JPS6258214A - Optical beam scanner - Google Patents

Optical beam scanner

Info

Publication number
JPS6258214A
JPS6258214A JP60198754A JP19875485A JPS6258214A JP S6258214 A JPS6258214 A JP S6258214A JP 60198754 A JP60198754 A JP 60198754A JP 19875485 A JP19875485 A JP 19875485A JP S6258214 A JPS6258214 A JP S6258214A
Authority
JP
Japan
Prior art keywords
cylindrical lens
lens
light beams
light
optical beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60198754A
Other languages
Japanese (ja)
Other versions
JPH0547084B2 (en
Inventor
Masashi Yamamoto
将史 山本
Masaru Noguchi
勝 野口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP60198754A priority Critical patent/JPS6258214A/en
Publication of JPS6258214A publication Critical patent/JPS6258214A/en
Publication of JPH0547084B2 publication Critical patent/JPH0547084B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To properly perform corrections for surface tilting and wobbling, by making plural optical beams incident on a cylindrical lens by arranging them in such a way that the major axis of the cross section of each beam can almost coincide with the direction of the generating line of the cylindrical lens and two or more optical beams can be arranged so that the minor axes of the cross sections of these optical beams can almost be aligned in one line. CONSTITUTION:Optical beams 41-44 passed through collimater lenses 21-24 are made incident on the 1st cylindrical lens 5 under a condition where they are arranged in such a way that the major axis of the cross section of each beam can almost coincide with the direction of the generating line X-X of the lens 5 and, at the same time, the minor axis of the cross section can almost be aligned in one line. Therefore, the beam flux composed of these optical beams 41-44 does not pass through the peripheral part of the lens 5 which is far from the center and is able to form an ideal line image without receiving any influences of the aberration of the lens 5. On the other side, the line image has a length which is the same as the width of the beams made incident on the 1st cylindrical lens 5 in the direction of the generating line of the lens 5 since the optical beams 41-44 are arranged in the direction of the generating line. Therefore, a relatively small-sized one can be used as the rotating polygon mirror 6 of this device.

Description

【発明の詳細な説明】 (発明の分野) 本発明は反射面により光ビームを反射偏向する機械式光
偏向器により光ビームを走査する光ビーム走査装置、特
に詳細には光出力の低い半導体レーザを用いながら高エ
ネルギーの走査ビームが得られるようにした光ビーム走
査fiwに罰するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of the Invention) The present invention relates to a light beam scanning device that scans a light beam using a mechanical optical deflector that reflects and deflects the light beam using a reflective surface. This is to punish the optical beam scanning fiw that allows a high-energy scanning beam to be obtained while using.

(発明の技術的背景および先行技術) 従来より、光ビームを光偏向器により偏向して走査する
光ビーム走査装置が、例えば各種走査記録装置、走査読
取装置等において広く実用に供されている。このような
光ビーム走査装置において光ビームを発生する手段の1
つとして、半導体レーザが従来から用いられている。こ
の半導体レーザは、ガスレーザ等に比べれば小型、安価
で消費電力も少なく、また駆動電流を変えることによっ
て直接変調が可能である等、数々の長所を有している。
(Technical Background and Prior Art of the Invention) Conventionally, light beam scanning devices that scan a light beam by deflecting it with an optical deflector have been widely put into practical use, for example, in various scanning recording devices, scanning reading devices, and the like. One of the means for generating a light beam in such a light beam scanning device
As one example, semiconductor lasers have been conventionally used. This semiconductor laser has many advantages, such as being smaller, cheaper, and consumes less power than gas lasers, and can be directly modulated by changing the drive current.

