JPS6242593A - Semiconductor light emission device - Google Patents

Semiconductor light emission device

Info

Publication number
JPS6242593A
JPS6242593A JP18219485A JP18219485A JPS6242593A JP S6242593 A JPS6242593 A JP S6242593A JP 18219485 A JP18219485 A JP 18219485A JP 18219485 A JP18219485 A JP 18219485A JP S6242593 A JPS6242593 A JP S6242593A
Authority
JP
Japan
Prior art keywords
mode
light
laser
junction
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18219485A
Other languages
Japanese (ja)
Inventor
Haruhiko Tabuchi
田渕 晴彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18219485A priority Critical patent/JPS6242593A/en
Publication of JPS6242593A publication Critical patent/JPS6242593A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/062Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
    • H01S5/06233Controlling other output parameters than intensity or frequency
    • H01S5/06236Controlling other output parameters than intensity or frequency controlling the polarisation, e.g. TM/TE polarisation switching

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To facilitate variation of a TE mode and a TM mode and improve both of light extinguishing ratio and S-N ratio by a method wherein a light emitted from the P-N junction of a light emission device is introduced into a laser resonator to which a modulation current is applied and the modulated light is introduced into an optical fiber through a photodetection unit and lenses. CONSTITUTION:A light emitted from the P-N junction provided in an unshown semiconductor light emission device is introduced into a laser chip 1, to which a bias current IB and a modulation current IS are applied, to be subjected to optical amplification. Then the light emitted from the laser chip 1 is introduced into an optical fiber 6 through a lens 2, a photodetection unit 3 composed of a prism beam splitter (PBS) with an optical monitor 4 and a lens 5 in this order and emitted from the optical fiber 6 to the outside. With this constitution, the intensity of the light from the P-N junction can be freely controlled by the variation of the modulation current IS and high speed long distance transmission can be realized while required TE and TM modes being obtained.

Description

【発明の詳細な説明】 〔概要〕 pn接合に注入する光を変化させると、レーザ共振器内
でのレーザ光の偏波面が、TEモードからTMモード或
いはTMモードからTEモードへ変化する半導体レーザ
と、TEモード或いはTMモードのどちらか一方の偏波
を持つレーザ光のみを透過させるような検光子と、該半
導体レーザから放射される光を該検光子を通して外部に
取出す手段を有し、注入電流の変化により、TEモード
、TMモモ−間でモードを変化させ、外部へ取出される
光の強度を変化させ高速で消光比の大きな光パルスを得
る。
[Detailed Description of the Invention] [Summary] A semiconductor laser in which the plane of polarization of laser light within a laser resonator changes from TE mode to TM mode or from TM mode to TE mode by changing the light injected into the pn junction. and an analyzer that transmits only laser light having polarization of either the TE mode or the TM mode, and a means for extracting the light emitted from the semiconductor laser to the outside through the analyzer. By changing the current, the mode is changed between TE mode and TM mode, and the intensity of the light taken out to the outside is changed to obtain a high-speed light pulse with a large extinction ratio.

〔産業上の利用分野〕[Industrial application field]

本発明は半導体発光装置に係り、特に、TEモード、T
Mモモ−間で偏波が変化するレーザを利用し、高速で消
光比の大きな光パルスを得る発光装置に関する。
The present invention relates to a semiconductor light emitting device, and particularly relates to a TE mode, T
The present invention relates to a light emitting device that uses a laser whose polarization changes between M and M to obtain a light pulse with a high extinction ratio at high speed.

〔従来の技術〕[Conventional technology]

第8図(a)に典型的な半導体レーザのしきい値1.t
hを有する電流−光出力特性を示す。このような特性を
持つレーザに図(b)に示したように、I b /1t
h =0.8〜1.0の直流バイアス電流Ibを流し、
これに、変調電流Isを重ねて光出力を変調する。
FIG. 8(a) shows the threshold value 1 of a typical semiconductor laser. t
The current-light output characteristics with h are shown. As shown in Figure (b), a laser with such characteristics has I b /1t
A DC bias current Ib of h = 0.8 to 1.0 is applied,
A modulation current Is is superimposed on this to modulate the optical output.

