JPS629322Y2 - - Google Patents

Info

Publication number
JPS629322Y2
JPS629322Y2 JP1983064054U JP6405483U JPS629322Y2 JP S629322 Y2 JPS629322 Y2 JP S629322Y2 JP 1983064054 U JP1983064054 U JP 1983064054U JP 6405483 U JP6405483 U JP 6405483U JP S629322 Y2 JPS629322 Y2 JP S629322Y2
Authority
JP
Japan
Prior art keywords
substrate
substrate support
cooling
bottom wall
air
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983064054U
Other languages
Japanese (ja)
Other versions
JPS59169354U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6405483U priority Critical patent/JPS59169354U/en
Publication of JPS59169354U publication Critical patent/JPS59169354U/en
Application granted granted Critical
Publication of JPS629322Y2 publication Critical patent/JPS629322Y2/ja
Granted legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【考案の詳細な説明】 (イ) 産業上の利用分野 本考案は、主としてイオン工学的コーテイング
技術分野で利用可能な成膜装置に関するものであ
る。
[Detailed description of the invention] (a) Industrial application field The present invention relates to a film forming apparatus that can be used mainly in the field of ion-technical coating technology.

(ロ) 従来技術 スパツタリング装置などの成膜装置は、例え
ば、第1図に示すように、真空容器a内に、一方
の電極を兼ねる基板支持台bと、他方の電極を兼
ねるターゲツト材支持台cとを対向配置してい
る。そして、前記基板支持台bには、該基板支持
台bに装着した基板dを所定温度にまで予熱する
ためのヒータ等の加熱機構eと、前記基板dを成
膜終了後冷却するための冷却機構fとを設けてい
るのが一般的である。ところが、従来の冷却機構
fはパイプ材により構成した冷却コイルgを前記
基板支持台bの背面に添設し、この冷却コイルg
内に冷却水hを流通させ得るようにした水冷式の
ものである。そのため、第1図に示すように、い
わゆるデポアツプ方式を採用した場合、すなわ
ち、基板支持台bをターゲツト材支持台cの上方
に配置し、この基板支持台bの下面側に基板dを
装着し得るようにした場合、種々の不都合が生じ
る。すなわち、このようにすると、冷却水の供給
を停止した場合でも、流通していた冷却水の一部
が前記冷却コイルg内に残留することになる。し
たがつて、加熱機構eに通電して基板dの加熱を
開始した場合に、前記冷却コイルg内の残留冷却
水が蒸気化することになり、危険である。また、
かかる冷却水が完全に蒸発してしまうまでは、基
板dの温度上昇が阻止されるため、設定温度に達
するまでに時間がかかる。換言すれば、前記加熱
機構eに付与する電力の一部が前記冷却水を蒸発
させるためのエネルギとして労費されてしまう。
よつてエネルギの有効な利用を図ることが難し
く、効率的な運転を行なうことができないという
問題がある。
(B) Prior Art A film forming apparatus such as a sputtering apparatus, for example, as shown in FIG. 1, has a substrate support stand b that also serves as one electrode and a target material support stand that also serves as the other electrode in a vacuum vessel a. c are placed facing each other. The substrate support stand b includes a heating mechanism e such as a heater for preheating the substrate d mounted on the substrate support stand b to a predetermined temperature, and a cooling mechanism e for cooling the substrate d after film formation. Generally, a mechanism f is provided. However, in the conventional cooling mechanism f, a cooling coil g made of pipe material is attached to the back side of the substrate support base b.
It is a water-cooled type that allows cooling water h to flow inside. Therefore, as shown in Fig. 1, when the so-called depot-up method is adopted, the substrate support stand b is placed above the target material support stand c, and the substrate d is mounted on the underside of this substrate support stand b. If this is done, various inconveniences will occur. That is, in this case, even if the supply of cooling water is stopped, a portion of the circulating cooling water will remain in the cooling coil g. Therefore, when the heating mechanism e is energized to start heating the substrate d, the residual cooling water in the cooling coil g will vaporize, which is dangerous. Also,
Since the temperature of the substrate d is prevented from rising until the cooling water completely evaporates, it takes time to reach the set temperature. In other words, part of the electric power applied to the heating mechanism e is used as energy for evaporating the cooling water.
Therefore, there is a problem in that it is difficult to utilize energy effectively, and efficient operation cannot be performed.

このような事情から、現実には、第2図に示す
ような、いわゆるデポダウン方式、すなわち、基
板支持台b′をターゲツト材支持台c′の下方に配置
し、この基板支持台b′の上方側に基板dを装着す
るようにした方式の採用を余儀なくされてきた。
しかしながら、かかる方式を採ると、基板dの表
面に不純物が沈積する可能性が高くなり、良質な
薄膜を生成させるのが難しいという問題がある。
Due to these circumstances, in reality, the so-called deposit-down method as shown in Fig. 2 is used, that is, the substrate support stand b' is placed below the target material support stand c', and the substrate support stand b' is placed above the target material support stand c'. There has been no choice but to adopt a method in which the board d is mounted on the side.
However, when such a method is adopted, there is a problem that there is a high possibility that impurities will be deposited on the surface of the substrate d, and it is difficult to form a high-quality thin film.

