JPS6242061U - - Google Patents
Info
- Publication number
- JPS6242061U JPS6242061U JP13468685U JP13468685U JPS6242061U JP S6242061 U JPS6242061 U JP S6242061U JP 13468685 U JP13468685 U JP 13468685U JP 13468685 U JP13468685 U JP 13468685U JP S6242061 U JPS6242061 U JP S6242061U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- block
- holder
- sample holder
- fixing mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims description 2
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Description
第１図ないし第５図は本考案の実施例を示すも
ので、第１図はＸ線回折装置用試料固定機構の正
面図、第２図は同機構を一部省略して示す斜視図
、第３図はＶブロツクの試料台への取り付け状態
を示す断面図、第４図はＶブロツクの斜視図、第
５図は試料ホルダの斜視図、第６図は従来使用さ
れている試料板の斜視図である。
１……Ｘ線回折装置用試料固定機構、２……ゴ
ニオメータの回転軸、４……試料台、６……Ｖブ
ロツク、１０……試料ホルダ、１２……試料充填
用穴。
1 to 5 show an embodiment of the present invention, in which FIG. 1 is a front view of a sample fixing mechanism for an X-ray diffraction apparatus, FIG. 2 is a perspective view showing the same mechanism with some parts omitted, Figure 3 is a sectional view showing how the V-block is attached to the sample stage, Figure 4 is a perspective view of the V-block, Figure 5 is a perspective view of the sample holder, and Figure 6 is a view of a conventional sample plate. FIG. DESCRIPTION OF SYMBOLS 1...Sample fixing mechanism for X-ray diffractometer, 2...Goniometer rotation axis, 4...Sample stand, 6...V block, 10...Sample holder, 12...Sample filling hole.
Claims (1)
え、この試料台には試料ホルダが載置されるＶブ
ロツクが取り付けられる一方、前記試料ホルダは
円柱状を成しかつその中心軸に沿つて試料充填用
穴が形成されていることを特徴とするＸ線回析装
置用試料固定機構。 The goniometer has a sample stand fixed to the rotating shaft, and a V block on which a sample holder is placed is attached to the sample stand.The sample holder has a cylindrical shape and the sample is filled along its central axis. A sample fixing mechanism for an X-ray diffraction apparatus, characterized in that a hole is formed therein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985134686U JPH044995Y2 (en) | 1985-09-02 | 1985-09-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985134686U JPH044995Y2 (en) | 1985-09-02 | 1985-09-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6242061U true JPS6242061U (en) | 1987-03-13 |
| JPH044995Y2 JPH044995Y2 (en) | 1992-02-13 |
Family
ID=31036156
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985134686U Expired JPH044995Y2 (en) | 1985-09-02 | 1985-09-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH044995Y2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5236626U (en) * | 1975-09-04 | 1977-03-15 |
-
1985
- 1985-09-02 JP JP1985134686U patent/JPH044995Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5236626U (en) * | 1975-09-04 | 1977-03-15 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH044995Y2 (en) | 1992-02-13 |
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