JPH01110357U - - Google Patents
Info
- Publication number
- JPH01110357U JPH01110357U JP383888U JP383888U JPH01110357U JP H01110357 U JPH01110357 U JP H01110357U JP 383888 U JP383888 U JP 383888U JP 383888 U JP383888 U JP 383888U JP H01110357 U JPH01110357 U JP H01110357U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- diffraction apparatus
- ray
- cylindrical
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims description 3
- 238000012856 packing Methods 0.000 claims description 2
- 239000012780 transparent material Substances 0.000 claims description 2
- 238000004458 analytical method Methods 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Description
第１図は本考案実施例の縦断面図、第２図は第
１図におけるＡ―Ａ断面図、第３図は第１図第２
図の試料保持器を取り付けたＸ線回折装置の平面
図である。なお図において、ｐはＸ線回折装置の
回転軸線、８は試料、２は試料取付台、５は円筒
面状部分、１４は環状パツキング、１３は有底円
筒体、１２はＸ線透過材、１１はＸ線窓、である
。
Fig. 1 is a longitudinal sectional view of an embodiment of the present invention, Fig. 2 is a sectional view taken along line A-A in Fig. 1, and Fig. 3 is a sectional view of the embodiment of the present invention.
FIG. 2 is a plan view of the X-ray diffraction apparatus equipped with the sample holder shown in the figure. In the figure, p is the rotation axis of the X-ray diffraction device, 8 is the sample, 2 is the sample mount, 5 is the cylindrical surface portion, 14 is the annular packing, 13 is the bottomed cylindrical body, 12 is the X-ray transparent material, 11 is an X-ray window.
Claims (1)
乗るようにこの試料を上記線回折装置に取り付
ける試料取付台に上記軸線を中心とする円筒面状
の部分を形成し、一端が環状パツキングを介して
上記円筒面状の部分に気密に嵌合することにより
内部に前記試料を収容する有底円筒体を設けて、
上記円筒体の周側面にＸ線透過材で密閉した円弧
状のＸ線窓を形成したＸ線回折装置の試料保持器
。 A cylindrical part centered on the axis is formed on the sample mount for attaching the sample to the linear diffraction apparatus so that the axis of rotation of the linear diffraction apparatus is on the analysis surface of the plate-shaped sample, and one end has an annular packing. Providing a bottomed cylindrical body that accommodates the sample inside by fitting airtightly to the cylindrical surface portion through the cylindrical surface,
A sample holder for an X-ray diffraction apparatus, in which an arc-shaped X-ray window sealed with an X-ray transparent material is formed on the circumferential side of the cylindrical body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988003838U JPH0637317Y2 (en) | 1988-01-18 | 1988-01-18 | Sample holder for X-ray diffractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988003838U JPH0637317Y2 (en) | 1988-01-18 | 1988-01-18 | Sample holder for X-ray diffractometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01110357U true JPH01110357U (en) | 1989-07-25 |
| JPH0637317Y2 JPH0637317Y2 (en) | 1994-09-28 |
Family
ID=31205825
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988003838U Expired - Lifetime JPH0637317Y2 (en) | 1988-01-18 | 1988-01-18 | Sample holder for X-ray diffractometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0637317Y2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022093242A (en) * | 2020-12-11 | 2022-06-23 | 東莞理工学院 | Sample environment installations easily converting product to be measured |
| JP2022093241A (en) * | 2020-12-11 | 2022-06-23 | 東莞理工学院 | Vacuum stress sample environment demonstration machine |
-
1988
- 1988-01-18 JP JP1988003838U patent/JPH0637317Y2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022093242A (en) * | 2020-12-11 | 2022-06-23 | 東莞理工学院 | Sample environment installations easily converting product to be measured |
| JP2022093241A (en) * | 2020-12-11 | 2022-06-23 | 東莞理工学院 | Vacuum stress sample environment demonstration machine |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0637317Y2 (en) | 1994-09-28 |