JPS6284762U - - Google Patents
Info
- Publication number
- JPS6284762U JPS6284762U JP17574385U JP17574385U JPS6284762U JP S6284762 U JPS6284762 U JP S6284762U JP 17574385 U JP17574385 U JP 17574385U JP 17574385 U JP17574385 U JP 17574385U JP S6284762 U JPS6284762 U JP S6284762U
- Authority
- JP
- Japan
- Prior art keywords
- guide block
- lead
- component
- guide
- prober
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17574385U JPS6284762U (da) | 1985-11-15 | 1985-11-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17574385U JPS6284762U (da) | 1985-11-15 | 1985-11-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6284762U true JPS6284762U (da) | 1987-05-29 |
Family
ID=31115342
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17574385U Pending JPS6284762U (da) | 1985-11-15 | 1985-11-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6284762U (da) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015117991A (ja) * | 2013-12-18 | 2015-06-25 | アキム株式会社 | プローブユニットおよびそれを用いた温度特性計測装置 |
-
1985
- 1985-11-15 JP JP17574385U patent/JPS6284762U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015117991A (ja) * | 2013-12-18 | 2015-06-25 | アキム株式会社 | プローブユニットおよびそれを用いた温度特性計測装置 |
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