C 以上より電源電圧低下検出電圧vn L Dの温度特性
は、トランジスタ3のgA値電圧v丁II lの温度特
性とほぼ等しい。この値は50@Cの温度変化に対し約
0.1V検出電圧が変動する事になる。
Blue=C(-(AR)-'X(2R Feng+2A Shizuka))=0"Xf='2f'+(2CVTR1+C")-
'X C%"9-=-2mv/"C,Vt)ls=
3v, then 豐=-2,15mv/''C From the above, the temperature characteristics of the power supply voltage drop detection voltage vn LD are almost equal to the temperature characteristics of the gA value voltage vd II l of the transistor 3. This value is 50@ The detection voltage will fluctuate by about 0.1V with respect to the temperature change of C.

一方従来技術の第4図においては素子数が多いという問
題点がある。第4図の検出電圧の温度特性を以下に述べ
る。
On the other hand, the conventional technique shown in FIG. 4 has a problem in that the number of elements is large. The temperature characteristics of the detection voltage shown in FIG. 4 will be described below.

基Kll電圧Vra@はトランジスタ11.12とで作
っており、値はトランジスタ11.12の閾値電圧VT
 o r I % V丁u + * (D差テア6゜V
r  # g:V丁I+  +  +  −VT 11
  +  雪V、;、、の温度特性は一2mV/”Cで
あるが、基準電圧は閾値電圧V 丁o r 11VTI
I 1mの差である為、温度特性は無い。一方電源電圧
検出の為の抵抗分割された電位は比で決定される為、温
度特性は無い。コンパレータはプラス入力、マイナス人
力共にペア性が保たれる為、温度特性は無い。以上より
第4図における?Ii源電圧電圧低下検出回温度時、性
が無い。
The basic Kll voltage Vra@ is created by the transistor 11.12, and the value is the threshold voltage VT of the transistor 11.12.
o r I % V d u + * (D difference tare 6°V
r#g:VT1+++-VT11
+ The temperature characteristic of snow V, ;,, is -2mV/''C, but the reference voltage is the threshold voltage V 11VTI
Since the difference is I 1m, there is no temperature characteristic. On the other hand, the resistor-divided potential for power supply voltage detection is determined by a ratio, so there is no temperature characteristic. Since the comparator maintains pairability for both positive input and negative input, there is no temperature characteristic. From the above, ? in Figure 4? Ii When the voltage drop in the source voltage is detected, there is no effect.

しかし前に述べたように第4図の回路に比べ、4倍の素
子を必要とする。これはICチップサイズに大きなウェ
イトをしめる事になり、余裕をもったチップサイズのI
Cでないと使用できない。
However, as mentioned earlier, this requires four times as many elements as the circuit of FIG. This places a large weight on the IC chip size, and the chip size I
It cannot be used unless it is C.

そこで本発明は、このような間に点解決するもので、そ
の目的とするところは、極めて小さい温度特性の電源電
圧低下検出回路を極めて少ない素子数で実現する方法を
提供するところにある。
SUMMARY OF THE INVENTION The present invention aims to solve this problem, and its purpose is to provide a method for realizing a power supply voltage drop detection circuit with extremely small temperature characteristics using an extremely small number of elements.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の電源電圧低下検出回路は、MOS)ランジスタ
のソースが1つの電源に接続され、前記トランジスタの
ドレインは抵抗を通してソース電位でない片一方の電源
に接続され、前記トランジスタのゲートは抵抗のv<枕
された電源に接続される手段を要し、前記トランジスタ
が次段インバータのゲートに接続され、前記抵抗に高抵
抗ポリシリコンを用いる事を特徴とする。
In the power supply voltage drop detection circuit of the present invention, the source of a MOS transistor is connected to one power supply, the drain of the transistor is connected through a resistor to one power supply that is not at the source potential, and the gate of the transistor is connected to a resistor of v< The method is characterized in that the transistor is connected to the gate of the next-stage inverter, and the resistor is made of high-resistance polysilicon.