(ハ) 目的 本考案は、このような事情に着目してなされた
もので、良質な薄膜を生成させることができ、し
かも、エネルギの労費が少なく効率的な運転を行
なうことができる成膜装置を提供することを目的
とする。
(C) Purpose The present invention was developed in light of these circumstances, and is a film forming method that can produce high-quality thin films and that can be operated efficiently with low energy costs. The purpose is to provide equipment.

(ニ) 構成 本考案は、かかる目的を達成するために、デポ
アツプ方式を採用するとともに基板支持台に設け
る冷却機構を空冷式にしたことを特徴とするもの
である。すなわち、本考案に係る成膜装置は、底
壁に加熱機構を内蔵した基板支持台を真空容器内
に、その底壁下面に基板を装着し得る姿勢で配設
し、この基板支持台内に、成膜終了後その底壁の
上面側に冷却用エアーを直接に吹付ける空冷式の
冷却機構を設けたことを特徴とするものである。
(d) Configuration In order to achieve the above object, the present invention is characterized by adopting a depot-up method and using an air-cooling type cooling mechanism provided on the substrate support. That is, in the film forming apparatus according to the present invention, a substrate support with a built-in heating mechanism in the bottom wall is arranged in a vacuum container in a position that allows the substrate to be mounted on the lower surface of the bottom wall, and the substrate support is placed inside the substrate support. , is characterized by being provided with an air-cooling type cooling mechanism that blows cooling air directly onto the upper surface side of the bottom wall after film formation is completed.

(ホ) 実施例 以下、本考案の一実施例を第3図を参照して説
明する。
(e) Embodiment An embodiment of the present invention will be described below with reference to FIG. 3.

第3図は本考案に係る成膜装置の概略断面図で
ある。この図面に示されているように、本成膜装
置は、真空容器1内の天井部に一方の電極をなす
基板支持台2を配設するとともに、底部に他方の
電極をなすターゲツト材支持台3を設け、前記基
板支持台2の下面に装着した基板4と、前記ター
ゲツト材支持台3の上面に装着したターゲツト材
5とを上、下に対向させている。基板支持台2
は、上端2aを真空容器1外に開口させたチヤン
バ状のもので、その底壁2b内にヒータ等の加熱
機構6を設けるとともに、中空部2c内に空冷式
の冷却機構7を設けている。冷却機構7は、多数
の噴口8を有したエアー噴射パイプ9を前記中空
部2c内に配設し、外部に配置したエアー源11
から吐出される空冷用エアーAを送気パイプ12
を介して前記エアー噴射パイプ9内に逐次供給し
得るようにしたものであり、前記エアー噴射パイ
プ9の噴口8から噴射されるエアーAは第3図に
示すように底壁2bの上面に直接に吹付けられて
前記中空部2c内に充満するとともに、上のもの
から順次外部へ排出されるようになつている。な
お、13は直流電源、14は排気系路である。
FIG. 3 is a schematic cross-sectional view of a film forming apparatus according to the present invention. As shown in this drawing, this film forming apparatus has a substrate support 2 that serves as one electrode on the ceiling of a vacuum vessel 1, and a target material support that serves as the other electrode on the bottom. 3 are provided, and the substrate 4 mounted on the lower surface of the substrate support 2 and the target material 5 mounted on the upper surface of the target material support 3 are faced upwardly and downwardly. Board support stand 2
is a chamber-shaped chamber whose upper end 2a is open to the outside of the vacuum container 1, and has a heating mechanism 6 such as a heater in its bottom wall 2b, and an air-cooled cooling mechanism 7 in its hollow part 2c. . The cooling mechanism 7 includes an air injection pipe 9 having a large number of nozzles 8 disposed within the hollow portion 2c, and an air source 11 disposed outside.
Air cooling air A discharged from the air supply pipe 12
The air A is injected from the nozzle 8 of the air injection pipe 9 directly onto the upper surface of the bottom wall 2b as shown in FIG. The particles are sprayed to fill the hollow portion 2c, and are discharged to the outside in order from the top. Note that 13 is a DC power supply, and 14 is an exhaust system path.

