JPS6262979U - - Google Patents
Info
- Publication number
- JPS6262979U JPS6262979U JP15461485U JP15461485U JPS6262979U JP S6262979 U JPS6262979 U JP S6262979U JP 15461485 U JP15461485 U JP 15461485U JP 15461485 U JP15461485 U JP 15461485U JP S6262979 U JPS6262979 U JP S6262979U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- diode
- setting circuit
- sets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000010355 oscillation Effects 0.000 claims description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15461485U JPS6262979U (US06277897-20010821-C00009.png) | 1985-10-09 | 1985-10-09 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15461485U JPS6262979U (US06277897-20010821-C00009.png) | 1985-10-09 | 1985-10-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6262979U true JPS6262979U (US06277897-20010821-C00009.png) | 1987-04-18 |
Family
ID=31074566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15461485U Pending JPS6262979U (US06277897-20010821-C00009.png) | 1985-10-09 | 1985-10-09 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6262979U (US06277897-20010821-C00009.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08240639A (ja) * | 1995-01-23 | 1996-09-17 | Fluke Corp | 電子テスト計器において半導体ダイオードを自動的にテストする方法およびポータブルテスト計器 |
-
1985
- 1985-10-09 JP JP15461485U patent/JPS6262979U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08240639A (ja) * | 1995-01-23 | 1996-09-17 | Fluke Corp | 電子テスト計器において半導体ダイオードを自動的にテストする方法およびポータブルテスト計器 |
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