ところが、この方式では第8図(c)の変調電流の振幅
と光の消光比の関係から明らかのように、伝送距離を長
くし、且つ消光比を大きくするためには変調電流を大き
くし、光出力の変化を大きくしなければならない。しか
しながら、このために必要となる大電力変調器を作製す
ることはむづかしい。また、大電力変調はレーザに与え
るストレスが大きくなり、信頼性が低下する。又、変調
電力を大きくするためには大電力トランジスタを用いる
必要があるが、大電力トランジスタは接合容量が大きい
ため、応答速度が悪くなり、高速化に通さない。
However, in this method, as is clear from the relationship between the amplitude of the modulation current and the extinction ratio of light in FIG. 8(c), in order to lengthen the transmission distance and increase the extinction ratio, the modulation current must be increased. The change in light output must be large. However, it is difficult to fabricate the high power modulators required for this purpose. Furthermore, high power modulation increases stress on the laser, reducing reliability. Furthermore, in order to increase the modulation power, it is necessary to use a high-power transistor, but since the high-power transistor has a large junction capacitance, the response speed becomes poor and it is not possible to increase the speed.

さらに、レーザ自体も大振幅になる程変調かがかりにく
くなる。これは、第8図(d)の如くレーザのカットオ
フ周波数Fcが低下するためである。
Furthermore, the larger the amplitude of the laser itself, the less likely it is to be modulated. This is because the cutoff frequency Fc of the laser decreases as shown in FIG. 8(d).

又、レーザの振幅変調幅を大きくするとレーザ内のキャ
リア密度のゆらぎが生じ、レーザの単白色が低下し、ス
ペクトル幅が拡がる。ファイバ内を進む光の波は波長に
よって異なるため(ファイバの波長分散)、スペクトル
幅がひろくなると、長距離の伝送によって波形が歪み、
伝送距離と変調周波数との積が低い値に制限される。
Furthermore, when the amplitude modulation width of the laser is increased, carrier density within the laser fluctuates, the monochrome color of the laser decreases, and the spectral width expands. Since the light waves traveling in a fiber differ depending on the wavelength (fiber chromatic dispersion), when the spectral width becomes wider, the waveform becomes distorted due to long-distance transmission.
The product of transmission distance and modulation frequency is limited to a low value.

そのため、伝送距離を長くするために、振幅を大きくす
るとスペクトルの拡がりにより、距離が制限され、スペ
クトルを小さくするため振幅を小さくすると、光出力が
小さくなりファイバの損失により伝送距離が制限される
という欠点が生じる(第7図(a)の■のスペクトル幅
と変調振幅の関係を参照)。
Therefore, if you increase the amplitude in order to increase the transmission distance, the distance will be limited due to the broadening of the spectrum, and if you decrease the amplitude to decrease the spectrum, the optical output will decrease and the transmission distance will be limited due to fiber loss. A drawback occurs (see the relationship between the spectral width and the modulation amplitude, indicated by ■ in FIG. 7(a)).

一方、第8図(b)に示したバイアス電流rbをL4い
値1thより高くすることにより、第7図(b)に示す
ようにレーザ自体の周波数特性を良くすることができる
。更に、第7図(a)の■のようスペクトルの拡がりを
小さくするたことができるが、第7図(e)のようにI
b/Ithが1より大きくなると、信号の0レベルでも
レーザ発振状態となるため、0と1との光強度の比(消
光比)が小さくなり、この方法による高速化は困難であ
るという欠点がある。
On the other hand, by making the bias current rb shown in FIG. 8(b) higher than the L4 value 1th, the frequency characteristics of the laser itself can be improved as shown in FIG. 7(b). Furthermore, it is possible to reduce the spread of the spectrum as shown in Figure 7(a), but the I
When b/Ith is greater than 1, the laser oscillates even at the 0 level of the signal, so the ratio of the light intensity between 0 and 1 (extinction ratio) becomes small, and this method has the disadvantage that it is difficult to increase the speed. be.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来においては、以上のように、伝送距離を長くし、且
つ消光比を大きくするためには変調電流を大きくし、光
出力の変化を大きくしなければならない。しかしながら
、このために必要となる大電力変調器を作製することは
むづかしく、また、大電力変調はレーザに与えるストレ
スが大きくなり、信頼性が低下する。さらに、レーザ自
体も大振幅になる程周波数特性が劣化し変調がかかりに
くくなったり、スペクトル幅が拡がり、伝送距離が短く
なる等種々の欠点があった。
Conventionally, as described above, in order to increase the transmission distance and increase the extinction ratio, it is necessary to increase the modulation current and increase the change in optical output. However, it is difficult to manufacture the high power modulator required for this purpose, and high power modulation increases stress on the laser, reducing reliability. Furthermore, the laser itself has various drawbacks such as the frequency characteristics deteriorate as the amplitude increases, making it difficult to apply modulation, broadening the spectrum width, and shortening the transmission distance.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、pn接合に注入する光を変化させると、レー
ザ共振器内でのレーザ光の偏波面が、TEモードからT
Mモード或いは7MモードからTEモードへ変化する半
導体レーザにおいて、TEとTMの偏波の移行が、非常
に少ない電流で起ることに着目し、これを利用するもの
で、TEモード或いは7Mモードのどちらか一方の偏波
を持つレーザ光のみを透過させるような検光子と、該半
導体レーザから放射される光を該検光子を通して外部に
取出す手段を有し、注入電流の変化により、TEモード
、TMモード間でモードを変化させ、外部へ取出される
光の強度を変化させることにより、高速で消光比の大き
な光パルスを得る。
In the present invention, by changing the light injected into the pn junction, the polarization plane of the laser light within the laser resonator changes from the TE mode to the T mode.
We focused on the fact that in a semiconductor laser that changes from M mode or 7M mode to TE mode, the transition between TE and TM polarization occurs with a very small current, and utilizes this fact. It has an analyzer that allows only laser light with one of the polarizations to pass through, and a means for extracting the light emitted from the semiconductor laser to the outside through the analyzer. By changing the mode between TM modes and changing the intensity of the light extracted to the outside, a light pulse with a high extinction ratio is obtained at high speed.

