JPS6247092Y2 - - Google Patents

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Publication number
JPS6247092Y2
JPS6247092Y2 JP16749081U JP16749081U JPS6247092Y2 JP S6247092 Y2 JPS6247092 Y2 JP S6247092Y2 JP 16749081 U JP16749081 U JP 16749081U JP 16749081 U JP16749081 U JP 16749081U JP S6247092 Y2 JPS6247092 Y2 JP S6247092Y2
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JP
Japan
Prior art keywords
signal
drive
detection
drive signal
circuit
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Expired
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JP16749081U
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Japanese (ja)
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JPS5872670U (en
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Description

【考案の詳細な説明】 この考案は、入力端子へ駆動信号が印加される
と導通して被駆動素子を通電可能とする駆動素子
を備えた回路の動作状態を検出する動作検出回路
に関する。
DETAILED DESCRIPTION OF THE INVENTION This invention relates to an operation detection circuit that detects the operating state of a circuit that includes a drive element that becomes conductive when a drive signal is applied to its input terminal, thereby enabling current to flow through the driven element.

従来、この種の動作検出回路には種々のものが
あるが、例えば第1図のようなものがある。即
ち、一端が電源Vに接続された被駆動素子たる電
磁石の巻線1の他端を、警報端子2を備えた所謂
警報端子付ヒユーズ3に接続し、このヒユーズ3
の他端をエミツタ接地された駆動素子たる駆動ト
ランジスタ4のコレクタに接続し、入力端子5か
ら駆動トランジスタ4のベースに駆動信号S1が与
えられると駆動トランジスタ4が導通し巻線1が
導電されて電磁石が作動する。巻線1の短絡その
他の原因によりヒユーズ3に過大電流が流れると
ヒユーズ3が溶断し、警報端子2が閉じて検出端
子6から警報が出力されるようになつていた。
Conventionally, there are various kinds of motion detection circuits of this type, and for example, there is one as shown in FIG. That is, one end of the winding 1 of the electromagnet, which is a driven element, is connected to the power source V, and the other end is connected to a so-called fuse 3 with an alarm terminal equipped with an alarm terminal 2.
The other end is connected to the collector of a drive transistor 4, which is a drive element whose emitter is grounded, and when a drive signal S1 is applied from an input terminal 5 to the base of the drive transistor 4, the drive transistor 4 becomes conductive and the winding 1 becomes conductive. The electromagnet is activated. When excessive current flows through the fuse 3 due to a short circuit in the winding 1 or other causes, the fuse 3 blows out, the alarm terminal 2 closes, and an alarm is output from the detection terminal 6.

しかしながらこのような従来例にあつては、ヒ
ユーズが溶断した場合は検出できるものの巻線1
自体が断線した場合は検出が不可能であり、従つ
て不動作状態であるにもかかわらずそれを検知で
きないまま続く指令が次々と出されてしまうなど
の不都合があつた。
However, in such a conventional example, although it is possible to detect if the fuse blows, winding 1
If the wire itself breaks, it is impossible to detect it, and therefore, there are inconveniences such as consecutive commands being issued one after another without being able to detect it even though it is in an inactive state.

この考案はこれらの欠点を除去すべくなされた
もので、電磁石巻線その他の素子に電流が流れて
いるときおよびその後に於いてその通電状態を繰
返しチエツクすることにより、種々の異常を確実
に検出可能とすることをその目的としている。
This invention was made to eliminate these drawbacks, and by repeatedly checking the current status while and after the current is flowing through the electromagnet windings and other elements, various abnormalities can be reliably detected. Its purpose is to make it possible.

以下、本考案を図示の実施例に基づいて詳細に
説明する。
Hereinafter, the present invention will be explained in detail based on illustrated embodiments.

図中Aが動作をチエツクされる回路である。そ
して本考案の動作検出回路は主に検知部B、比較
部C、そして制御部Dとより構成される。先ず
夫々の構成から説明する。
A in the figure is a circuit whose operation is checked. The motion detection circuit of the present invention is mainly composed of a detection section B, a comparison section C, and a control section D. First, each configuration will be explained.

動作をチエツクされる回路Aは、便宜上駆動素
子たる駆動トランジスタ4の入力端子5へ駆動信
号S1を印加してこれを導通させ、以つて被駆動素
子たる電磁石の巻線1に通電するものが選んであ
る。尚、7は安全用の単なるヒユーズである。
For convenience, the circuit A whose operation is to be checked applies a drive signal S1 to the input terminal 5 of the drive transistor 4, which is a drive element, and makes it conductive, thereby energizing the winding 1 of the electromagnet, which is a driven element. I have chosen it. Note that 7 is just a fuse for safety.

