JPS6284156U - - Google Patents
Info
- Publication number
- JPS6284156U JPS6284156U JP17601485U JP17601485U JPS6284156U JP S6284156 U JPS6284156 U JP S6284156U JP 17601485 U JP17601485 U JP 17601485U JP 17601485 U JP17601485 U JP 17601485U JP S6284156 U JPS6284156 U JP S6284156U
- Authority
- JP
- Japan
- Prior art keywords
- cooling
- conductive member
- thermally conductive
- pipe
- cooling means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985176014U JPH0323650Y2 (en:Method) | 1985-11-15 | 1985-11-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985176014U JPH0323650Y2 (en:Method) | 1985-11-15 | 1985-11-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6284156U true JPS6284156U (en:Method) | 1987-05-29 |
| JPH0323650Y2 JPH0323650Y2 (en:Method) | 1991-05-23 |
Family
ID=31115867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985176014U Expired JPH0323650Y2 (en:Method) | 1985-11-15 | 1985-11-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0323650Y2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005100988A (ja) * | 2003-09-24 | 2005-04-14 | Carl Zeiss Nts Gmbh | 粒子放射装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51145848U (en:Method) * | 1975-05-16 | 1976-11-24 | ||
| JPS5478076A (en) * | 1977-12-05 | 1979-06-21 | Hitachi Ltd | Frozen sample observation device of scanning electron microscope and similar unit |
| JPS58165848U (ja) * | 1982-04-28 | 1983-11-04 | 日本電子株式会社 | 電子顕微鏡等の試料交換装置 |
-
1985
- 1985-11-15 JP JP1985176014U patent/JPH0323650Y2/ja not_active Expired
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51145848U (en:Method) * | 1975-05-16 | 1976-11-24 | ||
| JPS5478076A (en) * | 1977-12-05 | 1979-06-21 | Hitachi Ltd | Frozen sample observation device of scanning electron microscope and similar unit |
| JPS58165848U (ja) * | 1982-04-28 | 1983-11-04 | 日本電子株式会社 | 電子顕微鏡等の試料交換装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005100988A (ja) * | 2003-09-24 | 2005-04-14 | Carl Zeiss Nts Gmbh | 粒子放射装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0323650Y2 (en:Method) | 1991-05-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH03245504A (ja) | 臨界磁場測定装置用磁石 | |
| JPS6284156U (en:Method) | ||
| JPS6399749U (en:Method) | ||
| JPS6080657U (ja) | 電子顕微鏡用試料冷却装置 | |
| JPS644051U (en:Method) | ||
| JPH01161545U (en:Method) | ||
| JPS5849567Y2 (ja) | 電子顕微鏡等における電子レンズ | |
| JPS6174945U (en:Method) | ||
| JPS6338523Y2 (en:Method) | ||
| JPS60241280A (ja) | 超電導電磁石装置 | |
| JPS5849566Y2 (ja) | 電子顕微鏡の試料汚染防止装置 | |
| JP2000208083A (ja) | 電子顕微鏡の試料冷却装置 | |
| JPS6210353U (en:Method) | ||
| JPH0610612Y2 (ja) | 電子顕微鏡等の試料冷却装置 | |
| JPS63165759U (en:Method) | ||
| JPS5974661U (ja) | 電子顕微鏡等の試料冷却装置 | |
| JPS621358U (en:Method) | ||
| JPH0348848U (en:Method) | ||
| JPS6025985U (ja) | エネルギ−分散型x線検出装置 | |
| JPS6123256U (ja) | 電子顕微鏡等の試料冷却装置 | |
| JPS6228357U (en:Method) | ||
| JPS6298147U (en:Method) | ||
| JPH0179258U (en:Method) | ||
| JPS628110Y2 (en:Method) | ||
| JPH0326047U (en:Method) |