JPH0259411U - - Google Patents
Info
- Publication number
- JPH0259411U JPH0259411U JP13877388U JP13877388U JPH0259411U JP H0259411 U JPH0259411 U JP H0259411U JP 13877388 U JP13877388 U JP 13877388U JP 13877388 U JP13877388 U JP 13877388U JP H0259411 U JPH0259411 U JP H0259411U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- inspected
- surface roughness
- electrodes
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 13
- 238000007689 inspection Methods 0.000 claims description 6
- 230000003746 surface roughness Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第１図〜第１２図は本考案の一実施例を示した
もので、第１図は表面粗さ検査装置の側面図、第
２図は第１図の―線矢視図、第３図はプロー
ブの先端部分の拡大断面図、第４図は第３図の
―線に沿う断面図、第５図〜第８図は検査動作
図、第９図および第１０図は被検査物面のプロー
ブ走査状態を示す平面図およびプローブ走査部分
の拡大断面図、第１１図はプローブ出力波形の一
例を示す図、第１２図はブレーキデイスクの製造
ラインを示す概略図である。
Ａ……ブレーキデイスク（被検査物）、１０…
…搬送路、１１……チエーンコンベア、１２……
ストツパ、１３……昇降台、１６……上部検査ユ
ニツト、１７……下部検査ユニツト、２２，３８
……プローブ走査用スクリユーロツド、１９，３
５……横移動台、２３，３９……プローブ昇降用
シリンダ、２４，４０……プローブホルダ、２６
ａ，２６ｂ……プローブ、２７ａ，２７ｂ……電
極、２８……コイル、３０……被検査物摺接チツ
プ。
Figures 1 to 12 show an embodiment of the present invention, where Figure 1 is a side view of the surface roughness inspection device, Figure 2 is a view taken along the - line arrow in Figure 1, and Figure 3 is a side view of the surface roughness inspection device. 4 is an enlarged sectional view of the tip of the probe, FIG. 4 is a sectional view taken along the line - in FIG. 3, FIGS. 5 to 8 are inspection operation diagrams, and FIGS. FIG. 11 is a plan view showing a probe scanning state and an enlarged sectional view of a probe scanning portion, FIG. 11 is a diagram showing an example of a probe output waveform, and FIG. 12 is a schematic diagram showing a brake disc manufacturing line. A...Brake disc (inspected object), 10...
...Conveyance path, 11...Chain conveyor, 12...
Stopper, 13... Lifting platform, 16... Upper inspection unit, 17... Lower inspection unit, 22, 38
... Screw rod for probe scanning, 19,3
5... Lateral moving table, 23, 39... Cylinder for probe elevation, 24, 40... Probe holder, 26
a, 26b...probe, 27a, 27b...electrode, 28...coil, 30...test object sliding contact chip.
Claims (1)
、一対の電極とこの電極に巻回されたコイルとを
備えた渦電流式の凹凸探査プローブと、このプロ
ーブを前記被検査物の表面に対向させる機構と、
前記プローブと前記被検査物とのいずれか一方を
移動させて前記プローブを前記被検査物の表面に
沿わせて走査させるプローブ走査機構とを備えた
ことを特徴とする表面粗さ検査装置。 An apparatus for inspecting the surface roughness of an object to be inspected includes an eddy current type unevenness probe equipped with a pair of electrodes and a coil wound around the electrodes, and the probe is opposed to the surface of the object to be inspected. a mechanism for causing
A surface roughness inspection apparatus comprising: a probe scanning mechanism that moves either the probe or the object to be inspected to scan the probe along the surface of the object to be inspected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13877388U JPH0259411U (en) | 1988-10-25 | 1988-10-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13877388U JPH0259411U (en) | 1988-10-25 | 1988-10-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0259411U true JPH0259411U (en) | 1990-05-01 |
Family
ID=31401426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13877388U Pending JPH0259411U (en) | 1988-10-25 | 1988-10-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0259411U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012137473A (en) * | 2010-12-07 | 2012-07-19 | Kobe Steel Ltd | Roughness measuring device |
-
1988
- 1988-10-25 JP JP13877388U patent/JPH0259411U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012137473A (en) * | 2010-12-07 | 2012-07-19 | Kobe Steel Ltd | Roughness measuring device |
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