JPS6275466U - - Google Patents

Info

Publication number
JPS6275466U
JPS6275466U JP16761485U JP16761485U JPS6275466U JP S6275466 U JPS6275466 U JP S6275466U JP 16761485 U JP16761485 U JP 16761485U JP 16761485 U JP16761485 U JP 16761485U JP S6275466 U JPS6275466 U JP S6275466U
Authority
JP
Japan
Prior art keywords
probe
scanner
probes
inspected
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16761485U
Other languages
Japanese (ja)
Other versions
JPH0533962Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985167614U priority Critical patent/JPH0533962Y2/ja
Publication of JPS6275466U publication Critical patent/JPS6275466U/ja
Application granted granted Critical
Publication of JPH0533962Y2 publication Critical patent/JPH0533962Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図ないし第5図は本考案に係わる走査器の
一実施例を説明するために示したもので、第1図
は走査器の正面図、第2図は探触子配置および探
触子支持機構を示す上面図、第3図は探触子を載
置してなるサブフレームのメインフレームに対す
る支持状態を示す図、第4図および第5図は探触
子の配置関係を示す図、第6図および第7図はそ
れぞれ従来の走査器を説明する模式的な構成図で
ある。 10…平行走査器、11…部材、12…マグネ
ツトベース、13…X方向レール、14…モータ
ベース、16…X方向駆動モータ、21…連結フ
レーム、22…メインフレーム、23…マグネツ
トローラ、24…支持フレーム、24a,24b
,24c…横架フレーム、25…板バネ、26…
サブフレーム、27…フリーローラ、28…探触
子。
Figures 1 to 5 are shown to explain one embodiment of the scanner according to the present invention. Figure 1 is a front view of the scanner, and Figure 2 is a diagram showing the arrangement of the probe and the probe. FIG. 3 is a top view showing the support mechanism; FIG. 3 is a diagram showing how the subframe on which the probe is placed is supported on the main frame; FIGS. 4 and 5 are diagrams showing the arrangement of the probes; FIGS. 6 and 7 are schematic configuration diagrams illustrating conventional scanners, respectively. DESCRIPTION OF SYMBOLS 10...Parallel scanner, 11...Member, 12...Magnetic base, 13...X direction rail, 14...Motor base, 16...X direction drive motor, 21...Connection frame, 22...Main frame, 23...Magnetic roller, 24...Support frame, 24a, 24b
, 24c... Horizontal frame, 25... Leaf spring, 26...
Subframe, 27...free roller, 28...probe.

Claims (1)

【実用新案登録請求の範囲】 (1) 部材の被探傷部を超音波にて探傷する走査
器において、前記部材の被探傷部方向と直交する
方向に位置を異ならせて配置された複数の探触子
と、これらの探触子がそれぞれ独立して可動しか
つ前記部材面部に各探触子を押圧する如く支持す
る探触子支持機構と、これらの探触子支持機構を
支持して前記部材の被探傷部方向へ前記各探触子
を平行走査する走査機構とを備えたことを特徴と
する全姿勢多探触子平行走査器。 (2) 部材は、曲率部を持つた部材である実用新
案登録請求の範囲第(1)項記載の全姿勢多探触子
平行走査器。 (3) 部材の被探傷部方向は、前記部材が溶接部
を施したものである場合には該部材に施された溶
接部の溶接線の方向である実用新案登録請求の範
囲第(1)項記載の全姿勢多探触子平行走査器。 (4) 複数の探触子は、部材の被探傷部方向に所
定の間隔を有して複数段にわたつて配置されたも
のである実用新案登録請求の範囲第(1)項記載の
全姿勢多探触子平行走査器。
[Claims for Utility Model Registration] (1) In a scanner that uses ultrasonic waves to detect flaws in a part of a member, a plurality of detectors are arranged at different positions in a direction orthogonal to the direction of the part to be tested. a probe support mechanism that supports the probes so as to be movable independently and presses each probe against the surface portion of the member; An all-position multi-probe parallel scanner comprising: a scanning mechanism that scans each of the probes in parallel in a direction toward a part to be inspected of a member. (2) The all-position multi-probe parallel scanner according to claim (1), wherein the member is a member having a curved portion. (3) If the member has a welded part, the direction of the part to be inspected for flaws is the direction of the weld line of the welded part of the member.Claim No. (1) of Utility Model Registration All-position multi-probe parallel scanner described in Section 1. (4) The plurality of probes are arranged in multiple stages at predetermined intervals in the direction of the part to be inspected of the member, in all the positions described in paragraph (1) of the utility model registration claim. Multi-probe parallel scanner.
JP1985167614U 1985-10-31 1985-10-31 Expired - Lifetime JPH0533962Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985167614U JPH0533962Y2 (en) 1985-10-31 1985-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985167614U JPH0533962Y2 (en) 1985-10-31 1985-10-31

Publications (2)

Publication Number Publication Date
JPS6275466U true JPS6275466U (en) 1987-05-14
JPH0533962Y2 JPH0533962Y2 (en) 1993-08-27

Family

ID=31099705

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985167614U Expired - Lifetime JPH0533962Y2 (en) 1985-10-31 1985-10-31

Country Status (1)

Country Link
JP (1) JPH0533962Y2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5146386U (en) * 1974-10-01 1976-04-06
JPS5668158U (en) * 1979-10-30 1981-06-06
JPS59191665U (en) * 1983-06-07 1984-12-19 日立造船株式会社 detector scanning device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5146386B2 (en) * 1971-12-23 1976-12-08

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5146386U (en) * 1974-10-01 1976-04-06
JPS5668158U (en) * 1979-10-30 1981-06-06
JPS59191665U (en) * 1983-06-07 1984-12-19 日立造船株式会社 detector scanning device

Also Published As

Publication number Publication date
JPH0533962Y2 (en) 1993-08-27

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