検知部Bは、駆動トランジスタ4が導通してい
るか否か、即ち巻線1が通電されているかに対応
して導通検知信号S2を2値レベルのいずれかで出
力するもので、具体的には駆動トランジスタ4の
コレクタを、抵抗8を介して検知トランジスタ9
のベースと接続し、この検知トランジスタ9のコ
レクタ電位をもつて導通検知信号S2の出力値とし
ている。尚、図中10はダイオード、11は抵抗
で、逆起電力の吸収用として設けたものであり、
12は抵抗、V2は電源である。
The detection unit B outputs a continuity detection signal S2 at one of two levels depending on whether the drive transistor 4 is conductive or not, that is, whether the winding 1 is energized. connects the collector of the drive transistor 4 to the detection transistor 9 via the resistor 8.
The collector potential of this detection transistor 9 is used as the output value of the continuity detection signal S2 . In the figure, 10 is a diode and 11 is a resistor, which are provided to absorb back electromotive force.
12 is a resistor, and V2 is a power supply.

比較部Cは、導通検知信号S2と駆動信号S1とを
比較し、一致したときのみ動作検出信号S3を出力
するもので、具体的には導通検知信号S2と駆動信
号S1とを排他的論理和ゲート13に入力してその
出力をインバータ14で反転し、更に該インバー
タ14の出力を後述する制御部Dからのタイミン
グパルスと共にANDゲート15に入力してこれ
らの論理積をもつて動作検出信号S3とするように
している。
The comparison unit C compares the continuity detection signal S 2 and the drive signal S 1 and outputs the operation detection signal S 3 only when they match. is input to the exclusive OR gate 13, its output is inverted by the inverter 14, and the output of the inverter 14 is further input to the AND gate 15 together with a timing pulse from the control section D, which will be described later, to have a logical product of these. The motion detection signal S3 is generated using the motion detection signal S3 .

制御部Dは、駆動信号S1の前縁直後及び後縁直
後に同期させた第1及び第2チエツクパルスを発
生し、これらを検出のタイミングパルスとして比
較部Cに印加するもので、具体的には駆動信号S1
の立上り、立下り特性及び駆動トランジスタ4の
応答特性を考慮し駆動信号S1の前縁から約25μS
遅れて第1チエツクパルス16を、又、駆動信号
S1の後縁から約100μS遅れて第2チエツクパル
ス17を夫々発生し、これを前述の如く比較部C
のANDゲート15に印加するようにしている。
尚、この第1及び第2チエツクパルス16,17
の発生手段自体については周知のものが利用でき
るので説明を省略する。
The control section D generates synchronized first and second check pulses immediately after the leading edge and immediately after the trailing edge of the drive signal S1 , and applies these to the comparison section C as detection timing pulses. drive signal S 1
Approximately 25μS from the leading edge of the drive signal S1 , taking into account the rise and fall characteristics of S1 and the response characteristics of the drive transistor 4.
The first check pulse 16 is delayed, and the drive signal
A second check pulse 17 is generated with a delay of about 100 μS from the trailing edge of S1 , and is sent to the comparison section C as described above.
The voltage is applied to the AND gate 15 of .
Note that these first and second check pulses 16, 17
Since a well-known method can be used as the generating means itself, a description thereof will be omitted.

次に作用を説明する。 Next, the action will be explained.

先ず正常時の作用から説明する。駆動トランジ
スタ4は入力端子5に2値レベルでHの駆動信号
S1が与えられると導通して巻線1に電流が流れ電
磁石が作動する。このとき駆動トランジスタ4の
コレクタ電位L→検出トランジスタ9遮断→同コ
レクタ電位〔導通検知信号S2〕Hという状態とな
るため、結局排他的論理和ゲート13にはH,H
の一致信号が入力され、同出力L→インバータ出
力Hとなる。そしてこの状態を駆動信号S1の前縁
直後に発生された第1チエツクパルス16にてサ
ンプリングされてANDゲート15の出力〔動作
検出信号S3〕がHとなり回路正常が判るものであ
る〔第3図T1部分〕。
First, the normal operation will be explained. The drive transistor 4 receives a drive signal of H at a binary level to the input terminal 5.
When S 1 is applied, conduction occurs and current flows through winding 1, activating the electromagnet. At this time, the collector potential of the drive transistor 4 becomes L → the detection transistor 9 is cut off → the collector potential [continuity detection signal S 2 ] H.
A coincidence signal is input, and the output becomes L → the inverter output H. This state is sampled by the first check pulse 16 generated immediately after the leading edge of the drive signal S1 , and the output of the AND gate 15 [operation detection signal S3 ] becomes H, indicating that the circuit is normal. Figure 3 T 1 part].