〔作用〕[Effect]

DFBレーザにおいては、偏波選択性が悪いため、第3
図(a)(b)にTM、TEの発振波長とレーザの利得
の相互関係を示すように利得の大きさがTE、TMの双
方に同程度となるようにすると発振モードがTEモード
−TMモモ−間で変化することが報告されている(昭和
58年秋、応用物理学会学術講演会予稿集、  p 9
92,5 p −P −12、関雅文他、DFB−DC
−PBHLDのTE、7Mモード発振、昭和59年度電
子通信学会光・電波部門全国大会、260 田渕晴彦他
DFB lasers have poor polarization selectivity, so the third
As shown in Figures (a) and (b), which show the correlation between the oscillation wavelength of TM and TE and the laser gain, when the magnitude of the gain is made to be the same for both TE and TM, the oscillation mode changes from TE mode to TM. It has been reported that it varies between momos (Autumn 1982, Proceedings of the Japan Society of Applied Physics Academic Conference, p. 9)
92,5 p-P-12, Masafumi Seki et al., DFB-DC
-TE of PBHLD, 7M mode oscillation, 1985 National Conference of the Optical and Radio Division of the Institute of Electronics and Communication Engineers, 260 Haruhiko Tabuchi et al.

DFBレーザの発振軸モードの飛び参照)特に、第3図
(C)のように発振しきい値付近でTEに比べTMのほ
うがやや大きいように設定すると、しきい値付近では7
Mモードで発振する。
(See jump in oscillation axis mode of DFB laser) In particular, if TM is set to be slightly larger than TE near the oscillation threshold as shown in Figure 3 (C), the
Oscillates in M mode.

次に、電流を増加させると、利得が長波長側に移るため
、ある出力で発振モードはTEモードへ移動する。TE
モードは通常7Mモードより第3図(a)(c)に示す
ように20〜30人長波長に位置するためである。
Next, when the current is increased, the gain shifts to the longer wavelength side, so the oscillation mode shifts to the TE mode at a certain output. T.E.
This is because the mode is normally located at a wavelength 20 to 30 times longer than the 7M mode, as shown in FIGS. 3(a) and 3(c).

このようなレーザを用い、バイアス電流Ibを7Mモー
ドからTEモードへ移る直前に設定すると、僅かな変調
電流でTEモード、7Mモード間変調が可能となる。
If such a laser is used and the bias current Ib is set just before shifting from the 7M mode to the TE mode, modulation between the TE mode and the 7M mode is possible with a small modulation current.