このような構成のものであれば、従来のものと
同様にして基板4の表面に薄膜を生成させること
ができるが、本装置では、基板支持台2をターゲ
ツト材支持台3の上方に配置し、この基板支持台
2の下面側に基板4を装着するようにしている。
そのため、不純物が前記基板4の表面に沈積する
ようなことがなく、良質な薄膜を生成させること
ができる。しかも、前記基板支持台2の冷却を空
冷式の冷却機構7により行なうようにしているの
で、前述したようなデポアツプ方式を採用しても
冷却工程が終了した後に冷却水が残留するような
ことがない。そのため、基板支持台2を加熱した
際に、残留冷却水が蒸気化するという危険性がな
い。また、このようなものであれば、過熱機構6
に供給する電力の多くが、残留冷却水を蒸気化さ
せるためのエネルギとして労費されるという不都
合がない。したがつて、前記基板支持台2の底壁
2bに加熱機構6を内蔵させていることと相まつ
て、基板の温度を速かに設定温度にまで上昇させ
ることが可能となり、エネルギロスの少ない効率
的な運転を行なうことができるものである。その
上、下面に基板4を保持するとともに内部に加熱
機構6を有した前記底壁2bに冷却用のエアーA
を直接に吹付けるようにしているので、冷却の効
率が高く、空冷式にしたために冷却に時間かかる
というような不具合は生じない。
With such a configuration, a thin film can be generated on the surface of the substrate 4 in the same manner as in conventional devices, but in this device, the substrate support 2 is placed above the target material support 3. , the substrate 4 is mounted on the lower surface side of the substrate support stand 2.
Therefore, impurities are not deposited on the surface of the substrate 4, and a high-quality thin film can be produced. Furthermore, since the substrate support stand 2 is cooled by the air-cooled cooling mechanism 7, even if the depot-up method described above is adopted, there is no possibility that cooling water will remain after the cooling process is completed. do not have. Therefore, there is no risk that the residual cooling water will vaporize when the substrate support stand 2 is heated. In addition, if it is like this, the overheating mechanism 6
There is no inconvenience that much of the electric power supplied to the system is spent as energy for vaporizing the residual cooling water. Therefore, together with the fact that the heating mechanism 6 is built into the bottom wall 2b of the substrate support stand 2, it becomes possible to quickly raise the temperature of the substrate to the set temperature, resulting in efficiency with less energy loss. The vehicle can be operated with ease. Moreover, cooling air A is provided to the bottom wall 2b which holds the substrate 4 on the lower surface and has a heating mechanism 6 inside.
Since it is sprayed directly, the cooling efficiency is high, and there are no problems such as the time it takes to cool down due to an air-cooled system.

なお、冷却機構の構成は図示実施例のものに限
らず、例えば、基板支持台の中空部に撹拌器を内
設しておき、その撹拌器により付勢したエアーを
基板支持台の底壁上面に直接に吹付けるようにし
たようなものであつてもよい。
Note that the configuration of the cooling mechanism is not limited to that of the illustrated embodiment; for example, a stirrer may be provided inside the hollow part of the substrate support, and air energized by the stirrer may be applied to the top surface of the bottom wall of the substrate support. It may also be something that is sprayed directly onto the surface.

また、本考案は、スパツタリング装置に限ら
ず、CVD装置等にも同様に適用が可能である。
Further, the present invention can be applied not only to sputtering equipment but also to CVD equipment and the like.

(ヘ) 効果 本考案は、以上のような構成であるから、良質
な薄膜を生成させることができ、しかも、エネル
ギの労費が少なく効率的な運転を行なうことがで
きる成膜装置を提供できるものである。
(f) Effects Since the present invention has the above-described configuration, it is possible to provide a film forming apparatus that can produce a high-quality thin film and can operate efficiently with low energy costs. It is something.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は従来例を示す概略断面図、第
3図は本考案の一実施例を示す概略断面図であ
る。 1……真空容器、2……基板支持台、2b……
底壁、4……基板、6……加熱機構、7……冷却
機構。
1 and 2 are schematic sectional views showing a conventional example, and FIG. 3 is a schematic sectional view showing an embodiment of the present invention. 1... Vacuum container, 2... Substrate support stand, 2b...
Bottom wall, 4... substrate, 6... heating mechanism, 7... cooling mechanism.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] チヤンバ状の基板支持台の底壁に加熱機構を内
蔵させ、この基板支持台を真空容器内に、その底
壁下面に基板を装着し得る姿勢で配設し、この基
板支持台内に、成膜終了後その底壁の上面側に冷
却用エアーを直接に吹付ける空冷式の冷却機構を
設けたことを特徴とする成膜装置。
A heating mechanism is built into the bottom wall of a chamber-shaped substrate support, and this substrate support is placed in a vacuum container in a position where a substrate can be attached to the lower surface of the bottom wall. A film forming apparatus characterized by being provided with an air-cooling type cooling mechanism that blows cooling air directly onto the upper surface side of the bottom wall after the film is finished.
JP6405483U 1983-04-29 1983-04-29 Film forming equipment Granted JPS59169354U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6405483U JPS59169354U (en) 1983-04-29 1983-04-29 Film forming equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6405483U JPS59169354U (en) 1983-04-29 1983-04-29 Film forming equipment

Publications (2)

Publication Number Publication Date
JPS59169354U JPS59169354U (en) 1984-11-13
JPS629322Y2 true JPS629322Y2 (en) 1987-03-04

Family

ID=30194239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6405483U Granted JPS59169354U (en) 1983-04-29 1983-04-29 Film forming equipment

Country Status (1)

Country Link
JP (1) JPS59169354U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55100973A (en) * 1979-01-23 1980-08-01 Ricoh Co Ltd Heating of base plate in vacuum deposition

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5489350U (en) * 1977-12-07 1979-06-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55100973A (en) * 1979-01-23 1980-08-01 Ricoh Co Ltd Heating of base plate in vacuum deposition

Also Published As

Publication number Publication date
JPS59169354U (en) 1984-11-13

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