この状態から駆動信号S1がLになると駆動トラ
ンジスタ4が遮断されて巻線1に電流が流れなく
なり電磁石は非作動となる。このとき駆動トラン
ジスタ4のコレクタ電位H→検出トランジスタ9
導通→同コレクタ電位〔導通検知信号S2〕Lとい
う状態となるため、結局排他的論理和ゲート13
にはL,Lの一致信号が入力されることになる。
即ちこの導通検知信号S2は正常時は常に駆動信号
S1のL,Hと一致して出力されるものである。そ
の結果排他的論理和ゲート13の出力L→インバ
ータ出力Hとなりこの状態を駆動信号S1の後縁直
後に発生された第2チエツクパルス17にてサン
プリングされるのでANDゲート15の出力〔動
作検出信号S3〕はHとなり回路正常が判かるもの
である。〔第3図T2部分〕 この動作検出回路は正常時に上記の如き基本作
用を為し、異常が生じた場合には正常時には一致
していた導通検知信号S2と駆動信号S1とが不一致
となることによりその検出を行なうものである。
即ちこれらの不一致により排他的論理和ゲート1
3の出力がH→インバータ14の出力がLとな
り、このLがANDゲート15を介して第1チエ
ツクパルス16又は第2のチエツクパルス17に
よつてサンプリングされ動作検出信号S3がL、即
ち異常があると知らせるものである。検出される
異常としては例えば次のようなものがある。
When the drive signal S1 becomes L from this state, the drive transistor 4 is cut off, and no current flows through the winding 1, and the electromagnet becomes inactive. At this time, the collector potential H of the drive transistor 4 → the detection transistor 9
Continuity → collector potential [continuity detection signal S 2 ] becomes L, so the exclusive OR gate 13
The matching signals of L and L will be input to the .
In other words, this continuity detection signal S2 is always a drive signal during normal operation.
It is output in agreement with L and H of S1 . As a result, the output of the exclusive OR gate 13 changes from L to the inverter output H. This state is sampled by the second check pulse 17 generated immediately after the trailing edge of the drive signal S1 , so the output of the AND gate 15 [operation detection The signal S 3 ] becomes H, indicating that the circuit is normal. [Fig. 3 T 2 section] This operation detection circuit performs the basic function as described above during normal operation, and when an abnormality occurs, the continuity detection signal S 2 and drive signal S 1 , which were the same during normal operation, do not match. Detection is performed by
That is, due to these mismatches, exclusive OR gate 1
The output of S3 becomes H → the output of the inverter 14 becomes L, and this L is sampled by the first check pulse 16 or the second check pulse 17 through the AND gate 15, and the operation detection signal S3 becomes L, that is, abnormal. This is to let you know that there is. Examples of detected abnormalities include the following:

〔第1チエツクパルスによつて検出される異常〕 (イ) 巻線1の断線 (ロ) ヒユーズ7の溶断 (ハ) 駆動トランジスタ4の開放故障 これらはすべて導通検知信号S2をLにする要因
であり駆動信号S1のHと不一致を生じ異常が検出
される。〔第3図T3部分〕 〔第2チエツクパルスによつて検出される異常〕 (イ) 巻線1のアース短絡 (ロ) 駆動トランジスタ4の短絡 これらは共に導通検知信号S2をHにする要因で
あり駆動信号S1のLと不一致を生じ異常が検出さ
れる。
[Abnormalities detected by the first check pulse] (a) Disconnection of winding 1 (b) Melting of fuse 7 (c) Open failure of drive transistor 4 These are all factors that cause the continuity detection signal S2 to go low. This causes a mismatch with H of the drive signal S1 , and an abnormality is detected. [Part T3 in Figure 3] [Abnormalities detected by the second check pulse] (a) Short circuit to ground in winding 1 (b) Short circuit in drive transistor 4 Both of these cause the continuity detection signal S2 to become H. This causes a mismatch with L of the drive signal S1 , and an abnormality is detected.