この変調された光を、TE波、TM波のみを選択するよ
うな検光子を通して外部へ取出すようにすることにより
、■TEモード、7Mモードの偏波の移行は非常に少な
い電流でおこるので、少ない変調電流でTEモード、7
Mモード間変調を行なうことができ、周波数特性の低下
と、スペクトルの拡がりを抑圧可能となる、■検光子と
TEモード、7Mモード間変調を用いることにより、r
b/rthが1より十分大きいときでも高い消光比が得
られ、バイアス電流Ibの増加によるレーザの周波数特
性を改善することにより、高速な光変調を可能とする。
By extracting this modulated light to the outside through an analyzer that selects only TE waves and TM waves, ■The transition of polarization between TE mode and 7M mode occurs with a very small amount of current. TE mode with low modulation current, 7
By using an analyzer, TE mode, and 7M mode modulation, the r
A high extinction ratio can be obtained even when b/rth is sufficiently larger than 1, and by improving the frequency characteristics of the laser by increasing the bias current Ib, high-speed optical modulation is possible.

〔実施例〕〔Example〕

本実施例においては、第2図に示す7MモードからTE
モードへバイアスの増加で移行するレーザを用いる。第
1図に本実施例の光学系を示し、1が該レーザチップで
レンズ2を介してTE波のみを通過する検光子3(PB
S:プリスムビームスプリノタ)に導〃く。PBS3を
出た光はレンズ5をへて6の光ファイバに入射する。尚
、4は光モニタ用受光素子である。
In this embodiment, from 7M mode shown in FIG.
It uses a laser that shifts into mode with increasing bias. FIG. 1 shows the optical system of this embodiment, where 1 is the laser chip and an analyzer 3 (PB
S: Leads to Prism Beam Supurinota). The light exiting the PBS 3 passes through a lens 5 and enters an optical fiber 6. Note that 4 is a light receiving element for light monitoring.

第2図において、P点にバイアスして、信号電流(変調
電流)Isで変調すると、ファイバ6にはTE光の変化
Psのみが入射される。本実施例では、Isとしては、
5mA(ピーク−ピーク)程度で十分高い消光比が得ら
れる。
In FIG. 2, when biased to point P and modulated by signal current (modulation current) Is, only the change Ps of the TE light is incident on the fiber 6. In this embodiment, Is is
A sufficiently high extinction ratio can be obtained at about 5 mA (peak-to-peak).

本発明に用られるTEモード、TMモード間移行が生じ
るレーザは一般にコルゲーションを持ち、端面反射をな
くしたレーザ、例えばDFBレーザにみられる。その構
造を第4図に示してあり、ソド層21、p−InGaA
sPコンタクト層22が形成されたストライプ状のメサ
構造を有し、これをp−1nP12.n−1nP13.
n−InGaAs P 14で埋め込んでいる。ガイド
層19にそって形成されるコルゲーションの深さDは5
0〜150ns 、ピッチは400nmである。又レー
ザ長LLは400μmである。そして、端面には反射を
なくすためA12Q3のコーティング18が施しである
。尚、15は5i02膜、16.17はレーザの電橋で
ある。
The laser used in the present invention, in which the transition between the TE mode and the TM mode occurs, generally has corrugations and is found in lasers that eliminate end face reflection, such as DFB lasers. Its structure is shown in FIG.
It has a striped mesa structure in which an sP contact layer 22 is formed, and this is a p-1nP12. n-1nP13.
It is embedded with n-InGaAs P14. The depth D of the corrugation formed along the guide layer 19 is 5
0-150ns, pitch is 400nm. Further, the laser length LL is 400 μm. The end face is coated with A12Q3 coating 18 to eliminate reflection. Note that 15 is a 5i02 film, and 16.17 is a laser bridge.

以上TMモードーTEモードに移行するレーザを用いた
例を示したが、TEモード−7Mモードの移行を示すレ
ーザもみられる。例えば、第5図に示す半導体レーザの
特性ではTEモード−7Mモードの移行が観測される。
Although an example using a laser that transitions from TM mode to TE mode has been shown above, lasers that transition from TE mode to 7M mode are also seen. For example, in the characteristics of the semiconductor laser shown in FIG. 5, a transition from TE mode to 7M mode is observed.

第6図にはそのレーザのスペクトルを示し、I/Ith
=0.8では発振しきい値以下でTE、TMを分離した
スペクトルを示し、I/Ith=1.8ではTEモード
のみで発振しており、I/Ith=2.0ではTEモー
ドの短波長側に7Mモードが現れていることがわかる。
Figure 6 shows the spectrum of the laser, and I/Ith
= 0.8 shows a spectrum with TE and TM separated below the oscillation threshold, I/Ith = 1.8 shows oscillation only in TE mode, and I/Ith = 2.0 shows a spectrum with TE mode separated. It can be seen that the 7M mode appears on the wavelength side.

