JPS6257176U - - Google Patents
Info
- Publication number
- JPS6257176U JPS6257176U JP14957285U JP14957285U JPS6257176U JP S6257176 U JPS6257176 U JP S6257176U JP 14957285 U JP14957285 U JP 14957285U JP 14957285 U JP14957285 U JP 14957285U JP S6257176 U JPS6257176 U JP S6257176U
- Authority
- JP
- Japan
- Prior art keywords
- wiring bar
- base
- panel
- wiring
- connector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14957285U JPS6257176U (en, 2012) | 1985-09-30 | 1985-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14957285U JPS6257176U (en, 2012) | 1985-09-30 | 1985-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6257176U true JPS6257176U (en, 2012) | 1987-04-09 |
Family
ID=31064908
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14957285U Pending JPS6257176U (en, 2012) | 1985-09-30 | 1985-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6257176U (en, 2012) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021113800A (ja) * | 2019-12-18 | 2021-08-05 | 株式会社クオルテック | 半導体試験装置及び半導体素子の試験方法 |
-
1985
- 1985-09-30 JP JP14957285U patent/JPS6257176U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021113800A (ja) * | 2019-12-18 | 2021-08-05 | 株式会社クオルテック | 半導体試験装置及び半導体素子の試験方法 |
| JP2024107246A (ja) * | 2019-12-18 | 2024-08-08 | 株式会社クオルテック | 半導体試験装置 |
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