〔作用〕[Effect]

本発明の上記の構成によれば、高抵抗ポリシリコンはマ
イナスの温度特性をもち、又シート抵抗による温度特性
が変化する為、従来の温度特性の大部分であったMOS
)ランジスタ3の閾値電圧の温度特性を打ち消すように
抵抗を設定でき、はぼフラットな温度特性を得る事が可
能となる。
According to the above configuration of the present invention, high-resistance polysilicon has negative temperature characteristics, and the temperature characteristics change due to sheet resistance, so MOS
) The resistance can be set so as to cancel out the temperature characteristics of the threshold voltage of the transistor 3, making it possible to obtain a substantially flat temperature characteristic.

〔実施例〕〔Example〕

第1図は本発明の実施例における電源電圧低下検出回路
である。回路的には従来と変わらない。
FIG. 1 shows a power supply voltage drop detection circuit in an embodiment of the present invention. The circuit is the same as before.

変わったのは抵抗4を従来P=低抵抗使っていたのを高
抵抗ポリシリコンに変えた点である。本回路において、
高抵抗ポリシリコンの抵抗値をRとすると、従来技術と
同様に電源電圧低下検出電圧Vnjoは次のように書け
る。(〔従来技術〕参照) Vtu、n= (Vn+3+C)+((Vtus+C)
”−2C(Vtl(s−1p扁−VTHII)  Vt
u3)’−〇C=(AR(1+ 〃qK> )司   
  −■以下に!!度時特性ついて述べる。
What has changed is that resistor 4, which used to be P = low resistance, has been changed to high resistance polysilicon. In this circuit,
Assuming that the resistance value of high-resistance polysilicon is R, the power supply voltage drop detection voltage Vnjo can be written as follows, as in the prior art. (Refer to [Prior Art]) Vtu, n= (Vn+3+C)+((Vtus+C)
”-2C(Vtl(s-1p-VTHII) Vt
u3)'-〇C=(AR(1+ 〃qK〉)
−■Below! ! Let's talk about the time characteristics.

前記検出電圧において、VTII k = VTII 
g、β、=β、とすると、検出電圧の温度特性4次1は
次のようになる。
At the detection voltage, VTII k = VTII
When g, β, = β, the fourth-order temperature characteristic of the detected voltage is as follows.

’rf’ = ’j:? + % + 4 (2CVT
H3+ C”) −4X (2VTH3靜+2C4’?
+2Cff)     −〇5 = −(2AR)−’
刈2R4?−+2A聾)  −〇ここで閾値VTI+の
温度特性は−2m V / ’C0β、゛の温度特性は
一3000PPm/” C。
'rf' = 'j:? + % + 4 (2CVT
H3+ C") -4X (2VTH3silence+2C4'?
+2Cff) −〇5 = −(2AR)−'
Hari 2R4? -+2A deaf) -〇Here, the temperature characteristic of threshold value VTI+ is -2mV/'C0β, and the temperature characteristic of ゛ is -3000PPm/''C.

高抵抗ポリシリコンの温度特性を−50001)Pm 
 /  ”   Co   V  t   o   s
   =  3  V  S  R=   1  へ1
9 、  β 、  =15μA/V’として計算する
Temperature characteristics of high resistance polysilicon -50001) Pm
/ ” Co V t o s
= 3 V S R = 1 to 1
9, β, = 15 μA/V'.

fi=0.26667mv/’C ’at’= 0.078mv/”C 以上より本実施例の電源電圧低下検出電圧VnLrlの
温度特性は、トランジスタ3の閾値電圧■T 113の
温度特性を補正している。この値は50′Cの温度変化
に対し約4mV検出電圧が変動するだけである。
fi=0.26667mv/'C 'at'=0.078mv/"C From the above, the temperature characteristics of the power supply voltage drop detection voltage VnLrl of this embodiment are determined by correcting the temperature characteristics of the threshold voltage ■T113 of the transistor 3. This value only changes the detection voltage by about 4 mV for a temperature change of 50'C.