このように考え得る異常が確実に検出できるの
みならずそれがいずれのチエツクパルスにて検出
されたかによつてある程度異常の原因を推定でき
るものである。この外、当該動作検出回路自体の
故障、たとえば検知トランジスタ9の故障や各接
点部の接触不良、電源V2の故障等があると必ず
いずれかのチエツクパルスに異常として顕われる
ため、該動作検出回路をも含めた動作検出が行な
えるものである。
In this way, not only possible abnormalities can be detected reliably, but also the cause of the abnormality can be estimated to some extent depending on which check pulse the abnormality was detected. In addition, if there is a failure in the operation detection circuit itself, such as a failure in the detection transistor 9, poor contact at each contact, failure in the power supply V2 , etc., it will always appear as an abnormality in one of the check pulses, so the operation detection will be delayed. It is possible to detect the operation of circuits as well.

尚、動作検出信号S3をどのように用いるかは動
作を検出される回路Aの性質に応じて自由に決定
できる。具体的には、これによつて警報ブザー又
はランプを作動させたり、或いはこれを駆動信号
S1の発生系に導びいて以降の駆動指令を停止させ
る等が考えられる。
Note that how to use the motion detection signal S3 can be freely determined depending on the characteristics of the circuit A whose motion is to be detected. Specifically, this can activate a warning buzzer or lamp, or can be used as a drive signal.
It is conceivable to guide the signal to the generation system of S1 and stop subsequent drive commands.

尚、この動作検出回路を機能させるに当たり、
駆動信号に先立つて、被駆動素子〔この場合は電
磁石の巻線1〕を作動させるに足りない程度、例
えば50μS幅程度のセミ駆動信号S1′を駆動素子
〔この場合は駆動トランジスタ4〕の入力端子に
入れてやることにより、この段階で上述と全く同
様の動作検出を行なわせることができ、現実に動
作検出される回路を稼動状態とする以前に故障の
チエツクが可能となる〔第4図〕。従つてこのよ
うにセミ駆動信号S1′によつて事前チエツクを行
ない、且つ動作検出信号S3〔この場合はANDゲ
ート15の出力〕を駆動信号発生系に抑制信号と
して入力するようにすれば異常のあるときに駆動
素子にその後の駆動信号を送つてしまうという事
態を防止できる。〔第4図T4部分〕。更にこのよ
うな動作チエツクされる回路を複数備える機器に
あつては、駆動信号S1の直前の外に、該機器の電
源ONの直後にこの種のセミ駆動信号をS1′を個々
の動作チエツクされる回路に与えるようにすれ
ば、機器の使用に先立つて機器全体の異常を完全
にチエツクできるので極めて合理的である。加え
て該機器使用中に異常が発生しても駆動信号S1
直前に出されたセミ駆動信号S1′によつて事前チ
エツクができるので高い安全性が期待できること
になる。
In order to make this motion detection circuit function,
Prior to the drive signal, a semi-drive signal S 1 ' with a width of about 50 μS, for example, is applied to the drive element (drive transistor 4 in this case) to an extent that is insufficient to operate the driven element (in this case, the winding 1 of the electromagnet). By inserting it into the input terminal, it is possible to perform operation detection in exactly the same manner as described above at this stage, and it is possible to check for failures before putting the circuit whose operation is actually detected into operation. figure〕. Therefore, if a preliminary check is performed using the semi-drive signal S 1 ' as described above, and the operation detection signal S 3 (in this case, the output of the AND gate 15) is inputted as a suppression signal to the drive signal generation system, It is possible to prevent a situation in which a subsequent drive signal is sent to the drive element when there is an abnormality. [Figure 4 T 4 section]. Furthermore, in the case of a device having a plurality of circuits whose operation is to be checked, in addition to immediately before the drive signal S 1 , this type of semi-drive signal S 1 ' is applied immediately after turning on the power of the device. If the signal is applied to the circuit to be checked, it is extremely rational because it is possible to completely check for abnormalities in the entire device before using the device. In addition, even if an abnormality occurs during use of the device, a high level of safety can be expected since a preliminary check can be made using the semi-drive signal S 1 ' issued immediately before the drive signal S 1 .

