JPS6293745U - - Google Patents
Info
- Publication number
- JPS6293745U JPS6293745U JP18702885U JP18702885U JPS6293745U JP S6293745 U JPS6293745 U JP S6293745U JP 18702885 U JP18702885 U JP 18702885U JP 18702885 U JP18702885 U JP 18702885U JP S6293745 U JPS6293745 U JP S6293745U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample chamber
- gas
- heat exchange
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 claims description 6
- 239000012535 impurity Substances 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000001073 sample cooling Methods 0.000 claims description 5
- 238000001179 sorption measurement Methods 0.000 claims description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims 2
- 229910002092 carbon dioxide Inorganic materials 0.000 claims 1
- 239000001569 carbon dioxide Substances 0.000 claims 1
- 239000003463 adsorbent Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
- Optical Measuring Cells (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図はこの考案の一実施例の低温試験用試料
冷却装置を示す縦断面図、第２図は従来の低温光
学試験用試料冷却装置の一例を示す縦断面図であ
る。
１……低温液化ガス、２……冷却槽、３……内
筒体、４……試料室、５……試料、６……試料保
持部、７……保持軸、８……外装体、９……断熱
層、１１……光学窓、１５……熱交換用ガス、１
６……不純物吸着トラツプ、２０……吸着剤、２
３……導入管路。
FIG. 1 is a vertical cross-sectional view showing a sample cooling device for low-temperature tests according to an embodiment of the invention, and FIG. 2 is a vertical cross-sectional view showing an example of a conventional sample cooling device for low-temperature optical tests. DESCRIPTION OF SYMBOLS 1...Low temperature liquefied gas, 2...Cooling tank, 3...Inner cylinder, 4...Sample chamber, 5...Sample, 6...Sample holder, 7...Holding shaft, 8...Exterior body, 9... Heat insulation layer, 11... Optical window, 15... Heat exchange gas, 1
6... Impurity adsorption trap, 20... Adsorbent, 2
3...Introduction pipe.
Claims (1)
液化ガスを収容する冷却槽の中央部を上下に貫通
するように配設され、かつその内筒体の下端には
冷却槽の下方において試料室が形成され、また前
記内筒体内には、試料を保持するための試料保持
部を下端に設けた保持軸が上方から挿入され、前
記冷却槽および試料室が全体として外装体によつ
て取囲まれ、かつその冷却槽および試料室の外面
と外装体との間が断熱層とされ、さらに前記内筒
体および試料室内に外部から熱交換用ガスを導入
するように構成された低温試験用試料冷却装置に
おいて、 前記冷却槽内の低温液化ガスに浸漬される位置
に、外部から前記熱交換用ガスが導入されてその
導入ガス中の水分、炭酸ガス等の不純物を吸着す
るための不純物吸着トラツプが配設され、この不
純物吸着トラツプを通過した熱交換ガスが前記内
筒体および試料室内に導入されるように構成した
ことを特徴とする低温試験用試料冷却装置。 (2) 前記試料室の壁面および外装体の壁面には
、それぞれ前記試料に対応する位置に光学窓が形
成されており、かつ前記不純物吸着トラツプを通
過した熱交換用ガス内筒体および試料室内へ導入
するための管路が、前記試料室の壁面の光学窓に
対向する位置まで延びており、その光学窓に熱交
換用ガスを吹付けるように構成されている実用新
案登録請求の範囲第１項記載の低温試験用試料冷
却装置。[Claims for Utility Model Registration] (1) An inner cylindrical body having a hollow cylindrical shape as a whole is arranged so as to vertically penetrate the center of a cooling tank that accommodates low-temperature liquefied gas, and the inner cylindrical body A sample chamber is formed below the cooling tank at the lower end, and a holding shaft having a sample holding portion at the lower end for holding the sample is inserted into the inner cylinder from above, and the cooling tank and the sample The chamber is entirely surrounded by an exterior body, and a heat insulating layer is provided between the outer surface of the cooling tank and the sample chamber and the exterior body, and a heat exchange gas is supplied from the outside into the inner cylindrical body and the sample chamber. In the sample cooling device for low-temperature tests, the heat exchange gas is introduced from the outside into a position immersed in the low-temperature liquefied gas in the cooling tank, and moisture and carbon dioxide in the introduced gas are removed. for low-temperature testing, characterized in that an impurity adsorption trap is provided for adsorbing impurities such as, and the heat exchange gas that has passed through the impurity adsorption trap is introduced into the inner cylinder and the sample chamber. Sample cooling device. (2) An optical window is formed on the wall surface of the sample chamber and the wall surface of the exterior body at a position corresponding to the sample, and the heat exchange gas inner cylinder and the sample chamber that have passed through the impurity adsorption trap are formed. The pipe line for introducing the gas into the sample chamber extends to a position opposite to the optical window on the wall surface of the sample chamber, and is configured to blow the heat exchange gas onto the optical window. The sample cooling device for low-temperature tests according to item 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18702885U JPH0320758Y2 (en) | 1985-12-04 | 1985-12-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18702885U JPH0320758Y2 (en) | 1985-12-04 | 1985-12-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6293745U true JPS6293745U (en) | 1987-06-15 |
| JPH0320758Y2 JPH0320758Y2 (en) | 1991-05-07 |
Family
ID=31137127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18702885U Expired JPH0320758Y2 (en) | 1985-12-04 | 1985-12-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0320758Y2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03274438A (en) * | 1990-03-26 | 1991-12-05 | Nagase Sangyo Kk | Measuring apparatus of characteristic of sample and measuring method thereof |
| JPH063194A (en) * | 1992-06-18 | 1994-01-11 | Mitsubishi Heavy Ind Ltd | Apparatus for measuring solar light absorption factor and emissivity |
| JP2018154357A (en) * | 2017-03-16 | 2018-10-04 | 大陽日酸株式会社 | Freezing storage container |
| WO2021131056A1 (en) * | 2019-12-27 | 2021-07-01 | 株式会社エムダップ | Specimen shipment anchoring device for use in vacuum-insulated double-walled container |
-
1985
- 1985-12-04 JP JP18702885U patent/JPH0320758Y2/ja not_active Expired
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03274438A (en) * | 1990-03-26 | 1991-12-05 | Nagase Sangyo Kk | Measuring apparatus of characteristic of sample and measuring method thereof |
| JPH063194A (en) * | 1992-06-18 | 1994-01-11 | Mitsubishi Heavy Ind Ltd | Apparatus for measuring solar light absorption factor and emissivity |
| JP2018154357A (en) * | 2017-03-16 | 2018-10-04 | 大陽日酸株式会社 | Freezing storage container |
| WO2021131056A1 (en) * | 2019-12-27 | 2021-07-01 | 株式会社エムダップ | Specimen shipment anchoring device for use in vacuum-insulated double-walled container |
| US11974967B2 (en) | 2019-12-27 | 2024-05-07 | Mdap Co., Ltd. | Fixing device for transport sample for use in vacuum heat insulating double walled container |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0320758Y2 (en) | 1991-05-07 |
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