しかしながら、その反面この半導体レーザは、連続発振
させる場合には現状では出力がたかだか20〜30mW
と小さり、シたがって高エネルギーの走査光を必要とす
る光ビーム走査装置、例えば感痕の低い記録44F1(
金属膜、アモルファス膜等のDRAWl利等)に記録す
る走査記録装置等に用いるのは極めて困難である。また
、ある種の螢光体に放射線(X線、α線、β線、γ線、
紫外線等)を照射すると、この放射線エネルギーの一部
が螢光体中に蓄積され、この螢光体に可視光等の励起光
を照射すると、蓄積されたエネルギーに応じて螢光体が
輝尽発光を示ずことが知られており、このような蓄積性
螢光体(輝尽性蛍光体)を利用して、人体等の放射線画
像情報を−B蓄積性螢光体からなる層を有する蓄積性螢
光体シートに記録し、この蓄積性螢光体シートをレーザ
光等の励起光で走査して輝尽発光光を生ぜしめ、得られ
た輝尽発光光を光電的に読み取って画像信号を得、この
画像信号に基づき写実感光材料等の記録材料、CRT等
に可視像として出力させる放射線画像情報記録再生シス
テムが本出願人により既に提案されている(特開昭55
−12429号、同55−116340号、同55−1
63472号、同56−11395号、同56−104
645号など)。
However, on the other hand, when this semiconductor laser is continuously oscillated, the current output is only 20 to 30 mW.
A light beam scanning device that is small and therefore requires high-energy scanning light, such as the recording 44F1 (with low impression)
It is extremely difficult to use it in a scanning recording device that records on a metal film, an amorphous film, etc. Also, some types of phosphors are exposed to radiation (X-rays, α-rays, β-rays, γ-rays,
When irradiated with ultraviolet rays, etc., a part of this radiation energy is accumulated in the phosphor, and when this phosphor is irradiated with excitation light such as visible light, the phosphor is exhausted according to the accumulated energy. It is known that such a stimulable phosphor does not emit light, and by using such a stimulable phosphor, radiation image information of a human body, etc. Recording is performed on a stimulable phosphor sheet, and the stimulable phosphor sheet is scanned with excitation light such as a laser beam to generate stimulated luminescent light, and the resulting stimulated luminescent light is read photoelectrically to form an image. The applicant has already proposed a radiation image information recording and reproducing system that obtains a signal and outputs it as a visible image to a recording material such as a photosensitive material, a CRT, etc. based on this image signal (Japanese Patent Laid-Open No. 55
-12429, 55-116340, 55-1
No. 63472, No. 56-11395, No. 56-104
645 etc.).

そしてこのシステムにおいて放射線画像情報が蓄積記録
された蓄積性螢光体シートを走査して画像情報の読取り
を行なうのに半導体レーザを用いた光ビーム走査装置の
使用が考えられている。しかしながら、蓄積性螢光体を
輝尽発光させるためには、十分に高エネルギーの励起光
を該螢光体に照射する必要があり、したがって前記半導
体レーザを用いた光ビーム走査装置を、この放射線画像
情報記録再生システムにおいて画像情報読取りのために
使用することも難しい。
In this system, it has been considered to use a light beam scanning device using a semiconductor laser to scan a stimulable phosphor sheet on which radiation image information is stored and read the image information. However, in order to stimulate a stimulable phosphor to emit light, it is necessary to irradiate the phosphor with excitation light of sufficiently high energy. It is also difficult to use it for reading image information in an image information recording and reproducing system.

上記事情に鑑み本出願人は、複数の半導体レーザと、こ
れらの半導体レーザから出射した光ビームをそれぞれ平
行光にするコリメータレンズと、前記複数の光ビームを
共通のスポットに集束させる共通の集束光学系と、−F
記複数の光ビームを偏向する共通の光偏向器とからなる
光ビーム走査装置を提案した(特願昭59−76889
 @ )。こ=3− のような光ビーム走査装置によれば、光出力が低い半導
体レーザを光ビーム発生手段として用いても、十分高エ
ネルギーの走査ビームが得られるようになる。
In view of the above circumstances, the present applicant has developed a plurality of semiconductor lasers, a collimator lens that converts the light beams emitted from these semiconductor lasers into parallel beams, and a common focusing optical system that focuses the plurality of light beams onto a common spot. system and -F
We proposed a light beam scanning device consisting of a common light deflector that deflects a plurality of light beams (Japanese Patent Application No. 76889/1989).
@). According to such a light beam scanning device, a scanning beam with sufficiently high energy can be obtained even if a semiconductor laser with low optical output is used as the light beam generating means.