本発明においては、このようなレーザを用い、光の実施
例と逆に7Mモードの偏波のみを通す検光子を通し、注
入電流の変化でTEモ−ドーTMモード変化を起こさせ
、外部へ取出す光の強度を変調することができる。
In the present invention, such a laser is used, and contrary to the optical embodiment, it is passed through an analyzer that only passes polarized waves in the 7M mode, and a change in the injected current causes the TE mode to TM mode to be transmitted to the outside. The intensity of the extracted light can be modulated.

〔発明の効果〕〔Effect of the invention〕

以上のように、本発明によれば次に示す効果が得られる
As described above, according to the present invention, the following effects can be obtained.

■変調電流Isが小さくても、高い消光比が得られ、S
/N比が向上し伝送距離が長く出来る。
■Even if the modulation current Is is small, a high extinction ratio can be obtained, and S
/N ratio is improved and transmission distance can be extended.

■変調電流の振幅が小さいため、比較的簡単に高速変調
ができ、スペクトル幅の拡がりもちいさくできる為、高
速で長距離の伝送が可能となる。
■Since the amplitude of the modulation current is small, high-speed modulation can be performed relatively easily, and the spectrum width can be expanded quickly, allowing high-speed, long-distance transmission.

■バイアス電流をrthより十分大きな位置に設定でき
るため、レーザの周波数特性が向上し、高速変調するこ
とにより、通信容量の大容量化が可能になる。
(2) Since the bias current can be set at a position sufficiently larger than rth, the frequency characteristics of the laser are improved, and by high-speed modulation, it becomes possible to increase the communication capacity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例の構成図、第2図は本発明の実
施例の動作説明図、第3図(a)(b)(C)はそれぞ
れ本発明に用いるレーザの特性図、第4図は実施例に用
いる素子の要部断面図、第5図、第6図はTE−TMに
移行するレーザの特性図、第7図(a)(b)(c)及
び第8図(a)〜(d)は従来の半導体発光装置の特性
図である。 主な符号 1・・・レーザチップ 2.5・・・レンズ 3・・・PBS 4・・・光モニタ 6・・・光ファイバ
FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is an explanatory diagram of the operation of an embodiment of the present invention, and FIGS. 3(a), (b), and (C) are characteristic diagrams of a laser used in the present invention, respectively. Figure 4 is a sectional view of the main part of the element used in the example, Figures 5 and 6 are characteristic diagrams of the laser transitioning to TE-TM, Figures 7 (a), (b), (c) and 8. (a) to (d) are characteristic diagrams of conventional semiconductor light emitting devices. Main code 1... Laser chip 2.5... Lens 3... PBS 4... Optical monitor 6... Optical fiber

Claims (1)

【特許請求の範囲】 電流を注入することによって電子と正孔の再結合により
光を発生する半導体のpn接合と、そのpn接合より発
生した光を導波、増幅するレーザ共振器とを有し、該p
n接合に注入する光を変化させると、レーザ共振器内で
のレーザ光の偏波面が、TEモードからTMモード或い
はTMモードからTEモードへ変化する半導体レーザと
、該半導体レーザから放射されるレーザ光のうち、TE
モード或いはTMモードのどちらか一方の偏波を持つレ
ーザ光のみを透過させるような検光子と、 該半導体レーザから放射される光を該検光子を通して外
部に取出す手段を有し、 注入電流の変化により、TEモード、TMモード間でモ
ードを変化させ、外部へ取出される光の強度を変化させ
るようにしたことを特徴とする半導体発光装置
[Claims] A semiconductor pn junction that generates light by recombining electrons and holes when current is injected, and a laser resonator that guides and amplifies the light generated from the pn junction. , the p
A semiconductor laser in which the plane of polarization of laser light within a laser resonator changes from TE mode to TM mode or from TM mode to TE mode when the light injected into the n-junction is changed, and a laser emitted from the semiconductor laser Out of the light, TE
It has an analyzer that transmits only laser light having polarization of either mode or TM mode, and means for extracting the light emitted from the semiconductor laser to the outside through the analyzer, and changes in the injected current. A semiconductor light emitting device characterized in that the mode is changed between TE mode and TM mode, and the intensity of light extracted to the outside is changed.
JP18219485A 1985-08-20 1985-08-20 Semiconductor light emission device Pending JPS6242593A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18219485A JPS6242593A (en) 1985-08-20 1985-08-20 Semiconductor light emission device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18219485A JPS6242593A (en) 1985-08-20 1985-08-20 Semiconductor light emission device

