JPS6244618B2 - - Google Patents

Info

Publication number
JPS6244618B2
JPS6244618B2 JP54043715A JP4371579A JPS6244618B2 JP S6244618 B2 JPS6244618 B2 JP S6244618B2 JP 54043715 A JP54043715 A JP 54043715A JP 4371579 A JP4371579 A JP 4371579A JP S6244618 B2 JPS6244618 B2 JP S6244618B2
Authority
JP
Japan
Prior art keywords
driver
sensor
board
pins
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54043715A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54138351A (en
Inventor
Erisu Herupusu Donarudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Publication of JPS54138351A publication Critical patent/JPS54138351A/ja
Publication of JPS6244618B2 publication Critical patent/JPS6244618B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP4371579A 1978-04-13 1979-04-12 Digital printed circuit board tester Granted JPS54138351A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/895,898 US4196386A (en) 1978-04-13 1978-04-13 Method and portable apparatus for testing digital printed circuit boards

Publications (2)

Publication Number Publication Date
JPS54138351A JPS54138351A (en) 1979-10-26
JPS6244618B2 true JPS6244618B2 (enrdf_load_stackoverflow) 1987-09-21

Family

ID=25405251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4371579A Granted JPS54138351A (en) 1978-04-13 1979-04-12 Digital printed circuit board tester

Country Status (3)

Country Link
US (1) US4196386A (enrdf_load_stackoverflow)
JP (1) JPS54138351A (enrdf_load_stackoverflow)
BE (1) BE875531A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214718U (enrdf_load_stackoverflow) * 1988-07-13 1990-01-30

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4458197A (en) * 1981-09-08 1984-07-03 The Boeing Company Apparatus and method for automatically testing a multiple node electrical circuit
US4472679A (en) * 1981-11-25 1984-09-18 The United States Of America As Represented By The Secretary Of The Air Force Diagnostic apparatus for radar pulse repetition frequency control circuit card
US4525802A (en) * 1982-05-14 1985-06-25 Cache Technology Corporation Portable electronic testing apparatus
US4517512A (en) * 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
US4837502A (en) * 1983-11-04 1989-06-06 Grumman Aerospace Corporation Computer-aided, logic pulsing probe for locating faulty circuits on a printed circuit card
USD296086S (en) 1985-03-29 1988-06-07 Mars, Incorporated Electronic circuit board tester
US4760330A (en) * 1986-06-06 1988-07-26 Northern Telecom Limited Test system with shared test instruments
US5180976A (en) * 1987-04-17 1993-01-19 Everett/Charles Contact Products, Inc. Integrated circuit carrier having built-in circuit verification
USD311698S (en) 1987-05-13 1990-10-30 Protech, Inc. In-circuit tester console
USD338416S (en) 1988-07-25 1993-08-17 Hewlett-Packard Company Printed circuit board tester
US5404584A (en) * 1990-08-06 1995-04-04 Ericsson Ge Mobile Communications Inc. Printed circuit board having modularized circuit functions designed for early diagnostics
US5122753A (en) * 1990-12-20 1992-06-16 Microelectronics And Computer Technology Corporation Method of testing electrical components for defects
US5235273A (en) * 1991-07-12 1993-08-10 Schlumberger Technologies, Inc. Apparatus for setting pin driver/sensor reference voltage level
GB2277817B (en) * 1993-05-06 1997-07-16 Qmax Technologies Pte Limited A bus cycle signature system
US5581463A (en) * 1993-10-07 1996-12-03 Hewlett-Packard Co Pay-per-use access to multiple electronic test capabilities and tester resources
US5412575A (en) * 1993-10-07 1995-05-02 Hewlett-Packard Company Pay-per-use access to multiple electronic test capabilities
JPH09297162A (ja) 1996-04-30 1997-11-18 Nittetsu Semiconductor Kk バーンインボード
US5659483A (en) * 1996-07-12 1997-08-19 National Center For Manufacturing Sciences System and method for analyzing conductor formation processes
US5796639A (en) * 1996-09-19 1998-08-18 Intel Corporation Method and apparatus for verifying the installation of strapping devices on a circuit board assembly
US5802074A (en) * 1996-09-19 1998-09-01 Intel Corporation Method and apparatus for the non-invasive testing of printed circuit board assemblies
JPH10269100A (ja) * 1997-03-25 1998-10-09 Mitsubishi Electric Corp ボード配線故障検出装置
US6104198A (en) * 1997-05-20 2000-08-15 Zen Licensing Group Llp Testing the integrity of an electrical connection to a device using an onboard controllable signal source
WO2000057796A1 (en) 1999-03-31 2000-10-05 Rosenblatt Peter L Systems and methods for soft tissue reconstruction
TW561263B (en) * 2001-03-10 2003-11-11 Samsung Electronics Co Ltd Parallel test board used in testing semiconductor memory devices
US7239126B2 (en) * 2003-06-23 2007-07-03 General Motors Corporation System bench wireless mapping board
US7259665B2 (en) * 2004-10-27 2007-08-21 International Business Machines Corporation Battery backed service indicator aids for field maintenance
US8179143B2 (en) * 2008-10-15 2012-05-15 Test Research, Inc. Apparatus for testing printed circuit and method therefor
CN102129028A (zh) * 2011-01-17 2011-07-20 伟创力电子技术(苏州)有限公司 一种硬件调试装置
KR200487355Y1 (ko) * 2017-06-14 2018-09-05 대구도시철도공사 도시철도 무정전 전원장치용 휴대용 마스터 보드 시험장치

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA768761A (en) * 1962-12-12 1967-10-03 E. Jones Harold Automatic logic circuit tester
US3336434A (en) * 1964-02-03 1967-08-15 Thomas & Betts Corp Wiring system and connection
US3274529A (en) * 1964-02-12 1966-09-20 Buck Engineering Company Inc Cross-bar distribution panel
US3409828A (en) * 1964-10-30 1968-11-05 Phillips Petroleum Co Apparatus for testing electrical circuit boards
US3325766A (en) * 1966-09-23 1967-06-13 Harris Intertype Corp Socket panel for integrated circuit modules
US3549996A (en) * 1967-04-04 1970-12-22 Bendix Corp Universal tester for dynamic and static tests on the operating efficiency of electrical apparatus
US3646438A (en) * 1967-06-14 1972-02-29 Essex International Inc Apparatus for testing different kinds of electromechanical components using preprogrammed connecting for each of the different components
DE1951861A1 (de) * 1968-10-17 1970-08-06 Gen Electric Information Syste Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen
US3676777A (en) * 1970-08-10 1972-07-11 Tektronix Inc Apparatus for automatically testing integrated circuit devices
US3739349A (en) * 1971-05-24 1973-06-12 Sperry Rand Corp Digital equipment interface unit
US3922537A (en) * 1974-09-26 1975-11-25 Instrumentation Engineering Multiplex device for automatic test equipment
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214718U (enrdf_load_stackoverflow) * 1988-07-13 1990-01-30

Also Published As

Publication number Publication date
JPS54138351A (en) 1979-10-26
US4196386A (en) 1980-04-01
BE875531A (fr) 1979-07-31

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