上述の光偏向器とじては、反tJJ向により光ビームを
反射偏向する機械式光偏向器、例えばガルバノメータミ
ラーやポリゴンミラー(回転多面鏡)等が用いられるこ
とが多い。この種の機械式光偏向器を用いた場合には、
鏡面の面倒れやウオブリングにより走査ずれが生じるこ
とがあるが、一般にこのような走査ずれは、例えば上記
特願昭59−76889号明細書にも示されているよう
に、シリンドリカルレンズを有する面倒れ補正光学系を
用いて解消することができる。
As the above-mentioned optical deflector, a mechanical optical deflector that reflects and deflects a light beam in the anti-tJJ direction, such as a galvanometer mirror or a polygon mirror (rotating polygon mirror), is often used. When using this type of mechanical optical deflector,
Scanning deviations may occur due to surface inclination or wobbling of the mirror surface, but generally such scanning deviations are caused by surface inclinations with cylindrical lenses, as shown in the above-mentioned Japanese Patent Application No. 59-76889. This can be solved using a correction optical system.

ところがシリンドリカルレンズに通す光ビームの本数が
増えれば、そのうちの何本かの光ビームは該シリンドリ
カルレンズの周辺部を通過するようになる。このように
シリンドリカルレンズの周辺部を通過する光ビームは該
シリンドリカルレンズの収差の影響を受けやすくなり、
ミラー上に理想的な線像、すなわち曲りが無くて十分に
細い線像を結ばせることが困難になる。このようなこと
を無くすため、すべての光ビームがシリンドリカルレン
ズの母線上の中央部に入射するように光ビlxを並べる
と、この場合は線像が長くなりやすく、大向積のミラー
を備えた大型の光偏向器が必要になるという問題が生じ
る。
However, as the number of light beams passing through the cylindrical lens increases, some of the light beams will pass through the periphery of the cylindrical lens. In this way, the light beam passing through the periphery of the cylindrical lens becomes susceptible to the aberrations of the cylindrical lens,
It becomes difficult to form an ideal line image on the mirror, that is, a line image that is not curved and is sufficiently thin. In order to eliminate this problem, if the optical beams are arranged so that all the light beams are incident on the central part on the generatrix of the cylindrical lens, the line image tends to be long in this case, and a mirror with a large mukai area is A problem arises in that a large optical deflector is required.

(発明の目的) そこで本発明は、機械式光偏向器のミラー上に理想的な
光ビームの線像を形成して前記面倒れ補正、ウオブリン
グ補正を正しく行なうことが可能で、しかも小型の機械
式光偏向器を用いることができる、レーザビーム合成式
の光ビーム走査装置を提供することを目的とするもので
ある。
(Object of the Invention) Therefore, the present invention is capable of correctly performing the above-mentioned surface tilt correction and wobbling correction by forming an ideal line image of a light beam on the mirror of a mechanical optical deflector. An object of the present invention is to provide a laser beam combining type optical beam scanning device that can use a type optical deflector.

(発明の構成) 本発明の光ビーム走査装置は、半導体レーザから出射す
るレーザビームは、半導体レーザのpn接合面に平行な
方向と直角な方向とでそれぞれ拡がり角が異なり、その
断面形状は惰円状となっていることに着目してなされた
ものであり、前述したJ、うな複数の半導体レーザと、
]リメータ1ノンズと、共通の集束光学系と、共通の機
械式光偏向器と、シリンドリカル1ノンズを有する面倒
れ補正光学系とからなる光ビーム走査装置において、複
数の光ビームを、各ビームの断面の長軸が前記シリンド
リカルレンズの母線方向に略一致すると共に複数の光ビ
ームのう#52つ以上の光ビームが断面の短軸が略−線
に揃うように並べて1−記シリントリカルレンズに入射
さUるようにしたことを特徴とするものである。
(Structure of the Invention) In the optical beam scanning device of the present invention, the laser beam emitted from the semiconductor laser has different divergence angles in a direction parallel to and a direction perpendicular to the pn junction surface of the semiconductor laser, and its cross-sectional shape is This was done by focusing on the circular shape, and the above-mentioned J, Una plural semiconductor lasers,
] In a light beam scanning device consisting of a remeter 1 nons, a common focusing optical system, a common mechanical optical deflector, and a surface tilt correction optical system having a cylindrical 1 nons, a plurality of light beams are The long axis of the cross section substantially coincides with the generatrix direction of the cylindrical lens, and two or more light beams of the plurality of light beams are arranged so that the short axis of the cross section is substantially aligned with the - line, thereby forming the cylindrical lens. It is characterized in that it is made incident on U.