以上説明して来た如く、この考案によれば、動
作チエツクされる回路の考え得るほとんど全ての
異常を確実にチエツクでき、又動作検出回路自体
に故障が生じても必ずいずれかのチエツクパルス
で検出できるため動作検出回路自体の自己診断を
併せて行なうことができ、動作チエツクされる回
路を極めて高い信頼性の下で使用することができ
る。更にセミ駆動信号を有効に与えることにより
異常を事前にチエツクでき、より合理的な動作検
出回路に発展させることができるという効果もあ
る。
As explained above, according to this invention, almost all conceivable abnormalities in the circuit whose operation is being checked can be reliably checked, and even if a failure occurs in the operation detection circuit itself, one of the check pulses will always be detected. Since it can be detected, the operation detection circuit itself can be self-diagnosed, and the circuit whose operation is checked can be used with extremely high reliability. Furthermore, by effectively applying semi-drive signals, abnormalities can be checked in advance, and a more rational operation detection circuit can be developed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の動作検出回路の一例を示す回路
図、第2図はこの考案に係る動作検出回路の一実
施例を示す回路図、第3図は各部の波形タイムチ
ヤートを示す説明図、そして第4図はセミ駆動信
号を与えた場合の各部の波形タイムチヤートを示
す説明図である。 A……動作チエツクされる回路、B……検知
部、C……比較部、D……制御部、S1……駆動信
号、S2……導通検知信号、S3……動作検出信号、
S′1……セミ駆動信号、1……巻線(被駆動素
子)、4……駆動トランジスタ(駆動素子)、5…
…入力端子、9……導通検知信号、13……排他
的論理和ゲート、16……第1チエツクパルス
(タイミングパルス)、17……第2チエツクパル
ス(タイミングパルス)。
FIG. 1 is a circuit diagram showing an example of a conventional motion detection circuit, FIG. 2 is a circuit diagram showing an embodiment of the motion detection circuit according to this invention, and FIG. 3 is an explanatory diagram showing waveform time charts of various parts. FIG. 4 is an explanatory diagram showing waveform time charts of various parts when a semi-drive signal is applied. A...Circuit to be checked for operation, B...Detection section, C...Comparison section, D...Control section, S1 ...Drive signal, S2 ...Continuity detection signal, S3 ...Operation detection signal,
S' 1 ...Semi-drive signal, 1...Winding (driven element), 4...Drive transistor (drive element), 5...
...Input terminal, 9...Continuity detection signal, 13...Exclusive OR gate, 16...First check pulse (timing pulse), 17...Second check pulse (timing pulse).

Claims (1)

【実用新案登録請求の範囲】 入力端子へ駆動信号が印加されると導通して被
駆動素子を通電可能とする駆動素子を備えた回路
の通電状態を検出する動作検出回路に於いて、 上記駆動素子が導通しているか否かに対応して
導通検知信号を2値レベルのいずれかで出力する
検知部と、 この導通検知信号と上記駆動信号とを比較し一
致したときのみ動作検出信号を出力する比較部
と、 上記駆動信号の前縁直後及び後縁直後に同期さ
せた第1及び第2チエツクパルスを発生し、これ
らを検出のタイミングパルスとして前記比較部に
印加する制御部と、を具備したことを特徴とする
動作検出回路。
[Claims for Utility Model Registration] In an operation detection circuit that detects the energization state of a circuit including a drive element that becomes conductive when a drive signal is applied to an input terminal and enables energization of a driven element, the above drive A detection unit that outputs a continuity detection signal at one of two levels depending on whether the element is conductive or not, and compares this continuity detection signal with the above drive signal and outputs an operation detection signal only when they match. and a control unit that generates synchronized first and second check pulses immediately after the leading edge and immediately after the trailing edge of the drive signal, and applies these as detection timing pulses to the comparing unit. A motion detection circuit characterized by:
JP16749081U 1981-11-10 1981-11-10 motion detection circuit Granted JPS5872670U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16749081U JPS5872670U (en) 1981-11-10 1981-11-10 motion detection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16749081U JPS5872670U (en) 1981-11-10 1981-11-10 motion detection circuit

Publications (2)

Publication Number Publication Date
JPS5872670U JPS5872670U (en) 1983-05-17
JPS6247092Y2 true JPS6247092Y2 (en) 1987-12-24

Family

ID=29959582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16749081U Granted JPS5872670U (en) 1981-11-10 1981-11-10 motion detection circuit

Country Status (1)

Country Link
JP (1) JPS5872670U (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH065237B2 (en) * 1985-09-18 1994-01-19 エナジーサポート株式会社 Control circuit of short-circuit detection display device
JP2009186352A (en) * 2008-02-07 2009-08-20 Yokogawa Electric Corp Measuring system

Also Published As

Publication number Publication date
JPS5872670U (en) 1983-05-17

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