JPS625001Y2 - - Google Patents
Info
- Publication number
- JPS625001Y2 JPS625001Y2 JP15421381U JP15421381U JPS625001Y2 JP S625001 Y2 JPS625001 Y2 JP S625001Y2 JP 15421381 U JP15421381 U JP 15421381U JP 15421381 U JP15421381 U JP 15421381U JP S625001 Y2 JPS625001 Y2 JP S625001Y2
- Authority
- JP
- Japan
- Prior art keywords
- yoke
- vacuum
- pole piece
- vacuum chamber
- similar devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 5
- 239000000615 nonconductor Substances 0.000 claims description 5
- 150000002500 ions Chemical class 0.000 description 14
- 238000004458 analytical method Methods 0.000 description 6
- 238000009413 insulation Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15421381U JPS5859160U (ja) | 1981-10-19 | 1981-10-19 | 質量分析計および類似装置の磁石装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15421381U JPS5859160U (ja) | 1981-10-19 | 1981-10-19 | 質量分析計および類似装置の磁石装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5859160U JPS5859160U (ja) | 1983-04-21 |
| JPS625001Y2 true JPS625001Y2 (US07166745-20070123-C00016.png) | 1987-02-04 |
Family
ID=29946812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15421381U Granted JPS5859160U (ja) | 1981-10-19 | 1981-10-19 | 質量分析計および類似装置の磁石装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5859160U (US07166745-20070123-C00016.png) |
-
1981
- 1981-10-19 JP JP15421381U patent/JPS5859160U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5859160U (ja) | 1983-04-21 |
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