(実施態様) 以下、図面に示づ実1AIB様に基づいて本発明をjT
lllに説明する。
(Embodiment) Hereinafter, the present invention will be described based on the example 1 AIB shown in the drawings.
Explain to lll.

第1図は本発明の光ビーム走査装置の一実IM態様を示
すものである。−例として4つの半導体レーザ11.1
2.13.14はηいにビーム出射軸を平行に揃えて配
置され、これらの半導体レーザ11.12.13.14
のそれぞれに対して」リメー゛タレンズ21.22.2
3.24と、反射ミラー31.32.33.34が設け
られている。各半導体レーザ11.12.13.14か
ら出射したレープビームは、」−記コリメータレンズ2
1.22.23.24によって平行ビーム41.42.
43.44とされ、これらの光ビーム41.42.43
.44は上記反射ミラー31.32.33.34におい
て反射し、互いに密接するように間隔を狭めて1木のビ
ーム束となり、第1のシリンドリカルレンズ5を通過し
て共通の回転多面鏡(ポリゴンミラー)6に入射覆る。
FIG. 1 shows an actual IM mode of the optical beam scanning device of the present invention. - As an example four semiconductor lasers 11.1
2.13.14 are arranged with their beam emission axes parallel to each other, and these semiconductor lasers 11.12.13.14
For each of the "remator lenses 21.22.2
3.24 and reflective mirrors 31.32.33.34 are provided. The lep beam emitted from each semiconductor laser 11, 12, 13, 14 is
1.22.23.24 parallel beam 41.42.
43.44 and these light beams 41.42.43
.. The beams 44 are reflected by the reflecting mirrors 31, 32, 33, and 34, and the beams are closely spaced to form a single beam bundle, which passes through the first cylindrical lens 5 to a common rotating polygon mirror (polygon mirror). ) 6.

回転多面鏡6は図中上下方向に回転し、1−配光ビーム
41.42.43.44を矢印B方向に偏向する。
The rotating polygon mirror 6 rotates in the vertical direction in the figure and deflects the 1-light distribution beam 41, 42, 43, 44 in the direction of arrow B.

偏向された光ビーム41.42.43.44は、jt通
の集束レンズ7および第2のシリンドリカルレンズ8に
よって被走査面9土の1つのスポットSに集中されると
ともに、それぞれがこのスポットSにおいて集束される
。したがって、該被走査面9は、各半導体レーザ11.
12.13.14が出射した光ビームが合成されて高エ
ネルギーとなった走査ビームによって矢印B方向に走査
される。なお通常上記被走査面9は平面とされ、そのた
めに上記集束レンズ7としてfθレンズが用いられる。
The deflected light beams 41, 42, 43, 44 are focused on one spot S on the scanned surface 9 by the converging lens 7 and the second cylindrical lens 8, and each focused. Therefore, the surface to be scanned 9 is connected to each semiconductor laser 11 .
The light beams emitted by 12, 13, and 14 are combined and scanned in the direction of arrow B by a high-energy scanning beam. Note that the surface to be scanned 9 is usually a flat surface, and therefore an fθ lens is used as the focusing lens 7.