〔発明の効采〕[Efficacy of invention]

以上述べたように発明によれば、抵抗に高抵抗ポリシリ
コンを使用した為、検出電圧の温度特性の主’R因であ
ったM OS )ランジスタの閾値電圧の温度特性を打
ち消す事が可能である。又、抵抗にI)−抵抗を用いる
のに比べ、拡散の広がり、ストッパーとの距離等を気に
しないで済む事、及び高抵抗ポリシリコンのシート抵抗
がP−抵抗より大きい為、形状比が小さく済む事より抵
抗部のパターン面積が小さくなりチップサイズ縮小し、
低コストで温度特性の極めて小さい電源電圧低下検出回
路が得られる。
As described above, according to the invention, since high-resistance polysilicon is used for the resistor, it is possible to cancel the temperature characteristic of the threshold voltage of the MOS transistor, which is the main cause of the temperature characteristic of the detected voltage. be. Also, compared to using an I)-resistance as a resistor, there is no need to worry about diffusion spread, distance to the stopper, etc., and the sheet resistance of high-resistance polysilicon is greater than the P-resistance, so the shape ratio is Since it is smaller, the pattern area of the resistor part becomes smaller and the chip size is reduced.
A low-cost power supply voltage drop detection circuit with extremely small temperature characteristics can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の4素子電源電圧低下検出回路図であ
り、第2図は従来の4素子電源電圧低下検出回路図であ
り、第3回は従来の電源電圧低下検出回路構成図であり
、第4図は従来の電源電圧低下検出回路図であり、 0・・・マイナス電源 1・・・プラス電源 2・・・電源電圧低下検出出力 4・・・高抵抗ポリシリコン抵抗 7・・・P二抵抗 以  上 出願人 セイコーエプソン株式会社 第4図
FIG. 1 is a diagram of a four-element power supply voltage drop detection circuit according to the present invention, FIG. 2 is a diagram of a conventional four-element power supply voltage drop detection circuit, and Part 3 is a diagram of a conventional power supply voltage drop detection circuit. Yes, Fig. 4 is a conventional power supply voltage drop detection circuit diagram. 0...Minus power supply 1...Plus power supply 2...Power supply voltage drop detection output 4...High resistance polysilicon resistor 7...・P2 resistance or more Applicant: Seiko Epson Corporation Figure 4

Claims (1)

【特許請求の範囲】[Claims] MOSトランジスタのソースが1つの電源に接続され、
前記トランジスタのドレインは抵抗を通してソース電位
でない片一方の電源に接続され、前記トランジスタのゲ
ートは、抵抗の接続された電源に接続される手段を要し
、前記トランジスタが次段インバータのゲートに接続さ
れる事を特徴とする電源電圧低下検出回路において、前
記抵抗に高抵抗ポリシリコンを用いる事を特徴とする電
源電圧低下検出回路。
The sources of the MOS transistors are connected to one power supply,
The drain of the transistor is connected to one power source other than the source potential through a resistor, the gate of the transistor requires means for connecting to the power source connected to the resistor, and the transistor is connected to the gate of the next stage inverter. A power supply voltage drop detection circuit characterized in that the resistor is made of high resistance polysilicon.
JP24905186A 1986-10-20 1986-10-20 Source voltage drop detecting circuit Pending JPS63103978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24905186A JPS63103978A (en) 1986-10-20 1986-10-20 Source voltage drop detecting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24905186A JPS63103978A (en) 1986-10-20 1986-10-20 Source voltage drop detecting circuit

Publications (1)

Publication Number Publication Date
JPS63103978A true JPS63103978A (en) 1988-05-09

Family

ID=17187281

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24905186A Pending JPS63103978A (en) 1986-10-20 1986-10-20 Source voltage drop detecting circuit

Country Status (1)

Country Link
JP (1) JPS63103978A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644546A (en) * 1992-09-11 1997-07-01 Fujitsu Limited MOS static RAM with improved soft error resistance; high-level supply voltage drop detection circuit and complementary signal transition detection circuit for the same; and semiconductor device with improved intersignal time margin
JP2010074519A (en) * 2008-09-18 2010-04-02 Toshiba Mitsubishi-Electric Industrial System Corp A/d conversion apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644546A (en) * 1992-09-11 1997-07-01 Fujitsu Limited MOS static RAM with improved soft error resistance; high-level supply voltage drop detection circuit and complementary signal transition detection circuit for the same; and semiconductor device with improved intersignal time margin
US5734622A (en) * 1992-09-11 1998-03-31 Fujitsu Limited MOS static RAM with improved soft error resistance; high-level supply voltage drop detection circuit and complementary signal transition detection circuit for the same; and semiconductor device with improved intersignal time margin
JP2010074519A (en) * 2008-09-18 2010-04-02 Toshiba Mitsubishi-Electric Industrial System Corp A/d conversion apparatus

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