Publications (1)

Publication Number Publication Date
JPS6242593A true JPS6242593A (en) 1987-02-24

Family

ID=16113985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18219485A Pending JPS6242593A (en) 1985-08-20 1985-08-20 Semiconductor light emission device

Country Status (1)

Country Link
JP (1) JPS6242593A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0717481A1 (en) 1994-12-17 1996-06-19 Canon Kabushiki Kaisha Semiconductor laser, modulation method therefor and optical communication system using the same
US5586131A (en) * 1993-12-10 1996-12-17 Canon Kabushiki Kaisha Oscillation polarization mode selective semiconductor laser, light source apparatus and optical communication system using the laser
US5590145A (en) * 1994-02-23 1996-12-31 Canon Kabushiki Kaisha Light-emitting apparatus capable of selecting polarization direction, optical communication system, and polarization modulation control method
JPH0969671A (en) * 1995-08-30 1997-03-11 Canon Inc Distributed feedback semiconductor laser capable of polarization modulation
US5699373A (en) * 1994-03-17 1997-12-16 Canon Kabushiki Kaisha Oscillation polarization selective semiconductor laser and optical communication system using the same
US5757832A (en) * 1995-04-27 1998-05-26 Canon Kabushiki Kaisha Optical semiconductor device, driving method therefor and light source and opitcal communication system using the same
US5757828A (en) * 1995-12-08 1998-05-26 Canon Kabushiki Kaisha Semiconductor laser device, method for driving the same, and optical communication system using the same
US5764670A (en) * 1995-02-27 1998-06-09 Canon Kabushiki Kaisha Semiconductor laser apparatus requiring no external modulator, method of driving semiconductor laser device, and optical communication system using the semiconductor laser apparatus
US5841799A (en) * 1994-12-17 1998-11-24 Canon Kabushiki Kaisha Semiconductor laser, modulation method therefor and optical communication system using the same
US6031860A (en) * 1996-08-22 2000-02-29 Canon Kabushiki Kaisha Optical device capable of switching output intensity of light of predetermined polarized wave, optical transmitter using the device, network using the transmitter, and method of driving optical device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5586131A (en) * 1993-12-10 1996-12-17 Canon Kabushiki Kaisha Oscillation polarization mode selective semiconductor laser, light source apparatus and optical communication system using the laser
US5590145A (en) * 1994-02-23 1996-12-31 Canon Kabushiki Kaisha Light-emitting apparatus capable of selecting polarization direction, optical communication system, and polarization modulation control method
US5699373A (en) * 1994-03-17 1997-12-16 Canon Kabushiki Kaisha Oscillation polarization selective semiconductor laser and optical communication system using the same
EP0717481A1 (en) 1994-12-17 1996-06-19 Canon Kabushiki Kaisha Semiconductor laser, modulation method therefor and optical communication system using the same
US5757840A (en) * 1994-12-17 1998-05-26 Canon Kabushiki Kaisha Semiconductor laser modulation method therefor and optical communication system using the same
US5841799A (en) * 1994-12-17 1998-11-24 Canon Kabushiki Kaisha Semiconductor laser, modulation method therefor and optical communication system using the same
US5764670A (en) * 1995-02-27 1998-06-09 Canon Kabushiki Kaisha Semiconductor laser apparatus requiring no external modulator, method of driving semiconductor laser device, and optical communication system using the semiconductor laser apparatus
US5757832A (en) * 1995-04-27 1998-05-26 Canon Kabushiki Kaisha Optical semiconductor device, driving method therefor and light source and opitcal communication system using the same
JPH0969671A (en) * 1995-08-30 1997-03-11 Canon Inc Distributed feedback semiconductor laser capable of polarization modulation
US5757828A (en) * 1995-12-08 1998-05-26 Canon Kabushiki Kaisha Semiconductor laser device, method for driving the same, and optical communication system using the same
US6031860A (en) * 1996-08-22 2000-02-29 Canon Kabushiki Kaisha Optical device capable of switching output intensity of light of predetermined polarized wave, optical transmitter using the device, network using the transmitter, and method of driving optical device

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