ここで、平行光とされた複数の光ビーム41〜44は、
第1のシリンドリカルレンズ5により図中上下方向のみ
に集束され、更に、第2のシリンドリカルレンズ8によ
り、被走査面9土において一定の上下位置に集束され、
スポラh Sが走査方向Bに対して直角な方向にずれる
ことがなくなる。したがって、この回転多面鏡6に面倒
れが有って、該回転多部&116で反射した光ビーム4
1〜44が正規の光偏向方向に対して波を打つように変
位しても被走査面〇上でスポットSは上下方向に変動せ
ず走査ずれを補正することができる。
Here, the plurality of parallel light beams 41 to 44 are as follows:
The first cylindrical lens 5 focuses the image only in the vertical direction in the figure, and the second cylindrical lens 8 focuses the image at a certain vertical position on the scanned surface 9.
The spoiler hS is no longer displaced in a direction perpendicular to the scanning direction B. Therefore, the rotating polygon mirror 6 has a tilted surface, and the light beam 4 reflected by the rotating polygon 116
Even if the beams 1 to 44 are displaced in a wave manner with respect to the normal light deflection direction, the spot S does not move vertically on the scanned surface 〇, and scanning deviation can be corrected.

周知のとおり、半導体レーザ11〜14から出射しおレ
ーザビームは、該半導体レーザ11〜14のpn接合面
に平行な方向と直角な方向とでそれぞれ拡がり角が異な
り、ビーム断面形状は惰円形となっているが、上記光ビ
ーム走査装置においてコリメータレンズ21〜24を通
過した光ビーム41〜44は、第2図に詳しく示すよう
に、各ビームの断面の長軸が第1のシリンドリカルレン
ズ5の母線x−x方向に略一致すると共に短軸が略−線
に揃うよう一〇− に並べて第1のシリンドリカルレンズ5に入射せしめら
れている。したがってこれらの光ビーム41〜44から
なるビーム束は、この第1のシリンドリカルレンズ5の
中心から遠く離れた周辺部を通らず、よって該レンズ5
の収差の影響を大きく受けずに理想的な線像を結びつる
。またその反°面、光ビーム41〜44は第1のシリン
ドリカルレンズ5の母線方向にはそろっているので、上
記線像は第1のシリンドリカルレンズ5に入射するビー
ムのそのシリンドリカルレンズ5の母線方向の幅と同じ
長さで、回転多面鏡6として比較的小型のものが使用可
能となっている。
As is well known, the laser beams emitted from the semiconductor lasers 11 to 14 have different divergence angles in the direction parallel to and perpendicular to the pn junction surfaces of the semiconductor lasers 11 to 14, and the beam cross-sectional shape is circular. However, as shown in detail in FIG. 2, the light beams 41 to 44 that have passed through the collimator lenses 21 to 24 in the light beam scanning device have their long axes in cross section aligned with the first cylindrical lens 5. The light beams are arranged in a line of 10- to be incident on the first cylindrical lens 5 so that they substantially coincide with the generatrix xx direction and have their short axes substantially aligned with the - line. Therefore, the beam bundle consisting of these light beams 41 to 44 does not pass through the periphery far from the center of this first cylindrical lens 5, and therefore
An ideal line image is created without being significantly affected by aberrations. On the other hand, since the light beams 41 to 44 are aligned in the direction of the generatrix of the first cylindrical lens 5, the above-mentioned line image is the direction of the generatrix of the cylindrical lens 5 of the beam incident on the first cylindrical lens 5. The length is the same as the width of the rotating polygon mirror 6, so a relatively small rotating polygon mirror 6 can be used.

なお以上説明した実施態様においては、機械式光偏向器
として回転多面鏡6が用いられているが、この機械式光
偏向器としてはその他、公知のガルバノメータミラーを
使用することもできる。この場合にも前記第1および第
2のシリンドリカルレンズ5.8を用いれば、ガルバノ
メータミラーのウオブリングによる走査ずれを補正する
ことができる。
In the embodiment described above, the rotating polygon mirror 6 is used as the mechanical optical deflector, but a known galvanometer mirror may also be used as the mechanical optical deflector. In this case as well, by using the first and second cylindrical lenses 5.8, it is possible to correct scanning deviations due to wobbling of the galvanometer mirror.

また−F記載2のシリンドリカルレンズ8は、回転多面
鏡6と集束レンズ7との間に配置されてもよいし、特公
昭58−8号に記載されているように第1、第2シリン
ドリカルレンズを兼ねて回転多面16と集束レンズ7と
の間に配置されてもよい。
Further, the cylindrical lens 8 described in -F description 2 may be arranged between the rotating polygon mirror 6 and the focusing lens 7, or the cylindrical lens 8 described in -F description 2 may be arranged between the first and second cylindrical lenses as described in Japanese Patent Publication No. 58-8. It may also be placed between the rotating polygon 16 and the focusing lens 7.

さらに合成する光ビーム本数も上記実施態様における4
本に限られるものではなく、2本以上何本の光ビームが
合成されてもよい。ここで、合成する光ビームの本数が
多い場合には、第3図に示すように光ビーム断面の短軸
方向が略−線に揃うように並べられた複数本の光ビーム
列が長軸方向(シリンドリカルレンズ5の母線X−X方
向)に複数列並ぶように合成されてもよい。
Furthermore, the number of light beams to be combined is also 4 in the above embodiment.
The light beam is not limited to a book, and two or more light beams may be combined. Here, when there are many light beams to be combined, as shown in Figure 3, a plurality of light beam arrays are arranged so that the short axis direction of the light beam cross section is approximately aligned with the - line, and the long axis direction is They may be combined in a plurality of rows (in the generatrix XX direction of the cylindrical lens 5).

(発明の効宋) 以上詳細に説明した通り本発明の光ビーム走査装置は、
光出力の低い半導体レーザを光ビーム発生手段として用
いながら、高エネルギーの走査ビームが得られるもので
あるから、例えば前述したように高エネルギーの走査ビ
ームが必要なりRAW材料への記録、あるいは蓄積性螢
光体シートからの放射線画像情報の読取り等にも使用可
能であり、既述した半導体レーザの数々の特長を活かし
て広範な分野に使用されうるちのとなる。しかも本発明
の光ビーム走査装置においては複数の光ビームが光偏向
器のミラー上に即想的な線像を結ぶようになっているの
で、該ミラーの面倒れ、ウオブリングの補正が確実に行
なわれて、走査精度が高められる。また本発明の光ビー
ム走査装置は複数の光ビームを合成するものでありなが
ら比較的小型の光偏向器を使用可能で、安価に形成可能
となっている。
(Effect of the invention in Song Dynasty) As explained in detail above, the light beam scanning device of the present invention has the following features:
Although a semiconductor laser with a low optical output is used as a light beam generating means, a high-energy scanning beam can be obtained, so for example, as mentioned above, a high-energy scanning beam is required, and recording on RAW material or storage is difficult. It can also be used to read radiation image information from a phosphor sheet, and by taking advantage of the many features of the semiconductor laser described above, it can be used in a wide range of fields. Moreover, in the light beam scanning device of the present invention, since the plurality of light beams form an immediate line image on the mirror of the optical deflector, the tilting of the surface of the mirror and wobbling can be reliably corrected. As a result, scanning accuracy is improved. Further, although the light beam scanning device of the present invention combines a plurality of light beams, it can use a relatively small optical deflector and can be formed at low cost.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の光ビーム走査装置の一実施態様を示す
概略斜視図、 第2図は上記実ms様装置において合成される光ビーム
の並び方を示す概略図、 第3図は、他の光ビームの並び方を示す概略図である。 5.8・・・シリンドリカルレンズ 6・・・回転多面1    7・・・集束レンズ9・・
・被走査面 11.12.13.14・・・半導体レーザ21.22
.23.24・・・コリメータレンズ41.42.43
.44・・・光ビーム第3図
FIG. 1 is a schematic perspective view showing one embodiment of the light beam scanning device of the present invention, FIG. 2 is a schematic diagram showing how the light beams combined in the above-mentioned actual ms-like device are arranged, and FIG. FIG. 2 is a schematic diagram showing how light beams are arranged. 5.8...Cylindrical lens 6...Rotating polygon 1 7...Focusing lens 9...
・Scanned surface 11.12.13.14...Semiconductor laser 21.22
.. 23.24...Collimator lens 41.42.43
.. 44...Light beam Figure 3

Claims (1)

【特許請求の範囲】[Claims] 複数の半導体レーザと、これらの半導体レーザから出射
した断面が楕円状の光ビームをそれぞれ平行光にするコ
リメータレンズと、前記複数の光ビームを共通のスポッ
トに集束させる共通の集束光学系と、前記複数の光ビー
ムを偏向する共通の機械式光偏向器とからなる光ビーム
走査装置において、シリンドリカルレンズを有する面倒
れ補正光学系が設けられるとともに、前記シリンドリカ
ルレンズに入射する前記複数の光ビームが、各ビームの
断面の長軸が前記シリンドリカルレンズの母線方向に略
一致すると共に複数の光ビームのうち2つ以上の光ビー
ムが断面の短軸が略一線に揃うように並べられているこ
とを特徴とする光ビーム走査装置。
a plurality of semiconductor lasers, a collimator lens that converts each of the light beams having an elliptical cross section emitted from these semiconductor lasers into parallel lights, a common focusing optical system that focuses the plurality of light beams onto a common spot; In a light beam scanning device comprising a common mechanical optical deflector that deflects a plurality of light beams, a surface tilt correction optical system having a cylindrical lens is provided, and the plurality of light beams incident on the cylindrical lens are The long axis of the cross section of each beam substantially coincides with the generatrix direction of the cylindrical lens, and two or more light beams among the plurality of light beams are arranged so that the short axes of the cross sections are substantially aligned. A light beam scanning device.
JP60198754A 1985-09-09 1985-09-09 Optical beam scanner Granted JPS6258214A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60198754A JPS6258214A (en) 1985-09-09 1985-09-09 Optical beam scanner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60198754A JPS6258214A (en) 1985-09-09 1985-09-09 Optical beam scanner

Publications (2)

Publication Number Publication Date
JPS6258214A true JPS6258214A (en) 1987-03-13
JPH0547084B2 JPH0547084B2 (en) 1993-07-15

Family

ID=16396403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60198754A Granted JPS6258214A (en) 1985-09-09 1985-09-09 Optical beam scanner

Country Status (1)

Country Link
JP (1) JPS6258214A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006178371A (en) 2004-12-24 2006-07-06 Brother Ind Ltd Scanner and image forming apparatus

Also Published As

Publication number Publication date
JPH0547084B2 (en) 1993-07-15

Similar Documents

Publication Publication Date Title
US4123135A (en) Optical system for rotating mirror line scanning apparatus
EP0288970B1 (en) Optical system for flyingspot scanning system
JPS60220308A (en) Optical beam scanner
JP3433070B2 (en) Light beam scanning device
JPH0627901B2 (en) Semiconductor laser light source device
US4805974A (en) Polycone™ scanning system with multiple beams
JPS6258214A (en) Optical beam scanner
JPS6243620A (en) Semiconductor laser light source device
JPH1164793A (en) Semiconductor laser light source and radiograph reading device
JPS61156219A (en) Synthesizing method of semiconductor laser beam
JPS6113211A (en) Semiconductor laser beam synthesizing method
JP3426009B2 (en) Optical scanning device
JPS6410805B2 (en)
JPS6113215A (en) Semiconductor laser scanner
JP2004354975A (en) Device for detecting information contained in phosphor layer
JPS61212819A (en) Semiconductor laser light source device
JPH01101511A (en) Laser light source for multiplexing
JPH0228613A (en) Semiconductor laser beam source unit
JPS61212820A (en) Semiconductor laser light source device
JPH0477910B2 (en)
JPH01178914A (en) Source device for multiple semiconductor laser light source device
JPS60238811A (en) Optical beam scanner
JPS5915216A (en) Optical scanner
JPS60264158A (en) Semiconductor laser scanning device
JPS61275869A (en) Controller for quantity of light of semiconductor laser light source

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees